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Development of a 10 nm gap DNA electric tester and investigation of electric elements based on DNA molecules

Research Project

Project/Area Number 16360177
Research Category

Grant-in-Aid for Scientific Research (B)

Allocation TypeSingle-year Grants
Section一般
Research Field Electron device/Electronic equipment
Research InstitutionKagawa University

Principal Investigator

HASHIGUCHI Gen  Kagawa University, Faculty of Engineering, Professor, 工学部, 教授 (70314903)

Co-Investigator(Kenkyū-buntansha) HOSOGI Maho  Kagawa University, Faculty of Engineering, Assistant, 工学部, 助手 (50363180)
Project Period (FY) 2004 – 2006
Project Status Completed (Fiscal Year 2006)
Budget Amount *help
¥15,200,000 (Direct Cost: ¥15,200,000)
Fiscal Year 2006: ¥3,700,000 (Direct Cost: ¥3,700,000)
Fiscal Year 2005: ¥3,700,000 (Direct Cost: ¥3,700,000)
Fiscal Year 2004: ¥7,800,000 (Direct Cost: ¥7,800,000)
KeywordsDNA / DNA GRIPPER / SELF HEAT ETCHING / PALLADIUM WIRE / DNAテスター / アクチン / 微小管 / KOHエッチング / XeF2エッチング
Research Abstract

The aim of this study is to develop a DNA electric tester having a 10 nm gap between two electric probes and investigation of electric elements using DNA testers. To form such a small gap with good reproducibility, a kind of the small-gap detection mechanism should be implemented for probe fabrication process. For this purpose, a new fabrication method of a narrow gap DNA tester has been developed. In order to detect the formation of a small gap between a pair of probes during silicon etching, current flow though the two probes was monitored. In this etching, only the tips of the probe structure are dipped into a KOH solution while AC power is applied between the two probes. The applying current heat up at the narrowest part of the silicon structure locally, resulting in silicon etching locally. When a gap is formed, the current is dropped since the current pass is broken. The local heating will hence finished, eventually stopping the etching. Using this method, approximately 50 nm gap DNA tweezers could be fabricated. Successive Al film deposition will make the gap smaller.
Using the developed DNA testers and more wider gap DNA testers, electrical properties of DNA bundle were examined. The reproducible and explicit result is humidity dependency. We found that electrical conductance of DNA bundles is strongly affected by humidity. This result is consistent with literatures reported by other researchers.
Furthermore, we have developed a Pd coated DNA wire and measured its electrical characteristics. The wire showed the electrical resistively of approximately 74 ohm-cm. Even in vacuum and at very low temperature (up to 77K), the current flow was observed for the DNA-Pd wire. Since the effect of humidity will be eliminated in this case, the current flow was supposed to be in the coated Pd layer.

Report

(4 results)
  • 2006 Annual Research Report   Final Research Report Summary
  • 2005 Annual Research Report
  • 2004 Annual Research Report
  • Research Products

    (7 results)

All 2006 2005 2004

All Journal Article (7 results)

  • [Journal Article] Silicon Nanotweezers with Adjustable Gap for the Manipulation and Characterization of DNA Molecules2006

    • Author(s)
      C.Yamahata, T.Takekawa, K.Ayano, M.Hosogi, M.Kumemura, B.Legrand, D.Collard, G.Hashiguchi, H.Fujita
    • Journal Title

      Proceedings of 2006 International Conference on Microtechnologies in Medicine and Biology

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2006 Final Research Report Summary
  • [Journal Article] The Manipulation of Actin Filaments and Microtubules with Micromachined Nanotweezers2006

    • Author(s)
      M.Hosogi, G.Hashiguchi, S.Shimamoto, N.Araki, H.Tokumitsu, R.Kobayashi
    • Journal Title

      Proceedings of 2006 International Conference on Microtechnologies in Medicine and Biology

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2006 Final Research Report Summary
  • [Journal Article] Silicon Nanotweezers with Adjustable Gap for the Manipulation and Characterzation of DNA Molecules2006

    • Author(s)
      C.Yamahata, T.Takekawa, K.Ayano, M.Hosogi, M.Kumemura, B.Legrand, D.Collard, G.Hashiguchi, H.Fujita
    • Journal Title

      Proceedings of 2006 International Conference on Microtechnologies in Medicine and Biology

    • Related Report
      2006 Annual Research Report
  • [Journal Article] The Manipulation of Actin Filaments and Microtubules with Micromachined Nanotweezers2006

    • Author(s)
      M.Hosogi, G.Hashiguchi, S.Shimamoto, N.Araki, H.Tokumitsu, R.Kobayashi
    • Related Report
      2006 Annual Research Report
  • [Journal Article] Electrical Conductivity of Lambda DNA-Pd Wire2005

    • Author(s)
      Haho Hosogi et al.
    • Journal Title

      Proceedings of the 22th Sensor Symposium

      Pages: 333-336

    • NAID

      10016681484

    • Related Report
      2005 Annual Research Report
  • [Journal Article] Narrow Gap DNA Tweezers for Retrieval of Short Strand DNAs2004

    • Author(s)
      J.Yamamoto, K.Tamura^*, K.Kakushima^*, M.Hosogi, G.Hashiguchi, H.Fujita^*
    • Journal Title

      PROCEEDINGS OF THE 21ST SENSOR SYMPOSIUM

      Pages: 513-516

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2006 Final Research Report Summary
  • [Journal Article] Narrow Gap DNA Tweezers for Retrieval of Short Strand DNAs2004

    • Author(s)
      J.Yamamoto, K.Tamura, K.Kakushima, M.Hosogi, G.Hashiguchi, H.Fujita
    • Journal Title

      Proceedings of the 21^<st> Sensor Symposium

      Pages: 513-516

    • Related Report
      2004 Annual Research Report

URL: 

Published: 2004-04-01   Modified: 2016-04-21  

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