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Fabrication and characterization of small magnetic tunnel junction by atomic force microscope for observation of Coulomb blockade

Research Project

Project/Area Number 16560269
Research Category

Grant-in-Aid for Scientific Research (C)

Allocation TypeSingle-year Grants
Section一般
Research Field Electronic materials/Electric materials
Research InstitutionYokohama National University

Principal Investigator

TAKEMURA Yasushi  Yokohama National University, Graduate School of Engineering, Associate Professor, 大学院・工学研究院, 助教授 (30251763)

Project Period (FY) 2004 – 2006
Project Status Completed (Fiscal Year 2006)
Budget Amount *help
¥3,200,000 (Direct Cost: ¥3,200,000)
Fiscal Year 2006: ¥1,000,000 (Direct Cost: ¥1,000,000)
Fiscal Year 2005: ¥1,000,000 (Direct Cost: ¥1,000,000)
Fiscal Year 2004: ¥1,200,000 (Direct Cost: ¥1,200,000)
Keywordsatomic force microscope (AFM) / magnetic tunnel junction / Coulomb blockade / 原子間力顕微鏡(AFM)
Research Abstract

Well-defined nanostructures of oxide can be fabricated on metal thin films by applying a negative bias on a conductive atomic force microscopy (AFM) cantilever. With using this technique, planar-type magnetic tunnel junctions have been fabricated. The junction area of this structure can be much smaller than that of a conventional multilayer-type junction. This is advantageous for fabrication of single electron devices exhibiting Coulomb blockade. Ni thin film of 8-20 nm were deposited on SiO2/Si substrates by rf magnetron sputtering. The films were patterned to stripe shapes by photolithography and dry etching. Then nanowires of oxide were fabricated by the AFM nano-oxidation technique, and planar-type magnetic tunnel junctions were successfully obtained.
A diode characteristic was observed in current-voltage measurement at the temperature range of 17-300K. It was found that the fabricated nanowires of oxide could be a tunnel barrier. Formally the width of the barrier was thick but the AFM nano-oxidation using tapping mode of the AFM operation realized a thinner width. The barrier height of 1.5 eV and barrier width of 1.7 nm were derived from a calculation using the Simmons formula fitting. There results are promising for ferromagnetic single electron transistors exhibiting Coulomb blockade.

Report

(4 results)
  • 2006 Annual Research Report   Final Research Report Summary
  • 2005 Annual Research Report
  • 2004 Annual Research Report
  • Research Products

    (9 results)

All 2006 2005

All Journal Article (9 results)

  • [Journal Article] AFM Lithography for Magnetic Nanostructures and Devices2006

    • Author(s)
      Yasushi Takemura
    • Journal Title

      Journal of Magnetism and Magnetic Materials 304

      Pages: 19-22

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2006 Annual Research Report 2006 Final Research Report Summary
  • [Journal Article] Direct Modification of Magnetic Domains in Co Nanostructures by AFM-Lithography2005

    • Author(s)
      Yasushi Takemura
    • Journal Title

      Jpn. J. Applied Physics 44(9)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2006 Final Research Report Summary
  • [Journal Article] Modification of Electrical Properties and Magnetic Domain Structures in Magnetic Nanostructures by AFM Nano-lithography2005

    • Author(s)
      Yasushi Takemura
    • Journal Title

      Advanced Engineering Materials 7(3)

      Pages: 170-173

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2006 Final Research Report Summary
  • [Journal Article] Magnetoresistance of NiFe wires with modified structures by AFM nano-lithography2005

    • Author(s)
      Genta Watanabe
    • Journal Title

      J. Vacuum Science & Technology B23(6)

      Pages: 2390-2393

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2006 Final Research Report Summary
  • [Journal Article] Direct Modification of Magnetic Domains in Co Nanostructures by AFM-Lithography2005

    • Author(s)
      Yasushi Takemura
    • Journal Title

      Japanese Journal of Applied Physics 44(9)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2006 Final Research Report Summary
  • [Journal Article] Magnetoresistance of NiFe wires with modified structures by AFM nano-lithography2005

    • Author(s)
      Genta Watanabe
    • Journal Title

      Journal of Vacuum Science & Technology B23(6)

      Pages: 2390-2393

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2006 Final Research Report Summary
  • [Journal Article] Magnetoresistance of NiFe wires with modified structures by AFM nano-lithography2005

    • Author(s)
      Genta Watanabe
    • Journal Title

      J.Vacuum Science & Technology B Vol.23,No.6

      Pages: 2390-2393

    • Related Report
      2005 Annual Research Report
  • [Journal Article] Direct Modification of Magnetic Domains in Co Nanostructures by AFM -Lithography2005

    • Author(s)
      Yasushi Takemura
    • Journal Title

      Japanese Journal of Applied Physics Vol.44,No.9(in print)

    • Related Report
      2004 Annual Research Report
  • [Journal Article] Modification of Electrical Properties and Magnetic Domain Structures in Magnetic Nanostructures by AFM Nano-lithography2005

    • Author(s)
      Yasushi Takemura
    • Journal Title

      Advanced Electronic Materials Vol.7,No.3(in print)

    • Related Report
      2004 Annual Research Report

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Published: 2004-04-01   Modified: 2016-04-21  

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