Development of X-ray stress measurement technique to achieve accurate evaluation for strength of polygranular graphite
| Project/Area Number |
16K17983
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| Research Category |
Grant-in-Aid for Young Scientists (B)
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| Allocation Type | Multi-year Fund |
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| Research Field |
Materials/Mechanics of materials
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| Research Institution | Tokyo City University |
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Principal Investigator |
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| Project Period (FY) |
2016-04-01 – 2018-03-31
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| Project Status |
Completed (Fiscal Year 2017)
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| Budget Amount *help |
¥3,120,000 (Direct Cost: ¥2,400,000、Indirect Cost: ¥720,000)
Fiscal Year 2017: ¥910,000 (Direct Cost: ¥700,000、Indirect Cost: ¥210,000)
Fiscal Year 2016: ¥2,210,000 (Direct Cost: ¥1,700,000、Indirect Cost: ¥510,000)
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| Keywords | X線応力測定 / 黒鉛 / 残留応力 / X線回折 / Ｘ線 / 機械材料・材料力学 / 解析・評価 |
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| Outline of Final Research Achievements |
A polygranular graphite consists of graphite crystallites. A graphite has strong elastic and strength anisotropy due to its crystal structure, especially in-plane and out-of-plane directions. To reveal mechanical behavior in several directions, stress measurements in several directions are required. In this study, to realize the measurements, a ψ-diffraction X-ray stress measurement system was developed that is equipped a cradle stage onto the current Ω-diffraction X-ray stress measurement system. This system can measure diffractions from 004 indices
The measurements using Ω-diffraction X-ray stress measurements were also conducted for the measurements of several directions. Stress measurements were performed during applying stress by four-point bending or uniaxial compressing on the specimens. The relationship between applied macroscopic stress and measured stress by X-ray stress measurement, which corresponds to elastic lattice strain in each crystal direction, were revealed.
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Report
(3 results)
Research Products
(3 results)
