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Elucidation of structural properties of ferroelectric domains revealed by in-situ biasing together with microsecond HVEM observation

Research Project

Project/Area Number 17H02746
Research Category

Grant-in-Aid for Scientific Research (B)

Allocation TypeSingle-year Grants
Section一般
Research Field Nanomaterials engineering
Research InstitutionOsaka University

Principal Investigator

Sato Kazuhisa  大阪大学, 超高圧電子顕微鏡センター, 准教授 (70314424)

Project Period (FY) 2017-04-01 – 2020-03-31
Project Status Completed (Fiscal Year 2019)
Budget Amount *help
¥17,550,000 (Direct Cost: ¥13,500,000、Indirect Cost: ¥4,050,000)
Fiscal Year 2019: ¥5,590,000 (Direct Cost: ¥4,300,000、Indirect Cost: ¥1,290,000)
Fiscal Year 2018: ¥7,020,000 (Direct Cost: ¥5,400,000、Indirect Cost: ¥1,620,000)
Fiscal Year 2017: ¥4,940,000 (Direct Cost: ¥3,800,000、Indirect Cost: ¥1,140,000)
Keywords電場印加 / マイクロ秒観察 / 時間分解 / 超高圧電子顕微鏡 / リラクサー強誘電体 / 強誘電体
Outline of Final Research Achievements

Ferroelectric materials such as PMN-PT are known as relaxor ferroelectrics characterized by inhomogeneous nanostructures known as polar nano-regions. To elucidate ferroelectric domain switching mechanism, we employed in situ biasing in a high-voltage electron microscope (HVEM) equipped with a direct electron detection (DED) CMOS camera. We developed a novel electrical biasing specimen holder for in situ HVEM observation. The DED camera enables fast image acquisition with a frame rate of 400 fps. Microstructures of the PMN-0.3PT specimens were composed of ferroelectric domains, 100~200 nm in sizes, oriented [110] and [1-10] directions. By applying electric field (1 kV/mm) in the [110] directions, domain switching initiated at a corner of a domain, and propagated rapidly. Domain switching kinetics was analyzed based on the Kolmogolov-Avrami-Ishibashi model and found that the switching proceeds via two-dimensional nucleation and growth (n = 2.4-3.2).

Academic Significance and Societal Importance of the Research Achievements

本研究の大きな特徴は、超高圧電子顕微鏡を活用したバルク強誘電体試料の電場印加その場観察にある。実デバイスを模擬したバルク状厚膜試料を用いて、組成相境界近傍における強誘電体ドメイン構造とその電場応答を従来にない1/400秒スケールで可視化した点に学術的意義がある。リラクサー現象の構造物性を明らかにする上で、バルク単結晶に近い厚膜試料を対象とした電場印加高速その場観察法の実現は、統計的信頼性の観点から非常に有用と考えられ、広範な用途を有するリラクサー強誘電体材料開発のための研究手法として今後の発展が期待される。

Report

(5 results)
  • 2019 Annual Research Report   Final Research Report ( PDF )
  • 2018 Annual Research Report
  • 2017 Annual Research Report
  • Products Report
  • Research Products

    (25 results)

All 2021 2020 2019 2018 2017

All Journal Article (7 results) (of which Peer Reviewed: 7 results,  Open Access: 3 results) Presentation (18 results) (of which Int'l Joint Research: 4 results,  Invited: 4 results)

  • [Journal Article] Domain Switching dynamics in relaxor ferroelectric Pb (Mg_<1/3>Nb_<2/3>) O_3-PbTiO_3 revealed by time-resolved high-voltage electron microscopy2021

    • Author(s)
      Kazuhisa Sato and Naoya Asakura
    • Journal Title

      Journal of Applied Physics

      Volume: 130 Issue: 16

    • DOI

      10.1063/5.0064291

    • Related Report
      Products Report
    • Peer Reviewed
  • [Journal Article] Athermal Crystal Defect Dynamics in Si Revealed by Cryo-High-Voltage Electron Microscopy2020

    • Author(s)
      Sato Kazuhisa、Yasuda Hidehiro
    • Journal Title

      ACS Omega

      Volume: 5 Issue: 3 Pages: 1457-1462

    • DOI

      10.1021/acsomega.9b03028

    • Related Report
      2019 Annual Research Report
    • Peer Reviewed / Open Access
  • [Journal Article] High-Voltage Scanning Transmission Electron Microscopy: A Tool for Structural Characterization of Micrometer-Thick Specimens2019

    • Author(s)
      Sato Kazuhisa、Yamashita Yuki、Yasuda Hidehiro、Mori Hirotaro
    • Journal Title

      MATERIALS TRANSACTIONS

      Volume: 60 Issue: 5 Pages: 675-677

    • DOI

      10.2320/matertrans.MC201801

    • NAID

      130007636513

    • ISSN
      1345-9678, 1347-5320
    • Year and Date
      2019-05-01
    • Related Report
      2018 Annual Research Report
    • Peer Reviewed / Open Access
  • [Journal Article] Probing threading dislocations in a micrometer-thick GaN film by high-voltage scanning transmission electron microscopy2019

    • Author(s)
      K. Sato and H. Yasuda
    • Journal Title

      Microscopy & Microanalysis

      Volume: 25(Suppl 2) Issue: S2 Pages: 842-843

    • DOI

      10.1017/s143192761900494x

    • Related Report
      2019 Annual Research Report
    • Peer Reviewed
  • [Journal Article] 超高圧電子顕微鏡による観察可能試料厚さの定量評価2019

    • Author(s)
      佐藤和久, 保田英洋
    • Journal Title

      セラミックス

      Volume: 54 Pages: 90-93

    • NAID

      130007507525

    • Related Report
      2018 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Probing crystal dislocations in a micrometer-thick GaN film by modern high-voltage electron microscopy2018

    • Author(s)
      K. Sato and H. Yasuda
    • Journal Title

      ACS Omega

      Volume: 3 Issue: 10 Pages: 13524-13529

    • DOI

      10.1021/acsomega.8b02078

    • Related Report
      2018 Annual Research Report
    • Peer Reviewed / Open Access
  • [Journal Article] Maximum usable thickness revisited: Imaging dislocations in Si by modern high-voltage scanning transmission electron microscopy2017

    • Author(s)
      Kazuhisa Sato, Yuki Yamashita, Hidehiro Yasuda, and Hirotaro Mori
    • Journal Title

      Japanese Journal of Applied Physics

      Volume: 56 Issue: 10 Pages: 1003041-4

    • DOI

      10.7567/jjap.56.100304

    • NAID

      210000148310

    • Related Report
      2017 Annual Research Report
    • Peer Reviewed
  • [Presentation] 超高圧電子顕微鏡を活用した材料組織変化の高速その場観察2021

    • Author(s)
      佐藤 和久
    • Organizer
      日本顕微鏡学会関西支部特別講演会
    • Related Report
      Products Report
    • Invited
  • [Presentation] リラクサードメイン構造の電場印加その場超高圧電子顕微鏡観察2020

    • Author(s)
      佐藤和久, 朝倉直哉, 保田英洋
    • Organizer
      日本顕微鏡学会第76回学術講演会
    • Related Report
      2019 Annual Research Report
  • [Presentation] Pb(Mg1/3Nb2/3)O3-PbTiO3における微細ドメイン構造の電場印加その場超高圧電子顕微鏡観察2020

    • Author(s)
      佐藤和久, 朝倉直哉, 保田英洋
    • Organizer
      日本金属学会第166回(2020年春期)講演大会
    • Related Report
      2019 Annual Research Report
  • [Presentation] Evaluation of the maximum usable thickness of semiconductor crystals in high-voltage scanning transmission electron microscopy2020

    • Author(s)
      K. Sato and H. Yasuda
    • Organizer
      12th Asia-Pacific Microscopy Conference (APMC-2020)
    • Related Report
      2019 Annual Research Report
    • Int'l Joint Research / Invited
  • [Presentation] 超高圧電子顕微鏡を活用したリラクサードメイン構造の電場印加マイクロ秒観察2019

    • Author(s)
      佐藤和久, 朝倉直哉, 保田英洋
    • Organizer
      東北大学金属材料研究所ワークショップ「強誘電体関連物質の機能発現に関する構造科学の新展開」
    • Related Report
      2019 Annual Research Report
    • Invited
  • [Presentation] Probing threading dislocations in a micrometer-thick GaN film by high-voltage scanning transmission electron microscopy2019

    • Author(s)
      K. Sato and H. Yasuda
    • Organizer
      Microscopy & Microanalysis 2019
    • Related Report
      2019 Annual Research Report
    • Int'l Joint Research
  • [Presentation] クライオ超高圧電子顕微鏡によるSi{113}欠陥の生成・消滅過程2019

    • Author(s)
      佐藤和久, 保田英洋
    • Organizer
      日本物理学会第74回年次大会
    • Related Report
      2018 Annual Research Report
  • [Presentation] 低温電子照射によりSi(110)単結晶に導入される{113}欠陥の超高圧電子顕微鏡観察2018

    • Author(s)
      佐藤和久, 保田英洋
    • Organizer
      日本金属学会2018年秋期(第163回)講演大会
    • Related Report
      2018 Annual Research Report
  • [Presentation] Evaluation of the maximum usable thickness of semiconductor specimens in high-voltage scanning transmission electron microscopy2018

    • Author(s)
      K. Sato, Y. Yamashita, H. Yasuda, and H. Mori
    • Organizer
      12th Japanese-Polish Joint Seminar on Macro and Nano Analysis
    • Related Report
      2018 Annual Research Report
    • Int'l Joint Research / Invited
  • [Presentation] 低温電子照射によりSiに導入される格子欠陥のクライオ超高圧電子顕微鏡観察2018

    • Author(s)
      佐藤和久, 保田英洋
    • Organizer
      日本顕微鏡学会第74回学術講演会
    • Related Report
      2018 Annual Research Report
  • [Presentation] 1MV STEMによるGaN厚膜試料中の転位の観察2018

    • Author(s)
      佐藤和久, 山下悠輝, 保田英洋, 森博太郎
    • Organizer
      日本顕微鏡学会第74回学術講演会
    • Related Report
      2018 Annual Research Report
  • [Presentation] 超高圧電子顕微鏡によるGaN厚膜試料における観察可能試料厚さの定量評価2018

    • Author(s)
      佐藤和久, 山下悠輝, 保田英洋, 森博太郎
    • Organizer
      日本物理学会第73回年次大会
    • Related Report
      2017 Annual Research Report
  • [Presentation] 電場印加による強誘電体ドメイン構造変化の超高圧電子顕微鏡その場観察2018

    • Author(s)
      朝倉直哉, 佐藤和久, 保田英洋
    • Organizer
      日本金属学会関西支部 材料物性工学談話会平成29年度第2回講演会&ポスター発表会
    • Related Report
      2017 Annual Research Report
  • [Presentation] 超高圧電子顕微鏡を用いた1/400秒スケールその場観察と極厚試料における観察可能厚さの定量評価2017

    • Author(s)
      佐藤和久, 保田英洋
    • Organizer
      超顕微科学研究拠点事業平成29年度研究発表会
    • Related Report
      2017 Annual Research Report
  • [Presentation] Maximum usable thickness revisited: Imaging dislocations in semiconductors by modern high-voltage scanning transmission electron microscopy2017

    • Author(s)
      K. Sato, Y. Yamashita, H. Yasuda, and H. Mori
    • Organizer
      The 3rd East-Asia Microscopy Conference (EAMC3)
    • Related Report
      2017 Annual Research Report
    • Int'l Joint Research
  • [Presentation] 超高圧電子顕微鏡による観察可能試料厚さの定量評価2017

    • Author(s)
      佐藤和久, 山下悠輝, 保田英洋, 森博太郎
    • Organizer
      日本物理学会2017年秋季大会
    • Related Report
      2017 Annual Research Report
  • [Presentation] 超高圧電子顕微鏡による観察可能試料厚さの評価2017

    • Author(s)
      佐藤和久, 山下悠輝, 保田英洋, 森博太郎
    • Organizer
      日本金属学会2017年秋期(第161回)講演大会
    • Related Report
      2017 Annual Research Report
  • [Presentation] 電場印加による強誘電体ドメイン構造変化の超高圧電子顕微鏡その場観察2017

    • Author(s)
      朝倉直哉, 佐藤和久, 保田英洋
    • Organizer
      日本金属学会2017年秋期(第161回)講演大会
    • Related Report
      2017 Annual Research Report

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Published: 2017-04-28   Modified: 2023-03-30  

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