3D morphometry of synapses with focused ion beam-scanning electron microscopy
| Project/Area Number |
16K14767
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| Research Category |
Grant-in-Aid for Challenging Exploratory Research
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| Allocation Type | Multi-year Fund |
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| Research Field |
Morphology/Structure
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| Research Institution | Nagoya University |
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Principal Investigator |
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| Research Collaborator |
深澤 有吾 福井大学, 教授
上田 奈津実 (石原 奈津実) 名古屋大学, 講師
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| Project Period (FY) |
2016-04-01 – 2018-03-31
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| Project Status |
Completed (Fiscal Year 2017)
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| Budget Amount *help |
¥3,640,000 (Direct Cost: ¥2,800,000、Indirect Cost: ¥840,000)
Fiscal Year 2017: ¥1,820,000 (Direct Cost: ¥1,400,000、Indirect Cost: ¥420,000)
Fiscal Year 2016: ¥1,820,000 (Direct Cost: ¥1,400,000、Indirect Cost: ¥420,000)
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| Keywords | シナプス / 形態計測 / ノックアウトマウス / 電子顕微鏡 / ssTEM / FIB-SEM / 3D再構築 / 3次元再構築 / 微細形態計測 / グリア突起 / 透過型電顕画像3次元再構築 / 集束イオンビーム走査電顕 |
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| Outline of Final Research Achievements |
In this study we acquired serial 2D images from conventionally prepared tissue samples from wild type and genetically engineered mouse brain and compared 3D reconstructed images by using conventional ssTEM and FIB-SEM (in collaboration with the Fukazawa lab at Fukui Univ.). FIB-SEM, but not ssTEM, found a unique anomaly in synapse morphology, mainly due to the thickness along Z-axis (5nm vs. 50nm), whereas ssTEM could cover wider volume than FIB-SEM. Comparison of the two methods with immunogold-labeled samples is under investigation.
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Report
(3 results)
Research Products
(6 results)
