• Search Research Projects
  • Search Researchers
  • How to Use
  1. Back to previous page

Performance enhancement for Ge optical devices by applying local strain to Ge-On-Insulator substrates

Research Project

Project/Area Number 17H03237
Research Category

Grant-in-Aid for Scientific Research (B)

Allocation TypeSingle-year Grants
Section一般
Research Field Electronic materials/Electric materials
Research InstitutionKyushu University

Principal Investigator

Wang Dong  九州大学, 総合理工学研究院, 准教授 (10419616)

Co-Investigator(Kenkyū-buntansha) 中島 寛  九州大学, グローバルイノベーションセンター, 教授 (70172301)
Project Period (FY) 2017-04-01 – 2020-03-31
Project Status Completed (Fiscal Year 2019)
Budget Amount *help
¥18,460,000 (Direct Cost: ¥14,200,000、Indirect Cost: ¥4,260,000)
Fiscal Year 2019: ¥2,210,000 (Direct Cost: ¥1,700,000、Indirect Cost: ¥510,000)
Fiscal Year 2018: ¥2,080,000 (Direct Cost: ¥1,600,000、Indirect Cost: ¥480,000)
Fiscal Year 2017: ¥14,170,000 (Direct Cost: ¥10,900,000、Indirect Cost: ¥3,270,000)
KeywordsGe-光素子 / Ge-On-Insulator / Ge/絶縁膜界面 / 横方向発光・受光 / チップ内光配線 / 金属/半導体コンタクト / 金属/半導体コンタクト / 局所歪み
Outline of Final Research Achievements

In this research, high-quality Ge-On-Insulator(GOI)substrate was fabricated by improving the conventional smart-cut method. To evaluate border traps located near to the interface of Ge/insulator, an evaluation method was established based on the measurement of deep level transient spectroscopy. Through this method, the density and special distribution of border traps were precisely characterized. In addition, local-strain introduction was also investigated. Based on these results, optical devices were fabricated on GOI substrates by optimizing the parameters of fabrication process. Furthermore, a lateral light-emission and photo-detection structure was fabricated on GOI, and optical communication between the light-emitter and the photo-detector were successfully confirmed.

Academic Significance and Societal Importance of the Research Achievements

本研究では、高品質なGOI基板を自前で試作し、他グループでは決して実現できないGOI基板上の光素子を高度化し、Ge-光素子の性能の飛躍的向上を図った。更に、局所歪み導入・結晶欠陥制御、Ge/絶縁膜界面の理解と制御、デバイス試作等の幅広い見地から研究を推進し、光デバイス工学、半導体工学に大きく寄与したと考えている。開発した高性能GOI発光・受光素子の基盤技術は、超スマート社会の実現に貢献できるものと期待できる。

Report

(4 results)
  • 2019 Annual Research Report   Final Research Report ( PDF )
  • 2018 Annual Research Report
  • 2017 Annual Research Report
  • Research Products

    (48 results)

All 2020 2019 2018 2017 Other

All Int'l Joint Research (3 results) Journal Article (9 results) (of which Int'l Joint Research: 2 results,  Peer Reviewed: 9 results) Presentation (35 results) (of which Int'l Joint Research: 20 results,  Invited: 6 results) Remarks (1 results)

  • [Int'l Joint Research] 中国科学院上海マイクロシステムと情報技術研究所(中国)

    • Related Report
      2019 Annual Research Report
  • [Int'l Joint Research] 中国科学院上海マイクロシステムと情報技術研究所(中国)

    • Related Report
      2018 Annual Research Report
  • [Int'l Joint Research] 中国科学院上海マイクロシステムと情報技術研究所(中国)

    • Related Report
      2017 Annual Research Report
  • [Journal Article] High interfacial quality metal-oxide-semiconductor capacitor on (111) oriented 3C-SiC with Al2O3 interlayer and its internal charge analysis2020

    • Author(s)
      Oka Ryusei、Yamamoto Keisuke、Akamine Hiroshi、Wang Dong、Nakashima Hiroshi、Hishiki Shigeomi、Kawamura Keisuke
    • Journal Title

      Japanese Journal of Applied Physics

      Volume: 59 Issue: SG Pages: SGGD17-SGGD17

    • DOI

      10.35848/1347-4065/ab6862

    • Related Report
      2019 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Conduction Type Control of Ge-on-Insulator: Combination of Smart-Cut(TM) and Defect Elimination2019

    • Author(s)
      Keisuke Yamamoto, Kohei Nakae, Hiroshi Akamine, Dong Wang, Hiroshi Nakashima, Md. M Alam, Kentarou Sawano, Zhongying Xue, Miao Zhang, Zengfeng Di
    • Journal Title

      ECS transactions

      Volume: 93 Issue: 1 Pages: 73-77

    • DOI

      10.1149/09301.0073ecst

    • Related Report
      2019 Annual Research Report
    • Peer Reviewed / Int'l Joint Research
  • [Journal Article] Border-Trap Characterization for Ge Gate Stacks Using Deep-Level Transient Spectroscopy2019

    • Author(s)
      Hiroshi Nakashima, Wei-Chen Wen, Keisuke Yamamoto, Dong Wang
    • Journal Title

      ECS transactions

      Volume: 92 Issue: 4 Pages: 3-10

    • DOI

      10.1149/09204.0003ecst

    • Related Report
      2019 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Ge field-effect transistor with asymmetric metal source/drain fabricated on Ge-on-Insulator: Schottky tunneling source mode operation and conventional mode operation2019

    • Author(s)
      Yamamoto Keisuke、Nakae Kohei、Wang Dong、Nakashima Hiroshi、Xue Zhongying、Zhang Miao、Di Zengfeng
    • Journal Title

      Japanese Journal of Applied Physics

      Volume: 58 Issue: SB Pages: SBBA14-SBBA14

    • DOI

      10.7567/1347-4065/ab02e3

    • NAID

      210000155626

    • Related Report
      2018 Annual Research Report
    • Peer Reviewed / Int'l Joint Research
  • [Journal Article] Fabrication and characterization of asymmetric metal/Ge/metal diodes with Ge-on-insulator substrate2019

    • Author(s)
      Maekrua Takayuki、Goto Taiki、Nakae Kohei、Yamamoto Keisuke、Nakashima Hiroshi、Wang Dong
    • Journal Title

      Japanese Journal of Applied Physics

      Volume: 58 Issue: SB Pages: SBBE05-SBBE05

    • DOI

      10.7567/1347-4065/aafb5e

    • NAID

      210000135344

    • Related Report
      2018 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Wide range control of Schottky barrier heights at metal/Ge interfaces with nitrogen-contained amorphous interlayers formed during ZrN sputter deposition2018

    • Author(s)
      Yamamoto K、Noguchi R、Mitsuhara M、Nishida M、Hara T、Wang D、Nakashima H
    • Journal Title

      Semiconductor Science and Technology

      Volume: 33 Issue: 11 Pages: 114011-114011

    • DOI

      10.1088/1361-6641/aae4bd

    • Related Report
      2018 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Border trap evaluation for SiO2/GeO2/Ge gate stacks using deep-level transient spectroscopy2018

    • Author(s)
      Wen Wei-Chen、Yamamoto Keisuke、Wang Dong、Nakashima Hiroshi
    • Journal Title

      Journal of Applied Physics

      Volume: 124 Issue: 20

    • DOI

      10.1063/1.5055291

    • Related Report
      2018 Annual Research Report
    • Peer Reviewed
  • [Journal Article] (Invited) Achievement of Ultralow Contact Resistivity of Metal/n+-Ge Contacts with Zr-N-Ge Amorphous Interlayer2017

    • Author(s)
      Nakashima Hiroshi、Okamoto Hayato、Yamamoto Keisuke、Wang Dong
    • Journal Title

      ECS transactions

      Volume: 80 Issue: 4 Pages: 97-106

    • DOI

      10.1149/08004.0097ecst

    • Related Report
      2017 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Effect of n-type doping level on direct band gap electroluminescence intensity for asymmetric metal/Ge/metal diodes2017

    • Author(s)
      Maekura T、Tanaka K、Motoyama C、Yoneda R、Yamamoto K、Nakashima H、Wang D
    • Journal Title

      Semiconductor Science and Technology

      Volume: 32 Issue: 10 Pages: 104001-104001

    • DOI

      10.1088/1361-6641/aa827f

    • Related Report
      2017 Annual Research Report
    • Peer Reviewed
  • [Presentation] Conduction Type Control of Ge-on-Insulator: Combination of Smart-Cut and Defect Elimination2019

    • Author(s)
      K. Yamamoto, K. Nakae, H. Akamine, D. Wang, H. Nakashima, Md. M. Alam, K. Sawano, Z. Xue, M. Zhang, Z. Di
    • Organizer
      2nd Joint ISTDM / ICSI 2019 Conference
    • Related Report
      2019 Annual Research Report
    • Int'l Joint Research
  • [Presentation] Border Trap Evaluation for Al2O3/GeOX/p-Ge Gate Stacks using Deep-Level Transient Spectroscopy2019

    • Author(s)
      W.-C. Wen, K. Yamamoto, D. Wang, H. Nakashima
    • Organizer
      2nd Joint ISTDM / ICSI 2019 Conference
    • Related Report
      2019 Annual Research Report
    • Int'l Joint Research
  • [Presentation] Low temperature (<300oC Fabrication of Ge MOS Structure for Advanced Electronic Devices2019

    • Author(s)
      K. Iseri, W.-C. Wen, K. Yamamoto, D. Wang, H. Nakashima
    • Organizer
      2019 International Conference on Solid State Devices and Materials (SSDM2019)
    • Related Report
      2019 Annual Research Report
    • Int'l Joint Research
  • [Presentation] Demonstration of n-MOSFET operation and charge analysis of SiO2/Al2O3 gate dielectric on (111) oriented 3C-SiC2019

    • Author(s)
      R. Oka, K. Yamamoto, D. Wang, H. Nakashima, S. Hishiki, K. Kawamura
    • Organizer
      2019 International Conference on Solid State Devices and Materials (SSDM2019)
    • Related Report
      2019 Annual Research Report
    • Int'l Joint Research
  • [Presentation] 新規電子デバイス応用に向けたGeゲートスタックの低温(<300°C)形成2019

    • Author(s)
      井芹 健人、温 偉辰、山本 圭介、王 冬、中島 寛
    • Organizer
      2019年第80回応用物理学会秋季学術講演会
    • Related Report
      2019 Annual Research Report
  • [Presentation] Evaluation of Border Traps in Al2O3/GeOx/p-Ge Stacks Using Deep-Level Transient Spectroscopy2019

    • Author(s)
      W.-C. Wen, K. Yamamoto, D. Wang, H. Nakashima
    • Organizer
      2019年第80回応用物理学会秋季学術講演会
    • Related Report
      2019 Annual Research Report
  • [Presentation] SiO2/Al2O3絶縁膜を有する3C-SiC n-MOSキャパシタとn-MOSFET動作2019

    • Author(s)
      山本 圭介、岡 龍誠、王 冬、中島 寛、菱木 繁臣、川村 啓介
    • Organizer
      2019年第80回応用物理学会秋季学術講演会
    • Related Report
      2019 Annual Research Report
  • [Presentation] SiO2/Al2O3絶縁膜を有する3C-SiC n-MOSキャパシタの固定電荷と界面ダイポール解析2019

    • Author(s)
      岡 龍誠、山本 圭介、王 冬、中島 寛、菱木 繁臣、川村 啓介
    • Organizer
      2019年第80回応用物理学会秋季学術講演会
    • Related Report
      2019 Annual Research Report
  • [Presentation] Border-Trap Characterization for Ge Gate Stacks Using Deep-Level Transient Spectroscopy2019

    • Author(s)
      H. Nakashima, W.-C. Wen, K. Yamamoto, D. Wang
    • Organizer
      236th ECS meeting
    • Related Report
      2019 Annual Research Report
    • Int'l Joint Research / Invited
  • [Presentation] Enhancement of direct band gap electroluminescence in asymmetric metal/Ge/metal diodes2019

    • Author(s)
      D. Wang, T. Maekura, K. Yamamoto, H. Nakashima
    • Organizer
      TACT 2019 International Thin Film Conference
    • Related Report
      2019 Annual Research Report
    • Int'l Joint Research / Invited
  • [Presentation] Study on Position of Border Traps in Al2O3/GeOx/p-Ge Gate Stacks Using Deep-Level Transient Spectroscopy2019

    • Author(s)
      W.-C. Wen, K. Yamamoto, D. Wang, H. Nakashima
    • Organizer
      8th International Symposium on Control of Semiconductor Interfaces
    • Related Report
      2019 Annual Research Report
    • Int'l Joint Research
  • [Presentation] Border-Trap Evaluation for SiO2/GeO2/Ge Gate Stacks Using Deep-Level Transient Spectroscopy2019

    • Author(s)
      H. Nakashima(Invited), W.-C. Wen, K. Yamamoto, D. Wang
    • Organizer
      8th International Symposium on Control of Semiconductor Interfaces
    • Related Report
      2019 Annual Research Report
    • Int'l Joint Research / Invited
  • [Presentation] 3C-SiC MOSFETの閾値電圧制御に向けたSiO2/Al2O3ゲートスタック中の固定電荷・界面ダイポールの解析2019

    • Author(s)
      岡 龍誠、山本 圭介、王 冬、中島 寛、菱木 繁臣、川村 啓介
    • Organizer
      第11回半導体材料・デバイスフォーラム
    • Related Report
      2019 Annual Research Report
  • [Presentation] Ambipolar operation of asymmetric Ge Schottky tunneling source field-effect transistor fabricated on Ge-on-Insulator2018

    • Author(s)
      K. Yamamoto, K. Nakae, D. Wang, H. Nakashima, Z. Xue, M. Zhang, Z. Di
    • Organizer
      2018 International Conference on Solid State Devices and Materiaals (SSDM2018)
    • Related Report
      2018 Annual Research Report
    • Int'l Joint Research
  • [Presentation] Fabrication and characterization of asymmetric metal/Ge/metal diodes with Ge-on-Insulator substrate2018

    • Author(s)
      T. Maekura, T. Goto, K. Nakae, K. Yamamoto, H. Nakashima, D. Wang
    • Organizer
      2018 International Conference on Solid State Devices and Materiaals (SSDM2018)
    • Related Report
      2018 Annual Research Report
    • Int'l Joint Research
  • [Presentation] Impact of Al2O3 interlayer for metal-oxide-semiconductor capacitor on (111) oriented 3C-SiC for electronic device application2018

    • Author(s)
      K. Yamamoto, D. Wang, H. Nakashima, S. Hishiki, K. Kawamura
    • Organizer
      2018 International Conference on Solid State Devices and Materiaals (SSDM2018)
    • Related Report
      2018 Annual Research Report
    • Int'l Joint Research
  • [Presentation] GOI基板を用いた非対称ー金属/Ge/金属構造光素子の作製・特性評価2018

    • Author(s)
      後藤 太希、前蔵 貴行、仲江 航平、山本 圭介、中島 寛、王 冬、Miao Zhang、Zhongying Xue、Zenfeng Di
    • Organizer
      2018年第79回応用物理学会秋季学術講演会
    • Related Report
      2018 Annual Research Report
  • [Presentation] Smart-Cut法を用いて作製したGe-on-Insulatorの極性変化2018

    • Author(s)
      仲江 航平、薛 飛達、山本 圭介、王 冬、中島 寛、Miao Zhang、Zhongying Xue、Zenfeng Di
    • Organizer
      2018年第79回応用物理学会秋季学術講演会
    • Related Report
      2018 Annual Research Report
  • [Presentation] Low-temperature fabrication of Ge MOS capacitors for spintronics and flexible electronics application2018

    • Author(s)
      Wei-Chen Wen、Keisuke Yamamoto、Dong Wang、Hiroshi Nakashima
    • Organizer
      2018年第79回応用物理学会秋季学術講演会
    • Related Report
      2018 Annual Research Report
  • [Presentation] 電子ビーム蒸着によるGe上へのY酸化物系ゲート絶縁膜形成2018

    • Author(s)
      秋山 健太郎、井芹 健人、温 偉辰、山本 圭介、王 冬、中島 寛
    • Organizer
      2018年第79回応用物理学会秋季学術講演会
    • Related Report
      2018 Annual Research Report
  • [Presentation] Border trap characterization using deep-level transient spectroscopy for GeO2/Gegate stacks grown by thermal oxidation and plasma oxidation2018

    • Author(s)
      Wei-Chen Wen、Keisuke Yamamoto、Dong Wang、Hiroshi Nakashima
    • Organizer
      シリコン材料の科学と技術フォーラム2018
    • Related Report
      2018 Annual Research Report
  • [Presentation] Fabrication of Ge MOS Capacitor by Metal Yttrium Oxidation2018

    • Author(s)
      K. Yamamoto, K. Akiyama, K. Iseri, W.-C. Wen, D. Wang, and H. Nakashima
    • Organizer
      12th International Workshop on New Group IV Semiconductor Nanoelectronics
    • Related Report
      2018 Annual Research Report
    • Int'l Joint Research / Invited
  • [Presentation] Border trap evaluation using deep-level transient spectroscopy for SiO2/GeO2/Ge gate stacks2018

    • Author(s)
      W.-C. Wen, K. Yamamoto, D. Wang, and H. Nakashima
    • Organizer
      12th International Workshop on New Group IV Semiconductor Nanoelectronics
    • Related Report
      2018 Annual Research Report
    • Int'l Joint Research
  • [Presentation] Direct band gap electroluminescence and photo detection in asymmetric metal/Ge/metal diodes2018

    • Author(s)
      D. Wang, T. Maekura, K. Yamamoto, H. Nakashima
    • Organizer
      Collaborative Conference on Materials Research (CCMR) 2018
    • Related Report
      2018 Annual Research Report
    • Int'l Joint Research / Invited
  • [Presentation] 遷移金属窒化物を用いた金属/Geコンタクトの障壁制御2018

    • Author(s)
      山本 圭介、光原 昌寿、王 冬、中島 寛
    • Organizer
      2018年第65回応用物理学会春季学術講演会
    • Related Report
      2017 Annual Research Report
  • [Presentation] Evaluation of border-traps in GeO2/Ge gate stacks grown by thermal oxidation and plasma oxidation2018

    • Author(s)
      W.-C. Wen, T. Sakaguchi, K. Yamamoto, D. Wang and H. Nakashima
    • Organizer
      2018年第65回応用物理学会春季学術講演会
    • Related Report
      2017 Annual Research Report
  • [Presentation] Near-interface border-traps characterization by deep-level transient spectroscopy for GeO2/Ge gate stacks2018

    • Author(s)
      H. Nakashima, W.-C. Wen, K. Yamamoto and D. Wang
    • Organizer
      11th International Workshop on New Group IV Semiconductor Nanoelectronics
    • Related Report
      2017 Annual Research Report
    • Int'l Joint Research
  • [Presentation] Achievement of Ultralow Contact Resistivity of Metal/n+-Ge Contacts with Zr-N-Ge Amorphous Interlayer2017

    • Author(s)
      H. Nakashima, H. Okamoto, K. Yamamoto, and D. Wang
    • Organizer
      232nd ECS meeting
    • Related Report
      2017 Annual Research Report
    • Int'l Joint Research / Invited
  • [Presentation] Dependence of Channel Mobility on Substrate Impurity Concentration for Metal Source/Drain Ge MOSFETs2017

    • Author(s)
      T. Sakaguchi, K. Akiyama, K. Yamamoto, D. Wang, and H. Nakashima
    • Organizer
      2017 International Conference on Solid State Devices and Materiaals (SSDM2017)
    • Related Report
      2017 Annual Research Report
    • Int'l Joint Research
  • [Presentation] Characterization of near-interface border-traps in GeO2/Ge gate stacks grown by low and high temperature thermal oxidation using deep-level transient spectroscopy2017

    • Author(s)
      W. -C. Wen, T. Sakaguchi, K. Yamamoto, D. Wang, and H. Nakashima
    • Organizer
      2017 International Conference on Solid State Devices and Materiaals (SSDM2017)
    • Related Report
      2017 Annual Research Report
    • Int'l Joint Research
  • [Presentation] 非晶質Ge界面層とNによるGeコンタクトの外因性準位とSファクターの変調(Ⅱ)2017

    • Author(s)
      板屋 航、仲江 航平、山本 圭介、王 冬、中島 寛
    • Organizer
      2017年第78回応用物理学会秋季学術講演会
    • Related Report
      2017 Annual Research Report
  • [Presentation] メタルS/D型 Ge n-MOSFET のチャネル移動度の基板濃度依存性2017

    • Author(s)
      坂口 大成、秋山 健太郎、山本 圭介、王 冬、中島 寛
    • Organizer
      2017年第78回応用物理学会秋季学術講演会
    • Related Report
      2017 Annual Research Report
  • [Presentation] Near-interface border traps characterization for GeO2/Ge gate stacks grown by low and high temperature thermal oxidation by using deep-level transient spectroscopy2017

    • Author(s)
      W. -C. Wen, T. Sakaguchi, K. Yamamoto, D. Wang, and H. Nakashima
    • Organizer
      2017年第78回応用物理学会秋季学術講演会
    • Related Report
      2017 Annual Research Report
  • [Presentation] Near-interface border-traps characterization by deep-level transient spectroscopy for GeO2/Ge gate stacks2017

    • Author(s)
      W.-C. Wen, T. Sakaguchi, K. Yamamoto, D. Wang, and H. Nakashima
    • Organizer
      The 10th International Conference on Silicon Epitaxy and heterostructures
    • Related Report
      2017 Annual Research Report
    • Int'l Joint Research
  • [Presentation] Effect of n-type doping level on direct band gap light emission intensity for asymmetric metal/Ge/metal diodes2017

    • Author(s)
      T. Maekura, C. Motoyama, K. Tanaka, K. Yamamoto, H. Nakashima, and D. Wang
    • Organizer
      The 10th International Conference on Silicon Epitaxy and heterostructures
    • Related Report
      2017 Annual Research Report
    • Int'l Joint Research
  • [Remarks] 中島・王研究室

    • URL

      http://www.gic.kyushu-u.ac.jp/nakasima/index.htm

    • Related Report
      2019 Annual Research Report 2018 Annual Research Report 2017 Annual Research Report

URL: 

Published: 2017-04-28   Modified: 2021-02-19  

Information User Guide FAQ News Terms of Use Attribution of KAKENHI

Powered by NII kakenhi