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Uniform Adaptive Testing in e-Testing

Research Project

Project/Area Number 15K21007
Research Category

Grant-in-Aid for Young Scientists (B)

Allocation TypeMulti-year Fund
Research Field Educational technology
Learning support system
Research InstitutionTokyo Gakugei University

Principal Investigator

MIYAZAWA Yoshimitsu  東京学芸大学, 次世代教育研究推進機構, 助教 (70726166)

Project Period (FY) 2015-04-01 – 2018-03-31
Project Status Completed (Fiscal Year 2017)
Budget Amount *help
¥4,160,000 (Direct Cost: ¥3,200,000、Indirect Cost: ¥960,000)
Fiscal Year 2017: ¥910,000 (Direct Cost: ¥700,000、Indirect Cost: ¥210,000)
Fiscal Year 2016: ¥650,000 (Direct Cost: ¥500,000、Indirect Cost: ¥150,000)
Fiscal Year 2015: ¥2,600,000 (Direct Cost: ¥2,000,000、Indirect Cost: ¥600,000)
Keywords適応型テスト / 複数等質テスト構成 / eテスティング / 項目反応理論 / 等質テスト構成 / CBT / Computer Based Testing / 複数等質テスト / 複数質テスト
Outline of Final Research Achievements

Adaptive testing is a question format of computer testing that estimates an examinee’s ability sequentially and which selects question items with the highest estimation accuracy according to the examinee’s ability. However, in conventional adaptive tests, it is highly likely that the exact same group of items will be selected for examinees who have equivalent ability. We propose a uniform adaptive test that adaptively selects different items for examinees even if those with equivalent capabilities, maintaining the same evaluation accuracy. Specifically, we follow the procedure outlined below. 1) We compose an item cluster for a multiple equivalent test based on the amount of test information. 2) Regarding an item cluster for a multiple equivalent test as an item bank, we propose a uniform adaptive test that estimates the value of an examinee’s ability sequentially and which selects items with the highest estimation accuracy.

Report

(4 results)
  • 2017 Annual Research Report   Final Research Report ( PDF )
  • 2016 Research-status Report
  • 2015 Research-status Report
  • Research Products

    (5 results)

All 2018 2017 2016

All Journal Article (1 results) (of which Peer Reviewed: 1 results) Presentation (4 results)

  • [Journal Article] 測定精度の偏り軽減のための等質適応型テストの提案2018

    • Author(s)
      宮澤芳光,宇都雅輝,石井隆稔,植野真臣
    • Journal Title

      電子情報通信学会論文誌

      Volume: J101-D

    • NAID

      120006549769

    • Related Report
      2017 Annual Research Report
    • Peer Reviewed
  • [Presentation] 整数計画問題を用いた木構造型等質適応型テストの提案2017

    • Author(s)
      宮澤芳光,石井隆稔,宇都雅輝,植野真臣
    • Organizer
      日本教育工学会
    • Related Report
      2017 Annual Research Report
  • [Presentation] 複数等質テストを用いた適応型テスト2017

    • Author(s)
      宮澤芳光,石井隆稔,宇都雅輝,植野真臣
    • Organizer
      日本テスト学会
    • Related Report
      2017 Annual Research Report
  • [Presentation] 複数等質適応型テストの提案2016

    • Author(s)
      宮澤 芳光,石井 隆稔,植野 真臣
    • Organizer
      日本教育工学会
    • Place of Presentation
      大阪大学(大阪府・大阪市)
    • Year and Date
      2016-09-17
    • Related Report
      2016 Research-status Report
  • [Presentation] 複数等質テストを用いた適応型テストのシミュレーション評価2016

    • Author(s)
      宮澤 芳光,石井 隆稔,植野 真臣
    • Organizer
      教育システム情報学会
    • Place of Presentation
      帝京大学(栃木県・宇都宮市)
    • Year and Date
      2016-08-29
    • Related Report
      2016 Research-status Report

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Published: 2015-04-16   Modified: 2019-03-29  

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