Complex point defect analysis by high temporal resolution STEM
| Project/Area Number |
18H01823
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| Research Category |
Grant-in-Aid for Scientific Research (B)
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| Allocation Type | Single-year Grants |
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| Section | 一般 |
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| Review Section |
Basic Section 28030:Nanomaterials-related
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| Research Institution | The University of Tokyo |
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Principal Investigator |
Ishikawa Ryo 東京大学, 大学院工学系研究科(工学部), 特任准教授 (20734156)
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| Project Period (FY) |
2018-04-01 – 2021-03-31
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| Project Status |
Completed (Fiscal Year 2020)
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| Budget Amount *help |
¥17,420,000 (Direct Cost: ¥13,400,000、Indirect Cost: ¥4,020,000)
Fiscal Year 2020: ¥2,340,000 (Direct Cost: ¥1,800,000、Indirect Cost: ¥540,000)
Fiscal Year 2019: ¥4,420,000 (Direct Cost: ¥3,400,000、Indirect Cost: ¥1,020,000)
Fiscal Year 2018: ¥10,660,000 (Direct Cost: ¥8,200,000、Indirect Cost: ¥2,460,000)
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| Keywords | 高速電子顕微鏡法 / 拡散 / 複合点欠陥 / 高時間分解能 / 原子分解能電子顕微鏡 / 酸化物表面 / 原子分解能電子顕微鏡法 / 単原子ドーパント / 走査透過型電子顕微鏡 / 時間分解能 / 原子分解能 / 原子拡散 / 蛍光体 / 高時間分解能STEM / 原子分解能STEM / 原子空孔 |
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| Outline of Final Research Achievements |
We have successfully developed a new high temporal-resolution scanning transmission electron microscopy (STEM). The developed scan coils have 200 times smaller inductances than that in the previous generation, and we can acquire 25 frames of atomic-resolution STEM images as per second (512×512 pixels), where the acquisition time is 83 nano seconds per pixel. Utilizing such high temporal- resolution, it becomes possible to directly observe dynamics of point defects within solids or on the surface. The present study could open the way to perform dynamic STEM observations at atomic-scale.
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| Academic Significance and Societal Importance of the Research Achievements |
走査透過型電子顕微鏡は高い空間分解能を有することから，材料中に形成される点欠陥などの原子構造解析において重要な役割を果たしてきた．しかし，材料機能の本質的な理解には，材料やデバイスの実環境下における挙動を原子レベルで明らかにすることが要求される．本研究では，従来の原子分解能を保持しつつ時間分解能を改善することにより，原子レベルでのダイナミクスが観察可能な顕微鏡法の開発を行った．本顕微鏡法は，高温，ガス雰囲気，液中などの様々な環境下における動的観察の実現に向けて必要不可欠な手法であり，今後の材料開発での幅広い応用が期待される．
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Report
(4 results)
Research Products
(59 results)
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[Journal Article] Discovery of Ternary Silicon Titanium Nitride with Spinel-Type Structure2020
Author(s)
Shrikant Bhat, Abhijeet Lale, Samuel Bernard, Wei Zhang, Ryo Ishikawa, Shariq Haseen, Peter Kroll, Leonore Wiehl, Robert Farla, Tomoo Katsura, Yuichi Ikuhara, Ralf Riedel
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Journal Title
Scientific Reports
Volume: 10
Issue: 1
Pages: 7372-7372
DOI
Related Report
Peer Reviewed / Open Access / Int'l Joint Research
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