Small region XRF in-situ analysis of solid-liquid interface analysis
| Project/Area Number |
19350042
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| Research Category |
Grant-in-Aid for Scientific Research (B)
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| Allocation Type | Single-year Grants |
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| Section | 一般 |
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| Research Field |
Analytical chemistry
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| Research Institution | Osaka City University |
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Principal Investigator |
TSUJI Kouichi Osaka City University, 大学院・工学研究科, 教授 (30241566)
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| Project Period (FY) |
2007 – 2009
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| Project Status |
Completed (Fiscal Year 2009)
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| Budget Amount *help |
¥17,680,000 (Direct Cost: ¥13,600,000、Indirect Cost: ¥4,080,000)
Fiscal Year 2009: ¥2,600,000 (Direct Cost: ¥2,000,000、Indirect Cost: ¥600,000)
Fiscal Year 2008: ¥4,160,000 (Direct Cost: ¥3,200,000、Indirect Cost: ¥960,000)
Fiscal Year 2007: ¥10,920,000 (Direct Cost: ¥8,400,000、Indirect Cost: ¥2,520,000)
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| Keywords | 機器分析 / 蛍光X線分析 / 固液界面 / その場分析 / 元素分析 / 元素マッピング |
|---|
| Research Abstract |
It is very important to investigate and control solid-liquid interfaces, where various chemical reactions such as corrosions occur. In this research, the primary x-rays were introduced in the solutions through the newly developed injection-needle type collimator. The XRF produced in the solution was also measured through the needle collimator by the x-ray detector. Finally, it was confirmed that a direct XRF analysis of the surface of solid materials in the solution could be performed as well as the direct XRF analysis of the liquid-liquid interfaces.
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Report
(4 results)
Research Products
(190 results)
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[Journal Article] 2007年X線分析関連文献総合報告2008
Author(s)
石井 真史, 栗崎 敏, 高山 透, 辻 幸一, 沼子 千弥, 林 久史, 前尾 修司, 松尾 修司, 村松康司, 森 良弘, 横溝 臣智, 渡部孝
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Journal Title
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Peer Reviewed
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[Presentation] Multi-dimension analysis of vias in ULSIs2007
Author(s)
Y.Hirose, N.Murata T.Katayama K.Tsuji
Organizer
International Symposium on "Future Prospects of Scanning Electron/He^+Ion Microscope fbr Nano-surface Analysis"-bridging the gap betweensurface analysis and electron microscopy-
Place of Presentation
Keio University,Japan
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