Three-dimensional operando analysis of interfaces in organic semiconductor devices using synchrotron X-ray spectromicroscopy
| Project/Area Number |
15K17463
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| Research Category |
Grant-in-Aid for Young Scientists (B)
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| Allocation Type | Multi-year Fund |
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| Research Field |
Thin film/Surface and interfacial physical properties
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| Research Institution | National Institute for Materials Science |
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Principal Investigator |
NAGAMURA Naoka 国立研究開発法人物質・材料研究機構, 先端材料解析研究拠点, 研究員 (40708799)
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| Project Period (FY) |
2015-04-01 – 2018-03-31
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| Project Status |
Completed (Fiscal Year 2017)
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| Budget Amount *help |
¥3,640,000 (Direct Cost: ¥2,800,000、Indirect Cost: ¥840,000)
Fiscal Year 2016: ¥1,560,000 (Direct Cost: ¥1,200,000、Indirect Cost: ¥360,000)
Fiscal Year 2015: ¥2,080,000 (Direct Cost: ¥1,600,000、Indirect Cost: ¥480,000)
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| Keywords | 有機電界効果トランジスタ / 量子ビーム / 顕微分光 / イメージング / ナノ電子デバイス / オペランド観測 / オペランド分析 / 電界効果トランジスタ / 有機分子半導体 / 放射光 / 界面 |
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| Outline of Final Research Achievements |
Organic field effect transistor (OFET) utilizing π-electron organic molecular semiconductor thin films as a channel have great advantage in flexibility and potential for molecular designing. In our research, we have clarified the microscopic electronic states in the vicinity of interfaces and defects in device structures, which affect the macroscopic transport characteristics, using a scanning photoelectron microscopy equipment with a operando measurement system, called “3D nano-ESCA”.
We confirmed that the pin-point core level peak shift of carbon 1s state reflects local chemical potential by simultaneous measurements of spectroscopy and transport characteristics of OFETs using thiophene derivative molecule "C10-DNBDT-NW". The potential mapping obtained by measuring the spatial change of the core level peak shift suggests the presence of the charge trapping at the metal electrode/organic molecular interface, and several domains with different mobilities.
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Report
(4 results)
Research Products
(27 results)
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[Presentation] Electronic state analysis of organic materials using synchrotron radiation soft X-ray2015
Author(s)
永村直佳, 北田祐太, 谷木良輔, 鶴見淳人, 松井弘之, 堀場弘司, 朝倉大輔, 細野英司, 本間格, 竹谷純一, 尾嶋正治
Organizer
The 2nd Tohoku University and NIMS-GREEN Joint Symposium
Place of Presentation
東北大学 片平キャンパス
Year and Date
2015-10-30
Related Report
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