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Amorphous structures and crystallization processes of phase-change recording materials

Research Project

Project/Area Number 16560008
Research Category

Grant-in-Aid for Scientific Research (C)

Allocation TypeSingle-year Grants
Section一般
Research Field Applied materials science/Crystal engineering
Research InstitutionOsaka University

Principal Investigator

ISHIMARU Manabu  Osaka University, The Institute of Scientific and Research, Associate Professor, 産業科学研究所, 助教授 (00264086)

Co-Investigator(Kenkyū-buntansha) HIROTSU Yoshihiko  Osaka University, The Institute of Scientific and Research, Professor, 産業科学研究所, 教授 (70016525)
NAITO Muneyuki  Osaka University, The Institute of Scientific and Research, Research Associate, 産業科学研究所, 助手 (10397721)
Project Period (FY) 2004 – 2005
Project Status Completed (Fiscal Year 2005)
Budget Amount *help
¥3,700,000 (Direct Cost: ¥3,700,000)
Fiscal Year 2005: ¥1,600,000 (Direct Cost: ¥1,600,000)
Fiscal Year 2004: ¥2,100,000 (Direct Cost: ¥2,100,000)
KeywordsPhase change recording material / Nanobeam electron diffraction / Radial distribution function / Ge-Sb-Te / ナノビーム電子回析
Research Abstract

As-sputtered and melt-quenched amorphous structures together with the laser-induced crystallized structure of Ge-Sb-Te thin films were investigated using high-resolution electron microscopy (HREM) and nanobeam electron diffraction (NBED). Each of the Ge-Sb-Te thin films was embedded in a four-layered stack, which is the same as the layered structure of phase-change optical disks. Cross-sectional HREM revealed crystalline atomic clusters in the melt-quenched amorphous layer at a greater frequency than in the as-sputtered amorphous layer. Autocorrelation function analysis of the HREM images revealed similarity between the structures of atomic ordered regions in the amorphous phase and that of crystalline Sb. Atomic pair-distribution functions derived from halo NBED intensity analysis indicated that the atomic neighbor correlations developed more in the melt-quenched amorphous phase than in the as-sputtered phase. The development of locally ordered regions is considered to be closely related to the differences in optical properties and crystallization behaviors between these two amorphous phases.

Report

(3 results)
  • 2005 Annual Research Report   Final Research Report Summary
  • 2004 Annual Research Report
  • Research Products

    (15 results)

All 2005 2004 Other

All Journal Article (15 results)

  • [Journal Article] Identification of Soft Phonon Modes in Ge-Sb-Te using Electron Diffraction2005

    • Author(s)
      M.Naito, M.Ishimaru, Y.Hirotsu, M.Takashima
    • Journal Title

      J. Appl. Phys. 98号

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2005 Final Research Report Summary
  • [Journal Article] Identification of Soft Phonon Modes in Ge-Sb-Te using Electron Diffraction2005

    • Author(s)
      M.Naito, M.Ishimaru, Y Hirotsu, M.Takashima
    • Journal Title

      J.Appl.Phys. 98

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2005 Final Research Report Summary
  • [Journal Article] Identification of soft phonon modes in Ge-Sb-Te using electron diffraction2005

    • Author(s)
      M.Naito, M.Ishimaru, Y.Hirotsu, M.Takashima
    • Journal Title

      Journal of Applied Physics 98

    • Related Report
      2005 Annual Research Report
  • [Journal Article] Local Structure Analysis of Ge-Sb-Te Phase Change Materials using High-Resolution Electron Microscopy and Nanobeam Diffraction2004

    • Author(s)
      M.Naito, M.Ishimaru, Y.Hirotsu, M.Takashima
    • Journal Title

      J. Appl. Phys. 95号

      Pages: 8130-8135

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2005 Final Research Report Summary
  • [Journal Article] Local Structural Change of Amorphous Ge-Sb-Te Thin Film during Annealing2004

    • Author(s)
      M.Naito, M.Ishimaru, Y.Hirotsu, M.Takashima
    • Journal Title

      J. Non-Cryst. Solids 345/346号

      Pages: 112-115

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2005 Final Research Report Summary
  • [Journal Article] Structural Analysis of As-Sputterd and Melt-Quenched Ge-Sb-Te Thin Film2004

    • Author(s)
      M.Naito, M.Ishimaru, Y.Hirotsu, M.Takashima
    • Journal Title

      Proc. 8^<th> Asia-Pacific Conf. Electron Microscopy

      Pages: 608-609

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2005 Final Research Report Summary
  • [Journal Article] Local Structure Analysis of Ge-Sb-Te Phase Change Materials using High-Resolution Electron Microscopy and Nanobeam Diffraction2004

    • Author(s)
      M.Naito, M.Ishimaru, Y.Hirotsu, M.Takashima
    • Journal Title

      J.Appl.Phys. 95

      Pages: 8130-8135

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2005 Final Research Report Summary
  • [Journal Article] Local Structural Change of Amorphous Ge-Sb-Te Thin Film during Annealing2004

    • Author(s)
      M.Naito, M.Ishimaru, Y.Hirotsu, M.Takashima
    • Journal Title

      J.Non-Cryst.Solids 345/346

      Pages: 112-115

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2005 Final Research Report Summary
  • [Journal Article] Structural Analysis of As-Sputtered and Melt-Quenched Ge-Sb-Te Thin Film2004

    • Author(s)
      M.Naito, M.Ishimaru, Y.Hirotsu, M.Takashima
    • Journal Title

      Proc.8^<th> Asia-Pacific Conf.Electron Microscopy

      Pages: 608-609

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2005 Final Research Report Summary
  • [Journal Article] Local Structure Analysis of Ge-Sb-Te Phase Change Materials Using High-resolution Electron Microscopy and Nanobeam Diffraction2004

    • Author(s)
      M.Naito, M.Ishimaru, Y.Hirotsu, M.Takashima
    • Journal Title

      Journal of Applied Physics 95号

      Pages: 8130-8135

    • Related Report
      2004 Annual Research Report
  • [Journal Article] Local Structural Change of Amorphous Ge-Sb-Te Thin Film during Annealing2004

    • Author(s)
      M.Naito, M.Ishimaru, Y.Hirotsu, M.Takashima
    • Journal Title

      Journal of Non-crystalline Solids 345/346号

      Pages: 112-115

    • Related Report
      2004 Annual Research Report
  • [Journal Article] Structural Analysis of As-sputterd and Melt-quenched Ge-Sb-Te Thin Film2004

    • Author(s)
      M.Naito, M.Ishimaru, Y.Hirotsu, M.Takashima
    • Journal Title

      Proceedings of 8^<th> Asia-Pacific Conference on Electron Microscopy

      Pages: 608-609

    • Related Report
      2004 Annual Research Report
  • [Journal Article] Structural Investigation of Ge-Sb-Sn Thin Film using Transmission Electron Microscopy

    • Author(s)
      M.Naito, M.Ishimaru, Y.Hirotsu, M.Takashima, H.Matsumoto
    • Journal Title

      J. Mater. Sci. (in press)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2005 Final Research Report Summary
  • [Journal Article] Structural Investigation of Ge-Sb-Sn Thin Film using Transmission Electron Microscopy

    • Author(s)
      M.Naito, M.Ishimaru, Y.Hirotsu, M.Takashima, H.Matsumoto
    • Journal Title

      J.Mater.Sci. (in press)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2005 Final Research Report Summary
  • [Journal Article] Structural investigation of Ge-Sb-Sn thin film using transmission electron microscopy

    • Author(s)
      M.Naito, M.Ishimaru, Y.Hirotsu, M.Takashima
    • Journal Title

      Journal of Materials Science (in press)

    • Related Report
      2005 Annual Research Report

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Published: 2004-04-01   Modified: 2016-04-21  

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