Understanding the role of the interface oxide layer in the multiferroicity at the ferromagnet/insulator junctions
| Project/Area Number |
15K17684
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| Research Category |
Grant-in-Aid for Young Scientists (B)
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| Allocation Type | Multi-year Fund |
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| Research Field |
Condensed matter physics I
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| Research Institution | High Energy Accelerator Research Organization |
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Principal Investigator |
SAKAMAKI Masako 大学共同利用機関法人高エネルギー加速器研究機構, 物質構造科学研究所, 助教 (90598880)
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| Research Collaborator |
AMEMIYA Kenta 高エネルギー加速器研究機構, 物質構造科学研究所, 教授 (80313196)
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| Project Period (FY) |
2015-04-01 – 2017-03-31
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| Project Status |
Completed (Fiscal Year 2016)
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| Budget Amount *help |
¥4,160,000 (Direct Cost: ¥3,200,000、Indirect Cost: ¥960,000)
Fiscal Year 2016: ¥910,000 (Direct Cost: ¥700,000、Indirect Cost: ¥210,000)
Fiscal Year 2015: ¥3,250,000 (Direct Cost: ¥2,500,000、Indirect Cost: ¥750,000)
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| Keywords | 深さ分解 / X線吸収分光 / 電界効果 / X線磁気円二色性 / 表面・界面 / 磁性薄膜 |
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| Outline of Final Research Achievements |
In this proposal, we have developed fluorescence-yield depth-resolved x-ray magnetic circular dichroism (XMCD) measurement system by using soft x-ray camera, and performed a study on the multiferroicity at the ferromagnet/insulator junction. By placing the permanent magnet next to the sample and irradiating the circularly polarized synchrotron soft x ray on it, the depth-resolved XMCD measurement under the magnetic field has been realized. Its depth resolution is estimated to be sub nm. We furthermore developed the sample holder so that the depth-resolved XMCD measurement under the electric field has realised, as well.
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Report
(3 results)
Research Products
(21 results)
