Non-equilibrium phases appearing on semiconductor surfaces at low temperatures induced by electronic excitation
Project/Area Number |
19340083
|
Research Category |
Grant-in-Aid for Scientific Research (B)
|
Allocation Type | Single-year Grants |
Section | 一般 |
Research Field |
Condensed matter physics I
|
Research Institution | Kyushu University |
Principal Investigator |
TOCHIHARA Hiroshi Kyushu University, 大学院・総合理工学研究院, 教授 (80080472)
|
Co-Investigator(Kenkyū-buntansha) |
TAKAHASHI Toshio 東京大学, 物性研究所, 教授 (20107395)
SHIRASAWA Tetsuroh 東京大学, 物性研究所, 助教 (80451889)
|
Project Period (FY) |
2007 – 2009
|
Project Status |
Completed (Fiscal Year 2009)
|
Budget Amount *help |
¥18,850,000 (Direct Cost: ¥14,500,000、Indirect Cost: ¥4,350,000)
Fiscal Year 2009: ¥1,560,000 (Direct Cost: ¥1,200,000、Indirect Cost: ¥360,000)
Fiscal Year 2008: ¥4,680,000 (Direct Cost: ¥3,600,000、Indirect Cost: ¥1,080,000)
Fiscal Year 2007: ¥12,610,000 (Direct Cost: ¥9,700,000、Indirect Cost: ¥2,910,000)
|
Keywords | Ge(111)表面 / Sn吸着 / 表面構造 / 半導体表面 / 電子線照射効果 / 低速電子回折 / 相転移 / 低温 / 表面構造相転移 / 半導体表面物性 / 非平衡物質 / Sn 吸着 / シリコン / 電子励起と脱励起 / ドーパント / 半導体キャリアー濃度 / 低温半導体 / LEED |
Research Abstract |
Just before starting the present study (2005), we had found that the structure of clean Si(001)c(4×2) surfaces undergoes the disordering induced by the irradiation of low-energy electron beam only below about 50K. In this study we have succeeded to find another example of electron-beam-irradiation induced disordering of the surface structure on the Ge(111)-Sn adsorption system only below 40K. We have clarified the conditions for the occurrence of this phenomenon, and proposed its microscopic mechanism.
|
Report
(4 results)
Research Products
(7 results)