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Noncontact Temperature Measurement During Rapid Thermal Annealing and Investigation on Impurity Activation

Research Project

Project/Area Number 19360187
Research Category

Grant-in-Aid for Scientific Research (B)

Allocation TypeSingle-year Grants
Section一般
Research Field Measurement engineering
Research InstitutionHiroshima University

Principal Investigator

HIGASHI Seiichiro  Hiroshima University, 大学院・先端物質科学研究科, 准教授 (30363047)

Project Period (FY) 2007 – 2009
Project Status Completed (Fiscal Year 2009)
Budget Amount *help
¥18,200,000 (Direct Cost: ¥14,000,000、Indirect Cost: ¥4,200,000)
Fiscal Year 2009: ¥2,990,000 (Direct Cost: ¥2,300,000、Indirect Cost: ¥690,000)
Fiscal Year 2008: ¥6,500,000 (Direct Cost: ¥5,000,000、Indirect Cost: ¥1,500,000)
Fiscal Year 2007: ¥8,710,000 (Direct Cost: ¥6,700,000、Indirect Cost: ¥2,010,000)
Keywords計測システム / 超々大規模集積回路 / 薄膜トランジスタ / 不純物活性化 / 極浅接合 / 急速熱処理 / 非接触温度測定
Research Abstract

Activation of As and B atoms in Silicon wafer surface by thermal plasma jet (TPJ) annealing has been investigated. The sheet resistance of B-implanted samples saturates at an annealing temperature higher than 1400K, while it is 1000K in the case of As-implanted samples. In the case of As, not only the annealing temperature, but faster heating and cooling rates play important role to achieve efficient activation.

Report

(4 results)
  • 2009 Annual Research Report   Final Research Report ( PDF )
  • 2008 Annual Research Report
  • 2007 Annual Research Report
  • Research Products

    (56 results)

All 2010 2009 2008 2007 Other

All Journal Article (9 results) (of which Peer Reviewed: 9 results) Presentation (41 results) Book (2 results) Remarks (4 results)

  • [Journal Article] Activation of B and As in Ultrashallow Junction During Millisecond Annealing Induced by Thermal Plasma Jet Irradiation2010

    • Author(s)
      K. Matsumoto, S. Higashi, H. Murakami, S. Miyazaki
    • Journal Title

      Jpn. J. Appl. Phys 49

    • NAID

      210000068160

    • Related Report
      2009 Final Research Report
    • Peer Reviewed
  • [Journal Article] Characterization of Microcrystalline Silicon Thin Film Transistors Fabricated by Thermal Plasma Jet Crystallization Technique2010

    • Author(s)
      S. Higashi, K. Sugakawa, H. Kaku, T. Okada, S. Miyazaki
    • Journal Title

      Jpn. J. Appl. Phys 49

    • NAID

      210000068062

    • Related Report
      2009 Final Research Report
    • Peer Reviewed
  • [Journal Article] Millisecond Rapid Thermal Annealing of Si wafer Induced by High Power Density Thermal Plasma Jet Irradiation and Its application to Ultra Shallow Junction Formation2009

    • Author(s)
      H. Furukawa, S. Higashi, T. Okada, H. Kaku, H. Murakami, S. Miyazaki
    • Journal Title

      Jpn. J. Appl. Phys 48(4)

    • Related Report
      2009 Final Research Report
    • Peer Reviewed
  • [Journal Article] "熱プラズマによるアモルファスシリコンの結晶化, "「講座熱流を伴う反応性プラズマを用いた材料合成プロセス3. 結晶化・相変化制御への応用」2009

    • Author(s)
      東清一郎, 宮崎誠一
    • Journal Title

      プラズマ・核融合学会誌 85(3)

      Pages: 119-123

    • Related Report
      2009 Final Research Report
    • Peer Reviewed
  • [Journal Article] Millisecond Rapid Thermal Annealing of Si Wafer Induced by High Density Thermal Plasma Jet Irradiation2009

    • Author(s)
      H. Furukawa
    • Journal Title

      Jpn. J. Appl. Phys. 48(in press)

    • Related Report
      2008 Annual Research Report
    • Peer Reviewed
  • [Journal Article] In-situ Monitoring of Si Wafer Temperature during Millisecond Rapid Thermal Annealing2008

    • Author(s)
      H. Furukawa, S. Higashi, T. Okada, H. Kaku, H. Murakami, S. Miyazaki
    • Journal Title

      Electrochem. Soc. Trans 13(1)

      Pages: 31-36

    • Related Report
      2009 Final Research Report
    • Peer Reviewed
  • [Journal Article] In-situ Measurement of Temperature Variation in Si Wafer During Millisecond Rapid Thermal Annealing Induced by Thermal Plasma Jet Irradiation2008

    • Author(s)
      H. Furukawa, S. Higashi, T. Okada, H. Kaku, H. Murakami, S. Miyazaki
    • Journal Title

      Jpn. J. Appl. Phys 47(4)

      Pages: 2460-2463

    • NAID

      10022549196

    • Related Report
      2009 Final Research Report
    • Peer Reviewed
  • [Journal Article] In-situ Monitoring of Si Wafer Temperature during Millisecond Rapid Thermal Annealing2008

    • Author(s)
      H. Furukawa
    • Journal Title

      Electrochem. Soc. Trans. 13

      Pages: 31-36

    • Related Report
      2008 Annual Research Report
    • Peer Reviewed
  • [Journal Article] In-situ Measurement of Temperature Variation in Si Wafer During Millisecond Rapid Thermal Annealing Induced by Thermal Plasma Jet Irradiation2008

    • Author(s)
      H. Furukawa
    • Journal Title

      Jpn. J. Appl. Phys. 47(in press)

    • Related Report
      2007 Annual Research Report
    • Peer Reviewed
  • [Presentation] 大気圧熱プラズマジェットを用いたシリコン膜のマイクロ秒溶融結晶化と高性能TFT作製応用2010

    • Author(s)
      東清一郎
    • Organizer
      電子情報通信学会技術研究報告シリコン材料・デバイス
    • Place of Presentation
      沖縄青年会館
    • Year and Date
      2010-04-23
    • Related Report
      2009 Final Research Report
  • [Presentation] 高密度熱プラズマジェット照射急速熱処理による極浅接合中の高効率不純物活性化2010

    • Author(s)
      松本和也
    • Organizer
      第57回応用物理学関係連合講演会
    • Place of Presentation
      東海大学湘南キャンパス
    • Year and Date
      2010-03-17
    • Related Report
      2009 Annual Research Report
  • [Presentation] Millisecond Annealing Induced by Atmospheric Pressure Thermal Plasma Jet Irradiation and Its Application to Ultra Shallow Junction Formation2010

    • Author(s)
      S. Higashi
    • Organizer
      Ext. Abs. 2010 Int. Workshop Junction Tech. (IWJT-2010)
    • Place of Presentation
      Shanghai, China(Invited)
    • Related Report
      2009 Final Research Report
  • [Presentation] Activation of B and As in Ultra Shallow Junction with Heating and Cooling Rates Controlled Millisecond Annealing Induced by Thermal Plasma Jet2009

    • Author(s)
      松本和也
    • Organizer
      2009 Int. Conf. Solid Sate Dev. Mat.
    • Place of Presentation
      Sendai, Japan
    • Year and Date
      2009-10-07
    • Related Report
      2009 Annual Research Report
  • [Presentation] 結晶化・相変化への応用熱プラズマジェットによるアモルファスシリコンの結晶化2009

    • Author(s)
      東清一郎
    • Organizer
      第31回真空展VACUUM2009併設真空トピックス, 日本真空協会9月研究例会, スパッタリングおよびプラズマプロセス技術部会第115回定例研究会
    • Place of Presentation
      東京ビッグサイトSputtering & Plasma Processes
    • Year and Date
      2009-09-16
    • Related Report
      2009 Final Research Report
  • [Presentation] 結晶化・相変化への応用 熱プラズマジェットによるアモルファスシリコンの結晶化2009

    • Author(s)
      東清一郎
    • Organizer
      日本真空協会9月研究例会, スパッタリングおよびプラズマプロセス技術部会第115回定例研究会
    • Place of Presentation
      東京ビッグサイト
    • Year and Date
      2009-09-16
    • Related Report
      2009 Annual Research Report
  • [Presentation] 熱プラズマジェット照射ミリ秒急速熱処理中の加熱・冷却速度制御と不純物活性化2009

    • Author(s)
      松本和也
    • Organizer
      第44回応用物理学会スクール「安価、簡単、便利~大気圧プラズマの基礎と応用~」
    • Place of Presentation
      富山大学五福キャンパス
    • Year and Date
      2009-09-08
    • Related Report
      2009 Annual Research Report
  • [Presentation] Millisecond Thermal Processing for TFT and ULSI [Invited]2009

    • Author(s)
      東清一郎
    • Organizer
      Semiconductor Tech. for Ultra Large Scale Integrated Circuits and Thin Film Transistors II
    • Place of Presentation
      Xi'an, China
    • Year and Date
      2009-07-05
    • Related Report
      2009 Annual Research Report
  • [Presentation] 熱プラズマジェットによるミリ秒急速熱処理とその半導体プロセス応用2009

    • Author(s)
      東清一郎
    • Organizer
      第44回応用物理学会スクール「安価、簡単、便利~大気圧プラズマの基礎と応用~」
    • Place of Presentation
      筑波大学
    • Year and Date
      2009-04-01
    • Related Report
      2009 Final Research Report
  • [Presentation] Activation of B and As in Ultra Shallow Junction with Heating and Cooling Rates Controlled Millisecond Annealing Induced by Thermal Plasma Jet2009

    • Author(s)
      K. Matsumoto, S. Higashi, H. Furukawa, T. Okada, H. Murakami, S. Miyazaki
    • Organizer
      Ext. Abs. 2009 Int. Conf. Solid Sate Dev. Mat
    • Place of Presentation
      Sendai, Japan
    • Related Report
      2009 Final Research Report
  • [Presentation] Millisecond Thermal Processing for TFT and ULSI2009

    • Author(s)
      S. Higashi
    • Organizer
      Semiconductor Tech. for Ultra Large Scale Integrated Circuits and Thin Film Transistors II
    • Place of Presentation
      Xi'an, China(Invited)
    • Related Report
      2009 Final Research Report
  • [Presentation] Characterization of Microcrystalline Silicon Thin Film Transistors Fabricated by Thermal Plasma Jet Crystallization Technique2009

    • Author(s)
      K. Sugakawa, S. Higashi, H. Kaku, T. Okada, S. Miyazaki
    • Organizer
      Proc. AM-FPD 09
    • Place of Presentation
      Nara, Japan
    • Related Report
      2009 Final Research Report
  • [Presentation] 熱プラズマジエットによるミリ秒急速熱処理とその半導体プロセス応用(第44回応用物理学会スクール「安価、簡単、便利〜大気圧プラズマの基礎と応用〜」)2009

    • Author(s)
      東 清一郎
    • Organizer
      第56回応用物理学関係連合講演会
    • Place of Presentation
      筑波大学
    • Related Report
      2008 Annual Research Report
  • [Presentation] 高パワー密度熱プラズマジエット照射ミリ秒急速熱処理によるSiウエハ中Bの活性化2009

    • Author(s)
      松本 和也, 他
    • Organizer
      第56回応用物理学関係連合講演会
    • Place of Presentation
      筑波大学
    • Related Report
      2008 Annual Research Report
  • [Presentation] Generation of High Density Thermal Plasma Jet and Its Application to Millisecond Annealing of Si Wafer Surface for Shallow Junction Formation2008

    • Author(s)
      H. Furukawa, S. Higashi, T. Okada, H. Murakami, S. Miyazaki
    • Organizer
      Proc. Int. Symp. Dry Process
    • Place of Presentation
      Tokyo, Japan
    • Related Report
      2009 Final Research Report
  • [Presentation] Millisecond Rapid Thermal Annealing of Si Wafer Induced by High Density Thermal Plasma Jet Irradiation2008

    • Author(s)
      H. Furukawa, S. Higashi, T. Okada, H. Kaku, H. Murakami, S. Miyazaki
    • Organizer
      Ext. Abs. 2008 Int. Conf. Solid Sate Dev. Mat
    • Place of Presentation
      Tsukuba, Japan
    • Related Report
      2009 Final Research Report
  • [Presentation] Application of Thermal Plasma Jet Annealing to Channel Crystallization and Doping for Thin Film Transistor Fabrication2008

    • Author(s)
      H. Kaku, S. Higashi, T. Yorimoto, T. Okada, H. Furukawa, S. Miyazaki
    • Organizer
      Dig. Tech. Pap. AM-FPD 08
    • Place of Presentation
      Tokyo, Japan
    • Related Report
      2009 Final Research Report
  • [Presentation] In-situ Monitoring of Si Wafer Temperature during Millisecond Rapid Thermal Annealing2008

    • Author(s)
      H. Furukawa, S. Higashi, T. Okada, H. Kaku, H. Murakami, S. Miyazaki
    • Organizer
      213th Electrochemical Society (ECS) Meeting Abs
    • Place of Presentation
      Phoenix, USA
    • Related Report
      2009 Final Research Report
  • [Presentation] Impact of Annealing condition on the Efficiency of Dopant Activation Induced by Thermal Plasma Jet Crystallization of Heavily-Phosphorus-Doped Amorphous Si films2008

    • Author(s)
      H. Kaku, S. Higashi, H. Furukawa, T. Okada, T. Yorimoto, H. Murakami, S. Miyazaki
    • Organizer
      1st Int. Conf. on Plasma-NanoTechnology and Science (IC-PLANTS 2008)
    • Place of Presentation
      Nagoya, Japan
    • Related Report
      2009 Final Research Report
  • [Presentation] Formation of Source and Drain for Polycrystalline Si Thin Film Transistors Using Thermal Plasma Jet Induced Impurity Activation2008

    • Author(s)
      H. Kaku, S. Higashi, T. Yorimoto, T. Okada, H. Furukawa, H. Murakami, S. Miyazaki
    • Organizer
      Proc. 4th Int. TFT Conf
    • Place of Presentation
      Seoul, Korea
    • Related Report
      2009 Final Research Report
  • [Presentation] Generation of High Density Thermal Plasma Jet and Its Application to Millisecond Annealing of Si Wafer Surface for Shallow Junction Formation2008

    • Author(s)
      H. Furukawa
    • Organizer
      Int. Symp. Dry Process
    • Place of Presentation
      Tokyo, Japan
    • Related Report
      2008 Annual Research Report
  • [Presentation] Millisecond Rapid Thermal Annealing of Si Wafer Induced by High Density Thermal Plasma Jet Irradiation2008

    • Author(s)
      H. Furukawa
    • Organizer
      Int. Conf. Solid Sate Dev. Mat.
    • Place of Presentation
      Tsukuba, Japan
    • Related Report
      2008 Annual Research Report
  • [Presentation] In-situ Monitoring of Si Wafer Temperature during Millisecond Rapid Thermal Annealing2008

    • Author(s)
      H. Furukawa
    • Organizer
      213^<th>Electrochemical Society (ECS) Meeting
    • Place of Presentation
      Phoenix, USA
    • Related Report
      2008 Annual Research Report
  • [Presentation] 高密度熱プラズマジエット照射によるSiウエハ表面のミリ秒急速熱処理2008

    • Author(s)
      古川 弘和, 他
    • Organizer
      第69回応用物理学学術講演会
    • Place of Presentation
      中部大学
    • Related Report
      2008 Annual Research Report
  • [Presentation] Formation of Source and Drain for Polycrystalline Si Thin Film Transistors Using Thermal Plasma Jet lnduced Impurity Activation2008

    • Author(s)
      H. Kaku
    • Organizer
      4th Int. TFT Conf.
    • Place of Presentation
      Seoul, Korea
    • Related Report
      2007 Annual Research Report
  • [Presentation] ミリ秒急速熱処理におけるSiウエハ内温度変化のその場観測2007

    • Author(s)
      古川 弘和
    • Organizer
      電子情報通信学会技術研究報告
    • Place of Presentation
      奈良先端科学技術大学院大学
    • Year and Date
      2007-12-14
    • Related Report
      2007 Annual Research Report
  • [Presentation] Application of Thermal Plasma Jet to Crystallization of Amorphous Si Films on Glass Substrate and Thin Film Transistor Fabrication2007

    • Author(s)
      S. Higashi
    • Organizer
      6th Asian-European Int. Conf. Plasma Surf. Eng. (AEPSE 2007) Workshop on Flat-panel and Flexible Devices
    • Place of Presentation
      Nagasaki, Japan
    • Year and Date
      2007-09-28
    • Related Report
      2009 Final Research Report
  • [Presentation] Application of Thermal Plasma Jet to Crystallization of Amorphous Si Films on Glass Substrate and Thin Film Transistor Fabrication (invited)2007

    • Author(s)
      S. Higashi
    • Organizer
      6th Asian-European Int. Conf. Plasma Surf. Eng. (AEPSE 2007)
    • Place of Presentation
      Nagasaki, Japan
    • Year and Date
      2007-09-28
    • Related Report
      2007 Annual Research Report
  • [Presentation] 熱プラズマジェットを用いたミリ秒急速熱処理技術のTFT作製プロセス応用2007

    • Author(s)
      東清一郎
    • Organizer
      半導体界面制御技術第154委員会第58回研究会資料
    • Place of Presentation
      首都大学東京
    • Year and Date
      2007-05-16
    • Related Report
      2009 Final Research Report
  • [Presentation] 熱プラズマジェットを用いたミリ秒急速熱処理技術のTFT作製プロセス応用(招待講演)2007

    • Author(s)
      東 清一郎
    • Organizer
      半導体界面制御技術第154委員会第58回研究会
    • Place of Presentation
      首都大学東京
    • Year and Date
      2007-05-16
    • Related Report
      2007 Annual Research Report
  • [Presentation] In-situ Measurement of Temperature Variation in Si Wafer During Millisecond Rapid Thermal Annealing Induced by Thermal Plasma Jet Irradiation2007

    • Author(s)
      H. Furukawa, S. Higashi, T. Okada, H. Kaku, H. Murakami, S. Miyazaki
    • Organizer
      Ext. Abs. 2007 Int. Conf. Solid Sate Dev. Mat
    • Place of Presentation
      Tsukuba, Japan
    • Related Report
      2009 Final Research Report
  • [Presentation] High Efficiency Dopant Activation Induced by Thermal Plasma Jet Crystallization of Heavily-Phosphorus-Doped Amorphous Si Films2007

    • Author(s)
      H. Kaku, S. Higashi, H. Furukawa, T. Okada, T. Yorimoto, H. Murakami, S. Miyazaki
    • Organizer
      Ext. Abs. 5th Int. Symp. Control of Semiconductor Interfaces (ISCSI-V)
    • Place of Presentation
      Tokyo, Japan
    • Related Report
      2009 Final Research Report
  • [Presentation] "Poly-Si TFT新たなSi膜結晶化法(熱プラズマジェット法)"シンポジウム「Poly-Si TFT最近の展開と今後」2007

    • Author(s)
      東清一郎
    • Organizer
      第68回応用物理学会学術講演会
    • Place of Presentation
      北海道工業大学
    • Related Report
      2009 Final Research Report
  • [Presentation] Dopant Activation Induced by Thermal Plasma Jet Crystallization of Heavily-Phosphorus-Doped Amorphous Si Films2007

    • Author(s)
      H. Kaku, S. Higashi, H. Furukawa, T. Okada, H. Murakami, S. Miyazaki
    • Organizer
      Dig. Tech. Pap. AM-FPD 07
    • Place of Presentation
      Hyogo, Japan
    • Related Report
      2009 Final Research Report
  • [Presentation] High Efficiency Activation of Phosphorus Atoms Induced by Thermal Plasma Jet Crystallization of Doped Amorphous Si Films2007

    • Author(s)
      H. Kaku, S. Higashi, T. Okada, T. Yorimoto, H. Murakami, S. Miyazaki
    • Organizer
      Abst. 2007 Material Research Society Spring Meeting
    • Place of Presentation
      San Francisco, U.S. A
    • Related Report
      2009 Final Research Report
  • [Presentation] High Efficiency Dopant Activation Induced by Thermal Plasma Jet Crystallization of Heavily-Phosphorus-Doped Amorphous Si Films2007

    • Author(s)
      H. Kaku
    • Organizer
      5th Int. Symp. Control of Semiconductor Interfaces (ISCSI-V)
    • Place of Presentation
      Tokyo, Japan
    • Related Report
      2007 Annual Research Report
  • [Presentation] In-situ Measurement of Temperature Variation in Si Wafer During Millisecond Rapid Thermal Annealing Induced by Thermal Plasma Jet Irradiation2007

    • Author(s)
      H. Furukawa
    • Organizer
      2007 Int. Conf. Solid Sate Dev. Mat.
    • Place of Presentation
      Tsukuba, Japan
    • Related Report
      2007 Annual Research Report
  • [Presentation] Dopant Activation Induced by Thermal Plasma Jet Crystallization of Heavily-Phosphorus-Doped Amorphous Si Films2007

    • Author(s)
      H. Kaku
    • Organizer
      AM-FPD 07
    • Place of Presentation
      Hyogo, Japan
    • Related Report
      2007 Annual Research Report
  • [Presentation] Poly-Si TFT新たなSi膜結晶化法(熱プラズマジェット法)2007

    • Author(s)
      東 清一郎
    • Organizer
      第68回応用物理学会学術講演会(シンポジウム)
    • Place of Presentation
      北海道工業大学
    • Related Report
      2007 Annual Research Report
  • [Presentation] ミリ秒急速熱処理におけるSiウエハ表面温度の非接触測定2007

    • Author(s)
      古川 弘和
    • Organizer
      第68回応用物理学会学術講演会
    • Place of Presentation
      北海道工業大学
    • Related Report
      2007 Annual Research Report
  • [Presentation] 熱プラズマジェットミリ秒急速熱処理によるSi膜中ドーパントの活性化2007

    • Author(s)
      加久 博隆
    • Organizer
      第68回応用物理学会学術講演会
    • Place of Presentation
      北海道工業大学
    • Related Report
      2007 Annual Research Report
  • [Book] 薄膜トランジスタ(薄膜材料デバイス研究会編)2008

    • Author(s)
      浦岡行治,神谷利夫,木村睦,佐野直樹,鮫島俊之,清水耕作,竹知和重,中村雅一,東清一郎,古田守,堀田将
    • Publisher
      コロナ社
    • Related Report
      2009 Final Research Report
  • [Book] 薄膜トランジスタ(3章分担執筆)2008

    • Author(s)
      薄膜材料デバイス研究会
    • Total Pages
      229
    • Publisher
      コロナ社
    • Related Report
      2008 Annual Research Report
  • [Remarks]

    • URL

      http://home.hiroshima-u.ac.jp/semicon

    • Related Report
      2009 Final Research Report
  • [Remarks]

    • URL

      http://home.hiroshima-u.ac.jp/semicon/

    • Related Report
      2009 Annual Research Report
  • [Remarks]

    • URL

      http://home.hiroshima-u.ac.jp/semicon/

    • Related Report
      2008 Annual Research Report
  • [Remarks]

    • URL

      http://home.hiroshima-u.ac.jp/semicon/

    • Related Report
      2007 Annual Research Report

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Published: 2007-04-01   Modified: 2016-04-21  

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