Imaging mechanism for molecules by optical near-field microscopy using force detection
| Project/Area Number |
16K13616
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| Research Category |
Grant-in-Aid for Challenging Exploratory Research
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| Allocation Type | Multi-year Fund |
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| Research Field |
Nanostructural physics
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| Research Institution | Osaka University |
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Principal Investigator |
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| Project Period (FY) |
2016-04-01 – 2018-03-31
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| Project Status |
Completed (Fiscal Year 2017)
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| Budget Amount *help |
¥3,640,000 (Direct Cost: ¥2,800,000、Indirect Cost: ¥840,000)
Fiscal Year 2017: ¥1,560,000 (Direct Cost: ¥1,200,000、Indirect Cost: ¥360,000)
Fiscal Year 2016: ¥2,080,000 (Direct Cost: ¥1,600,000、Indirect Cost: ¥480,000)
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| Keywords | 近接場光学 / 光起電力 / 走査プローブ顕微鏡 / 走査プローブ顕微鏡（AFM,SNOM） |
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| Outline of Final Research Achievements |
We investigated the method for measuring the optical near-field using photon-induced force detection with high sensitivity and high spatial resolution. We also investigated the mechanism of the atomic resolution imaging. We demonstrated atomic resolution imaging of the near field on the α-Al2O3 (0001) surface of a prism. We invstigated the spatial distribution of the near field by scanning at different tip-sample distances and found that the atomic corrugation of the near-field signal was observed at greater distances than that of the atomic force microscopy signal. We clarified that the Al atoms on the α-Al2O3 (0001) surface were resolved at an atomic level.
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Report
(3 results)
Research Products
(17 results)
