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Evaluation and improvement of physical properties of IGZO flexible semiconductors prepared by solution method

Research Project

Project/Area Number 17K18177
Research Category

Grant-in-Aid for Young Scientists (B)

Allocation TypeMulti-year Fund
Research Field Electronic materials/Electric materials
Condensed matter physics I
Research Institution防衛大学校(総合教育学群、人文社会科学群、応用科学群、電気情報学群及びシステム工学群) (2018)
Waseda University (2017)

Principal Investigator

Morimoto Takaaki  防衛大学校(総合教育学群、人文社会科学群、応用科学群、電気情報学群及びシステム工学群), 電気情報学群, 助教 (70754795)

Project Period (FY) 2017-04-01 – 2019-03-31
Project Status Completed (Fiscal Year 2018)
Budget Amount *help
¥4,290,000 (Direct Cost: ¥3,300,000、Indirect Cost: ¥990,000)
Fiscal Year 2018: ¥2,990,000 (Direct Cost: ¥2,300,000、Indirect Cost: ¥690,000)
Fiscal Year 2017: ¥1,300,000 (Direct Cost: ¥1,000,000、Indirect Cost: ¥300,000)
Keywords溶液法 / 酸化物半導体 / 透明半導体 / 酸素空孔 / フレキシブルデバイス / IGZO / TFT / X線光電子分光 / フォトルミネッセンス / センサー
Outline of Final Research Achievements

We confirmed that Indium-gallium-zinc-oxide thin film transistors (IGZO-TFT) with relatively high performance can be fabricated by solution process. On the other hand, optimization of the preparation conditions was insufficient. In this study, we investigated the effects of the conditions, and revealed that the on-current is large when the amount of In is large, the amount of Ga is small, and the sintering temperature is high. Instrumental analysis such as X-ray photoelectron spectroscopy showed the following mechanism: Since oxygen vacancies act as a scattering center that inhibits the current, the on-current becomes large when the amount of oxygen vacancies is small. Furthermore, the intensity of the broad photoluminescence (PL) observed around 2.0 eV was found to correlate well with the amount of oxygen vacancies, which indicates that PL can be used as an index of the amount of oxygen vacancies.

Academic Significance and Societal Importance of the Research Achievements

フレキシブル半導体デバイスを低コストで作製する研究自体は、ここ数年活発にされている。しかしながら、こうしたデバイスへの応用に不可欠な、低温焼成されたIGZO薄膜の物性について系統的な研究はこれまでほとんど行われていない。また、フレキシブルデバイスへの応用研究は、基本的なトランジスタ、配線作製に関するものが大半であるため、センサーの形成に関する研究開発の試みは報告例が極めて少ない。本研究は、そのような基礎的な知見の蓄積によって、溶液法によるトランジスタの特性向上や、新たなデバイスの開発に貢献するものである。

Report

(3 results)
  • 2018 Annual Research Report   Final Research Report ( PDF )
  • 2017 Research-status Report
  • Research Products

    (10 results)

All 2019 2018 2017

All Journal Article (2 results) (of which Int'l Joint Research: 2 results,  Peer Reviewed: 1 results) Presentation (8 results) (of which Int'l Joint Research: 1 results)

  • [Journal Article] Effects of ultraviolet photon irradiation and subsequent thermal treatments on solution-processed amorphous indium gallium zinc oxide thin films2018

    • Author(s)
      Yuki Takamori, Takaaki Morimoto, Nobuko Fukuda, and Yoshimichi Ohki
    • Journal Title

      AIP Advances

      Volume: 8 Issue: 11 Pages: 115304-115304

    • DOI

      10.1063/1.5049618

    • Related Report
      2018 Annual Research Report
    • Peer Reviewed / Int'l Joint Research
  • [Journal Article] Effects of UV Irradiation and Annealing on the Oxygen Vacancies in Solution-processed IGZO Thin Films2018

    • Author(s)
      Yuki Takamori, Takaaki Morimoto, Nobuko Fukuda, and Yoshimichi Ohki
    • Journal Title

      UVSOR activity report 2017

      Volume: 45 Pages: 127-127

    • Related Report
      2018 Annual Research Report
    • Int'l Joint Research
  • [Presentation] 溶液法IGZO中の酸素空孔密度の組成比依存性および深さ分布2019

    • Author(s)
      森本貴明,楊宜橙,福田伸子,大木義路
    • Organizer
      第66回応用物理学会春季学術講演会
    • Related Report
      2018 Annual Research Report
  • [Presentation] 高誘電率無機結晶に現れるテラヘルツ吸収帯2018

    • Author(s)
      森本貴明,大木義路
    • Organizer
      2018年 第79回応用物理学会秋季学術講演会
    • Related Report
      2018 Annual Research Report
  • [Presentation] 溶液法IGZO薄膜の組成比と焼成温度が電気特性に与える影響2018

    • Author(s)
      森本貴明,楊宜橙,福田伸子,大木義路
    • Organizer
      2018年 放電学会年次大会
    • Related Report
      2018 Annual Research Report
  • [Presentation] IGZO TFTの伝達特性に与える酸素空孔の影響2018

    • Author(s)
      高森悠圭,森本貴明, 福田伸子, 大木義路
    • Organizer
      第65回応用物理学会春季学術講演会, 18a-E201-9 (2018.3) 東京
    • Related Report
      2017 Research-status Report
  • [Presentation] フォトルミネセンス測定による溶液法IGZO中の酸素空孔の定量2018

    • Author(s)
      森本貴明, 落合祐輔, 福田伸子, 大木義路
    • Organizer
      第65回応用物理学会春季学術講演会, 20p-F104-1 (2018.3) 東京
    • Related Report
      2017 Research-status Report
  • [Presentation] Degradation of transfer characteristics of solution-processed IGZO thin-film transistors by UV irradiation and its recovery by heat treatment2017

    • Author(s)
      Takaaki Morimoto, Yuki Takamori, Nobuko Fukuda, and Yoshimichi Ohki
    • Organizer
      International Conference on Advanced Materials 2017, B1-O28-002 (2017. 8) Kyoto
    • Related Report
      2017 Research-status Report
    • Int'l Joint Research
  • [Presentation] 溶液法IGZO薄膜におけるGa比率がバンド構造に与える影響2017

    • Author(s)
      落合祐輔,森本貴明,福田伸子,大木義路
    • Organizer
      第78回応用物理学会秋季学術講演会, 6a-A203-3 (2017.9) 福岡
    • Related Report
      2017 Research-status Report
  • [Presentation] IGZO 薄膜の光吸収に与える紫外光照射と熱処理の影響2017

    • Author(s)
      高森悠圭,森本貴明, 福田伸子, 大木義路
    • Organizer
      第78回応用物理学会秋季学術講演会, 6a-A203-4 (2017.9) 福岡
    • Related Report
      2017 Research-status Report

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Published: 2017-04-28   Modified: 2020-03-30  

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