| Budget Amount *help |
¥3,770,000 (Direct Cost: ¥2,900,000、Indirect Cost: ¥870,000)
Fiscal Year 2017: ¥1,170,000 (Direct Cost: ¥900,000、Indirect Cost: ¥270,000)
Fiscal Year 2016: ¥2,600,000 (Direct Cost: ¥2,000,000、Indirect Cost: ¥600,000)
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| Outline of Final Research Achievements |
Phenomena such as crystal growth and chemical reaction have different results, depending on environmental factors such as temperature, humidity, gas, and liquid. In order to precisely control these environments, it is indispensable to reduce the size of the apparatus from the viewpoint that the influence from the surrounding environment has to be reduced. However, in the conventional atomic force microscope (AFM), It was difficult to realize. In this project, AFM capable of controlling multiple environments was realized and applied to ice surface measurements. We have developed a device housed in a hermetically sealed closed compact container, all of self-detecting type AFM sensor part, scanning part, coarse movement approach, without using optical system. Measurement of the growing ice surface was made by enabling multiple environmental control such as temperature, humidity and pressure.
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