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A Super High-Sensitivity Imaging for Photon Counting Using an Adaptively Quantized Correlated Multiple Sampling

Research Project

Project/Area Number 16206035
Research Category

Grant-in-Aid for Scientific Research (A)

Allocation TypeSingle-year Grants
Section一般
Research Field Electron device/Electronic equipment
Research InstitutionShizuoka University

Principal Investigator

SHOJI Kawahito  Shizuoka University, Research Institute of Electronics, Professor, 電子工学研究所, 教授 (40204763)

Project Period (FY) 2004 – 2006
Project Status Completed (Fiscal Year 2006)
Budget Amount *help
¥27,820,000 (Direct Cost: ¥21,400,000、Indirect Cost: ¥6,420,000)
Fiscal Year 2006: ¥7,150,000 (Direct Cost: ¥5,500,000、Indirect Cost: ¥1,650,000)
Fiscal Year 2005: ¥5,850,000 (Direct Cost: ¥4,500,000、Indirect Cost: ¥1,350,000)
Fiscal Year 2004: ¥14,820,000 (Direct Cost: ¥11,400,000、Indirect Cost: ¥3,420,000)
KeywordsPhoton Counting / Image Sensor / Low-Light-Level Imaging / Noiseless Detection / Wide Dynamic Range / 超高感度撮像 / イメージセンサ / 相関多重サンプリング
Research Abstract

In this study, a super high-sensitivity image sensor using a new noise reduction method called adaptively quantized correlated multiple sampling has been proposed and demonstrated through the theoretical analysis and implementation of image sensor chips. A switched capacitor amplifier whose gain is given by the capacitance ratio of the input capacitance to feedback capacitance is analyzed as a frontend circuit of the column parallel signal readout circuits and it is found that a very low-noise signal readout is possible if the freeze noise component of the frontend amplifier is cancelled in the second stage using a two-stage noise cancelling architecture. The effect of the noise cancelling has been demonstrated with the implementation of a prototype image sensor chip. By extending this idea to a pre-amplified correlated multiple sampling, an extremely low-noise signal readout circuit has been proposed. A noise analysis of the readout circuits with correlated multiple sampling shows that the thermal noise can be greatly reduced by increasing the pre-amplifier gain and the number of sampling. The input-referred noise level can be reduced to 0.2 electrons if the pre-amplifier gain of 32 and the integration times of 16 are used. The most severe problem in CMOS image sensors is an anomalously large noise generated in the in-pixel source follower amplifier, so-called random telegraph signal (RTS) noise. Techniques for reducing the RTS noise is investigated and it is found that a histogram-based noise RTS noise reduction method can effectively reduce the RTS noise with relatively slow relaxation rate. A technique for achieving both extremely low-noise readout and wide linear dynamic range is also proposed and its effectiveness is confirmed with noise analysis.

Report

(4 results)
  • 2006 Annual Research Report   Final Research Report Summary
  • 2005 Annual Research Report
  • 2004 Annual Research Report
  • Research Products

    (68 results)

All 2007 2006 2005 2004

All Journal Article (60 results) Book (6 results) Patent(Industrial Property Rights) (2 results)

  • [Journal Article] A Wide-Dynamic-Range CMOS Image Sensor Based on Multiple Short Exposure-Time Readout With Multiple-Resolution Column-Parallel ADC2007

    • Author(s)
      M.Sasaki, M.Mase, S.Kawahito, Y.Tadokoro
    • Journal Title

      IEEE Sensors Journal vol.7, no.1

      Pages: 151-158

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2006 Final Research Report Summary
  • [Journal Article] Noise at the Circuit Level2007

    • Author(s)
      S.Kawahito
    • Journal Title

      2007 IEEE ISSCC Forum Noise in Imaging Systems

      Pages: 89-116

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2006 Final Research Report Summary
  • [Journal Article] 最低被写体照度に関する一考察2007

    • Author(s)
      川人祥二, 河合信宏
    • Journal Title

      映像情報メディア学会技術報告 vol.31, no.3

      Pages: 53-56

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2006 Final Research Report Summary
  • [Journal Article] A High-Speed, High-Sensitivity Digital CMOS Image Sensor With a Global Shutter and 12-bit Column-Parallel Cyclic A/D Converter2007

    • Author(s)
      M.Furuta, Y.Nishikawa, T.Inoue, S.Kawahito
    • Journal Title

      IEEE Journal of Solid-State Circuits vol.42,no.4

      Pages: 766-774

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2006 Final Research Report Summary
  • [Journal Article] Column Parallel Signal Processing Techniques for Reducing Thermal and RTS noises for CMOS image sensors2007

    • Author(s)
      S.Kawahito, N.Kawai
    • Journal Title

      Proc. Int. Image Sensors Workshop

      Pages: 226-229

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2006 Final Research Report Summary
  • [Journal Article] Signal Processing Architectures for Low-Noise Hisrh-Resolution CMOS Image Sensors2007

    • Author(s)
      S.Kawahito
    • Journal Title

      Proc. Custom Integrated Circuits Conf. (印刷中)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2006 Final Research Report Summary
  • [Journal Article] A Wide-Dynamic-Range CMOS Image Sensor Based on Multiple Short Exposure-Time Readout With Multiple-Resolution Column-Parallel ADC2007

    • Author(s)
      M.Sasaki, M.Mase, S.Kawahito, Y.Tadokoro
    • Journal Title

      IEEE Sesors Journal vol.7, no.1

      Pages: 151-158

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2006 Final Research Report Summary
  • [Journal Article] Noise at the Circuit Level2007

    • Author(s)
      S.Kawahito
    • Journal Title

      2007 IEEE ISSCC Forum Noise in Imagings Systems

      Pages: 89-116

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2006 Final Research Report Summary
  • [Journal Article] A Study on the Definition of Minimum Illuminance2007

    • Author(s)
      S.Kawahito, N.Kawai
    • Journal Title

      ITE Tech. Report vol.31, no.3

      Pages: 53-56

    • NAID

      40015420819

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2006 Final Research Report Summary
  • [Journal Article] A High-Speed, High-Sensitivity Digital CMOS Image Sensor With a Global Shutter and 12-bit Column-Parallel Cyclic A/D Converter"2007

    • Author(s)
      M.Furuta, Y.Nishikawa, T.Inoue, S.Kawahito
    • Journal Title

      IEEE Journal of Solid-State Circuits Vol.42, No.4

      Pages: 766-774

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2006 Final Research Report Summary
  • [Journal Article] Column Parallel Signal Processing Techniques for Reducing Thermal and RTS Noises in CMOS Image Sensors2007

    • Author(s)
      S.Kawahtio, N.Kawai
    • Journal Title

      Proc. Int. Image Sensor Workshop

      Pages: 226-229

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2006 Final Research Report Summary
  • [Journal Article] Signal Processing Architectures for Low-Noise High-Resolution CMOS Image Sensors2007

    • Author(s)
      S.Kawahito
    • Journal Title

      Proc. Custom Integrated Circuits Conf (in press)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2006 Final Research Report Summary
  • [Journal Article] A Wide-Dynamic-Range CMOS Image Sensor Based on Multiple Short Exposure-Time Readout With Multiple-Resolution Column-Parallel ADC2007

    • Author(s)
      M.Sasaki, M.Mase, S.Kawahito, Y.Tadokoro
    • Journal Title

      IEEE Sesors Journal Vol.7, No.1

      Pages: 151-158

    • Related Report
      2006 Annual Research Report
  • [Journal Article] Noise at the Circuit Level2007

    • Author(s)
      S.Kawahito
    • Journal Title

      2007 IEEE Int. Solid State Circuits Conf. Forum Noise in Imaging Systems

      Pages: 89-116

    • Related Report
      2006 Annual Research Report
  • [Journal Article] CMOSセンサのノイズはどこまで減らせるか2007

    • Author(s)
      川人祥二
    • Journal Title

      次世代画像入力ビジョン・システム部会第111回定例会講演会資料

      Pages: 1-20

    • Related Report
      2006 Annual Research Report
  • [Journal Article] 最低被写体照度に関する一考察2007

    • Author(s)
      川人祥二, 河合信宏
    • Journal Title

      映像情報メディア学会技術報告 Vol.31, No.3

      Pages: 53-56

    • Related Report
      2006 Annual Research Report
  • [Journal Article] Measurement of Low-Noise Column Readout Circuits for CMOS Image Sensors2006

    • Author(s)
      N.Kawai, S.Kawahito
    • Journal Title

      IEEE Trans. Electron Devices vol.53, no.7

      Pages: 1737-1739

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2006 Final Research Report Summary
  • [Journal Article] An On-Sensor Bit-Serial Column-Parallel Processing Architecture for High-Speed Discrete Fourier Transform2006

    • Author(s)
      T.Eki, S.Kawahito, Y.Tadokoro
    • Journal Title

      IEEE Trans. Circuits and Systems II : Express Briefs vol.53, no.8

      Pages: 642-646

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2006 Final Research Report Summary
  • [Journal Article] A 3500fps High-Speed CMOS Image Sensor with 12b Column-Parallel Cyclic A/D Converters2006

    • Author(s)
      M.Furuta, T.Inoue, Y.Nishikawa, S.Kawahito
    • Journal Title

      Dig. Tech. Papers, 2006 Symp. on VLSI Circuits

      Pages: 27-28

    • NAID

      10018045762

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2006 Annual Research Report 2006 Final Research Report Summary
  • [Journal Article] Low-Power Design of Pipeline A/D Converters2006

    • Author(s)
      S.Kawahito
    • Journal Title

      Proc. IEEE 2006 Custom Integrated Circuits Conf. 2006

      Pages: 505-512

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2006 Final Research Report Summary
  • [Journal Article] Circuit and Device Technologies for CMOS Functional Image Sensors2006

    • Author(s)
      S.Kawahito
    • Journal Title

      Proc. IFIP WG 10.5 Int. Conf. on VLSI-SoC 2006

      Pages: 42-47

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2006 Annual Research Report 2006 Final Research Report Summary
  • [Journal Article] A CMOS Image Sensor for Fluorescence Lifetime Imaging2006

    • Author(s)
      H.J.Yoon, S.Kawahito
    • Journal Title

      Proc. IEEE Sensors 2006

      Pages: 400-403

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2006 Annual Research Report 2006 Final Research Report Summary
  • [Journal Article] A Wide Dynamic Range CMOS Image Sensor with Gated Charge Storage and a Multiple Sampling Technique2006

    • Author(s)
      S.Shafie, S.Kawahito
    • Journal Title

      Proc. IEEE Sensors 2006

      Pages: 404-407

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2006 Annual Research Report 2006 Final Research Report Summary
  • [Journal Article] An On-Sensor Bit-Serial Column-Parallel Processing Architecture for High-Speed Discrete Fourier Transform2006

    • Author(s)
      T.Eki, S.Kawahito, Y.Tadokoro
    • Journal Title

      IEEE Trans. Circuits and Systems II: Express Briefs vol.53, no.8

      Pages: 642-646

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2006 Final Research Report Summary
  • [Journal Article] Measurement of Low-Noise Column Readout Circuits for CMOS Image Sensors2006

    • Author(s)
      N.Kawai, S.Kawahito
    • Journal Title

      IEEE Trans. Electron Devices Vol.53, No.7

      Pages: 1737-1739

    • Related Report
      2006 Annual Research Report
  • [Journal Article] An On-Sensor Bit-Serial Column-Parallel Processing Architecture for High-Speed Discrete Fourier Transform2006

    • Author(s)
      T.Eki, S.Kawahito, Y.Tadokoro
    • Journal Title

      IEEE Trans. Circuits and Systems II : Express Briefs Vol.53, No.8

      Pages: 642-646

    • Related Report
      2006 Annual Research Report
  • [Journal Article] Low-Power Design of Pipeline A/D Converters2006

    • Author(s)
      S.Kawahito
    • Journal Title

      Proc. IEEE Custom Integrated Circuits Conf. 2006

      Pages: 505-512

    • Related Report
      2006 Annual Research Report
  • [Journal Article] Measurement of Low-noise Column Readout Circuits for CMOS Image Sensors2006

    • Author(s)
      N.Kawai, S.Kawahito
    • Journal Title

      IEEE Trans.Electron Devices (採録決定)

    • Related Report
      2005 Annual Research Report
  • [Journal Article] A high-sensitivity CMOS image sensor with gain-adaptive column amplifiers2005

    • Author(s)
      M.Sakakibara, S.Kawahito, et al.
    • Journal Title

      IEEE J. Solid-State Circuits vol. 40, no. 5

      Pages: 1147-1156

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2006 Final Research Report Summary
  • [Journal Article] Low-power design of high-speed A/D converters2005

    • Author(s)
      S.Kawahito, K.Honda, N.Kawai, F.Furuta, D.Miyazaki
    • Journal Title

      IEICE Trans. Electronics vol. E88-C, no. 4

      Pages: 468-478

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2006 Final Research Report Summary
  • [Journal Article] Photon Count Imaging Using a CMOS Technology2005

    • Author(s)
      S.Kawahito
    • Journal Title

      Proc. The 1^<st> Int. Symp. on Nanovision Science

      Pages: 130-134

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2006 Final Research Report Summary
  • [Journal Article] A Low-Noise Signal Readout Circuit Using Double-Stage Noise Canceling Architecture2005

    • Author(s)
      N.Kawai, S.Kawahito, M.Sasaki
    • Journal Title

      Proc. IEEE Workshop on Charge-Coupled Devices and Advanced Image Sensors

      Pages: 27-30

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2006 Final Research Report Summary
  • [Journal Article] A Column Parallel Double Integration Type A/D Converter for CMOS Image Sensors2005

    • Author(s)
      M.Sakakibara, S.Kawahito
    • Journal Title

      Proc. ITC-CSCC

      Pages: 189-190

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2006 Final Research Report Summary
  • [Journal Article] Effectiveness of a correlated multiple sampling differential averager for 1/f noise2005

    • Author(s)
      N.Kawai, S.Kawahito
    • Journal Title

      IEICE Express Letters vol. 2, no. 13

      Pages: 379-383

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2006 Final Research Report Summary
  • [Journal Article] A CMOS Time-of-Flight Range Image Sensor with Gates on Field Oxide Structure2005

    • Author(s)
      A.H.Izhal, T.Ushinaga, T.Sawada, M.Homma, Y.Maeda, S.Kawahito
    • Journal Title

      Proc. IEEE Sensors 2005

      Pages: 141-144

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2006 Final Research Report Summary
  • [Journal Article] A 142dB Dynamic Range CMOS Image Sensor with Multiple Exposure Time Signals2005

    • Author(s)
      J.H.Park, M.Mase, S.Kawahito, M.Sasaki, Y.Wakamori, Y.Ohta
    • Journal Title

      Proc. 2005 Asian Solid-State Circuits Conf.

      Pages: 85-88

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2006 Final Research Report Summary
  • [Journal Article] A Wide Dynamic Range CMOS Image Sensor With Multiple Exposure-Time Signal Outputs and 12-bit Column-Parallel Cyclic A/D Converters2005

    • Author(s)
      M.Mase, S.Kawahito, M.Sasaki, Y.Wakamori, M.Furuta
    • Journal Title

      IEEE J. Solid-State Circuits vol.40 no.12

      Pages: 2787-2795

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2006 Final Research Report Summary
  • [Journal Article] A high-sensitivity CMOS image sensor with gain-adaptive column amplifiers2005

    • Author(s)
      M.Sakakibara, S.Kawahito, et al.
    • Journal Title

      IEEE J. Solid-State Circuits vol.40, no.5

      Pages: 1147-1156

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2006 Final Research Report Summary
  • [Journal Article] Low-power design of high-speed A/D converters,2005

    • Author(s)
      S.Kawahito, K.Honda, N.Kawai, F.Furuta, D.Miyazaki
    • Journal Title

      IEICE Trans. Electronics vol.E88-C, no.4

      Pages: 468-478

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2006 Final Research Report Summary
  • [Journal Article] Photon Count Imaging Using a CMOS Technology2005

    • Author(s)
      S.Kawahito
    • Journal Title

      Proc. The 1st Int. Symp. on Nanovision Science

      Pages: 130-134

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2006 Final Research Report Summary
  • [Journal Article] A Low-Noise Signal Readout Circuit Using Double-Stage Noise Canceling Architecture2005

    • Author(s)
      N.Kawai, S.Kawahito, M.Sasaki
    • Journal Title

      IEEE Workshop on Charge-Coupled Devices and Advanced Image Sensors

      Pages: 27-30

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2006 Final Research Report Summary
  • [Journal Article] Effectiveness of a correlated multiple sampling differential averager for 1/f noise2005

    • Author(s)
      N.Kawai, S.Kawahito
    • Journal Title

      IEICE Express Lett. vol.2, no.13

      Pages: 379-383

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2006 Final Research Report Summary
  • [Journal Article] A CMOS Time-of-Flight Range Image Sensor with Gates on Field Oxide Structure2005

    • Author(s)
      A.H.Izhal, T.Ushinaga, T.Sawada, M.Homma, Y.Maeda, S.Kawahito
    • Journal Title

      Proc. IEEE Sensors 2005 A2L-A

      Pages: 141-144

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2006 Final Research Report Summary
  • [Journal Article] A 142dB Dynamic Range CMOS Image Sensor with Multiple Exposure Time Signals2005

    • Author(s)
      J.H.Park, M.Mase, S.Kawahito, M.Sasaki, Y.Wakamori, Y.Ohta
    • Journal Title

      Proc. 2005 Asian Solid-State Circuits Conf. A2L-3

      Pages: 85-88

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2006 Final Research Report Summary
  • [Journal Article] A High-Sensitivity CMOS Image Sensor with Gain-Adaptive Column Amplifiers2005

    • Author(s)
      M.Sakakibara, S.Kawahito, D.Handoko, N.Nakamura, H.Satoh, M.Higashi, K.Mabuchi, H.Sumi
    • Journal Title

      IEEE Journal of Solid-State Circuits vol.40, no.5

      Pages: 1147-1156

    • Related Report
      2005 Annual Research Report
  • [Journal Article] A Column Parallel Double Integration Type A/D Converter for CMOS Image Sensors2005

    • Author(s)
      M.Sakakibara, S.Kawahito
    • Journal Title

      Proccedings of ITC-CSCC

      Pages: 189-190

    • Related Report
      2005 Annual Research Report
  • [Journal Article] A Low-Noise Signal Readout Circuit Using Double-Stage Noise Canceling Architecture2005

    • Author(s)
      N.Kawai, S.Kawahito, M.Sasaki
    • Journal Title

      Proceeding of IEEE Workshop on Charge-Coupled Devices and Advanced Image Sensors

      Pages: 27-30

    • Related Report
      2005 Annual Research Report
  • [Journal Article] Effectiveness of a correlated multiple sampling differential averager for 1/f noise2005

    • Author(s)
      N.Kawai, S.Kawahito
    • Journal Title

      IEICE Electronics Express Vol.2, No.13

      Pages: 379-383

    • Related Report
      2005 Annual Research Report
  • [Journal Article] A CMOS Time-of-Flight Range Image Sensor with Gates on Field Oxide Structure2005

    • Author(s)
      A.H.Izhal, T.Ushinaga, T.Sawada, M.Homma, Y.Maeda, S.Kawahito
    • Journal Title

      Proceeding of IEEE Sensors 2005

      Pages: 141-144

    • Related Report
      2005 Annual Research Report
  • [Journal Article] A 142dB Dynamic Range CMOS Image Sensor with Multiple Exposure Time Signals2005

    • Author(s)
      Jong-Ho Park, Mitsuhiko Mase, Shoji Kawahito, Masaaki Sasaki, Yasuo Wakamori, Yukihiro Ohta
    • Journal Title

      Proceeding of 2005 Asian Solid-State Circuits Conference

      Pages: 85-88

    • Related Report
      2005 Annual Research Report
  • [Journal Article] A Wide Dynamic Range CMOS Image Sensor With Multiple Exposure-Time Signal Outputs and 12-bit Column-Parallel Cyclic A/D Converters2005

    • Author(s)
      M.Mase, S.Kawahito, M.Sasaki, Y.Wakamori, M.Furuta
    • Journal Title

      IEEE Journal of Solid-State Circuits Vol.40 No.12

      Pages: 2787-2795

    • Related Report
      2005 Annual Research Report
  • [Journal Article] Low-power design of high-speed A/D converters2005

    • Author(s)
      S.Kawahito, K.Honda et al.
    • Journal Title

      IEICE Trans.Electronics E88-C・4(印刷中)

    • Related Report
      2004 Annual Research Report
  • [Journal Article] Photon count imaging using a CMOS technology2005

    • Author(s)
      S.Kawahito
    • Journal Title

      Proc.1^<st> Int.Symp.Nanovision Science

      Pages: 130-134

    • Related Report
      2004 Annual Research Report
  • [Journal Article] A low-noise signal readout circuits using double-stage noise canceling architecture for CMOS image sensors2005

    • Author(s)
      N.Kawai, S.Kawahito
    • Journal Title

      Proc.IEEE Workshop on CCD and Advanced Image Sensors (掲載決定)

    • Related Report
      2004 Annual Research Report
  • [Journal Article] Noise analysis of high-gain low-noise column readout circuits for CMOS image sensors2004

    • Author(s)
      N.Kawai, S.Kawahito
    • Journal Title

      IEEE Trans. Electron Devices vol.51, no.2

      Pages: 185-194

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2006 Final Research Report Summary
  • [Journal Article] A CMOS time-of-flight range image sensor using charge domain operations2004

    • Author(s)
      I.A.Halin, S.Kawahito
    • Journal Title

      IEICE Trans. Electronics vol. E87-C, no. 11

      Pages: 1889-1896

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2006 Final Research Report Summary
  • [Journal Article] A CMOS time-of-flight range image sensor using charge domain operations2004

    • Author(s)
      I.A.Halin, S.Kawahito
    • Journal Title

      IEICE Trans. Electronics vol.E87-C, no.11

      Pages: 1889-1896

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2006 Final Research Report Summary
  • [Journal Article] Noise analysis of high-gain low-noise column readout circuits for CMOS image sensors2004

    • Author(s)
      N.Kawai, S.Kawahito
    • Journal Title

      IEEE Trans.Electron Devices 51・2

      Pages: 185-194

    • Related Report
      2004 Annual Research Report
  • [Journal Article] A CMOS time-of-flight range image sensor using charge domain operations2004

    • Author(s)
      I.A.Halin, S.Kawahito
    • Journal Title

      IEICE Trans.Electronics E87-C・11

      Pages: 1889-1896

    • Related Report
      2004 Annual Research Report
  • [Journal Article] A high-sensitivity CMOS image sensor with gain-adaptive column amplifiers2004

    • Author(s)
      M.Sakakibara, S.Kawahito et al.
    • Journal Title

      IEEE J.Solid-State Circuits 40・5(印刷中)

    • Related Report
      2004 Annual Research Report
  • [Book] 電子回路ハンドブック 第3編第12章[PLL]第13章「変復調回路」2006

    • Author(s)
      藤井信生 他 編集4名, 川人祥二 他 著者14名
    • Total Pages
      28
    • Publisher
      朝倉書店
    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2006 Final Research Report Summary
  • [Book] 電子物性・材料の事典 第4編第4章「撮像デバイス」2006

    • Author(s)
      森泉豊栄 他 編集5名, 川人祥二 他著
    • Total Pages
      28
    • Publisher
      朝倉書店
    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2006 Final Research Report Summary
  • [Book] Electronic Circuits Handbook, Chap. 12(PLL), 13(Modulation and Demodulation)2006

    • Author(s)
      S.Kawahito
    • Publisher
      Asakura Shoten
    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2006 Final Research Report Summary
  • [Book] Handbook on Electronic Materials and Physics2006

    • Author(s)
      S.Kawahito
    • Publisher
      Asakura Shoten
    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2006 Final Research Report Summary
  • [Book] 電子回路ハンドブック 第3編 第12章 [PLL] 第13章 「変復調回路」2006

    • Author(s)
      藤井信生 他 編集4名, 川人祥二 他 著者14名
    • Total Pages
      28
    • Publisher
      朝倉書店
    • Related Report
      2006 Annual Research Report
  • [Book] 電子物性・材料の事典 第4編 第4章 「撮像デバイス」2006

    • Author(s)
      森泉豊栄 他 編集5名, 川人祥二 他著
    • Total Pages
      28
    • Publisher
      朝倉書店
    • Related Report
      2006 Annual Research Report
  • [Patent(Industrial Property Rights)] 2重積分型A/D変換器、カラム処理回路、及び固体撮像装置2005

    • Inventor(s)
      川人祥二
    • Industrial Property Rights Holder
      静岡大学長
    • Industrial Property Number
      2005-034798
    • Filing Date
      2005-02-10
    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2006 Final Research Report Summary
  • [Patent(Industrial Property Rights)] 2重積分型A/D変換器、カラム処理回路、及び固体撮像装置2005

    • Inventor(s)
      川人祥二, 榊原雅樹
    • Industrial Property Rights Holder
      静岡大学
    • Industrial Property Number
      2005-034798
    • Filing Date
      2005-02-10
    • Related Report
      2004 Annual Research Report

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Published: 2004-04-01   Modified: 2016-04-21  

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