• Search Research Projects
  • Search Researchers
  • How to Use
  1. Back to previous page

Development of operand measurement method of structure/charge and discharge characteristics for all-solid-state rechargeable battery using helium ion microscopy

Research Project

Project/Area Number 16K14104
Research Category

Grant-in-Aid for Challenging Exploratory Research

Allocation TypeMulti-year Fund
Research Field Device related chemistry
Research InstitutionNational Institute for Materials Science

Principal Investigator

Sakai Chikako  国立研究開発法人物質・材料研究機構, ナノ材料科学環境拠点, NIMSポスドク研究員 (90580407)

Project Period (FY) 2016-04-01 – 2018-03-31
Project Status Completed (Fiscal Year 2017)
Budget Amount *help
¥3,640,000 (Direct Cost: ¥2,800,000、Indirect Cost: ¥840,000)
Fiscal Year 2017: ¥650,000 (Direct Cost: ¥500,000、Indirect Cost: ¥150,000)
Fiscal Year 2016: ¥2,990,000 (Direct Cost: ¥2,300,000、Indirect Cost: ¥690,000)
Keywordsヘリウムイオン顕微鏡 / 電位分布計測 / アクティブ電圧コントラスト / 積層型セラミックコンデンサ / ペロブスカイト太陽電池 / 全固体リチウムイオン二次電池 / 電圧印加 / 電池 / 環境材料
Outline of Final Research Achievements

By both an active voltage contrast (AVC) imaging using helium ion microscopy (HIM) and a contact potential difference imaging using Kelvin probe force microscopy (KPFM) which can quantitatively evaluate potential, we have been able to develop a new potential distribution measurement method. An in situ voltage-application system was incorporated into an HIM chamber. This allowed us to apply any voltage (±5 V) to a sample. We found that the AVC corresponding to the electrical potential of a multilayer ceramic capacitor in the secondary electron (SE) image could be observed when the applied voltage is less than or equal to 1.5 V. HIM observation of the perovskite solar cell was carried out. Despite the inclusion of organic materials, it is noteworthy that SE imaging could be achieved without adsorbing any metal.

Report

(3 results)
  • 2017 Annual Research Report   Final Research Report ( PDF )
  • 2016 Research-status Report
  • Research Products

    (14 results)

All 2018 2017 2016

All Journal Article (1 results) (of which Peer Reviewed: 1 results,  Acknowledgement Compliant: 1 results) Presentation (13 results) (of which Int'l Joint Research: 4 results)

  • [Journal Article] Active voltage contrast imaging of cross-sectional surface of multilayer ceramic capacitor using helium ion microscopy2016

    • Author(s)
      Chikako Sakai, Nobuyuki Ishida, Hideki Masuda, Shoko Nagano, Masayo Kitahara, Yoichiro Ogata, and Daisuke Fujita
    • Journal Title

      Applied Physics Letters

      Volume: 109 Issue: 5

    • DOI

      10.1063/1.4960524

    • Related Report
      2016 Research-status Report
    • Peer Reviewed / Acknowledgement Compliant
  • [Presentation] ヘリウムイオン顕微鏡によるペロブスカイト太陽電池の二次電子像観察2018

    • Author(s)
      酒井智香子, 白井康裕, 宮野健次郎, 藤田大介
    • Organizer
      MI・計測 合同シンポジウム 2018
    • Related Report
      2017 Annual Research Report
  • [Presentation] 電圧印加値を変化させた積層型セラミックコンデンサのヘリウムイオン顕微鏡を用いた二次電子像観察2017

    • Author(s)
      酒井智香子,石田暢之,永野聖子,小形曜一郎,藤田大介
    • Organizer
      第64回応用物理学会春季学術講演会
    • Place of Presentation
      パシフィコ横浜(神奈川県、横浜市)
    • Year and Date
      2017-03-14
    • Related Report
      2016 Research-status Report
  • [Presentation] Electrical Potential Imaging of Multilayer Ceramic Capacitors with Arbitrary Applied Voltages using Helium Ion Microscope2017

    • Author(s)
      Chikako Sakai, Nobuyuki Ishida, Shoko Nagano, Keiko Onishi, and Daisuke Fujita
    • Organizer
      The 8th International Symposium on Surface Science
    • Related Report
      2017 Annual Research Report
    • Int'l Joint Research
  • [Presentation] Secondary Electron Imaging for Multilayer Ceramic Capacitors with Applied Several Voltages using Helium Ion Microscope2017

    • Author(s)
      Chikako Sakai, Nobuyuki Ishida, Shoko Nagano, Keiko Onishi, Daisuke Fujita
    • Organizer
      Recent Progress on Interfacial Energy Conversion
    • Related Report
      2017 Annual Research Report
    • Int'l Joint Research
  • [Presentation] ヘリウムイオン顕微鏡装置への電圧印加機構の導入と印加電圧値を変化させた積層型セラミックコンデンサの二次電子像観察2017

    • Author(s)
      酒井智香子,石田暢之,永野聖子,大西桂子,藤田大介
    • Organizer
      2017年真空・表面科学合同講演会
    • Related Report
      2017 Annual Research Report
  • [Presentation] New Electrical Potential Observation Technique by Active Voltage Contrast Imaging using Helium Ion Microscopy2017

    • Author(s)
      Chikako Sakai, Nobuyuki Ishida, Shoko Nagano, Keiko Onishi, and Daisuke Fujita
    • Organizer
      第18回イオンビームによる表面・界面解析」特別研究会
    • Related Report
      2017 Annual Research Report
  • [Presentation] 印加電圧値を変化させた積層型セラミックコンデンサ断面のヘリウムイオン顕微鏡を用いた二次電子像観察2017

    • Author(s)
      酒井智香子, 石田暢之, 永野聖子, 大西桂子, 藤田大介
    • Organizer
      日本表面科学会 第2回関東支部講演大会
    • Related Report
      2017 Annual Research Report
  • [Presentation] Electrical potential distribution of Multilayer Ceramic Capacitors with Arbitrary Applied Voltages using Helium Ion Microscope2017

    • Author(s)
      Chikako Sakai, Nobuyuki Ishida, Shoko Nagano, Keiko Onishi, Daisuke Fujita
    • Organizer
      The 15th GREEN Symposium
    • Related Report
      2017 Annual Research Report
  • [Presentation] 電圧印加機構のヘリウムイオン顕微鏡への導入と電圧印加積層型セラミックコンデンサの二次電子像観測2017

    • Author(s)
      酒井智香子, 石田暢之, 永野聖子, 小形曜一郎, 藤田大介
    • Organizer
      共用・計測 合同シンポジウム 2017
    • Place of Presentation
      NIMS, 千現地区(茨城県、つくば市)
    • Related Report
      2016 Research-status Report
  • [Presentation] Active Voltage Contrast Imaging of Multilayer Ceramic Capacitor using Helium Ion Microscopy2016

    • Author(s)
      Chikako Sakai, Nobuyuki Ishida, Hideki Masuda, Shoko Nagano, Masayo Kitahara, Yoichiro Ogata, and Daisuke Fujita
    • Organizer
      NIMS WEEK 2016
    • Place of Presentation
      東京国際フォーラム(東京都、千代田区)
    • Year and Date
      2016-10-20
    • Related Report
      2016 Research-status Report
    • Int'l Joint Research
  • [Presentation] Voltage Contrast Imaging of Multilayer Ceramic Capacitor using Helium Ion Microscope2016

    • Author(s)
      Chikako Sakai, Nobuyuki Ishida, Hideki Masuda, Shoko Nagano, Masayo Kitahara, Yoichiro Ogata, and Daisuke Fujita
    • Organizer
      20th international vacuum congress
    • Place of Presentation
      Busan, Korea
    • Year and Date
      2016-08-21
    • Related Report
      2016 Research-status Report
    • Int'l Joint Research
  • [Presentation] ヘリウムイオン顕微鏡を用いた積層型セラミックコンデンサ断面のアクティブ電圧コントラストの画像化2016

    • Author(s)
      酒井智香子, 石田暢之, 増田秀樹, 永野聖子, 小形曜一郎, 藤田大介
    • Organizer
      日本表面科学会第1回関東支部講演大会
    • Place of Presentation
      東京大学化学本館5階講堂(東京都、文京区)
    • Related Report
      2016 Research-status Report
  • [Presentation] ヘリウムイオン顕微鏡を用いたアクティブ電圧コントラストの影響を反映した二次電子像の研究2016

    • Author(s)
      酒井智香子, 石田暢之, 増田秀樹, 永野聖子, 北原昌代, 小形曜一郎, 藤田大介
    • Organizer
      日本表面科学会関東支部 第4回関東支部セミナー
    • Place of Presentation
      東京大学化学本館5階講堂(東京都、文京区)
    • Related Report
      2016 Research-status Report

URL: 

Published: 2016-04-21   Modified: 2019-03-29  

Information User Guide FAQ News Terms of Use Attribution of KAKENHI

Powered by NII kakenhi