| Project/Area Number |
19310072
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| Research Category |
Grant-in-Aid for Scientific Research (B)
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| Allocation Type | Single-year Grants |
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| Section | 一般 |
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| Research Field |
Nanomaterials/Nanobioscience
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| Research Institution | Tohoku University |
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Principal Investigator |
OHNO Yutaka Tohoku University, 金属材料研究所, 准教授 (80243129)
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| Co-Investigator(Kenkyū-buntansha) |
河野 日出夫 大阪大学, 大学院・理学研究科, 准教授 (00273574)
米永 一郎 東北大学, 金属材料研究所, 教授 (20134041)
太子 敏則 東北大学, 金属材料研究所, 助教 (90397307)
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| Co-Investigator(Renkei-kenkyūsha) |
YONENAGA Ichirou 東北大学, 金属材料研究所, 教授 (20134041)
TAISHI Toshinori 東北大学, 金属材料研究所, 助教 (90397307)
KOHNO Hideo 大阪大学, 大学院・理学研究科, 准教授 (00273574)
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| Project Period (FY) |
2007 – 2009
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| Project Status |
Completed (Fiscal Year 2009)
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| Budget Amount *help |
¥19,890,000 (Direct Cost: ¥15,300,000、Indirect Cost: ¥4,590,000)
Fiscal Year 2009: ¥1,950,000 (Direct Cost: ¥1,500,000、Indirect Cost: ¥450,000)
Fiscal Year 2008: ¥4,160,000 (Direct Cost: ¥3,200,000、Indirect Cost: ¥960,000)
Fiscal Year 2007: ¥13,780,000 (Direct Cost: ¥10,600,000、Indirect Cost: ¥3,180,000)
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| Keywords | ナノ材料評価 / 透過電子顕微鏡 / 局在近接場分光法 / ナノ構造体 / ラマン散乱 / フォトルミネセンス |
|---|
| Research Abstract |
We have developed an apparatus for making a localized evanescent field spot on a specimen equipped in a transmission electron microscope. We have applied the apparatus for evaluating an optical response of dislocations in ZnO crystals, and revealed that screw dislocations in ZnO have a localized energy level of about 2.5eV in depth.
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