Understanding femtosecond X-ray damage processes via X-ray pump-X-ray probe scheme
| Project/Area Number |
17K14137
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| Research Category |
Grant-in-Aid for Young Scientists (B)
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| Allocation Type | Multi-year Fund |
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| Research Field |
Quantum beam science
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| Research Institution | Institute of Physical and Chemical Research |
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Principal Investigator |
Inoue Ichiro 国立研究開発法人理化学研究所, 放射光科学研究センター, 基礎科学特別研究員 (30783401)
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| Project Period (FY) |
2017-04-01 – 2019-03-31
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| Project Status |
Completed (Fiscal Year 2018)
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| Budget Amount *help |
¥3,380,000 (Direct Cost: ¥2,600,000、Indirect Cost: ¥780,000)
Fiscal Year 2018: ¥1,430,000 (Direct Cost: ¥1,100,000、Indirect Cost: ¥330,000)
Fiscal Year 2017: ¥1,950,000 (Direct Cost: ¥1,500,000、Indirect Cost: ¥450,000)
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| Keywords | X線自由電子レーザー / フェムト秒 / 放射損傷 / ポンププローブ法 / フェムト秒X線ダメージ / X線構造解析 |
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| Outline of Final Research Achievements |
To understand femtosecond damage processes induced by intense X-ray free-electron laser (XFEL) pulses, we performed a real-time observation of intense X-ray-induced electronic and structural changes in diamond through X-ray pump-X-ray probe diffraction technique using twin XFEL pulses with variable time separations. We find that chemical bonds of diamond are broken ~10 fs after XFEL irradiation, following inertial atomic motion caused by the interatomic potential changes.
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| Academic Significance and Societal Importance of the Research Achievements |
高強度のX線自由電子レーザー用いた実験では、パルス幅と同程度のフェムト秒時間スケールで起こるX線ダメージが無視できないという問題点がある。本研究によって明らかになった、電子励起による化学結合の切断や原子変位といったフェムト秒の時間スケールで起こるXFELの物質へのダメージ過程は、X線１分子構造解析などをはじめとした高強度XFELの利用実験を支える基礎となることが期待される。
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Report
(3 results)
Research Products
(18 results)
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[Presentation] Reflection self-seeding at SACLA2018
Author(s)
Inoue I., Osaka T., Inagaki T., Goto S., Hara T., Inubushi Y., Kinjo R., Ohashi H., Tanaka T., Togawa K., Tono K., Tanaka H., and Yabashi M.
Organizer
XOPT2018
Related Report
Int'l Joint Research
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