Manipulation of local spin ordering . Challenging nano-spin craft

• Project/Area Number: 18686004
• Research Category: Grant-in-Aid for Young Scientists (A)
• Allocation Type: Single-year Grants
• Research Field: Thin film/Surface and interfacial physical properties
• Research Institution: Hokkaido University
• Principal Investigator: HOSOI Hirotaka Hokkaido University, 大学院情報科学研究科, 特任助教 (00396334)
• Project Period (FY): 2006 – 2008
• Project Status: Completed (Fiscal Year 2008)
• Budget Amount: ¥30,420,000 (Direct Cost: ¥23,400,000、Indirect Cost: ¥7,020,000); Fiscal Year 2008: ¥4,290,000 (Direct Cost: ¥3,300,000、Indirect Cost: ¥990,000); Fiscal Year 2007: ¥6,500,000 (Direct Cost: ¥5,000,000、Indirect Cost: ¥1,500,000); Fiscal Year 2006: ¥19,630,000 (Direct Cost: ¥15,100,000、Indirect Cost: ¥4,530,000)
• Keywords: 走査プローブ顕微鏡 / ナノ磁性 / 表面磁性 / スピン操作 / 表面・界面物性 / 磁性 / 磁気記録 / スピンエレクトロニクス / スビンエレクトロニクス

Research Abstract

スピン・電荷整列状態の制御に使用するマグネタイト表面の作製・評価を行った。その結果、清浄かつ平坦な表面作製条件を確立し、走査型トンネル顕微鏡、ならびに、非接触原子間力顕微鏡を用いた原子分解能観察に成功した。非接触原子間力顕微鏡による原子像観察は世界に先駆けた結果である。また、整列相の制御に必要となる強磁場対応の極低温超高真空走査型プローブ顕微鏡の開発を行い、Si 表面の原子分解能観察に成功した。

Research Products

• [Journal Article] Surface potential imaging of CNT-FET devices by scanning Kelvin probe microscopy (2008)
  • Author(s): H.Hosoi, N.Nakamura, Y.Yamada, K.Sueoka, and K.Mukasa
  • Journal Title: Journal of Physics conference series 100
  • Peer Reviewed
• [Journal Article] Surface potential imaging of CNT-FET devices by scanning Kelvin probe microscopy (2008)
  • Author(s): H. Hosoi, N. Nakamura, Y. Yamada K. Sueoka, and K. Mukasa
  • Journal Title: Journal of Physics conference series 100
  • Peer Reviewed
• [Presentation] A low temperature ultrahigh vacuum scanning probe microscope (2009)
  • Author(s): H.Hosoi and K.Sueoka
  • Organizer: The 2nd international symposium on Global COE program of center for next-generation information technology based on knowledge discovery and knowledge federation
  • Place of Presentation: 北海道札幌市
  • Year and Date: 2009-01-20
• [Presentation] Noncontact-atomic Force Microscopy Study of Fe304(001) Surface (2009)
  • Author(s): T. Mizuno, H. Hosoi, A. Subagyo and K. Sueoka
  • Organizer: The 2nd international symposium on Global COE program of center for next-generation information technology based on knowledge discovery and knowledee federation
  • Place of Presentation: 北海道札幌市
  • Year and Date: 2009-01-20
• [Presentation] 極低温超高真空走査プローブ顕微鏡の開発 (2008)
  • Author(s): 細井浩貴, 天草貴昭, 末岡和久
  • Organizer: 若手研究者支援のための産学協同GCOEシンポジウム
  • Place of Presentation: 北海道札幌市
  • Year and Date: 2008-10-04
• [Presentation] Fe304(001)表面における酸素原子の配列に関する研究 (2008)
  • Author(s): 水野太一, 細井浩貴, アグススバギョ, 末岡和久
  • Organizer: 若手研究者支援のための産学協同GCOEシンポジウム
  • Place of Presentation: 北海道札幌市
  • Year and Date: 2008-10-04
• [Presentation] Atomic scale imaging on Fe3O4(001) surface studied by Non-contact Atomic Force Microscopy (2008)
  • Author(s): T.Mizuno, H.Hosoi, A.Subagyo and K.Sueoka
  • Organizer: 11th International Conference on Non-contact Atomic Force Microscopy(NC-AFM 2008)
  • Place of Presentation: Madrid(Spain)
  • Year and Date: 2008-09-16
• [Presentation] Atomic scale imaging on Fe304(001) surface studied by Non-contact Ato mic Force Microscopy (2008)
  • Author(s): T. Mizuno, H. Hosoi, A. Subagyo and K.Sueoka
  • Organizer: 11th International Conference on Non-contact Ato mic Force Microscopy (NC-AFM 2008)
  • Place of Presentation: Madrid (Spain)
  • Year and Date: 2008-09-16
• [Presentation] Noncontact-atomic Force Microscopy Study of Fe3O4 Surface (2008)
  • Author(s): T.Mizuno, H.Hosoi, A.Subagyo, K.Yamamoto and K.Sueoka
  • Organizer: International Conference on Nanoscale + Technology 2008 (ICN+T 2008)
  • Place of Presentation: Denver (USA)
  • Year and Date: 2008-07-20
• [Presentation] Noncontact-atomic Force Microscopy Study of Fe304 Surface (2008)
  • Author(s): T. Mizuno, H. Hosoi, A. Subagyo, K. Yamamoto and K. Sueoka
  • Organizer: International Conference on Nanoscale + Technolo gy 2008 (ICN+T 2008)
  • Place of Presentation: Denver (USA)
  • Year and Date: 2008-07-20
• [Presentation] NC-AFMによるFe_3O_4(001)薄膜の観察 (2008)
  • Author(s): 水野太一, アグススバギョ, 細井浩貴, 末岡和久
  • Organizer: 第55回応用物理学関係連合講演会
  • Place of Presentation: 千葉県船橋市
  • Year and Date: 2008-03-28
• [Book] Applications to Insulators, (Springer Handbook of Nanotechnology 2nd edition), (edited by B.Bhushan). Part C, section 24.3 (2006)
  • Author(s): H.Hosoi, K.Sueoka, and K.Mukasa
  • Publisher: Springer-Verlarg
• [Book] Applications to Insulators (Part C, section 24.3)(edited by B. Bhushan)(Springer Handbook of Nanotechnology 2nd edition) (2006)
  • Author(s): H.Hosoi, K.Sueoka, K.Mukasa
  • Total Pages: 8
  • Publisher: Springer-Verlarg