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Cathodoluminescence study of oxygen vacancy in SrTiO3

Research Project

Project/Area Number 18K04248
Research Category

Grant-in-Aid for Scientific Research (C)

Allocation TypeMulti-year Fund
Section一般
Review Section Basic Section 21050:Electric and electronic materials-related
Research InstitutionNational Institute for Materials Science

Principal Investigator

CHEN Jun  国立研究開発法人物質・材料研究機構, 機能性材料研究拠点, 主任研究員 (90537739)

Project Period (FY) 2018-04-01 – 2021-03-31
Project Status Completed (Fiscal Year 2020)
Budget Amount *help
¥4,290,000 (Direct Cost: ¥3,300,000、Indirect Cost: ¥990,000)
Fiscal Year 2020: ¥650,000 (Direct Cost: ¥500,000、Indirect Cost: ¥150,000)
Fiscal Year 2019: ¥650,000 (Direct Cost: ¥500,000、Indirect Cost: ¥150,000)
Fiscal Year 2018: ¥2,990,000 (Direct Cost: ¥2,300,000、Indirect Cost: ¥690,000)
Keywordsカソードルミネッセンス / チタン酸ストロンチウム / 転位 / 酸素空孔 / SrTiO3 / Oxygen vacancy / Cathodoluminescence / Dislocation / cathodoluminescence / oxygen vacancy / Oxygen vacancies / Oxygen
Outline of Final Research Achievements

Strontium titanate (SrTiO3) as a typical perovskite oxide has attracted many attentions in the application for resistive random access memory. Oxygen vacancies are the major defects in SrTiO3, and play an important role in the resistive switching. On another hand, the resistance switching is sometimes ascribed to the interaction between dislocations and oxygen vacancies.In this work, we applied cathodoluminescence (CL) to study the oxygen vacancies and dislocations in SrTiO3. The influence of dislocations on Vo distribution and diffusion is visualized by CL mapping. The correlation between resistive switching, Vo and dislocations is clarified.

Academic Significance and Societal Importance of the Research Achievements

本研究は、カソードルミネッセンス法によって、初めてチタン酸ストロンチウム(SrTiO3)中の転位と酸素空孔の空間分布に関する情報を得た。

Report

(4 results)
  • 2020 Annual Research Report   Final Research Report ( PDF )
  • 2019 Research-status Report
  • 2018 Research-status Report
  • Research Products

    (7 results)

All 2020 2019 2018

All Journal Article (3 results) (of which Peer Reviewed: 3 results,  Open Access: 2 results) Presentation (4 results) (of which Int'l Joint Research: 1 results,  Invited: 2 results)

  • [Journal Article] Electron-Beam-Induced Current and Cathodoluminescence Study of Dislocations in SrTiO32020

    • Author(s)
      Yi Wei、Chen Jun、Sekiguchi Takashi
    • Journal Title

      Crystals

      Volume: 10 Issue: 9 Pages: 736-736

    • DOI

      10.3390/cryst10090736

    • Related Report
      2020 Annual Research Report
    • Peer Reviewed / Open Access
  • [Journal Article] Oxygen vacancy migration along dislocations in SrTiO3 studied by cathodoluminescence2019

    • Author(s)
      Wang Peng、Yi Wei、Chen Jun、Ito Shun、Cui Can、Sekiguchi Takashi
    • Journal Title

      Journal of Physics D: Applied Physics

      Volume: 52 Issue: 47 Pages: 475103-475103

    • DOI

      10.1088/1361-6463/ab3b3e

    • Related Report
      2019 Research-status Report
    • Peer Reviewed
  • [Journal Article] Wafer-scale analysis of GaN substrate wafer by imaging cathodoluminescence2019

    • Author(s)
      Wei Yi, Jun Chen, Seiji Higuchi, Takashi Sekiguchi
    • Journal Title

      Applied Physics Express

      Volume: 12 Issue: 5 Pages: 051005-051005

    • DOI

      10.7567/1882-0786/ab0db8

    • Related Report
      2018 Research-status Report
    • Peer Reviewed / Open Access
  • [Presentation] Cathodoluminescence study of oxygen vacancy migration along dislocation in SrTiO32020

    • Author(s)
      Jun Chen, Wei Yi, Peng Wang, Shun Ito, Takashi Sekiguchi
    • Organizer
      2020年 第67回応用物理学会春季学術講演会 (開催中止)
    • Related Report
      2019 Research-status Report
  • [Presentation] Cathodoluminescence Characterization of GaN-based Materials: From Wafer-scale Mapping to Nano-scale 3D analysis2019

    • Author(s)
      Jun Chen, Wei Yi, Takashi Kimura, Takashi Sekiguchi
    • Organizer
      8th International Symposium on Practical Surface Analysis (PSA19)
    • Related Report
      2019 Research-status Report
    • Int'l Joint Research
  • [Presentation] Application and prospect of electron-beam-induced current technique: from defect characterization to device diagnosis2018

    • Author(s)
      Jun Chen
    • Organizer
      The 19th International Microscope Congress, Sydney, Australia, Sep. 9-14
    • Related Report
      2018 Research-status Report
    • Invited
  • [Presentation] Applications of EBIC in semiconductor research2018

    • Author(s)
      Jun Chen, Takashi Sekiguchi
    • Organizer
      The 3rd International Conference on Microstructure and Properties of Materials, Hangzhou, China, May27-28
    • Related Report
      2018 Research-status Report
    • Invited

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Published: 2018-04-23   Modified: 2022-01-27  

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