Development of Nobel Mass Spectrometer with Ultra-High Sensitivity and Ultra-Trace Sampling for Planetary Exploration

• Project/Area Number: 16GS0214
• Research Category: Grant-in-Aid for Creative Scientific Research
• Allocation Type: Single-year Grants
• Research Institution: Osaka University
• Principal Investigator: ISHIHARA Morio Osaka University, 大学院・理学研究科, 准教授 (30294151)
• Co-Investigator(Kenkyū-buntansha): TOYODA Michisato 大阪大学, 理学研究科, 准教授 (80283828) ; UEDA Chiaki 大阪大学, 理学研究科, 准教授 (50176591) ; UCHINO Kiichiro 九州大学, 総合理工学研究院, 教授 (10160285) ; YURIMOTO Hisayoshi 北海道大学, 理学研究院, 教授 (80191485) ; KURAMOTO Kiyoshi 北海道大学, 理学研究院, 教授 (50311519) ; MATSUMOTO Takuya 岡山大学, 地球物質科学研究センター, 准教授 (50294145)
• Project Period (FY): 2004 – 2008
• Project Status: Completed (Fiscal Year 2008)
• Budget Amount: ¥561,340,000 (Direct Cost: ¥431,800,000、Indirect Cost: ¥129,540,000); Fiscal Year 2008: ¥100,880,000 (Direct Cost: ¥77,600,000、Indirect Cost: ¥23,280,000); Fiscal Year 2007: ¥90,870,000 (Direct Cost: ¥69,900,000、Indirect Cost: ¥20,970,000); Fiscal Year 2006: ¥117,000,000 (Direct Cost: ¥90,000,000、Indirect Cost: ¥27,000,000); Fiscal Year 2005: ¥125,970,000 (Direct Cost: ¥96,900,000、Indirect Cost: ¥29,070,000); Fiscal Year 2004: ¥126,620,000 (Direct Cost: ¥97,400,000、Indirect Cost: ¥29,220,000)
• Keywords: SIMS / ポストイオン化 / TOF / フェムト秒レーザー / 多重周回飛行時間型質量分析計 / 非共鳴多光子吸収 / 収束イオンビーム装置 / 二次イオン質量分析

Research Abstract

まず新規に開発する超高感度極微量質量分析システムの構想決定を行い,その検討結果をもとに装置の製作を行った。その後,質量分析部,1次イオン照射系,レーザーイオン化について,それぞれ装置性能評価を行った。

Research Products

• [Journal Article] Ultra-high Performance Multi-Turn TOF-SIMS System with a Femto-second Laser for Post-Ionization (2010)
  • Author(s): 石原盛男
  • Journal Title: Surf.Intef.Anal. 42
  • Peer Reviewed
• [Journal Article] Ultra-high Performance Multi-Turn TOF-SIMS System with a Femto-second Laser for Post-Ionization
  • Author(s): 石原盛男
  • Journal Title: Surf. Intef. Anal. 42巻
  • Peer Reviewed
• [Presentation] Development of a Ultra-high Performance Multi-Turn TOF-SIMS System with a Femtosecond Laser for Post-Ionization (2009)
  • Author(s): 石原盛男
  • Organizer: 7th International Symposium on Atomic Level Characterizations or New Materials and Devices '09
  • Place of Presentation: 米国マウイ島
  • Year and Date: 2009-12-10
• [Presentation] Characteristics of Post-Ionization Using a Femto-second Laser (2007)
  • Author(s): 身深 亮, 他
  • Organizer: The 16th International Conference on Secondary Ion Mass Spectrometry, SIMS XVI
  • Place of Presentation: 石川音楽堂(金沢市)
  • Year and Date: 2007-11-01
• [Presentation] Post-Ionization by a Femto-second Laser (2007)
  • Author(s): 内野 喜一郎, 他
  • Organizer: The 16th International Conference on Secondary Ion Mass Spectrometry, SIMS XVI
  • Place of Presentation: 石川音楽堂(金沢市)
  • Year and Date: 2007-11-01
• [Presentation] Development of a Multi-Turn TOF-SIMS System with a Femto-second Laser for Post-Ionization (2007)
  • Author(s): 石原 盛男, 他
  • Organizer: The 16th International Conference on Secondary Ion Mass Spectrometry, SIMS XVI
  • Place of Presentation: 石川音楽堂(金沢市)
  • Year and Date: 2007-10-30
• [Presentation] Development of a Multi-turn TOF-SIMS System with a Femtosecond Laser for Post-Ionization (2007)
  • Author(s): 公文代 康祐, 他
  • Organizer: The 55th ASMS Conference on Mass Spectrometry and Allied Topics
  • Place of Presentation: Indiana Convention Center Indianapolis, USA
  • Year and Date: 2007-06-06
• [Presentation] 次世代超高感度極微量質量分析システムの開発 (2007)
  • Author(s): 戸所 竜太郎, 他
  • Organizer: 第55回質量分析総合討論会
  • Place of Presentation: 広島国際会議場(広島市)
  • Year and Date: 2007-05-16