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Development of SNOM/KFM probe microscope and investigation of optical properties of organic thin films with the microscope

Research Project

Project/Area Number 16360022
Research Category

Grant-in-Aid for Scientific Research (B)

Allocation TypeSingle-year Grants
Section一般
Research Field Thin film/Surface and interfacial physical properties
Research InstitutionThe Institute of Physical and Chemical Research

Principal Investigator

OZASA Kazunari  The Institute of Physical and Chemical Research, Bioengineering Lab., Senior Scientist (10231234)

Co-Investigator(Kenkyū-buntansha) ITO Eisuke  RIKEN, FRS, Researcher (40333322)
ISOSHIMA Takashi  RIKEN, Condensed Mol. Material Lab., Senior Scientist (40271522)
Project Period (FY) 2004 – 2006
Project Status Completed (Fiscal Year 2006)
Budget Amount *help
¥15,100,000 (Direct Cost: ¥15,100,000)
Fiscal Year 2006: ¥2,600,000 (Direct Cost: ¥2,600,000)
Fiscal Year 2005: ¥6,200,000 (Direct Cost: ¥6,200,000)
Fiscal Year 2004: ¥6,300,000 (Direct Cost: ¥6,300,000)
KeywordsKelvin probe force microscope / Nanoprobe / Organic semiconductor films / Surface potential / Near-field optical properties
Research Abstract

We have succeeded to develop a probe microscope with near-field optical stimulation and Kelvin probe force detection, which allows us to measure the surface potential of the thin films and to stimulate the surface by photo irradiation through the aperture of optical fiber probes. Photoinduced reduction of surface potential of Alq3 thin films have been intensively investigated as follows.
The characteristics and mechanisms of photoinduced reduction of surface potential on tris(8-hydroxyquinolinato)aluminum(III) (Alq3) thin films are investigated and discussed from the results of photo-patterning of the surface potential and the reduction dependence on exposure time/intensity. The uniform surface potentials of 14-17 V in 300-nm Alq3 thin films on n-Si (001) substrates can be patterned by contact-mask exposure with spatial scales down to 700 nm at least, and the patterns remain more than one year in the dark. The dependence of potential reduction on exposure time and/or exposure intensity … More can be fitted well with the calculation of potential reduction due to the drift of photoexcited carriers with taking into account Poole-Frankel formula for the electron mobility. These observations indicate that the mechanism of photoinduced reduction of surface potential of Alq3 should be the drift of photoexcited carriers.
The dependence of photo-induced reduction of surface potential on photo-exposure intensity is reproduced well by fitting calculation based on the assumption that the drift of photo-excited electrons/holes decreases the surface potential. Two-dimensional (2D) transfer functions of KFM probes are discussed from KFM potential-profiles obtained for a step pattern of surface potential. Near-field optical stimulation through an aperture of an optical-fiber probe is demonstrated as scanning near-field optical microscope (SNOM) combined with KFM (SNOM-KFM). A photoemission pattern from an aperture of SNOM probes can be visualized as a surface-potential pattern on Alq3 thin films by means of SNOM-KFM measurements. Less

Report

(4 results)
  • 2006 Annual Research Report   Final Research Report Summary
  • 2005 Annual Research Report
  • 2004 Annual Research Report
  • Research Products

    (2 results)

All 2007

All Journal Article (2 results)

  • [Journal Article] Influence of Organic Overlayer on Giant Surface Potential oflq3 Film2007

    • Author(s)
      E. Ito, et. al.
    • Journal Title

      Mol.Cryst.Liq.Cryst. 462

      Pages: 111-116

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2006 Final Research Report Summary
  • [Journal Article] Influence of Organic Overlayer on Giant Surface Potential of A1q^3 Film2007

    • Author(s)
      E.Ito, et. al.
    • Journal Title

      Mol.Cryst.Liq.Cryst. vol. 462

      Pages: 111-116

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2006 Final Research Report Summary

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Published: 2004-04-01   Modified: 2016-04-21  

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