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Surface X-ray diffraction studies of ultrathin films and their structural changes from bulk crystals

Research Project

Project/Area Number 16H03866
Research Category

Grant-in-Aid for Scientific Research (B)

Allocation TypeSingle-year Grants
Section一般
Research Field Thin film/Surface and interfacial physical properties
Research InstitutionTokyo Gakugei University

Principal Investigator

TAKAHASHI Toshio  東京学芸大学, 教育学部, 研究員 (20107395)

Co-Investigator(Kenkyū-buntansha) 白澤 徹郎  国立研究開発法人産業技術総合研究所, 計量標準総合センター, 主任研究員 (80451889)
Research Collaborator VOEGELI Wolfgang  
ARAKAWA Etsuo  
Project Period (FY) 2016-04-01 – 2019-03-31
Project Status Completed (Fiscal Year 2018)
Budget Amount *help
¥16,770,000 (Direct Cost: ¥12,900,000、Indirect Cost: ¥3,870,000)
Fiscal Year 2018: ¥1,950,000 (Direct Cost: ¥1,500,000、Indirect Cost: ¥450,000)
Fiscal Year 2017: ¥2,340,000 (Direct Cost: ¥1,800,000、Indirect Cost: ¥540,000)
Fiscal Year 2016: ¥12,480,000 (Direct Cost: ¥9,600,000、Indirect Cost: ¥2,880,000)
Keywords表面界面物性 / 超薄膜 / 強相関系 / 表面X線回折 / CTR散乱 / 位相問題 / トポロジカル物質 / 超伝導 / トポロジカル絶縁体 / Bi2Se3 / 表面・界面物性 / 強相関電子系
Outline of Final Research Achievements

We have studied the structure of ultrathin films such as topological or superconducting materials by surface X-ray diffraction.
We obtained a thickness dependence of surface and interface structures in Bi2Se3 ultrathin films of 1, 2 and 3QL(Quintuple Layer) formed on Si substrate, and found that the structural parameters approach to those of bulk crystals as the thickness increases.
The atomic structure of a superconducting atomic sheet of indium grown on a Si(111) surface, i.e., In/Si(111)-√7x√3-In, was determined with the aid of low-energy electron diffraction. The structure consists of double layers of In atoms with a rectangular arrangement, verifying a theoretical prediction.

Academic Significance and Societal Importance of the Research Achievements

表面や界面は周囲の環境がバルクの中とは異なることから、超薄膜ではバルクでは発現しない機能を有するデバイスを開発できる可能性があり、超薄膜に関する研究が盛んに行われている。本研究では、バルクの構造解析で実績のあるX線回折法を高度に進展させた表面X線回折法により、超薄膜の構造決定を通して機能発現の起源を理解し、さらに高機能省エネルギーデバイスの開発に寄与する。

Report

(4 results)
  • 2018 Annual Research Report   Final Research Report ( PDF )
  • 2017 Annual Research Report
  • 2016 Annual Research Report
  • Research Products

    (27 results)

All 2019 2018 2017 2016

All Journal Article (6 results) (of which Int'l Joint Research: 1 results,  Peer Reviewed: 6 results,  Open Access: 3 results) Presentation (21 results) (of which Int'l Joint Research: 8 results,  Invited: 3 results)

  • [Journal Article] Structure determination of the Si(111)?7×3 In atomic-layer superconductor2019

    • Author(s)
      Shirasawa Tetsuroh、Yoshizawa Shunsuke、Takahashi Toshio、Uchihashi Takashi
    • Journal Title

      Physical Review B

      Volume: 99 Issue: 10 Pages: 1-5

    • DOI

      10.1103/physrevb.99.100502

    • Related Report
      2018 Annual Research Report
    • Peer Reviewed
  • [Journal Article] 表面X線回折測定の高速化と固液界面構造のその場追跡2018

    • Author(s)
      白澤徹郎、Wolfgang Voegeli、荒川悦雄、高橋敏男、松下正
    • Journal Title

      固体物理

      Volume: 53 Pages: 525-530

    • Related Report
      2018 Annual Research Report
    • Peer Reviewed
  • [Journal Article] A New Pentacene Polymorph Induced by Interaction with a Substrate2018

    • Author(s)
      T.Shirasawa, S.Yanagisawa, S.Hatada, W.Voegeli, Y.Morikawa, and T.Takahashi
    • Journal Title

      J.Phys.Chem.C

      Volume: 122 Issue: 11 Pages: 6240-6245

    • DOI

      10.1021/acs.jpcc.8b00892

    • Related Report
      2017 Annual Research Report
    • Peer Reviewed / Open Access / Int'l Joint Research
  • [Journal Article] Evidence for a gold trimer on the Si(111)-21×21-(Ag + Au) surface2018

    • Author(s)
      Takahashi Toshio、Yamaguchi Yudai、Shirasawa Tetsuroh、Voegeli Wolfgang、Tajiri Hiroo
    • Journal Title

      Applied Surface Science

      Volume: 432 Pages: 147-151

    • DOI

      10.1016/j.apsusc.2017.03.069

    • Related Report
      2017 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Observation of Structure of Surfaces and Interfaces by Synchrotron X-ray Diffraction: Atomic-Scale Imaging and Time-Resolved Measurements2018

    • Author(s)
      Y. Wakabayashi, T. Shirasawa, W. Voegeli, and T. Takahashi
    • Journal Title

      J. Phys. Soc. Jpn.

      Volume: 87 Issue: 6 Pages: 061010-061010

    • DOI

      10.7566/jpsj.87.061010

    • NAID

      120006873162

    • Related Report
      2017 Annual Research Report
    • Peer Reviewed / Open Access
  • [Journal Article] A quick convergent-beam laboratory X-ray reflectometer using a simultaneous multiple-angle dispersive geometry2017

    • Author(s)
      Wolfgang Voegeli, Chika Kamezawa, Etsuo Arakawa, Yohko F. Yano,Tetsuroh Shirasawa,Toshio Takahashi and Tadashi Matsushita
    • Journal Title

      J. Appl. Crys.

      Volume: 50 Pages: 570-575

    • Related Report
      2016 Annual Research Report
    • Peer Reviewed / Open Access
  • [Presentation] X線CTR散乱法による界面の静的および動的構造解析2018

    • Author(s)
      白澤徹郎
    • Organizer
      PF研究会「量子ビームと新規合成手法の融合による酸化物の新機能探索」
    • Related Report
      2018 Annual Research Report
    • Invited
  • [Presentation] Real-Time Monitoring of Interface Processes by Wavelength Dispersive X-ray CTR Measurements2018

    • Author(s)
      T. Shirawawa, W. Voegeli, E. Arakawa, T. Masuda, T. Takahashi, K. Uosaki, T. Matsushita
    • Organizer
      The 15th International Surface X-ray and Neutron Scattering Conference
    • Related Report
      2018 Annual Research Report
    • Int'l Joint Research
  • [Presentation] Investigation of the Photoconversion of Pentacene Precursor Thin Films by Time-Resolved X-ray Reflectivity2018

    • Author(s)
      Yuta Tameike, Wolfgang Voegeli, Etsuo Arakawa, Toshio Takahashi, Tetsuroh Shirasawa, Mitsuharu Suzuki, Hiroko Yamada, Tadashi Matsushita
    • Organizer
      The 15th International Surface X-ray and Neutron Scattering Conference
    • Related Report
      2018 Annual Research Report
    • Int'l Joint Research
  • [Presentation] Capturing interface processes at the atomic scale by high-speed surface X-ray diffraction2018

    • Author(s)
      T. Shirawawa, W. Voegeli, E. Arakawa, T. Masuda, T. Takahashi, K. Uosaki, T. Matsushita
    • Organizer
      The 9th Vacuum and Surface Science Conference of Asia and Australia
    • Related Report
      2018 Annual Research Report
    • Int'l Joint Research
  • [Presentation] Identification of the structure of In/Si(111)-√7×√3 surface2018

    • Author(s)
      T. Shirasawa
    • Organizer
      The 3rd Asia-Pacific Symposium on Solid Surfaces & Cross-Strait Symposium on Solid Surfaces
    • Related Report
      2018 Annual Research Report
    • Int'l Joint Research / Invited
  • [Presentation] インジウム原子層超伝導体Si(111)-√7×√3-Inの構造決定2018

    • Author(s)
      白澤徹郎、吉澤俊介、内橋隆、高橋敏男
    • Organizer
      日本物理学会2018年秋季大会
    • Related Report
      2018 Annual Research Report
  • [Presentation] 波長分散型X線CTR散乱法によるBi超薄膜成長過程の原子レベル構造解析2018

    • Author(s)
      白澤徹郎、Wolfgang Voegeli、溜池裕太、荒川悦雄、高橋敏男
    • Organizer
      日本物理学会2018年秋季大会
    • Related Report
      2018 Annual Research Report
  • [Presentation] X線CTR散乱迅速測定によるBi超薄膜成長過程の原子レベル追跡2018

    • Author(s)
      白澤徹郎、Wolfgang Voegeli、溜池裕太、荒川悦雄、高橋敏男
    • Organizer
      2018年第79回応用物理学会秋季学術講演会
    • Related Report
      2018 Annual Research Report
  • [Presentation] 光変換型ペンタセン前駆体薄膜の温度による変換過程への影響2018

    • Author(s)
      溜池 祐太、Voegeli Wolfgang、荒川 悦雄、高橋 敏男、白澤 徹郎、山田 容子、鈴木 充朗、松下 正
    • Organizer
      2018年第79回応用物理学会秋季学術講演会
    • Related Report
      2018 Annual Research Report
  • [Presentation] Atomic Scale Growth Process of Thin Films as Revealed by Fast Surface X-ray Diffraction2018

    • Author(s)
      T. Shirawawa, W. Voegeli, E. Arakawa, T. Takahashi, T. Matsushita
    • Organizer
      AiMES 2018
    • Related Report
      2018 Annual Research Report
    • Int'l Joint Research
  • [Presentation] Investigation of the Photoconversion of Pentacene Precursor Thin Films by Time-Resolved X-ray Reflectivity2018

    • Author(s)
      Y. Tameike, W. Voegeli, E. Arakawa, T. Takahashi, T. Shirasawa, M. Suzuki, H. Yamada and T. Matsushita
    • Organizer
      14th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ACSIN-14)
    • Related Report
      2018 Annual Research Report
    • Int'l Joint Research
  • [Presentation] 波長分散型表面X線回折による界面構造その場追跡2018

    • Author(s)
      白澤徹郎、Wolfgang Voegeli、増田卓也、荒川悦雄、魚崎浩平、高橋敏男、松下正
    • Organizer
      2018年日本表面真空学会学術講演会
    • Related Report
      2018 Annual Research Report
  • [Presentation] 基板に誘起されたペンタセンの新しい結晶構造2018

    • Author(s)
      白澤 徹郎、柳澤将、畑田真之介、Voegeli Wolfgang、森川良忠、高橋敏男
    • Organizer
      第65回応用物理学会春季学術講演会
    • Related Report
      2017 Annual Research Report
  • [Presentation] Bi基板に誘起されたペンタセン薄膜の新しい結晶構造2018

    • Author(s)
      白澤徹郎, 柳澤将, Voegeli Wolfgang, 森川良忠, 高橋敏男
    • Organizer
      日本物理学会 第73回年次大会
    • Related Report
      2017 Annual Research Report
  • [Presentation] Investigation of Photoconversion of Organic Thin Films by Time-Resolved X-ray Reflectivity2017

    • Author(s)
      Y. Tameike, W. Voegeli, E. Arakawa,T. Takahashi, T. Shirasawa, M. Suzuki, H. Yamada, T. Matsushita
    • Organizer
      The 8th International Symposium on Surface Science
    • Related Report
      2017 Annual Research Report
  • [Presentation] Time-Resolved X-Ray Reflectivity and Surface Diffraction Using Monochromatic Undulator Radiation2017

    • Author(s)
      W. Voegeli, E. Arakawa, T. Takahashi, T. Shirasawa, H. Tajiri, T. Matsushita
    • Organizer
      The 8th International Symposium on Surface Science
    • Related Report
      2017 Annual Research Report
  • [Presentation] Minimal-functionによるSi(111)-√21×√21-(Ag+Au)構造の考察2017

    • Author(s)
      高橋敏男, 山口雄大, 白澤徹郎, Wolfgang Voegeli, 田尻寛男
    • Organizer
      日本物理学会 2017年秋季大会
    • Related Report
      2017 Annual Research Report
  • [Presentation] Bi2Se3超薄膜表面界面構造の膜厚依存性2017

    • Author(s)
      杉木裕人、白澤徹郎、高橋敏男
    • Organizer
      日本物理学会第72回年次大会
    • Related Report
      2016 Annual Research Report
  • [Presentation] Dispersive X-ray Scattering Measurements Using Monochromatic Undulator Radiation: Towards Millisecond Time Resolution2017

    • Author(s)
      Voegeli Wolfgang, 荒川悦雄, 高橋敏男, 白澤徹郎, 田尻寛男, 松下正
    • Organizer
      日本物理学会第72回年次大会
    • Related Report
      2016 Annual Research Report
  • [Presentation] High-Speed Characterization of Surface, Interface, and Thinfilm Structures by Using Multi-Wavelength Dispersive X-ray Diffraction2017

    • Author(s)
      T. Shirasawa
    • Organizer
      The 5th Annual Conference of AnalytiX-2017
    • Related Report
      2016 Annual Research Report
    • Int'l Joint Research / Invited
  • [Presentation] Quick thin film/multilayer characterization using convergent-beam X-ray scattering measurements2016

    • Author(s)
      Wolfgang VOEGELI, Chika KAMEZAWA, Hirokazu SAITO, Etsuo ARAKAWA, Tetsuroh SHIRASAWA, Toshio TAKAHASHI, Yohko F. YANO, Yumiko TAKAHASHI, Tadashi MATSUSHITA
    • Organizer
      20th International Vacuum Congress
    • Related Report
      2016 Annual Research Report
    • Int'l Joint Research

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Published: 2016-04-21   Modified: 2020-03-30  

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