Establishment of atom-by-atom interaction force using site-specific force spectroscopy

• Project/Area Number: 19360017
• Research Category: Grant-in-Aid for Scientific Research (B)
• Allocation Type: Single-year Grants
• Section: 一般
• Research Field: Thin film/Surface and interfacial physical properties
• Research Institution: Osaka University
• Principal Investigator: ABE Masayuki Osaka University, 大学院・工学研究科, 准教授 (00362666)
• Project Period (FY): 2007 – 2008
• Project Status: Completed (Fiscal Year 2008)
• Budget Amount: ¥18,720,000 (Direct Cost: ¥14,400,000、Indirect Cost: ¥4,320,000); Fiscal Year 2008: ¥5,070,000 (Direct Cost: ¥3,900,000、Indirect Cost: ¥1,170,000); Fiscal Year 2007: ¥13,650,000 (Direct Cost: ¥10,500,000、Indirect Cost: ¥3,150,000)
• Keywords: 原子間力顕微鏡 / フォーススペクトロスコピー / 交換型原子操作 / フォースマッピング / 原子識別 / 国際研究者交流

Research Abstract

超高真空・室温で動作する周波数変調方式原子間力顕微鏡(FM-AFM)を用い、AFM探針先端の原子1つと、測定試料表面の所定の原子1つの間に働く原子間力の距離依存性を測定するフォーススペクトロスコピーの手法を確立した。この手法を用いて、フォーススペクトロスコピーによる原子識別、フォースマッピングによる原子識別、原子識別画像化測定手法、原子ペンによる原子レベル構造物の作成とフォーススペクトロスコピーへの応用、フォースマッピングによるFM-AFMの画像化機構の解明を行えるようになった。

Research Products

• [Journal Article] Simultaneousatomic imaging of atomic forcemicroscopy and scanning tunnelingmicroscopy using metal coatedcantilevers (2009)
  • Author(s): D. Sawada, Y. Sugimoto, T. Namikawa,M. Abe, and S. Morita
  • Journal Title: Material Transactions Vol.50 No.5 Pages: 940-942
• [Journal Article] Mapping and imaging forrapid atom discrimination: A study offrequency modulation atomic forcemicroscopy (2009)
  • Author(s): Y. Sugimoto, T. Namikawa, M. Abe, andS. Morita
  • Journal Title: Applied Physics Letters Vol.94
• [Journal Article] Mapping and imaging for rapid atom discrimination : A study of frequency modulation atomic force microscopy (2009)
  • Author(s): Yoshiaki Sugimoto
  • Journal Title: Applied Physics Letters Vol. 94
  • Peer Reviewed
• [Journal Article] “原子ペン", 室温で (2009)
  • Author(s): 阿部真之
  • Journal Title: CERAMICS JAPAN Vol. 44 Pages: 126-126
  • Peer Reviewed
• [Journal Article] Complex Patterning byVertical Interchange AtomManipulation Using Atomic ForceMicroscopy (2008)
  • Author(s): Y. Sugimoto, P. Pou, O. Custance, P.Jelinek, M. Abe, R. Perez, and S.Morita
  • Journal Title: Science vol.322 Pages: 413-413
• [Journal Article] Statistics of lateral atommanipulation by atomic forcemicroscopy at room temperature (2008)
  • Author(s): Y. Sugimoto, K. Miki, M. Abe, and S.Morita
  • Journal Title: Physical Review B vol.78 Pages: 205305-205305
• [Journal Article] High-spatial resolutiontopographic imaging and dimerdistance analysis of Si(100)-(2x1)using noncontact atomic forcemicroscopy (2008)
  • Author(s): D. Sawada, T. Namikawa, M. Hiragaki,Y. Sugimoto, M. Abe, and S. Morita
  • Journal Title: Japanese Journal ofApplied Physics vol.47 Pages: 6085-6085
• [Journal Article] Vertical andlateral force mapping on theSi(111)-(7x7) surface by dynamicforce microscopy (2008)
  • Author(s): Y. Sugimoto, T. Namikawa, K. Miki, M.Abe, and S. Morita
  • Journal Title: Physical Review B vol.77 Pages: 195424-195424
• [Journal Article] フォースカーブによる元素識別とフォース・マッピン (2008)
  • Author(s): 森田清三、杉本宜昭、大藪範昭、Oscar Custance、阿部真之
  • Journal Title: 表面科学 Vol.29,No.4 Pages: 214-220
• [Journal Article] Atom-by-AtomChemical Coordination Effect Observedin Noncontact AFM Topography of Pb/Si(111)-( √3× √3) Mosaic Phase (2008)
  • Author(s): A. Ohiso, M. Hiragaki, K. Mizuta, M.Abe, and S. Morita
  • Journal Title: e-Journal of Surface Scienceand Nanotechnology vol.6 Pages: 79-83
• [Journal Article] Complex Patterning by Vertical Interchange Atom Manipulation Using Atomic Force Microscopy (2008)
  • Author(s): Yoshiaki Sugimoto
  • Journal Title: Science Vol. 322 Pages: 413-417
  • Peer Reviewed
• [Journal Article] Statistics of lateral atom manipulation by atomic force microscopy at room temperature (2008)
  • Author(s): Yoshiaki Sugimoto
  • Journal Title: Physical Review B Vol. 78
  • Peer Reviewed
• [Journal Article] Vertical and lateral force mapping on the Si(111)-(7×7) surface by dynamic force microscopy (2008)
  • Author(s): Yoshiaki Sugimoto
  • Journal Title: Physical Review B Vol. 77
  • Peer Reviewed
• [Journal Article] High Spatial Resolution Topographic Imaging and Dimer Distance Analysis of Si(100)-(2×1) Using Non-contact Atomic Force Microscopy (2008)
  • Author(s): Daisuke Sawada
  • Journal Title: Japanese Journal of Applied Physics Vol. 47 Pages: 6085-6087
  • Peer Reviewed
• [Journal Article] Solution Growth of Rubrene Single Crystals Using Various Organic Solvents (2008)
  • Author(s): Takeshi Matsukawa
  • Journal Title: Japanese Journal of Applied Physics Vol. 47 Pages: 8950-8954
  • Peer Reviewed
• [Journal Article] フォースカーブによる元素識別とフォース・マツピング (2008)
  • Author(s): 森田清三
  • Journal Title: 表面科学 Vol. 29 Pages: 214-220
  • Peer Reviewed
• [Journal Article] Chemical Coordination Effect Observed in Non-Contact AFM Topography of Pb/Si(111)-(√3×√3)Mosaic Phase (2008)
  • Author(s): Akihiro Ohiso
  • Journal Title: e-Journal of Surface Science and Nanotechnology Vol.6 Pages: 79-83
  • Peer Reviewed
• [Journal Article] 原子間力顕微鏡-超高分解能イメージングから原子操作,原子識別のツール- (2008)
  • Author(s): 阿部 真之
  • Journal Title: 未来材料 8 Pages: 6-9
  • Peer Reviewed
• [Journal Article] Efficiency enhancement in organic photovoltanic cell with interpenetrating conducting polymer/C_<60> heterojunction structure by sabstrate-heating treatment (2008)
  • Author(s): V. Kittichungchit
  • Journal Title: Japanese Journal of Applied Physics 47 Pages: 1094-1097
  • Peer Reviewed
• [Journal Article] Growth dynamics ofinsulating SrF2 films on Si(111) (2007)
  • Author(s): Y. Seino, S. Yoshikawa, M. Abe, and S.Morita
  • Journal Title: J.Phys. : Condens. Matter 19 Pages: 445001-445001
• [Journal Article] Dynamicforce spectroscopy using cantileverhigher flexural modes (2007)
  • Author(s): Y. Sugimoto, S. Innami, M. Abe, O.Custancee, and S. Morita
  • Journal Title: AppliedPhysics Letters 91 Pages: 93120-93120
• [Journal Article] Tip-induced LocalReconstruction on the Pb/Ge(111)Surface Using Frequency ModulationAtomic Force Microscopy (2007)
  • Author(s): A. Ohiso, Y. Sugimoto, M. Abe, and S.Morita
  • Journal Title: Japanese Journal of Applied Physics Vol.46,No.8B Pages: 5582-5585
• [Journal Article] Drift-compensated data acquisition performed at room temperature with frequency modulation atomic forcemicroscopy (2007)
  • Author(s): M. Abe, Y. Sugimoto, T. Namikawa, K.Morita, N. Oyabu, and S. Morita
  • Journal Title: Applied Physics Letters 90 Pages: 203103-203103
• [Journal Article] Mechanism for Room-Temperature Single-Atom Lateral Manipulations on Semiconductors using Dynamic Force Microscopy (2007)
  • Author(s): Y. Sugimoto, P. Jelinek, P. Pou, M. Abe,S. Morita, R. Perez, and O. Custance
  • Journal Title: Phys. Rev. Lett 98 Pages: 106104-106104
• [Journal Article] Growth dynamics of insulating SrF_2 films on Si(111) (2007)
  • Author(s): Yoshihide Seino
  • Journal Title: J. Phys.: Condensed Matter Vol.19
  • Peer Reviewed
• [Journal Article] Tip-induced Local Reconstruction on the Pb/Ge(111)Surface Using Frequency Modulation Atomic Force Microscopy (2007)
  • Author(s): Akihiro Ohiso
  • Journal Title: Japanese Journal of Applied Physics Vol.46 Pages: 5582-5585
  • Peer Reviewed
• [Journal Article] Dynamic force spectroscopy using cantilever higher flexural modes (2007)
  • Author(s): Yoshiaki Sugimoto
  • Journal Title: Applied Physics Letters Vol.91
  • Peer Reviewed
• [Journal Article] Drift-compensated data acquisition performed at room temperature with frequency modulation atomic force microscopy (2007)
  • Author(s): Masayuki Abe
  • Journal Title: Applied Physics Letters Vol.90
  • Peer Reviewed
• [Journal Article] ナノ計測・加工・評価技術と原子間力顕微鏡 (2007)
  • Author(s): 森田清三
  • Journal Title: 東レリサーチセンターThe TRC NEWS No.102 Pages: 1-13
  • Peer Reviewed
• [Journal Article] AFMによる個々の原子の元素同定 (2007)
  • Author(s): 杉本宜昭
  • Journal Title: 固体物理 第42巻 Pages: 775-783
  • Peer Reviewed
• [Journal Article] 原子分解能を有する原子間力顕微鏡法の新展開-原子種識別や原子操作を行うための新技術- (2007)
  • Author(s): 阿部真之
  • Journal Title: 日本物理学会誌 Vol.62 Pages: 829-837
  • NAID: 110006440249
  • Peer Reviewed
• [Journal Article] 原子の指紋-原子間力顕微鏡による元素識別- (2007)
  • Author(s): 阿部真之
  • Journal Title: 現代化学 No.440 Pages: 22-26
  • NAID: 40015674117
  • Peer Reviewed
• [Journal Article] AFMによる原子操作と複素ナノ構造体組立 (2007)
  • Author(s): 森田清三
  • Journal Title: 顕微鏡 第42巻 Pages: 100-105
  • Peer Reviewed
• [Presentation] Development of Atomic Force Microscopy Using Quartz Tuning Fork Operated in Ultra High Vacuum (2009)
  • Author(s): Takashi TERADO
  • Organizer: 3rd International Symposium on Atomic Technology (ISAT-3) 3rd Polyscale Technology Workshop (PTW-3)
  • Place of Presentation: Tokyo International Exchange Center, Tokyo, Japan
  • Year and Date: 2009-03-05
• [Presentation] Optical Interferometer for Detection and Excitation of Cantilever Motion : A Study of Atomic Force Microscopy (2009)
  • Author(s): Arushi SATO
  • Organizer: 3rd International Symposium on Atomic Technology (ISAT-3) 3rd Polyscale Technology Workshop (PTW-3)
  • Place of Presentation: Tokyo International Exchange Center, Tokyo, Japan
  • Year and Date: 2009-03-05
• [Presentation] Sensitivity improvement of interferometer for NC-AFM (2009)
  • Author(s): Kenichi INA
  • Organizer: 3rd International Symposium on Atomic Technology (ISAT-3) 3rd Polyscale Technology Workshop (PTW-3)
  • Place of Presentation: Tokyo International Exchange Center, Tokyo, Japan
  • Year and Date: 2009-03-05
• [Presentation] Investigation of excitation method for quartz tuning fork atomic force microscopy (2009)
  • Author(s): Yuki SASAGAWA
  • Organizer: 3rd International Symposium on Atomic Technology (ISAT-3) 3rd Polyscale Technology Workshop (PTW-3)
  • Place of Presentation: Tokyo International Exchange Center, Tokyo, Japan
  • Year and Date: 2009-03-05
• [Presentation] Observation of the metal oxide surface by scanning probe microscopy (2009)
  • Author(s): Hideki TANAKA
  • Organizer: 3rd International Symposium on Atomic Technology (ISAT-3) 3rd Polyscale Technology Workshop (PTW-3)
  • Place of Presentation: Tokyo International Exchange Center, Tokyo, Japan
  • Year and Date: 2009-03-05
• [Presentation] High Resolution Imaging of TiO_2 (110)-(1x1) Using Non-Contact AFM at Low Temperature (2009)
  • Author(s): Abdi PRATAMA
  • Organizer: 3rd International Symposium on Atomic Technology (ISAT-3)3rd Polyscale Technology Workshop (PTW-3)
  • Place of Presentation: Tokyo International Exchange Center, Tokyo, Japan
  • Year and Date: 2009-03-05
• [Presentation] High-resolution imaging of CaF_2/Si (111) surface using atomic resolution NC-AFM (2009)
  • Author(s): Makoto TAKEDA
  • Organizer: 3rd International Symposium on Atomic Technology (ISAT-3) 3rd Polyscale Technology Workshop (PTW-3)
  • Place of Presentation: Tokyo International Exchange Center, Tokyo, Japan
  • Year and Date: 2009-03-05
• [Presentation] Statistics of lateral atom manipulation by atomic force microscopy at room temperature (2009)
  • Author(s): Yuki NAKAJIMA
  • Organizer: 3rd International Symposium on Atomic Technology (ISAT-3) 3rd Polyscale Technology Workshop (PTW-3)
  • Place of Presentation: Tokyo International Exchange Center, Tokyo, Japan
  • Year and Date: 2009-03-05
• [Presentation] Investigation into small diameter metal tip for force sensor (2009)
  • Author(s): Hitomi HASEGAWA
  • Organizer: 3rd International Symposium on Atomic Technology (ISAT-3) 3rd Polyscale Technology Workshop (PTW-3)
  • Place of Presentation: Tokyo International Exchange Center, Tokyo, Japan
  • Year and Date: 2009-03-05
• [Presentation] Deflection amplifier for tuning fork operated in ultra-high vacuum (2009)
  • Author(s): Saeidifar SOMAYEH
  • Organizer: 3rd International Symposium on Atomic Technology (ISAT-3) 3rd Polyscale Technology Workshop (PTW-3)
  • Place of Presentation: Tokyo International Exchange Center, Tokyo, Japan
  • Year and Date: 2009-03-05
• [Presentation] 原子間力顕微鏡による多元素ナノ材料の元素マッピングとボトムアップ組立 (2009)
  • Author(s): 阿部真之、澤田大輔、Yurtsever Ayhan、杉本宜昭、森田清三
  • Organizer: 応用物理学会
• [Presentation] AFMを用いた室温原子操作の統計的実験 (2009)
  • Author(s): 杉本宜昭、三木浩太郎、阿部真之、森田清三
  • Organizer: 応用物理学会
• [Presentation] 室温環境下における相互作用力/トンネル電流の同時測定 (2009)
  • Author(s): 澤田大輔、杉本宜昭、阿部真之、森田清三
  • Organizer: 応用物理学会
• [Presentation] 室温原子操作の原子移動確率の研究 (2009)
  • Author(s): 杉本宜昭、三木浩太郎、阿部真之、森田清三
  • Organizer: 金属学会
• [Presentation] Ge(111)-c(2×8)表面におけるAFM/STM同時測定 (2009)
  • Author(s): 澤田大輔、杉本宜昭、阿部真之、森田清三
  • Organizer: 金属学会
• [Presentation] AFM/STMによる周波数シフトとトンネル電流の同時測 (2009)
  • Author(s): 澤田大輔、杉本宜昭、阿部真之、森田清三
  • Organizer: 物理学会
• [Presentation] Statistics of Lateral Atom Manipulation by Atomic Fprce Microscopy at Room Temperature (2008)
  • Author(s): Yoshiaki Sugimoto
  • Organizer: The 16th International Colloquium on Scanning Probe Microscopy
  • Place of Presentation: Atagawa, Japan
  • Year and Date: 2008-12-13
• [Presentation] NC-AFM/STM Study on the Semiconductor Surface (2008)
  • Author(s): Daisuke Sawada
  • Organizer: The 16th International Colloquium on Scanning Probe Microscopy
  • Place of Presentation: Atagawa, Japan
  • Year and Date: 2008-12-11
• [Presentation] 非接触原子間力顕微鏡を用いたフォース・マッピング (2008)
  • Author(s): 杉本宜昭
  • Organizer: 社団法人 日本表面科学会 主催第28回表面科学学術講演会
  • Place of Presentation: 早稲田大学総合学術情報センター(国際会議場)
  • Year and Date: 2008-11-15
• [Presentation] Vertical and lateral force mapping by non-contact atomic force microscopy (2008)
  • Author(s): Yoshiaki Sugimoto
  • Organizer: International Symposium on Surface Science and Nanotechnology (ISSS-5)
  • Place of Presentation: Waseda University, Tokyo, Japan
  • Year and Date: 2008-11-10
• [Presentation] Toward Atom-by-Atom Assembly of Composite Nanostructures Based on Atomic Force Microscopy (2008)
  • Author(s): Seizo Morita
  • Organizer: 21st International Microprocesses and Nanotechnology Conference (MNC 2008)
  • Place of Presentation: Fukuoka, Japan
  • Year and Date: 2008-10-29
• [Presentation] Atomic Tool for Nanofabrication Based on Atomic Force Microscopy (2008)
  • Author(s): Seizo Morita
  • Organizer: 55th AVS International Symposium
  • Place of Presentation: Boston, MA, USA
  • Year and Date: 2008-10-21
• [Presentation] Observation of the metal oxide surface by scanning probe microscopy (2008)
  • Author(s): Akira Hirai
  • Organizer: 4th Handai Nanoscience and technology International Symposium
  • Place of Presentation: Suita, Japan
  • Year and Date: 2008-09-30
• [Presentation] NC-AFM/STM measurements on the Ge(111)-c(2x8) Surface (2008)
  • Author(s): Daisuke Sawada
  • Organizer: 4th Handai Nanoscience and technology International Symposium
  • Place of Presentation: Suita, Japan
  • Year and Date: 2008-09-30
• [Presentation] Single atom manipulaiton at room temperature (2008)
  • Author(s): Yoshiaki Sugimoto
  • Organizer: 4th Handai Nanoscience and technology International Symposium
  • Place of Presentation: Suita, Japan
  • Year and Date: 2008-09-29
• [Presentation] 非接触原子間力顕微鏡を用いたSnを蒸着したSi(111)-(7×7)表面での原子操作 (2008)
  • Author(s): 三木浩太郎
  • Organizer: 日本金属学会2008年秋季(第143回)大会
  • Place of Presentation: 熊本大学黒髪キャンパス
  • Year and Date: 2008-09-25
• [Presentation] 非接触原子間力顕微鏡を用いた金属酸化物表面の観察 (2008)
  • Author(s): 平井 明
  • Organizer: 日本金属学会2008年秋季(第143回)大会
  • Place of Presentation: 熊本大学黒髪キャンパス
  • Year and Date: 2008-09-25
• [Presentation] Force spectroscopy using cantilever higher flexural modes (2008)
  • Author(s): Oscar Custance
  • Organizer: 11th International Conference on Non-contact Atomic Force Microscopy
  • Place of Presentation: Madrid, Spain
  • Year and Date: 2008-09-19
• [Presentation] Imaging and Mapping for discriminating atom species using Non-contact Atomic Force Microscopy (2008)
  • Author(s): Masayuki Abe
  • Organizer: 11th International, Conference on Non-contact Atomic Force Microscopy
  • Place of Presentation: Madrid, Spain
  • Year and Date: 2008-09-19
• [Presentation] Vertical and lateral force mapping on the Si(111)-(7x7) surface by dynamic force microscopy (2008)
  • Author(s): Yoshiaki Sugimoto
  • Organizer: 11th International Conference on Non-contact Atomic Force Microscopy
  • Place of Presentation: Madrid, Spain
  • Year and Date: 2008-09-16
• [Presentation] Distinct short-range electrostatic interaction on Si and substitutional Pb atoms at the Si(111)-(7x7) surface (2008)
  • Author(s): Sascha Sadewasser
  • Organizer: 11th International Conference on Non-contact Atomic Force Microscopy
  • Place of Presentation: Madrid, Spain
  • Year and Date: 2008-09-16
• [Presentation] Unveiling the atomic processes during the manipulation of single atoms at semiconductor surfaces using the FM-AFM in the repulsive regime (2008)
  • Author(s): Pablo Pou
  • Organizer: 11th International Conference on Non-contact Atomic Force Microscopy
  • Place of Presentation: Madrid, Spain
  • Year and Date: 2008-09-16
• [Presentation] Atom-by-Atom Chemical Identification and Following Manipulation on Semiconductor Surfaces Toward Nanostructuring at Room Temperature (2008)
  • Author(s): Seizo Morita
  • Organizer: the 14th International Conference on Solid Films and Surfaces (ICSFS-14)
  • Place of Presentation: Trinity College Dublin, Ireland
  • Year and Date: 2008-07-01
• [Presentation] Imaging of the Si clusters on the Si(111)-(7×7) surface by using NC-AFM (2008)
  • Author(s): Satoru Iwasaki
  • Organizer: The 1st International Symposium on Advanced Microscopy and Theoretical Calculations (AMTC)
  • Place of Presentation: Nagoya, Japan
  • Year and Date: 2008-06-30
• [Presentation] NC-AFM study of phosphorous/Si(001)2×1 surface (2008)
  • Author(s): Daisuke Sawada
  • Organizer: The 1st International Symposium on Advanced Microscopy and Theoretical Calculations (AMTC)
  • Place of Presentation: Nagoya, Japan
  • Year and Date: 2008-06-29
• [Presentation] Atomic force techniques fornano-engineering(TU-K9) (2008)
  • Author(s): M. Abe, Y. Sugimoto, and S. Morita
  • Organizer: International Symposium on Physics of Quantum Technology
• [Presentation] Vertical and lateral force mapping on the Si(111)-(7x7) surface by dynamic force microscopy (2008)
  • Author(s): Y. Sugimoto, T. Namikawa, K. Miki, M.Abe, and S. Morita
  • Organizer: The 11th International Conference on Non-contact Atomic Force Microscopy(NC-AFM)
• [Presentation] Imaging and Mapping for discriminating atom species using Non-contact Atomic Force Microscopy (2008)
  • Author(s): M. Abe, Y. Sugimoto, K. Miki, T.Namikawa, and S. Morita
  • Organizer: The 11th International Conference on Non-contact Atomic Force Microscopy(NC-AFM)
• [Presentation] フォースマッピングを用いたSi(111)-(7x7)上における探針に働く水平力の解析(4a-L5) (2008)
  • Author(s): 杉本宜昭、並川峻、三木浩太郎、阿部真之、森田清三
  • Organizer: 第69回応用物理学会学術講演会
• [Presentation] フォースマッピングによるFM-AFM凹凸像の考察(4a-L4) (2008)
  • Author(s): 杉本宜昭、並川峻、三木浩太郎、阿部真之、森田清三
  • Organizer: 第69回応用物理学会学術講演会
• [Presentation] 原子間力顕微鏡を用いた化学結合力マッピング(S3・24) (2008)
  • Author(s): 杉本宜昭、阿部真之、並川峻、三木浩太郎、森田清三
  • Organizer: 日本金属学会春期大会
• [Presentation] 原子間力顕微鏡の超高空間分解能イメージング(S3・23) (2008)
  • Author(s): 阿部真之、杉本宜昭、澤田大輔、李仁淑、森田清三
  • Organizer: 日本金属学会春期大会
• [Presentation] 2次共振モード原子間力顕微鏡によるForce spectroscopy(29a-Q-6) (2008)
  • Author(s): 杉本宜昭、院南誠嗣、阿部真之、クスタンセオスカル、森田清三
  • Organizer: 第55回応用物理学関係連合講演会
• [Presentation] P/Si(001)表面の高分解能NC-AFM観察(29a-Q-3) (2008)
  • Author(s): 澤田大輔、並川峻、平垣倍弘、杉本宜昭、阿部真之、森田清三
  • Organizer: 第55回応用物理学関係連合講演会
• [Presentation] 非接触原子間力顕微鏡を用いたSi(111)-(7x7)表面上のSiクラスタに関する研究(29a-Q-2) (2008)
  • Author(s): 岩崎悟、平井明、杉本宜昭、阿部真之、森田清三
  • Organizer: 第55回応用物理学関係連合講演会
• [Presentation] AFMによるP/Si(001)-(2x1)表面観察(24pPSA-22) (2008)
  • Author(s): 澤田大輔、並川峻、平垣倍弘、杉本宜昭、阿部真之、森田清三
  • Organizer: 日本物理学会第63回年次大会
• [Presentation] Room Temperature Atomic Manipulation Using Dynamic Force Microscopy (2007)
  • Author(s): Yoshiaki Sugimoto
  • Organizer: The 15th International Colloquium on Scanning Probe Microscopy
  • Place of Presentation: Atagawa, Japan
  • Year and Date: 2007-12-07
• [Presentation] Atom Manipulation on the Sn Deposited Si(111)-(7x7)Surface Using Atomic Force Microscopy (2007)
  • Author(s): Koutarou Miki
  • Organizer: The 15th International Colloquium on Scanning Probe Microscopy
  • Place of Presentation: Atagawa, Japan
  • Year and Date: 2007-12-06
• [Presentation] Atom Identification by Dynamic Force Mapping (2007)
  • Author(s): Takashi Namikawa
  • Organizer: The 15th International Colloquium on Scanning Probe Microscopy
  • Place of Presentation: Atagawa, Japan
  • Year and Date: 2007-12-06
• [Presentation] NC-AFM Investigation of the Si Cluster on the Si(111)-(7x7) Surface (2007)
  • Author(s): Satoru Iwasaki
  • Organizer: The 15th International Colloquium on Scanning Probe Microscopy
  • Place of Presentation: Atagawa, Japan
  • Year and Date: 2007-12-06
• [Presentation] AFM Observation of P/Si(001)-(2x1) Surface (2007)
  • Author(s): Daisuke Sawada
  • Organizer: The 15th International Colloquium on Scanning Probe Microscopy
  • Place of Presentation: Atagawa, Japan
  • Year and Date: 2007-12-06
• [Presentation] LabVIEWで原子を見て動かす (2007)
  • Author(s): 阿部真之
  • Organizer: Lab VIEW days
  • Place of Presentation: ホテルプリンスパークタワー東京
  • Year and Date: 2007-11-22
• [Presentation] Principles and State of the Art of Atomic Force Microscopy (2007)
  • Author(s): Seizo Morita
  • Organizer: 6th Int. Symp. Atomic Level Characterizations for New Materials and Devices'07 (ALC07)
  • Place of Presentation: Kanazawa Art Hall, Ishikawa, Japan
  • Year and Date: 2007-10-28
• [Presentation] Mechanism for room-temperature single-atom lateral manipulations on semiconductors using dynamic force microscopy (2007)
  • Author(s): Yoshiaki Sugimoto
  • Organizer: Second International Symposium on Atomic Technologies(ISAT-2)
  • Place of Presentation: Awaji Yumebutai, Hyogo, Japan
  • Year and Date: 2007-10-01
• [Presentation] Tip-surface interaction potential mapping at room-temperature using non-contact atomic force microscopy (2007)
  • Author(s): Takashi Namikawa
  • Organizer: Second International Symposium on Atomic Technologies(ISAT-2)
  • Place of Presentation: Awaji Yumebutai, Hyogo, Japan
  • Year and Date: 2007-10-01
• [Presentation] Non-contact atomic force microscopy investigation of the Pb/Si(111)-(√3×√3) mosaic phase (2007)
  • Author(s): Akihiro Ohiso
  • Organizer: Second International Symposium on Atomic Technologies (ISAT-2)
  • Place of Presentation: Awaji Yumebutai, Hyogo, Japan
  • Year and Date: 2007-10-01
• [Presentation] Atomic force microscopy using quartz tuning fork in air (2007)
  • Author(s): Yusuke Murai
  • Organizer: Second International Symposium on Atomic Technologies (ISAT-2)
  • Place of Presentation: Awaji Yumebutai, Hyogo, Japan
  • Year and Date: 2007-10-01
• [Presentation] Room temperature lateral atom manipulations on semiconductors using dynamic force microscopy (2007)
  • Author(s): Yoshiaki Sugimoto
  • Organizer: Handai Nanoscience and Nanotechnology International Symposium 2007
  • Place of Presentation: Sigma Hall, Osaka University, Japan
  • Year and Date: 2007-09-27
• [Presentation] Potential mapping at room-temperature using dynamic force microscopy (2007)
  • Author(s): Takashi Namikawa
  • Organizer: Handai Nanoscience and Nanotechnology International Symposium 2007
  • Place of Presentation: Sigma Hall, Osaka University, Japan
  • Year and Date: 2007-09-27
• [Presentation] Surrounding atoms effects on the Pb/Si(111)-(√3×√3)mosaic phase (2007)
  • Author(s): Akihiro Ohiso
  • Organizer: Handai Nanoscience and Nanotechnology International Symposium 2007
  • Place of Presentation: Sigma Hall, Osaka University, Japan
  • Year and Date: 2007-09-27
• [Presentation] Atomic force microscopy using quartz tuning fork in air (2007)
  • Author(s): Yusuke Murai
  • Organizer: Handai Nanoscience and Nanotechnology International Symposium 2007
  • Place of Presentation: Sigma Hall, Osaka University, Japan
  • Year and Date: 2007-09-27
• [Presentation] AFMによる原子のidentification (2007)
  • Author(s): 杉本宜昭
  • Organizer: 日本物理学会 第62回年次大会
  • Place of Presentation: 北海道大学,北海道
  • Year and Date: 2007-09-23
• [Presentation] Characterization of the electrostatic interaction on substitutional Pb atoms at the Si(111)-(7×7)surface using low temperature dynamic force microscopy (2007)
  • Author(s): Yusaku Yamada
  • Organizer: The 10th International Conference on Non-Contact Atomic Force Microscopy
  • Place of Presentation: Antalya, Turkey
  • Year and Date: 2007-09-18
• [Presentation] Investigations of Organic Molecules by Frequency Modulation Atomic Force Microscopy in Air or Liquid (2007)
  • Author(s): Masahiro Ohta
  • Organizer: The 10th International Conference on Non-Contact Atomic Force Microscopy
  • Place of Presentation: Antalya, Turkey
  • Year and Date: 2007-09-18
• [Presentation] Development of Low-thermal Drift FM-AFM Working in Air/Liquid Environments (2007)
  • Author(s): Noriaki Oyabu
  • Organizer: The 10th International Conference on Non-Contact Atomic Force Microscopy
  • Place of Presentation: Antalya, Turkey
  • Year and Date: 2007-09-18
• [Presentation] Chemical identification of individual surface atoms using dynamic force microscopy (2007)
  • Author(s): Oscar Custance
  • Organizer: Trends in Nanotechnology (TNT2007) International Conference
  • Place of Presentation: San Sebastian, Spain
  • Year and Date: 2007-09-04
• [Presentation] Toward atom-by-atom assembly of complex nanostructures at room temperature based on AFM (2007)
  • Author(s): Seizo Morita
  • Organizer: The 10th Asia Pacific Physics Conference (APPC10)
  • Place of Presentation: POSTECH, Pohang, Korea
  • Year and Date: 2007-08-23
• [Presentation] Force spectroscopy and single atom chemical identification (2007)
  • Author(s): Oscar Custance
  • Organizer: Workshop on atomic/molecular manipulation and spectroscopy using scanning probe techniques
  • Place of Presentation: Suita Campus, Osaka University, Japan
  • Year and Date: 2007-08-02
• [Presentation] Atomic manipulation using dynamic force microscopy (2007)
  • Author(s): Yoshiaki Sugimoto
  • Organizer: Workshop on atomic/molecular manipulation and spectroscopy using scanning probe techniques
  • Place of Presentation: Suita Campus, Osaka University, Japan
  • Year and Date: 2007-08-01
• [Presentation] Drift-compensated data acquisition performed at room temperature with frequency modulation atomic force microscopy (2007)
  • Author(s): Masayuki Abe
  • Organizer: 17th International Vacuum Conference
  • Place of Presentation: Stockholm, Sweden
  • Year and Date: 2007-07-02
• [Presentation] AFMを用いた力学的元素識別 (2007)
  • Author(s): 杉本宜昭
  • Organizer: 日本顕微鏡学会 第63回学術講演会
  • Place of Presentation: 朱鷺メッセ(新潟コンベンションセンター),新潟
  • Year and Date: 2007-05-20
• [Presentation] 原子間力顕微鏡を用いた「交換型垂直原子操作」 (2007)
  • Author(s): 杉本宜昭
  • Organizer: 日本顕微鏡学会 第63回学術講演会
  • Place of Presentation: 朱鷺メッセ(新潟コンベンションセンター),新潟
  • Year and Date: 2007-05-20
• [Presentation] AFMを用いた個々の原子の元素同定 (2007)
  • Author(s): 杉本宜昭
  • Organizer: 日本真空協会 関西支部、平成19年度講演会(第2回)・研究会(第1回)
  • Place of Presentation: 大阪大学吹田キャンパス内、材料開発物性記念館
  • Year and Date: 2007-05-10
• [Presentation] Room temperature atomic manipulations using dynamic force microscopy(S7-1) [invited talk] (2007)
  • Author(s): Y. Sugimoto, M. Abe, O. Custance, S.Morita, P. Pou, P. Jelinek and R. Perez
  • Organizer: The 15th InternationalColloquium on Scanning ProbeMicroscopy
• [Presentation] AFM observation of P/Si(001)-(2x1)surface(S4-23) (2007)
  • Author(s): D. Sawada, T. Namikawa, M. Hiragaki,Y. Sugimoto, M. Abe, and S. Moritam
  • Organizer: The 15th InternationalColloquium on Scanning Probe Microscopy
• [Presentation] NC-AFM investigation of the Si clusters on Si(111)-(7×7) surface(S4-22) (2007)
  • Author(s): S. Iwasaki, A. Hirai, Y. Sugimoto, M.Abe, and S. Morita
  • Organizer: The 15th International Colloquium on Scanning Probe Microscopy
• [Presentation] Atomic identification by dynamic force mapping(S4-21) (2007)
  • Author(s): T. Namikawa, K. Miki, Y. Sugimoto, O.Custance, M. Abe, and S. Morita
  • Organizer: The 15th International Colloquium on Scanning Probe Microscopy
• [Presentation] Atomic manipulation on the Sn deposited Si(111)-(7x7) surface using atomic force microscopy(S4-20) (2007)
  • Author(s): K. Miki, T. Namikawa, Y. Sugimoto, M.Abe, and S. Morita
  • Organizer: The 15th International Colloquium on Scanning Probe Microscopy
• [Presentation] Atom-by-Atom Chemical Identification and Following Atom Manipulation(B-14) (2007)
  • Author(s): S. Morita, Y. Sugimoto, O. Custance,M. Abe, P. Pou, P. Jelinek and R. Perez
  • Organizer: 2nd International Workshop on "Materials Science and Nano-Engineering"
• [Presentation] Atomic force microscopy study of P/Si(001)-(2x1) surface(PB-07) (2007)
  • Author(s): D. Sawada, T. Namikawa, M. Hiragaki,Y. Sugimoto, M. Abe, and S. Morita
  • Organizer: 2nd International Workshop on "Materials Science and Nano-Engineering
• [Presentation] Atomic force microscopy using quarz tuning fork in air(PB-05) (2007)
  • Author(s): Y. Murai, R. Omae, Y. Sugimoto, M. Abe,and S. Morita
  • Organizer: 2nd International Workshop on "Materials Science and Nano-Engineering
• [Presentation] Potential mapping using non-contact atomic force microscopy(PB-04) (2007)
  • Author(s): T. Namikawa, K. Miki, Y. Sugimoto, O.Custance, M. Abe, and S. Morita
  • Organizer: 2nd International Workshop on "Materials Science and Nano-Engineering
• [Presentation] Non-Contact AFM observation of the "Chemical Coordination Effect" of Pb/Si(111)-(√3×√3) Mosaic Phase(PB-03) (2007)
  • Author(s): A. Ohiso, M. Hiragaki, K. Mizuta, Y.Sugimoto, M. Abe, and S. Morita
  • Organizer: 2nd International Workshop on "Materials Science and Nano-Engineering"
• [Presentation] Force spectroscopy using human interface(PB-02) (2007)
  • Author(s): M. Hiragaki, D. Sawada, Y. Sugimoto,M. Abe, and S. Morita
  • Organizer: 2nd International Workshop on "Materials Science and Nano-Engineering"
• [Presentation] 高次共振モード原子間力顕微鏡によるフォーススペクトロスコピー(1D25) (2007)
  • Author(s): 杉本宜昭、院南誠嗣、阿部真之、クスタンセ・オスカル、森田清三
  • Organizer: 日本表面科学会第27回表面化学講演大会
• [Presentation] Atomic force microscopy using quartz tuning fork in air(P-1-17) (2007)
  • Author(s): Y. Murai, R. Omae, Y. Sugimoto, M. Abe,and S. Morita
  • Organizer: 2nd International Symposium on Atomic Technologie
• [Presentation] Surrounding atoms effects on the Pb/Si(111)-(√3×√3) mosaic phase(P-1-14) (2007)
  • Author(s): A. Ohiso, M. Hiragaki, K. Mizuta, Y.Sugimoto, M. Abe, and S. Morita
  • Organizer: 2nd International Symposium on Atomic Technologie
• [Presentation] Potential mapping at room-temperature using dynamic force microscopy(P-1-13) (2007)
  • Author(s): T. Namikawa, Y. Sugimoto, O. Custance,M. Abe, and S. Morita
  • Organizer: 2nd International Symposium on Atomic Technologie
• [Presentation] Room temperature lateral atom manipulations on semiconductors using dynamic force microscopy(P-1-7) (2007)
  • Author(s): Y. Sugimoto, M. Abe, O. Custance, S.Morita, P. Jelinek, P. Pou, and R.Perez
  • Organizer: 2nd International Symposium on Atomic Technologie
• [Presentation] Atomic force microscopy using quartz tuning fork in air(P-16) (2007)
  • Author(s): Y. Murai, R. Omae, Y. Sugimoto, M. Abe,and S. Morita
  • Organizer: Handai Nanoscience and Nanotechnology International Symposium
• [Presentation] Non-contact atomic force microscopy investigation of the Pb/Si(111)-(√3×√3) mosaic phase(P-11) (2007)
  • Author(s): A.Ohiso, M. Hiragaki, K. Mizuta, Y.Sugimoto, M. Abe, and S. Morita
  • Organizer: Handai Nanoscience and Nanotechnology International Symposium
• [Presentation] Tip-surface interaction potential mapping at room-temperature using non-contact atomic force microscopy(P-8) (2007)
  • Author(s): T. Namikawa, Y. Sugimoto, K. Morita,O. Custance, M. Abe, and S. Morita
  • Organizer: Handai Nanoscience and Nanotechnology International Symposium
• [Presentation] Drift-compensated data acquisition performed at room temperature with frequency modulation atomic force microscopy(NSP1-76) (2007)
  • Author(s): M. Abe, Y. Sugimoto, O. Custance, andS. Morita
  • Organizer: 17th International Vacuum Conference
  • Place of Presentation: Stockholm, Sweden
• [Presentation] Mechanism for room-temperature single-atom lateral manipulations on semiconductors using dynamic force microscopy(P-7) (2007)
  • Author(s): Y. Sugimoto, M. Abe, O. Custance, S.Morita, P. Jelinek, P. Pou, and R.Perez
  • Organizer: Handai Nanoscience and Nanotechnology International Symposium
• [Presentation] Drift-compensated data acquisition performed at room temperature with frequency modulation atomic force microscopy (2007)
  • Author(s): S. Morita, M. Abe, Y. Sugimoto, O.Custance
  • Organizer: 17th International Vacuum Conference
• [Presentation] Force spectroscopy using human interface (2007)
  • Author(s): Masuhiro Hiragak
  • Organizer: 2nd International Workshop on Materials Science and Nano-Engineering
  • Place of Presentation: Awaji Yumebutai, Japan
• [Presentation] Non-Contact AFM observation of the "Chemical Coordination Effect" of Pb/Si(111)-(√3×√3)Mosaic Phase (2007)
  • Author(s): Akihiro Ohiso
  • Organizer: 2nd International Workshop on Materials Science and Nano-Engineering
  • Place of Presentation: Awaji Yumebutai, Japan
• [Presentation] Potential mapping using non-contact atomic force microscopy (2007)
  • Author(s): Takashi Namikawa
  • Organizer: 2nd International Workshop on Materials Science and Nano-Engineering
  • Place of Presentation: Awaji Yumebutai, Japan
• [Presentation] Atomic force microscopy using quartz tuning fork in air (2007)
  • Author(s): Yusuke Murai
  • Organizer: 2nd International Workshop on Materials Science and Nano-Engineering
  • Place of Presentation: Awaji Yumebutai, Japan
• [Presentation] Atomic force microscopy study of P/Si(001)-(2x1) surface (2007)
  • Author(s): Daisuke Sawada
  • Organizer: 2nd International Workshop on Materials Science and Nano-Engineering
  • Place of Presentation: Awaji Yumebutai, Japan
• [Book] Precise Force Measurement (2009)
  • Author(s): M. Abe
  • Publisher: Chap. 2 in "Noncontact Atomic Force Microscopy vol.2"2009年(出版予定)(Springer)
• [Remarks]
  • URL: http://www.afm.eei.eng.osaka-u.ac.jp/jp/index.html
• [Remarks]
  • URL: http://www.afm.eei.eng.osaka-u.ac.jp/jp/index.html
• [Patent(Industrial Property Rights)] 原子間力顕微鏡及びそれを用いた相互作用力測定法 (2008)
  • Inventor(s): 大田昌弘, 大藪範昭, -阿部真之-, オスカル・クスタンセ, 杉本宜昭, 森田清三
  • Industrial Property Rights Holder: 株式会社島津製作所および国立大学法人大阪大学
  • Filing Date: 2008-01-17
  • Overseas
• [Patent(Industrial Property Rights)] 「Probe position control system and method」 (2007)
  • Inventor(s): Masayuki Abe, Masahiro Ohta, Yoshiaki Sugimoto, Kenichi Morita, Noriaki Oyabu,Morita Seizo
  • Industrial Property Rights Holder: SHIMADZU CORPORATION and OSAKA UNIVERSITY
  • Filing Date: 2007-05-24
• [Patent(Industrial Property Rights)] Probe position control system and method (2007)
  • Inventor(s): Masayuki Abe, Masahiro Ohta, Yoshiaki Sugimoto, Kenichi Morita, Noriaki Oyabu, Morita Seizo, Oscar Custance
  • Industrial Property Rights Holder: SHIMADZU CORPORATION and OSAKA UNIVERSITY
  • Filing Date: 2007-05-24
  • Overseas
• [Patent(Industrial Property Rights)] 探針位置制御装置及び方法 (2007)
  • Inventor(s): Masayuki Abe, Masahiro Ohta, Yoshiaki Sugimoto, Kenichi Morita, Noriaki Oyabu, Oscar Custance, Seizo Morita
  • Industrial Property Rights Holder: 株式会社島津製作所及び国立大学法人大阪大学
  • Filing Date: 2007-05-25
  • Overseas
• [Patent(Industrial Property Rights)] Probe position control system and method (2007)
  • Inventor(s): Masayuki Abe, Masahiro Ohta, Yoshiaki Sugimoto, Kenichi Morita, Noriaki Oyabu, Oscar Custance, Seizo Morita
  • Industrial Property Rights Holder: Shimazu Corporation and Osaka University
  • Filing Date: 2007-05-24
  • Overseas