Study on Scanning Method of Residual Stress by using High Energy White X-rays
Project/Area Number |
17560058
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Research Category |
Grant-in-Aid for Scientific Research (C)
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Allocation Type | Single-year Grants |
Section | 一般 |
Research Field |
Materials/Mechanics of materials
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Research Institution | Kitami Institute of Technology |
Principal Investigator |
SHIBANO Junichi Kitami Institute of Technology, Dept.of Mechanical Engineering, Assoc. Professor, 工学部, 助教授 (60206141)
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Co-Investigator(Kenkyū-buntansha) |
SUZUKI Kenji Niigata University, Dept.of Technology and Living Sciences, Professor, 人文社会・教育科学系, 教授 (30154537)
SHOBU Takahisa Kansai Photon Science Institute, JAEA, Staff, 量子ビーム応用研究部門, 技術開発協力員 (90425562)
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Project Period (FY) |
2005 – 2006
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Project Status |
Completed (Fiscal Year 2006)
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Budget Amount *help |
¥3,500,000 (Direct Cost: ¥3,500,000)
Fiscal Year 2006: ¥1,400,000 (Direct Cost: ¥1,400,000)
Fiscal Year 2005: ¥2,100,000 (Direct Cost: ¥2,100,000)
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Keywords | White X-rays / High energy X-rays / Synchrotron radiation / Internal strain / Residual stress / Non-destructive evaluation |
Research Abstract |
The strain in the bulk of material was measured using high energy white X-rays from a synchrotron radiation source of BL14B1 and BL28B2 of SPring-8 in Japan. An austenitic stainless steel (JIS-SUS30412) and WEL-TEN780E (JIS G3128 SHY685) were used for a specimen shaped into G type. The specimens were subjected to the bending. The white X-ray beam was incident in the specimen with the Bragg angle θ of 5 degree. Bending strain at the surface of specimen was measured by strain gauges. The strain in the loading direction of the specimen was obtained directly from a rate of change of peak energy of transmitted X-rays through the thickness. We investigated the effect of several factors on measurement accuracy, such as a grain size, an incident beam size, a measurement time, a diffracted X-ray profile, an intensity of diffracted X-ray, a thickness of specimen and Bragg angle. Results as shown below were obtained. (1) The internal strain of the steel material of thickness from 5mm to 15mm could be measured using white X-rays which range of energy from 60 keV to 150 keV. (2) It is suitable for the measurement with sufficient accuracy to include more than or equal to 5000 grains of crystal in the gauge volume. (3) The measurement error of strain could be decreased by using the diffracted beam with high energy, high peak count and the similar profile with the Gaussian distribution. (4) The measurement with a high degree of accuracy was accomplished using crFe321 diffraction in SHY685. (5) The measurement of the internal strain of the austenitic stainless steel was accomplished using simultaneously the strain data from several lattice planes of γ-Fe. (6) The high energy white X-ray is effective for the internal strain measurement in the depth of the order of millimeter.
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Report
(3 results)
Research Products
(6 results)
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[Journal Article] 高エネルギー白色X線による内部応力測定の検討2005
Author(s)
柴野純一, 他5名
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Journal Title
第40回X線材料強度に関するシンポジウム講演論文集 (Proceedings of The 40th Symposium on X-ray Studies on Mechanical Behaviour of Materials)
Pages: 166-171
Description
「研究成果報告書概要(和文)」より
Related Report
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[Journal Article] 高エネルギー白色X線による内部応力測定の検討2005
Author(s)
柴野純一, 他5名
-
Journal Title
第40回X線材料強度に関するシンポジウム講演論文集(Proceedings of The 40th Symposium on X-ray Studies on Mechanical Behaviour of Materials)
Pages: 166-171
Related Report