| Project/Area Number |
17K19100
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| Research Category |
Grant-in-Aid for Challenging Research (Exploratory)
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| Allocation Type | Multi-year Fund |
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| Research Field |
Physical chemistry, Functional solid state chemistry, and related fields
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| Research Institution | Tokyo Institute of Technology |
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Principal Investigator |
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| Project Period (FY) |
2017-06-30 – 2019-03-31
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| Project Status |
Completed (Fiscal Year 2018)
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| Budget Amount *help |
¥6,500,000 (Direct Cost: ¥5,000,000、Indirect Cost: ¥1,500,000)
Fiscal Year 2018: ¥3,250,000 (Direct Cost: ¥2,500,000、Indirect Cost: ¥750,000)
Fiscal Year 2017: ¥3,250,000 (Direct Cost: ¥2,500,000、Indirect Cost: ¥750,000)
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| Keywords | 単分子接合 / 表面増強ラマン散乱 / 電流電圧計測 |
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| Outline of Final Research Achievements |
We have developed a new methodology for characterizing the adsorption site of single-molecule junctions through the combination of surface enhanced Raman scattering (SERS), current-voltage (I-V) curve measurements. Using this technique, we recognized two distinct conductance states in a single aminobenzenethiol (ABT) molecular junction. It is noticeable the two states cannot be recognized by SERS or I-V measurement alone. The combination of this hybrid experimental technique and theoretical calculation, the two conductance states are assigned to the states where ABT is attached on the bridge and hollow sites.
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| Academic Significance and Societal Importance of the Research Achievements |
表面増強ラマン散乱計測は高感度の分子検出技術として注目を集めている。しかし、その増強機構はいまだ完全には解明されておらず信頼性の高い検出方法として未だ課題がある。増強機構の解明に向け単分子スケールでの吸着状態の決定が必要不可欠であるが分子スケールで吸着状態を決定することは非常に困難であった。本研究では分子の吸着構造を規定した表面増強ラマン散乱の観測に成功した。従って、本研究成果は表面増強ラマン散乱計測を信頼性の高い分析手法として発展させるものである。
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