| Budget Amount *help |
¥4,550,000 (Direct Cost: ¥3,500,000、Indirect Cost: ¥1,050,000)
Fiscal Year 2019: ¥1,300,000 (Direct Cost: ¥1,000,000、Indirect Cost: ¥300,000)
Fiscal Year 2018: ¥1,170,000 (Direct Cost: ¥900,000、Indirect Cost: ¥270,000)
Fiscal Year 2017: ¥2,080,000 (Direct Cost: ¥1,600,000、Indirect Cost: ¥480,000)
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| Outline of Final Research Achievements |
Shrinking feature size of LSI, test and diagnosis for complex defects are getting more difficult. It is considered that defects on power supply network may affect the degree of power supply as further shrinkage. In this work, we proposed methods to test and diagnose defects on power supply network. As the results, we established basic methods to test and diagnose defects by specifying high power consuming areas which are strongly affected by defects, and controlling power consumption for the specified areas.
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