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Development of an electron-attachment-type negative ion source

Research Project

Project/Area Number 16K17543
Research Category

Grant-in-Aid for Young Scientists (B)

Allocation TypeMulti-year Fund
Research Field Quantum beam science
Research InstitutionNational Institutes for Quantum and Radiological Science and Technology

Principal Investigator

Yamada Keisuke  国立研究開発法人量子科学技術研究開発機構, 高崎量子応用研究所 放射線高度利用施設部, 研究員(定常) (10414567)

Project Period (FY) 2016-04-01 – 2019-03-31
Project Status Completed (Fiscal Year 2018)
Budget Amount *help
¥4,420,000 (Direct Cost: ¥3,400,000、Indirect Cost: ¥1,020,000)
Fiscal Year 2018: ¥390,000 (Direct Cost: ¥300,000、Indirect Cost: ¥90,000)
Fiscal Year 2017: ¥1,560,000 (Direct Cost: ¥1,200,000、Indirect Cost: ¥360,000)
Fiscal Year 2016: ¥2,470,000 (Direct Cost: ¥1,900,000、Indirect Cost: ¥570,000)
Keywords負イオン源 / フラーレン / イオン源 / 負イオン
Outline of Final Research Achievements

We have developed an electron-attachment-type negative fullerene (C60) ion source to intensify the incident negative ion beam current to a tandem accelerator. In this ion source, the sublimated C60 is negatively ionized by capturing a low-energy electron. An ion source with a filament as an electron source was constructed, and negative ion beam current extracted from the ion source was measured. In the result, the intensity of the negative C60 ion beam by the ion source became ten thousand times higher than that by the cesium sputter type ion source.

Academic Significance and Societal Importance of the Research Achievements

MeV級エネルギーのC60イオンビームは、極めて高い二次イオン収量を利用した高感度二次イオン分析や、重イオン照射では困難な無機材料中へのイオントラック形成を可能にし、分析技術及び新機能材料開発の新しいツールであるが、得られるビーム電流の低さがこれらの開発を進める上での課題となっていた。本研究成果により、タンデム加速器を用いて高強度のC60イオンビームの生成が可能となり、これら研究開発の加速・新展開が望める。

Report

(4 results)
  • 2018 Annual Research Report   Final Research Report ( PDF )
  • 2017 Research-status Report
  • 2016 Research-status Report
  • Research Products

    (6 results)

All 2018 2017 2016

All Journal Article (1 results) (of which Peer Reviewed: 1 results) Presentation (5 results) (of which Int'l Joint Research: 1 results)

  • [Journal Article] Development of an electron-attachment-type negative fullerene ion source2018

    • Author(s)
      K. Yamada, A. Chiba, Y. Hirano, Y. Saitoh
    • Journal Title

      AIP Conference Proceedings

      Volume: 2011 Pages: 0500201-0500203

    • DOI

      10.1063/1.5053318

    • Related Report
      2018 Annual Research Report
    • Peer Reviewed
  • [Presentation] MeV級C60イオンビームの高強度化に向けた負イオン源の開発2018

    • Author(s)
      山田圭介、千葉敦也、平野貴美、鳴海一雅、齋藤勇一
    • Organizer
      第17回放射線プロセスシンポジウム
    • Related Report
      2018 Annual Research Report
  • [Presentation] 量研高崎におけるC60負イオン源の開発状況2017

    • Author(s)
      山田圭介
    • Organizer
      かけはし:TIA連携プログラム探索推進事業シンポジウム
    • Related Report
      2017 Research-status Report
  • [Presentation] Development of an Electron-Attachment-Type Negative Fullerene Ion Source2017

    • Author(s)
      山田圭介、千葉敦也、平野貴美、齋藤勇一
    • Organizer
      17th International Conference on Ion Sources
    • Related Report
      2017 Research-status Report
    • Int'l Joint Research
  • [Presentation] 電子付着型フラーレン負イオン源の開発2017

    • Author(s)
      山田圭介、千葉敦也、平野貴美、齋藤勇一
    • Organizer
      QST高崎サイエンスフェスタ2017
    • Related Report
      2017 Research-status Report
  • [Presentation] フラーレン負イオン源の開発2016

    • Author(s)
      山田圭介、千葉敦也、横山彰人、齋藤勇一、鳴海一雅
    • Organizer
      第13回日本加速器学会年会
    • Place of Presentation
      幕張メッセ (千葉県・千葉市)
    • Year and Date
      2016-08-08
    • Related Report
      2016 Research-status Report

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Published: 2016-04-21   Modified: 2020-03-30  

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