Yield measurement of secondary particles from liquid surface under heavy ion bombardment
| Project/Area Number |
19740247
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| Research Category |
Grant-in-Aid for Young Scientists (B)
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| Allocation Type | Single-year Grants |
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| Research Field |
原子・分子・量子エレクトロニクス・プラズマ
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| Research Institution | Nara Women's University |
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Principal Investigator |
ISHII Kunikazu Nara Women's University, 理学部, 助教 (00397837)
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| Project Period (FY) |
2007 – 2009
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| Project Status |
Completed (Fiscal Year 2009)
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| Budget Amount *help |
¥3,870,000 (Direct Cost: ¥3,300,000、Indirect Cost: ¥570,000)
Fiscal Year 2009: ¥650,000 (Direct Cost: ¥500,000、Indirect Cost: ¥150,000)
Fiscal Year 2008: ¥1,820,000 (Direct Cost: ¥1,400,000、Indirect Cost: ¥420,000)
Fiscal Year 2007: ¥1,400,000 (Direct Cost: ¥1,400,000)
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| Keywords | PIXE / ガラスキャピラリ / マイクロイオンビーム / 二次粒子収量 / MeVイオンビーム / RBS |
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| Research Abstract |
We have studied in order to measure absolute yields of secondary particles from various surface including liquid material. At first we have measured size distributions of extracted ion beam using glass capillary. As a result, we have found the 'halo' components in size distributions via glass capillary. In order to obtain an ion beam without 'halo' components, we have developed an extraction technique of ion beam using an metal capillary and an in-air-material analysis technique with this capillary.
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Report
(4 results)
Research Products
(18 results)
