| Budget Amount *help |
¥17,000,000 (Direct Cost: ¥14,900,000、Indirect Cost: ¥2,100,000)
Fiscal Year 2008: ¥4,290,000 (Direct Cost: ¥3,300,000、Indirect Cost: ¥990,000)
Fiscal Year 2007: ¥4,810,000 (Direct Cost: ¥3,700,000、Indirect Cost: ¥1,110,000)
Fiscal Year 2006: ¥7,900,000 (Direct Cost: ¥7,900,000)
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| Research Abstract |
We have added our original improvements on Kelvin probe microscopy (KFM) which is one kind of nano-probe technieques in order to ensure high accuracy, high spatial resolution, and high reliability in potential measurements. By means of this method, potential distribution around self-assembled InAs quantum dots was investigated and some electronic properties like a charging effect in the quantum dots were discussed. In addition, we observed photovoltaic properties on multicrystalline Si solar cell materials by KFM operated under light illumination and found the degradation of minority carrier dynamics around the grain boundary.
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