| Budget Amount *help |
¥48,750,000 (Direct Cost: ¥37,500,000、Indirect Cost: ¥11,250,000)
Fiscal Year 2010: ¥6,500,000 (Direct Cost: ¥5,000,000、Indirect Cost: ¥1,500,000)
Fiscal Year 2009: ¥8,450,000 (Direct Cost: ¥6,500,000、Indirect Cost: ¥1,950,000)
Fiscal Year 2008: ¥9,490,000 (Direct Cost: ¥7,300,000、Indirect Cost: ¥2,190,000)
Fiscal Year 2007: ¥24,310,000 (Direct Cost: ¥18,700,000、Indirect Cost: ¥5,610,000)
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| Research Abstract |
An absolute work function microscope, which can measure the absolute work function and can image the spatial distribution of the work function on the specimen surface, has been developed in the present study. A spherical and chromatic aberration corrected optical lens system and a high-brightness monochrometer were developed as the photon source, and the work function mapping was carried out using a photo emission electron microscope.
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