Near-field Raman Spectroscopy with wavelength resolution

• Project/Area Number: 19710080
• Research Category: Grant-in-Aid for Young Scientists (B)
• Allocation Type: Single-year Grants
• Research Field: Nanostructural science
• Research Institution: Osaka University
• Principal Investigator: SAITO Yuika Osaka University, 大学院工学研究科, 特任講師 (90373307)
• Project Period (FY): 2007 – 2008
• Project Status: Completed (Fiscal Year 2008)
• Budget Amount: ¥3,610,000 (Direct Cost: ¥3,400,000、Indirect Cost: ¥210,000); Fiscal Year 2008: ¥910,000 (Direct Cost: ¥700,000、Indirect Cost: ¥210,000); Fiscal Year 2007: ¥2,700,000 (Direct Cost: ¥2,700,000)
• Keywords: ナノ構造化学 / ラマン分光 / 近接場顕微鏡 / 偏光 / 表面プラズモン / 近接場分光 / ナノイメージング / 走査プローブ顕微鏡 / ナノフォトニクス / 波数

Research Abstract

近接場顕微鏡は光を用いて非破壊的に観測を行ないながら、光の波長よりも小さいナノメートルスケールの空間分解能で物質の形状を捉えることができる。この顕微鏡が光を用いているという利点を活かして、試料から多くの化学的情報を引き出すために、空間分解能のみならず波数分解能を高めた近接場ラマン顕微鏡を作製した。この顕微鏡を用いて種々の半導体材料のナノスケール評価を行なった。また近接場顕微鏡探針の入射光共鳴波長をコントロールする方法を同時に開発した。

Research Products

• [Journal Article] Imaging and Spectroscopy Through Plasmonic Nano-Probe (2009)
  • Author(s): Saito Y, Verma P
  • Journal Title: European Physical Journal- Applied Physics 46 Pages: 20101-15
  • Peer Reviewed
• [Journal Article] Contolling the surface plasmon resonance wavelength in metal-coated probe using refractive incex modification (2009)
  • Author(s): Taguchi A, Hayazawa N, Saito Y, Ishitobi H, Tarun A, Kawata S
  • Journal Title: Optics Express 17 Pages: 6509-6518
  • Peer Reviewed
• [Journal Article] Z-polarization sensitive detection in micro Raman spectroscopy by radially polarized incident light (2008)
  • Author(s): Saito Y, Kobayashi M, Hiraga D, Kawano S, Fujita K, NI Smith, Inouye Y, Kawata S
  • Journal Title: Journal of Raman Spectroscopy 39 Pages: 1643-1648
• [Journal Article] Stress Imagining of Semiconductor Surface by Tip-Enhanced Raman Spectroscopy (2008)
  • Author(s): Saito Y, Motohashi M, Hayazawa N, Kawata S
  • Journal Title: Jorunal of Microscopy 229, 39
  • Peer Reviewed
• [Journal Article] Active Control of the Oxidization of a Silicon Cantilever for the Characterization of Silicon-based Semiconductors (2008)
  • Author(s): Ono A, Masui K, Saito Y, Sakata T, Taguchi A, Motohashi M, Ichimura T, Ishitobi T, Tarun A, Hayazawa N, Verma P, Inouye Y, Kawata S
  • Journal Title: Chemistry Letters 37 Pages: 122-123
  • NAID: 10020148416
  • Peer Reviewed
• [Journal Article] 特殊波長板を用いた偏光顕微ラマン測定 (2008)
  • Author(s): 齊藤結花
  • Journal Title: 分光研究 vol 57 Pages: 195-197
  • NAID: 10021308293
• [Journal Article] 局在プラズモンを用いた近接場ラマンイメージング・可視光を使ってナノを見る (2008)
  • Author(s): 河田聡, 齊藤結花, 井上康志
  • Journal Title: 日本物理学会誌 vol63 Pages: 678-686
  • NAID: 110006936674
• [Journal Article] 局在プラズモンを用いた近接場ラマンイメージング・可視光を使ってナノを見る (2008)
  • Author(s): 河田聡, 齊藤結花, 井上康志
  • Journal Title: 日本物理学会誌 63 Pages: 678-686
  • NAID: 110006936674
• [Journal Article] 特殊波長板を用いた偏光顕微ラマン測定 (2008)
  • Author(s): 齊藤結花
  • Journal Title: 分光研究 57 Pages: 195-197
  • NAID: 10021308293
• [Journal Article] Stress Imagining of Semiconductor Surface by Tip-Enhanced Raman Spectroscopy (2008)
  • Author(s): Y.Saito, M.Motohashi, N.Hayazawa, S.Kawata
  • Journal Title: Journal of Microscopy 229 Pages: 217-222
  • Peer Reviewed
• [Journal Article] Active Control of the Oχidization of a Silicon Cantilever for the Characterization ofSilicon・based Semiconductors (2008)
  • Author(s): Atsushi Ono, K.Masui, Y.Saito, T.Sakata, A.Taguchi, M.Motohashi, T.Ichmiura, H.Ishitobi, A.Tarun, N.Hayazawa, P.Verma, Y.Inouye, S.Kawata
  • Journal Title: Chemistry letters 37 Pages: 122-123
  • Peer Reviewed
• [Journal Article] Nano-scale Analysis of Graphene Layers by Tip-enhanced Near-field Raman Spectroscopy
  • Author(s): Saito Y, Verma P, Masui K, Inouye Y, Kawata S
  • Journal Title: Journal of Raman Spectroscopy (in press)
  • Peer Reviewed
• [Journal Article] Pressure-assisted tip-enhanced Raman imaging at the resolution of a few nanometres
  • Author(s): Yano T, Verma P, Saito Y, Ichimura T, Kawata S
  • Journal Title: Nature Phtonics (in press)
  • Peer Reviewed
• [Journal Article] Contolling the surface plasmon resonance wavelength in metal-coated probe using refractive incex modification
  • Author(s): Taguchi A, Hayazawa N, Saito Y, Ishitobi H, Tarun A, Kawata S
  • Journal Title: Journal of Raman Spectroscopy (in press)
  • Peer Reviewed
• [Journal Article] Z-polarization sensitive detection in micro Raman spectroscopy by radially polarizedincident light
  • Author(s): Y.Saito, M.Kobayashi, D.Hiraga, S.Kawano, K.Fujita, Nl.Smith, Y.Inouye, S.Kawata
  • Journal Title: Journal of Raman spectroscopy in press
  • Peer Reviewed
• [Presentation] Near-Field Raman Analysis of Graphene Layers (2008)
  • Author(s): Saito Y, Yasugi S, Masui K, Kawata S
  • Organizer: 2008 Annual Meeting of the Spectroscopical Society of Japan
  • Place of Presentation: Sendai, Japan
  • Year and Date: 2008-11-20
• [Presentation] Z-polarization sensitive detection in micro-Raman spectroscopy (2008)
  • Author(s): Saito Y, Kobayashi M, Hiraga D, Fujita K, Kawata S
  • Organizer: 20^<th> International Conferences on Rama Spectroscopy
  • Place of Presentation: London, UK
  • Year and Date: 2008-08-20
• [Presentation] Z-polarization sensitive detection in micro-Raman spectroscopy (2008)
  • Author(s): Saito Y, Kobayashi M, Hiraga D, Fujita K, Kawata S
  • Organizer: 20^<th> International Conferences on Raman Spectros copy
  • Place of Presentation: London, UK
  • Year and Date: 2008-08-20
• [Presentation] z-polarization Sensitive Detection for Flexible raman Polarizability Measurements (2008)
  • Author(s): Saito Y, Kobayashi M, Hiraga D, Fujita K, Kawata S
  • Organizer: Focus on Microscopy 2008
  • Place of Presentation: Awaji Island, Japan
  • Year and Date: 2008-04-15
• [Presentation] z-polarization Sensitive Detection for Flexible Raman Polarizabiliti Measurements (2008)
  • Author(s): Saito Y, Kobayashi M, Hiraga D, Fujita K, Kawata S
  • Organizer: Focus on Microscopy 2008
  • Place of Presentation: Awaji, Japan
  • Year and Date: 2008-04-15
• [Presentation] Tip-enhanced near-field Raman spectroscopy applied to nano-composite materials (2007)
  • Author(s): Saito Y, Yanagi K, Kataura K, Hayazawa N, Kawata S
  • Organizer: SPIE Optics + Photonics
  • Place of Presentation: San Diego, USA
  • Year and Date: 2007-08-28
• [Remarks] SPIE NewsRoom March 2008に研究が紹介された Saito Y, Yanagi K Using a nano light source to investigate small-scale composite materials
• [Patent(Industrial Property Rights)] 近接場プローブ、近接場ラマン分光システムのカンチレバー、近接場ラマン分光システム、ならびに近接場ラマン分光システムの制御方法 (2008)
  • Inventor(s): 河田聡, 齊藤結花, 井上靖志, 田口敦清
  • Industrial Property Rights Holder: 大阪大学
  • Industrial Property Number: 2008-052511
  • Filing Date: 2008-03-03
• [Patent(Industrial Property Rights)] 近接場プローブ、近接場ラマン分光システムのカンチレバー、近接場ラマン分光システム、ならびに近接場ラマン分光システムの制御方法 (2008)
  • Inventor(s): 河田聡、齊藤結花、井上靖志、田口敦清
  • Industrial Property Rights Holder: 大阪大学
  • Industrial Property Number: 2008-052511
  • Filing Date: 2008-03-03
• [Patent(Industrial Property Rights)] PROBE FOR NEAR-FIELD MICROSCOPE, METHOD OF MANUFACTURING THE SAME AND SCANNING PROBE MICROSCOPE USING THE PROBE. (2007)
  • Inventor(s): Yuiia Saito. TakashiMurakami,
  • Industrial Property Rights Holder: RIKEN, SIINanotechnology
  • Filing Date: 2007-07-01
  • Overseas