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Dvelopment of Sn-Bi Based Low Temperature Solders which Enables Step Soldering

Research Project

Project/Area Number 17560633
Research Category

Grant-in-Aid for Scientific Research (C)

Allocation TypeSingle-year Grants
Section一般
Research Field Material processing/treatments
Research InstitutionOsaka University

Principal Investigator

UENISHI Keisuke  Osaka University, Graduate school of Engineering, Associate Professor, 大学院工学研究科, 助教授 (80223478)

Co-Investigator(Kenkyū-buntansha) SATO Takehiko  Osaka University, Graduate school of Engineering, Professor, 大学院工学研究科, 教授 (60379112)
SHOUJI Ikuo  Gunma University, Faculty of Engineering, Associate Professor, 工学部, 助教授 (00323329)
Project Period (FY) 2005 – 2006
Project Status Completed (Fiscal Year 2006)
Budget Amount *help
¥3,600,000 (Direct Cost: ¥3,600,000)
Fiscal Year 2006: ¥1,000,000 (Direct Cost: ¥1,000,000)
Fiscal Year 2005: ¥2,600,000 (Direct Cost: ¥2,600,000)
KeywordsMicro Joining / Low Temperature Packaging / Lead Free Solder / Interfacial Reaction / Electronics Packaging / Evaluation of Reliabilty / Microstructure / Tin Bismuth Alloy
Research Abstract

Effect of Ag Addition to Sn-Bi Eutectic Solders on the Microstructure and Properties of Joints with Cu. About 0.5mass% of Ag addition to the Sn-Bi changes the eutectic microstructure fine through Sn-Bi-Ag3Sn ternary eutectic solidification. With decreasing the eutectic microstructure, the ductility increased more than that of Sn-Pb solders especially at the rapid stress speed. Addition of Ag more than 1 mass%, however, formed coarse and uniaxial Ag3Sn which decreased the ductility of solders. rand improved its ductility.
By using Sn-Ag-Bi solders with low melting temperature about 410K, low temperature reflow soldering with Cu pad can be achieved at 433K. Microjoint with Cu using Sn-Bi-Ag solder exhibited the comparable tensile strength and thermal cycle fatigue property with that of Sn-Ag-Cu solders. Be the advantages of the low temperature soldering at 433K, residual stress caused by reflow soldering became smaller and fracture between Cu pad and substrate was drastically supressed. For the joints using Sn-Bi-Ag, fracture by tensile test occurs at the interface between Cu6Sn5 reaction layer and solder. The degradation of joint strength during the aging was caused by the growth of reaction layer. The growth behavior of reaction layer, however, was eastimated to be almost same as that for the joints using Sn-Ag-Cu solders by the kinetic analysis.

Report

(3 results)
  • 2006 Annual Research Report   Final Research Report Summary
  • 2005 Annual Research Report
  • Research Products

    (17 results)

All 2007 2006 2005

All Journal Article (17 results)

  • [Journal Article] Sn-Bi系はんだを用いた低温実装による基板への熱負荷低減効果2007

    • Author(s)
      上西啓介
    • Journal Title

      Proc. 13th Sympo. on Micro joining and Assembly Technologies for Electronics Vol.13

      Pages: 211-214

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2006 Final Research Report Summary
  • [Journal Article] Effect of Low Temperature Soldering using Sn-Bi Based Solders on Depression of Thermal Stress in Substrates2007

    • Author(s)
      Keisuke UENISHI
    • Journal Title

      Proc.13th Sympo.on Microjoining and Assembly Technologies in Electronics Vol.13

      Pages: 211-214

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2006 Final Research Report Summary
  • [Journal Article] Sn-Bi系はんだを用いた低温実装による基板への熱負荷低減効果2007

    • Author(s)
      上西啓介
    • Journal Title

      Proc. 13th Sympo. on Microjoining and Assembly Technologies for Electronics Vo1.13

      Pages: 211-214

    • Related Report
      2006 Annual Research Report
  • [Journal Article] Ag添加Sn-Bi系はんだを用いた低温実装部の接合性評価2006

    • Author(s)
      鳥居久範
    • Journal Title

      MES2006第16回マイクロエレクトロニクスシンポジウム論文集 Vol.16

      Pages: 19-22

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2006 Final Research Report Summary
  • [Journal Article] Sn-Ag系はんだと各種バリア金属との接合性評価2006

    • Author(s)
      小山晃弘
    • Journal Title

      MES2006第16回マイクロエレクトロニクスシンポジウム論文集 Vol.16

      Pages: 175-178

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2006 Final Research Report Summary
  • [Journal Article] Ag添加したSn-Bi系共晶はんだの組織と強度2006

    • Author(s)
      中嶋清吾
    • Journal Title

      Proc. 12th Sympo. on Microjoining and Assembly Technologies for Electronics Vol.12

      Pages: 19-22

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2006 Final Research Report Summary 2005 Annual Research Report
  • [Journal Article] 低融点はんだを用いたFlip-chip BGAはんだ接合部の信頼性2006

    • Author(s)
      赤松俊也
    • Journal Title

      Proc. 12th Sympo. on Microjoining and Assembly Technologies for Electronics Vol.12

      Pages: 259-264

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2006 Final Research Report Summary 2005 Annual Research Report
  • [Journal Article] Joint property of packages prepared by low temperature soldering using Ag added Sn-Bi solders2006

    • Author(s)
      Hisanori TORII
    • Journal Title

      Proceedings of 16th Symposium on Micro Electronics (MES2006) Vol.16

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2006 Final Research Report Summary
  • [Journal Article] Solderability of joints between Sn-Ag based solders and various barrier metals2006

    • Author(s)
      Akihiro OYAMA
    • Journal Title

      Proceedings of 16th Symposium on Micro Electronics (MES2006) Vol.16

      Pages: 175-178

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2006 Final Research Report Summary
  • [Journal Article] Microstructure and Strength of Ag Added Eutectic Sn-Bi Solders2006

    • Author(s)
      Seigo NAKAJIMA
    • Journal Title

      Proc.12th Sympo on Microjoining and Assembly Technologies in Electronics Vol.12

      Pages: 19-22

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2006 Final Research Report Summary
  • [Journal Article] Solder Joint Reliability of Flip-Chip BGA by Using Sn-Bi System Solder2006

    • Author(s)
      Toshiya AKAMATSU
    • Journal Title

      Proc.12th Sympo on Microjoining and Assembly Technology in Electronics Vol.12

      Pages: 259-264

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2006 Final Research Report Summary
  • [Journal Article] Ag添加Sn-Bi系はんだを用いた低温実装部の接合性評価2006

    • Author(s)
      鳥居久範
    • Journal Title

      MES2006 第16回マイクロエレクトロニクスシンポジウム論文集 Vol.16

      Pages: 19-22

    • Related Report
      2006 Annual Research Report
  • [Journal Article] Sn-Ag系はんだと各種バリア金属との接合性評価2006

    • Author(s)
      小山晃弘
    • Journal Title

      MES2006 第16回マイクロエレクトロニクスシンポジウム論文集 Vo1.16

      Pages: 175-178

    • Related Report
      2006 Annual Research Report
  • [Journal Article] 各種バリア金属材料とSn-Ag系はんだとの接合界面組織2006

    • Author(s)
      田中里英子
    • Journal Title

      Proc. 12th Sympo. on Microjoining and Assembly Technologies for Electronics Vol.12

      Pages: 145-148

    • Related Report
      2005 Annual Research Report
  • [Journal Article] Interfacial Reaction between Sn-Ag Based Solders and Au/Ni Alloy Platings2005

    • Author(s)
      Keisuke Uenishi
    • Journal Title

      Materials Science Forum Vol.502

      Pages: 411-416

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2006 Final Research Report Summary 2005 Annual Research Report
  • [Journal Article] Interfacial Reaction between Sn-Ag Based Solders and Au/Ni Alloy Platings2005

    • Author(s)
      Keisuke UENISHI
    • Journal Title

      Materials Science Forum Vol.502

      Pages: 411-416

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2006 Final Research Report Summary
  • [Journal Article] Reactivity between Sn-Ag Solder and Au/Ni-Co Plating to Form Intermetallic Phases2005

    • Author(s)
      Takashi Yamamoto
    • Journal Title

      Materials Transaction Vol.46 No.11

      Pages: 2406-2412

    • Related Report
      2005 Annual Research Report

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Published: 2005-04-01   Modified: 2016-04-21  

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