| Project/Area Number |
16K13688
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| Research Category |
Grant-in-Aid for Challenging Exploratory Research
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| Allocation Type | Multi-year Fund |
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| Research Field |
Thin film/Surface and interfacial physical properties
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| Research Institution | Osaka University |
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Principal Investigator |
Yamasaki Jun 大阪大学, 超高圧電子顕微鏡センター, 准教授 (40335071)
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| Co-Investigator(Kenkyū-buntansha) |
田中 信夫 名古屋大学, 未来材料・システム研究所, 研究員 (40126876)
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| Co-Investigator(Renkei-kenkyūsha) |
SAITOH KOH 名古屋大学, 未来材料・システム研究所, 教授 (50292280)
GOHARA KAZUTOSHI 北海道大学, 工学研究院, 教授 (40153746)
HIRATA AKIHIKO 東北大学, 原子分子材料科学高等研究機構, 准教授 (90350488)
KOBAYASHI KEITA 大阪大学, 超高圧電子顕微鏡センター, 助教 (40556908)
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| Project Period (FY) |
2016-04-01 – 2018-03-31
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| Project Status |
Completed (Fiscal Year 2017)
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| Budget Amount *help |
¥3,770,000 (Direct Cost: ¥2,900,000、Indirect Cost: ¥870,000)
Fiscal Year 2017: ¥1,690,000 (Direct Cost: ¥1,300,000、Indirect Cost: ¥390,000)
Fiscal Year 2016: ¥2,080,000 (Direct Cost: ¥1,600,000、Indirect Cost: ¥480,000)
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| Keywords | 収差補正電子顕微鏡 / 正焦点 / 格子縞コントラスト / 金属ナノ粒子 / 三次元分布 / 非整合エピタキシャル界面 / 三次元観察 / 収差補正TEM / 焦点位置スキャン / 結晶格子縞 / ナノ粒子 / 動画計測 / 三次元計測 / 深さ分解能 / ナノ構造 / 単原子 |
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| Outline of Final Research Achievements |
One of the imaging features in aberration-corrected transmission electron microscopy (AC-TEM) is that lattice fringe contrast is minimized at the in-focus condition. By utilizing the feature, we developed a new method to observe three-dimensional dispersion of metallic nano particles from a focal series of AC-TEM images. In the process, we developed a filtering procedure to display magnitude of lattice fringe contrast quantitatively. By using the filtering procedure, we also succeeded in developing a method to measure roughness at mismatch epitaxial interfaces between semiconducting materials.
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