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Microscopic Fluctuations and Transport Mechanism of Few Electron Systems

Research Project

Project/Area Number 18063004
Research Category

Grant-in-Aid for Scientific Research on Priority Areas

Allocation TypeSingle-year Grants
Review Section Science and Engineering
Research InstitutionUniversity of Tsukuba

Principal Investigator

SANO Nobuyuki  University of Tsukuba, 大学院・数理物質科学研究科, 教授 (90282334)

Research Collaborator NAKANISHI Kohei  筑波大学, 大学院・数理物質科学研究科, 博士
SHIBANO Nozomi  筑波大学, 大学院・数理物質科学研究科, 博士
YOSHIDA Katsuhisa  筑波大学, 大学院・数理物質科学研究科, 博士
KARASAWA Takahiko  筑波大学, 大学院・数理物質科学研究科, 博士
Project Period (FY) 2006 – 2009
Project Status Completed (Fiscal Year 2009)
Budget Amount *help
¥46,600,000 (Direct Cost: ¥46,600,000)
Fiscal Year 2009: ¥11,900,000 (Direct Cost: ¥11,900,000)
Fiscal Year 2008: ¥11,900,000 (Direct Cost: ¥11,900,000)
Fiscal Year 2007: ¥11,400,000 (Direct Cost: ¥11,400,000)
Fiscal Year 2006: ¥11,400,000 (Direct Cost: ¥11,400,000)
Keywords電子デバイス / 集積回路 / ボルツマン輸送方程式 / 電子輸送 / モンテカルロ法 / 半導体デバイス / デバイス・シミュレーション / クーロン相互作用 / 特性ばらつき / 半導体特性 / 半導体物性 / 非平衡グリーン関数法 / ボルツマン方程式 / 量子輸送
Research Abstract

The discreteness of doped impurities and electrons in nano-scale MOSFETs become important because of the decrease in number of particles in such devices. In order to study such phenomena associated with discreteness, we have successfully developed the 3-D Monte Carlo simulator which takes account of the full Coulomb interaction among charged particles. The physical mechanism of electrons transport and device characteristics under nano-scale device structures have been studied via the Monte Carlo simulations.

Report

(6 results)
  • 2009 Annual Research Report   Final Research Report ( PDF )
  • 2008 Annual Research Report   Self-evaluation Report ( PDF )
  • 2007 Annual Research Report
  • 2006 Annual Research Report
  • Research Products

    (50 results)

All 2009 2008 2007 2006 Other

All Journal Article (24 results) (of which Peer Reviewed: 20 results) Presentation (24 results) Remarks (2 results)

  • [Journal Article] 最先端デバイスのモンテカルロ法2009

    • Author(s)
      佐野伸行
    • Journal Title

      電気学会誌 12

      Pages: 796-799

    • NAID

      10026224039

    • Related Report
      2009 Final Research Report
    • Peer Reviewed
  • [Journal Article] Analysis of Photon-Induced Drain Current in Polycrystalline-Silicon Thin-Film Transistors2009

    • Author(s)
      H. Ikeda, N. Sano
    • Journal Title

      Jpn. J. Appl. Phys. 48

    • NAID

      40016796029

    • Related Report
      2009 Final Research Report
    • Peer Reviewed
  • [Journal Article] Scaling FETs to 10 nm: Coulomb Effects, Source Starvation, and Virtual Source2009

    • Author(s)
      M.V. Fischetti, S. Jin, T. -w. Tang, P. Asbeck, Y. Taur, S.E. Laux, N. Sano
    • Journal Title

      J. Comp. Electron. 2

      Pages: 60-77

    • Related Report
      2009 Final Research Report
    • Peer Reviewed
  • [Journal Article] Analysis of Photon-Induced Drain Current in Polycrystalline-Silicon Thin-Film Transistors2009

    • Author(s)
      F.Ootsuka, A.Katakami, K.Shirai, H.i Nakata, T.Eimori, Y.Nara, Y.Ohji, K.Shimura, S.Horii, N.Sano, K.Yamabe
    • Journal Title

      Jpn.J.Appl.Phys. 48

    • NAID

      40016796029

    • Related Report
      2009 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Analysis of Photon-Induced Drain Current in Polycrystalline-Silicon Thin-Film Transistors2009

    • Author(s)
      H.Ikeda, N.Sano
    • Journal Title

      Jpn.J.Appl.Phys. 48

    • NAID

      40016796029

    • Related Report
      2009 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Scaling FETs to 10nm : Coulomb Effects, Source Starvation, and Virtual Source2009

    • Author(s)
      M.V.Fischetti, S.Jin, T.-w.Tang, P.Asbeck, Y.Taur, S.E.Laux, N.Sano
    • Journal Title

      J.Comp.Electron. 2

      Pages: 60-77

    • Related Report
      2009 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Schottky Barrier MOSFETs as Resonant Tunneling Devices2008

    • Author(s)
      S. Toriyama, N. Sano
    • Journal Title

      J. Comp. Electron 7

      Pages: 471-474

    • NAID

      10022548097

    • Related Report
      2009 Final Research Report
    • Peer Reviewed
  • [Journal Article] 3D Monte Carlo Analysis of potential Fluctuations under High Electron Concentrations2008

    • Author(s)
      T. Uechi, T. Fukui, N. Sano
    • Journal Title

      J. Comp. Electron. 7

      Pages: 240-243

    • Related Report
      2009 Final Research Report
    • Peer Reviewed
  • [Journal Article] Consistency of Boundary Conditions in Nonequilibrium Green's Function Simulations2008

    • Author(s)
      S. Sato, N. Sano
    • Journal Title

      J. Comp. Electron. 7

      Pages: 301-304

    • Related Report
      2009 Final Research Report
    • Peer Reviewed
  • [Journal Article] 3D Monte Carlo Simulations including Full Coulomb Interaction under High Electron Concentration Regimes2008

    • Author(s)
      T. Uechi, T. Fukui, N. Sano
    • Journal Title

      Phys. stat. sol. (c) 5

      Pages: 102-106

    • Related Report
      2009 Final Research Report
    • Peer Reviewed
  • [Journal Article] Three -dimensional Monte Carlo Simulation of Electron Transport in Si Including Full Coulomb Interaction2008

    • Author(s)
      T.Fukui, T.Uechi, and N.Sano
    • Journal Title

      Appl. Phys. Exp 1

    • NAID

      10025080337

    • Related Report
      2008 Self-evaluation Report
    • Peer Reviewed
  • [Journal Article] Consistency of Boundary Conditions in Non- equilibrium Green's Function Simulations2008

    • Author(s)
      S.Sato and N.Sano
    • Journal Title

      J. Comp. Electron 7

      Pages: 301-304

    • Related Report
      2008 Self-evaluation Report
    • Peer Reviewed
  • [Journal Article] Three-dimensional Monte Carlo Simulation of Electron Transport in Si Including Full Coulomb Interaction2008

    • Author(s)
      Takayuki Fukui, Tadayoshi Uechi, and Nobuyuki Sano
    • Journal Title

      Applied Physics Express 1

    • NAID

      10025080337

    • Related Report
      2008 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Consistency of Boundary Conditions in Nonequilibrium Green's Function Simulations2008

    • Author(s)
      Suguru Sato and Nobuyuki Sano
    • Journal Title

      Journal of Computational Electronics 7

      Pages: 240-243

    • Related Report
      2008 Annual Research Report
    • Peer Reviewed
  • [Journal Article] 3D Monte Carlo Simulations including Full Coulomb Interaction under High Electron Concentration Regimes2008

    • Author(s)
      Tadayoshi Uechi, Takayuki Fukui, and Nobuyuki Sano
    • Journal Title

      Phys. stat. sol.(c) 5

      Pages: 102-106

    • Related Report
      2008 Annual Research Report
    • Peer Reviewed
  • [Journal Article] 3D Monte Carlo Simulations including Full Coulomb Interaction under High Electron Concentration Regimes2008

    • Author(s)
      Tadayoshi, Uechi・Takayuki, Fukui・Nobuyuki, Sano
    • Journal Title

      Phys.stat.sol.(c) 5

      Pages: 102-106

    • Related Report
      2007 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Schottky Barrier MOSFETs as Resonant Tunneling Devices2008

    • Author(s)
      Shuichi, Toriyama・Nobuyuki, Sano
    • Journal Title

      J.Comp.Phys. 7(In press)

    • NAID

      10022548097

    • Related Report
      2007 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Consistency of Boundary Conditions in Nonequilibrium Green's Function Simulations2008

    • Author(s)
      Suguru, Sato・Nobuyuki, Sano
    • Journal Title

      J.Comp.Phys. 7(In press)

    • Related Report
      2007 Annual Research Report
    • Peer Reviewed
  • [Journal Article] ナノスケール半導体構造における準弾道電子輸送2007

    • Author(s)
      佐野伸行
    • Journal Title

      応用物理学会誌 10

      Pages: 1135-1141

    • NAID

      10019956738

    • Related Report
      2009 Final Research Report
    • Peer Reviewed
  • [Journal Article] ナノスケール半導体構造における準弾道電子輸送2007

    • Author(s)
      佐野伸行
    • Journal Title

      応用物理学会誌 10月号

      Pages: 1135-1141

    • NAID

      10019956738

    • Related Report
      2008 Self-evaluation Report
    • Peer Reviewed
  • [Journal Article] Kinetic Study of Quasi-Ballistic Electron Transport in Nanoscale Semiconductor Devices2006

    • Author(s)
      Nobuyuki Sano
    • Journal Title

      Electronic Communications in Japan 88

      Pages: 1-9

    • NAID

      10016599142

    • Related Report
      2006 Annual Research Report
  • [Journal Article] Detailed Balance in Quasi-Ballistic Electron Transport under Nanoscale Device Structures2006

    • Author(s)
      Hiroyuki Kusaka
    • Journal Title

      International Conference on Solid State Materials and Devices (SSDM-2006)

      Pages: 356-357

    • Related Report
      2006 Annual Research Report
  • [Journal Article] Device Simulation of Random Dopant Effects in Ultra- small MOSFETs Based on Advanced Physical Models2006

    • Author(s)
      Shuichi Toriyama
    • Journal Title

      International Conference on Simulation of Semiconductor Processes and Devices (SISPAD-2006)

      Pages: 145-146

    • Related Report
      2006 Annual Research Report
  • [Journal Article] Hot Electrons Associated with the Long-Range Coulomb Interaction under the High-Density Regime2006

    • Author(s)
      Tadayoshi Uechi
    • Journal Title

      2006 VLSI-TSA Technology Symposium (VLSI-TSA)

      Pages: 141-142

    • Related Report
      2006 Annual Research Report
  • [Presentation] Impact of the Coulomb Interaction on Nano-scale Device Characteristics: A Monte Carlo Study2009

    • Author(s)
      N. Sano
    • Organizer
      IEEE EDS Mini-colloquium for Nano CMOS and Nanowire
    • Place of Presentation
      東工大、横浜市
    • Year and Date
      2009-02-21
    • Related Report
      2009 Final Research Report
  • [Presentation] Impact of the Coulomb Interaction on Nano-scale Device Characteristics: A Monte Carlo Study2009

    • Author(s)
      N.Sano
    • Organizer
      IEEE EDS Mini-colloquium for Nano CMOS and Nanowire
    • Place of Presentation
      東京工業大学、横浜市
    • Year and Date
      2009-02-21
    • Related Report
      2008 Self-evaluation Report
  • [Presentation] Discrete Impurity and Mobility in Drift- Diffusion Simulations for Device Characteristics Variability2009

    • Author(s)
      N. Shibano, N. Sano
    • Organizer
      2009 International Semiconductor Device Research Symposium (ISDRS 2009)
    • Place of Presentation
      College Park, USA
    • Related Report
      2009 Final Research Report
  • [Presentation] Discrete Impurity and Mobility in Drift-Diffusion Simulations for Device Characteristics Variability2009

    • Author(s)
      T. Karasawa, K. Nakanishi, N. Sano
    • Organizer
      2009 International Semiconductor Device Research Symposium (ISDRS 2009)
    • Place of Presentation
      College Park, USA
    • Related Report
      2009 Final Research Report
  • [Presentation] Self-Consistent Monte Carlo Device Simulations under Nano-Scale Device Structures: Role of Coulomb interaction, Degeneracy, and Boundary Condition2009

    • Author(s)
      K. Nakanishi, T. Uechi, N. Sano
    • Organizer
      IEEE International Electron Devices Meeting (IEDM-2009)
    • Place of Presentation
      Baltimore, USA
    • Related Report
      2009 Final Research Report
  • [Presentation] Numerical Analysis of Electron Transport in Quasi Quantum Dot Superlattice2009

    • Author(s)
      K. Yoshida, Y. Okada, N. Sano
    • Organizer
      Workshop on Information, Nano and Photonics Technology 2009 (WINPTech2009)
    • Place of Presentation
      Kobe University
    • Related Report
      2009 Final Research Report
  • [Presentation] Simulation of Electron Transport in Si Nano Devices2009

    • Author(s)
      N. Sano
    • Organizer
      G-COE PICE International Symposium on Silicon Nano Devices in 2030 - Prospects by World's Leading Scientists
    • Place of Presentation
      Tokyo Institute of Technology
    • Related Report
      2009 Final Research Report
  • [Presentation] Scaling FETs to 10 nm: Coulomb Effects, Source Starvation, and Virtual Source2009

    • Author(s)
      M.V. Fischetti, S. Jin, T. -w. Tang, P. Asbeck, Y. Taur, S.E. Laux, N. Sano
    • Organizer
      International Workshop on Computational Electronics (IWCE-13)
    • Place of Presentation
      Beijing, China
    • Related Report
      2009 Final Research Report
  • [Presentation] Self-Consistent Monte Carlo Device Simulations under Nano-Scale Device Structures : Role of Coulomb interaction, Degeneracy, and Boundary Condition2009

    • Author(s)
      Kohei Nakanishi, Tadayoshi Uechi, Nobuyuki Sano
    • Organizer
      IEEE International Electron Devices Meeting(IEDM-2009)
    • Place of Presentation
      Baltimore, MD, U.S.A
    • Related Report
      2009 Annual Research Report
  • [Presentation] 3D Monte Carlo Simulations of Nano-scale Devices: Impact of Coulomb Interaction on Device Characteristics2008

    • Author(s)
      N. Sano, T. Uechi, T. Fukui
    • Organizer
      Technical Seminar, International Conference on Solid State Materials and Devices (SSDM-2008)
    • Place of Presentation
      Tsukuba
    • Year and Date
      2008-09-23
    • Related Report
      2009 Final Research Report
  • [Presentation] Impacts of Random Dopant Fluctuation on Transient Characteristics in CMOS Inverters: A Device Simulation Study2008

    • Author(s)
      S. Toriyama, K. Matsuzawa, N. Sano
    • Organizer
      International Conference on Solid State Materials and Devices (SSDM-2008)
    • Place of Presentation
      Tsukuba
    • Related Report
      2009 Final Research Report
  • [Presentation] Scaling Dependence of Electron Transport in Nano-scale Shottky Barrier MOSFETs. International Conference on Solid State Materials and Devices (SSDM-2008)2008

    • Author(s)
      Shuichi Toriyama and Nobuyuk Sano
    • Organizer
      September 24-26, 2008
    • Place of Presentation
      Tsukuba, Japan
    • Related Report
      2008 Annual Research Report
  • [Presentation] Physics of Schottky barrier at Metal/high-k Interface2008

    • Author(s)
      T. Nakayama・R., Ayuda・H., Nii・K., Shiraishi
    • Organizer
      2008 MRS Spring Meeting, H5.5
    • Place of Presentation
      San Francisce, USA
    • Related Report
      2007 Annual Research Report
  • [Presentation] Effects of Gate-Edge Metamorphoses (GEM) on Device Characteristics of Scaled MOSFETs2007

    • Author(s)
      T. Yamada, N. Sano
    • Organizer
      2007 International Semiconductor Device Research Symposium (ISDRS 2007)
    • Place of Presentation
      College Park, USA
    • Related Report
      2009 Final Research Report
  • [Presentation] 3D Monte Carlo Analysis ofpotential Fluctuations under High Electron Concentrations2007

    • Author(s)
      T. Uechi, T. Fukui, N. Sano
    • Organizer
      International Workshop on Computational Electronics (IWCE-12)
    • Place of Presentation
      Amherst, USA
    • Related Report
      2009 Final Research Report
  • [Presentation] Scaling Dependence of Electron Transport in Nano-scale Shottky Barrier MOSFETs2007

    • Author(s)
      S. Toriyama, N. Sano
    • Organizer
      International Workshop on Computational Electronics (IWCE-12)
    • Place of Presentation
      Amherst, USA
    • Related Report
      2009 Final Research Report
  • [Presentation] Electron Transport Simulations Including Full Coulomb Interaction in Si2007

    • Author(s)
      T. Fukui, T. Uechi, N. Sano
    • Organizer
      International Workshop on Computational Electronics (IWCE-12)
    • Place of Presentation
      Amherst, USA
    • Related Report
      2009 Final Research Report
  • [Presentation] Consistency of Boundary Conditions in Nonequilibrium Green's Function Simulations2007

    • Author(s)
      S. Sato, H. Kusaka, N. Sano
    • Organizer
      International Workshop on Computational Electronics (IWCE-12)
    • Place of Presentation
      Amherst, USA
    • Related Report
      2009 Final Research Report
  • [Presentation] Schottky Barrier MOSFETs as Resonant Tunneling Devices2007

    • Author(s)
      S. Toriyama, N. Sano
    • Organizer
      International Conference on Solid State Materials and Devices (SSDM-2007)
    • Place of Presentation
      Tsukuba
    • Related Report
      2009 Final Research Report 2008 Self-evaluation Report
  • [Presentation] 3D Monte Carlo Simulations including Full Coulomb Interaction under High Electron Concentration Regimes2007

    • Author(s)
      T. Uechi, T. Fukui, N. Sano
    • Organizer
      15-th International Conference on Nonequilibrium Carrier Transport in Semiconductors (HCIS-15)
    • Place of Presentation
      Tokyo
    • Related Report
      2009 Final Research Report
  • [Presentation] Electron Transport Simulations Including Full Coulomb Interaction in Si2007

    • Author(s)
      Takayuki, Fukui・Tadayoshi, Uechi・Nobuyuki, Sano
    • Organizer
      International Workshop on Computational Electronics (IWCE-12)
    • Place of Presentation
      Amherst, MA, USA
    • Related Report
      2007 Annual Research Report
  • [Presentation] Detailed Balance in Quasi-Ballistic Electron Transport under Nanoscale Device Structures2006

    • Author(s)
      H. Kusaka, N. Sano
    • Organizer
      International Conference on Solid State Materials and Devices (SSDM-2006)
    • Place of Presentation
      Yokohama
    • Related Report
      2009 Final Research Report
  • [Presentation] Device Simulation of Random Dopant Effects in Ultra- small MOSFETs Based on Advanced Physical Models2006

    • Author(s)
      S. Toriyama, D. Hagishima, K. Matsuzawa, N. Sano
    • Organizer
      International Conference on Simulation of Semiconductor Processes and Devices (SISPAD-2006)
    • Place of Presentation
      Montley, USA
    • Related Report
      2009 Final Research Report
  • [Presentation] Hot Electrons Associated with the Long-Range Coulomb Interaction under the High-Density Regime2006

    • Author(s)
      T. Uechi, N. Sano
    • Organizer
      2006 VLSI-TSA Technology Symposium
    • Place of Presentation
      Hsinshu, Taiwan
    • Related Report
      2009 Final Research Report
  • [Remarks]

    • URL

      http://hermes.esys.tsukuba.ac.jp/

    • Related Report
      2009 Final Research Report
  • [Remarks]

    • URL

      http://hermes.esys.tsukuba.ac.jp/

    • Related Report
      2008 Self-evaluation Report

URL: 

Published: 2006-04-01   Modified: 2018-03-28  

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