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Reduction in current collapse and enhancement of breakdown voltage in GaN-based HEMTs

Research Project

Project/Area Number 16K06314
Research Category

Grant-in-Aid for Scientific Research (C)

Allocation TypeMulti-year Fund
Section一般
Research Field Electron device/Electronic equipment
Research InstitutionShibaura Institute of Technology

Principal Investigator

Horio Kazushige  芝浦工業大学, システム理工学部, 教授 (10165590)

Project Period (FY) 2016-04-01 – 2020-03-31
Project Status Completed (Fiscal Year 2019)
Budget Amount *help
¥4,810,000 (Direct Cost: ¥3,700,000、Indirect Cost: ¥1,110,000)
Fiscal Year 2018: ¥1,300,000 (Direct Cost: ¥1,000,000、Indirect Cost: ¥300,000)
Fiscal Year 2017: ¥1,560,000 (Direct Cost: ¥1,200,000、Indirect Cost: ¥360,000)
Fiscal Year 2016: ¥1,950,000 (Direct Cost: ¥1,500,000、Indirect Cost: ¥450,000)
Keywords窒化ガリウム / HEMT / 電流コラプス / 耐圧 / フィールドプレート / バッファ層 / 2次元解析 / 深いアクセプタ / 高誘電率膜 / 電子デバイス・機器 / 半導体物性 / マイクロ・ナノデバイス
Outline of Final Research Achievements

So-called current collapse and breakdown voltage in field-plate AlGaN/GaN HEMTs with a deep acceptor in the semi-insulating GaN buffer layer are studied.
It is shown that when the acceptor density is higher, the current collapse is reduced due to the field-plate effect and the breakdown voltage is enhanced. It is also analyzed how the breakdown voltage of AlGaN/GaN HEMTs with a high-k passivation layer depends on the gate-to-drain distance. As a result, the breakdown voltage increases as the gate-to-drain distance increases, indicating that the electric field between gate and drain are almost uniform (~ 3 MV/cm).In addition, a double passivation structure with a thin SiN layer and a relatively thick high-k passivation layer is analyzed, showing that the breakdown voltage is enhanced due to the high-k layer effect.

Academic Significance and Societal Importance of the Research Achievements

AlGaN/GaN HEMTは高電力マイクロ波デバイス及び高電力スイッチングデバイスとして注目されている。しかしながら,GaNデバイスに通常見られる電流コラプスはマイクロ波電力の低下やオン抵抗の増大につながり,また実験的に得られる耐圧は理論的なものよりかなり低い。そこで,AlGaN/GaN HEMTの電流コラプスを低減したり,その耐圧を向上することは非常に意味のあることである。本研究で得られた,電流コラプスを低減する方法や耐圧を向上する方法はこれらを改善するものとして価値の高いものと思われる。

Report

(5 results)
  • 2019 Annual Research Report   Final Research Report ( PDF )
  • 2018 Research-status Report
  • 2017 Research-status Report
  • 2016 Research-status Report
  • Research Products

    (34 results)

All 2019 2018 2017 2016

All Journal Article (6 results) (of which Peer Reviewed: 6 results,  Open Access: 6 results) Presentation (28 results) (of which Int'l Joint Research: 28 results)

  • [Journal Article] Analysis of breakdown voltage of field-plate AlGaN/GaN HEMTs as affected by buffer layer’s acceptor density2019

    • Author(s)
      S. Akiyama, M. Kondo, L. Wada, and K. Horio
    • Journal Title

      Jpn J. Appl. Phys

      Volume: 58 Issue: 6 Pages: 068003-068003

    • DOI

      10.7567/1347-4065/ab1e8f

    • NAID

      210000155899

    • Related Report
      2019 Annual Research Report
    • Peer Reviewed / Open Access
  • [Journal Article] Analysis of breakdown voltages in AlGaN/GaN HEMTs with low-k/high-k double passivation layers2019

    • Author(s)
      K. Nakamura, H. Hanawa, K. Horio
    • Journal Title

      IEEE Trans. Device Mater. Rel.

      Volume: 19 Issue: 2 Pages: 298-303

    • DOI

      10.1109/tdmr.2019.2903213

    • Related Report
      2019 Annual Research Report
    • Peer Reviewed / Open Access
  • [Journal Article] Enhancement of breakdown voltage in AlGaN/GaN HEMTs: Field plate plus high-k passivation layer and high acceptor density in buffer layer2018

    • Author(s)
      T. Kabemura, S. Ueda, Y. Kawada, and K. Horio
    • Journal Title

      IEEE Trans. Electron Devices

      Volume: 65 Issue: 9 Pages: 3848-3854

    • DOI

      10.1109/ted.2018.2857774

    • Related Report
      2018 Research-status Report
    • Peer Reviewed / Open Access
  • [Journal Article] Analysis of reduction in lag phenomena and current collapse in field-plate AlGaN/GaN HEMTs with high acceptor density in a buffer layer2018

    • Author(s)
      Y. Saito, R. Tsurumaki, N. Noda and K. Horio
    • Journal Title

      IEEE Trans. Device Mater. Rel.

      Volume: 18 Pages: 46-53

    • Related Report
      2017 Research-status Report
    • Peer Reviewed / Open Access
  • [Journal Article] Effects of acceptors in a Fe-doped buffer layer on breakdown characteristics of AlGaN/GaN HEMTs with a high-k passivation layer2017

    • Author(s)
      Y. Kawada, H. Hanawa and K. Horio
    • Journal Title

      Jpn J. Appl. Phys

      Volume: 56 Pages: 108003-108003

    • Related Report
      2017 Research-status Report
    • Peer Reviewed / Open Access
  • [Journal Article] Similarities of lag phenomena and current collapse in field-plate AlGaN/GaN HEMTs with different types of buffer layers2017

    • Author(s)
      R. Tsurumaki, N. Noda and K. Horio
    • Journal Title

      Microelectronics Reliability

      Volume: 73 Pages: 36-41

    • Related Report
      2016 Research-status Report
    • Peer Reviewed / Open Access
  • [Presentation] Analysis of gate-length dependence of lags and current collapse in field-plate AlGaN/GaN HEMTs2019

    • Author(s)
      T. Chiba, Y. Saito, R. Tsurumaki, and K. Horio
    • Organizer
      2019 TechConnect World Conference
    • Related Report
      2019 Annual Research Report
    • Int'l Joint Research
  • [Presentation] Analysis of breakdown characteristics in field-plate AlGaN/GaN HEMTs: Dependence on deep-acceptor density in buffer layer2019

    • Author(s)
      S. Akiyama, M. Kondo, L. Wada, and K. Horio
    • Organizer
      2019 TechConnect World Conference
    • Related Report
      2019 Annual Research Report
    • Int'l Joint Research
  • [Presentation] Analysis of breakdown voltage of AlGaN/GaN HEMTs with high-k passivation layer and high acceptor density in buffer layer2019

    • Author(s)
      S. Ueda, R. Tomita, Y. Kawada, and K. Horio
    • Organizer
      2019 TechConnect World Conference
    • Related Report
      2019 Annual Research Report
    • Int'l Joint Research
  • [Presentation] Dependence of breakdown voltage on gate-to-drain distance of AlGaN/GaN HEMTs with high-k passivation layer2019

    • Author(s)
      R. Tomita, S. Ueda, Y. Kawada, and K. Horio
    • Organizer
      43rd Workshop on Compound Semiconductors and Integrated Circuits
    • Related Report
      2019 Annual Research Report
    • Int'l Joint Research
  • [Presentation] High average breakdown field between gate and drain in AlGaN/GaN HEMTs with high-k passivation layer2019

    • Author(s)
      R. Tomita, S. Ueda, Y. Kawada, and K. Horio
    • Organizer
      13th International Conference of Nitride Semiconductors
    • Related Report
      2019 Annual Research Report
    • Int'l Joint Research
  • [Presentation] Gate-length dependence of gate lag, drain lag and current collapse in field-plate AlGaN/GaN HEMTs2019

    • Author(s)
      T. Chiba, Y. Saito, R. Tsurumaki, and K. Horio
    • Organizer
      13th International Conference of Nitride Semiconductors
    • Related Report
      2019 Annual Research Report
    • Int'l Joint Research
  • [Presentation] Dependence of breakdown voltage enhancement on gate-to-drain distance of AlGaN/GaN HEMTs with high-k passivation layer2019

    • Author(s)
      R. Tomita, S. Ueda, Y. Kawada, and K. Horio
    • Organizer
      9tth Asia-Pacific Workshop on Widegap Semiconductors
    • Related Report
      2019 Annual Research Report
    • Int'l Joint Research
  • [Presentation] Dependence of breakdown voltage enhancement on buffer acceptor density and gate-to-drain distance in AlGaN/GaN HEMTs with high-k passivation layer2019

    • Author(s)
      R. Tomita, S. Ueda, Y. Kawada, and K. Horio
    • Organizer
      2019 IEEE Semiconductor Interface Specialists Conference
    • Related Report
      2019 Annual Research Report
    • Int'l Joint Research
  • [Presentation] Simulation of breakdown characteristics of AlGaN/GaN HEMTs with double passivation layers2018

    • Author(s)
      K. Nakano, H. Hanawa, and K. Horio
    • Organizer
      2018 TechConnect World Conference
    • Related Report
      2018 Research-status Report
    • Int'l Joint Research
  • [Presentation] Effect of deep-acceptor density in buffer layer on breakdown voltage of AlGaN/GaN HEMTs with high-k passivation layer2018

    • Author(s)
      S. Ueda, Y. Kawada, and K. Horio
    • Organizer
      2018 TechConnect World Conference
    • Related Report
      2018 Research-status Report
    • Int'l Joint Research
  • [Presentation] Analysis of breakdown characteristics of field-plate AlGaN/GaN HEMTs with a high-k passivation layer2018

    • Author(s)
      T. Kabemura, H. Hanawa, and K. Horio
    • Organizer
      2018 TechConnect World Conference
    • Related Report
      2018 Research-status Report
    • Int'l Joint Research
  • [Presentation] Effect of acceptor density in buffer layer on breakdown characteristics of AlGaN/GaN HEMTs with high-k passivation layer2018

    • Author(s)
      S. Ueda, Y. Kawada, and K. Horio
    • Organizer
      42nd Workshop on Compound Semiconductor Devices and Integrated Circuits
    • Related Report
      2018 Research-status Report
    • Int'l Joint Research
  • [Presentation] Analysis of breakdown characteristics of AlGaN/GaN HEMTs with double passivation layers2018

    • Author(s)
      K. Nakano, H. Hanawa, K. Horio
    • Organizer
      IEEE WiPDA Asia 2018
    • Related Report
      2018 Research-status Report
    • Int'l Joint Research
  • [Presentation] Analysis of breakdown characteristics of AlGaN/GaN HEMTs with low-k/high-k double passivation layers2018

    • Author(s)
      K. Nakano, H. Hanawa, K. Horio
    • Organizer
      2018 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS 2018)
    • Related Report
      2018 Research-status Report
    • Int'l Joint Research
  • [Presentation] Enhancement of breakdown voltage in AlGaN/GaN HEMTs: High-k passivation layer and high acceptor density in buffer layer2018

    • Author(s)
      S. Ueda, Y. Kawada, and K. Horio
    • Organizer
      2018 International Workshop on Nitride semiconductors (IWN 2018)
    • Related Report
      2018 Research-status Report
    • Int'l Joint Research
  • [Presentation] Analysis of breakdown voltages of field-plate AlGaN/GaN HEMTs with high-k passivation layer2018

    • Author(s)
      T. Kabemura, H. Hanawa, and K. Horio
    • Organizer
      2018 International Workshop on Nitride semiconductors (IWN 2018)
    • Related Report
      2018 Research-status Report
    • Int'l Joint Research
  • [Presentation] Breakdown voltage of AlGaN/GaN HEMTs with low-k/high-k double passivation layers2018

    • Author(s)
      K. Nakano, H. Hanawa, K. Horio
    • Organizer
      2018 IEEE Semiconductor Interface Specialists Conference (SISC 2018)
    • Related Report
      2018 Research-status Report
    • Int'l Joint Research
  • [Presentation] Effects of acceptors in a buffer layer on breakdown characteristics of AlGaN/GaN HEMTs with a high-k passivation layer2017

    • Author(s)
      Y. Kawada, H. Hanawa and K. Horio
    • Organizer
      12th International Conference of Nitride Semiconductors
    • Related Report
      2017 Research-status Report
    • Int'l Joint Research
  • [Presentation] Breakdown voltage enhancement in AlGaN/GaN HEMTs with double passivation layers2017

    • Author(s)
      K. Horio and H. Hanawa
    • Organizer
      12th International Conference of Nitride Semiconductors
    • Related Report
      2017 Research-status Report
    • Int'l Joint Research
  • [Presentation] Suppression of lag phenomena and current collapse in field-plate AlGaN/GaN HEMTs with high acceptor density in a buffer layer2017

    • Author(s)
      Y. Saito, R. Tsurumaki, N. Noda and K. Horio
    • Organizer
      European Microwave Integrated Circuits Conference 2017
    • Related Report
      2017 Research-status Report
    • Int'l Joint Research
  • [Presentation] Breakdown voltage enhancement in AlGaN/GaN HEMTs using double passivation layers with a high-k dielectric2017

    • Author(s)
      K. Horio and H. Hanawa
    • Organizer
      2017 IEEE Semiconductor Interface Specialists Conference
    • Related Report
      2017 Research-status Report
    • Int'l Joint Research
  • [Presentation] Analysis of breakdown voltage enhancement in AlGaN/GaN HEMTs with double passivation layers using a high-k dielectric2017

    • Author(s)
      K. Horio and H. Hanawa
    • Organizer
      41st Workshop on Compound Semiconductor Devices and Integrated Circuits
    • Related Report
      2017 Research-status Report
    • Int'l Joint Research
  • [Presentation] Effects of buffer acceptors on breakdown voltages of AlGaN/GaN HEMTs with a high-k passivation layer2017

    • Author(s)
      Y. Kawada, H. Hanawa and K. Horio
    • Organizer
      2017 TechConnect World Conference
    • Related Report
      2017 Research-status Report
    • Int'l Joint Research
  • [Presentation] Simulation of breakdown voltage enhancement in AlGaN/GaN HEMTs with double passivation layers2017

    • Author(s)
      K. Horio and H. Hanawa
    • Organizer
      2017 TechConnect World Conference
    • Related Report
      2017 Research-status Report
    • Int'l Joint Research
  • [Presentation] Reduction in lags and current collapse in field-plate AlGaN/GaN HEMTs with high acceptor density in a buffer layer2017

    • Author(s)
      Y. Saito, R. Tsurumaki, N. Noda and K. Horio
    • Organizer
      2017 TechConnect World Conference
    • Related Report
      2017 Research-status Report
    • Int'l Joint Research
  • [Presentation] Effects of buffer leakage on breakdown characteristics of AlGaN/GaN HEMTs with a high-k passivation layer2016

    • Author(s)
      Y. Satoh, H. Hanawa and K. Horio
    • Organizer
      2016 IEEE Semiconductor Interface Specialists Conference
    • Place of Presentation
      San Diego, USA
    • Year and Date
      2016-12-08
    • Related Report
      2016 Research-status Report
    • Int'l Joint Research
  • [Presentation] Similarities of lags and current collapse in field-plate AlGaN/GaN HEMTs with different types of buffer layers2016

    • Author(s)
      R. Tsurumaki, N. Noda and K. Horio
    • Organizer
      2016 International Workshop on Nitride Semiconductors
    • Place of Presentation
      Orland, USA
    • Year and Date
      2016-10-05
    • Related Report
      2016 Research-status Report
    • Int'l Joint Research
  • [Presentation] Effects of buffer leakage current on breakdown voltage in AlGaN/GaN HEMTs with a high-k passivation layer2016

    • Author(s)
      Y. Satoh, H. Hanawa and K. Horio
    • Organizer
      European Microwave Integrated Circuits Conference 2016
    • Place of Presentation
      London, UK
    • Year and Date
      2016-10-03
    • Related Report
      2016 Research-status Report
    • Int'l Joint Research

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Published: 2016-04-21   Modified: 2021-02-19  

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