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Muon-induced soft error evaluation platform: future prediction based on measurement and simulation

Research Project

Project/Area Number 19H05664
Research Category

Grant-in-Aid for Scientific Research (S)

Allocation TypeSingle-year Grants
Review Section Broad Section J
Research InstitutionKyoto University

Principal Investigator

Hashimoto Masanori  京都大学, 情報学研究科, 教授 (80335207)

Co-Investigator(Kenkyū-buntansha) 安部 晋一郎  国立研究開発法人日本原子力研究開発機構, 原子力科学研究部門 原子力科学研究所 原子力基礎工学研究センター, 研究職 (00727373)
川瀬 頌一郎  九州大学, 総合理工学研究院, 助教 (10817133)
渡辺 幸信  九州大学, 総合理工学研究院, 教授 (30210959)
佐藤 朗  大阪大学, 大学院理学研究科, 助教 (40362610)
新倉 潤  国立研究開発法人理化学研究所, 仁科加速器科学研究センター, 協力研究員 (50644720)
鎌倉 良成  大阪工業大学, 情報科学部, 教授 (70294022)
Project Period (FY) 2019-06-26 – 2024-03-31
Project Status Completed (Fiscal Year 2023)
Budget Amount *help
¥203,190,000 (Direct Cost: ¥156,300,000、Indirect Cost: ¥46,890,000)
Fiscal Year 2023: ¥7,020,000 (Direct Cost: ¥5,400,000、Indirect Cost: ¥1,620,000)
Fiscal Year 2022: ¥9,750,000 (Direct Cost: ¥7,500,000、Indirect Cost: ¥2,250,000)
Fiscal Year 2021: ¥39,390,000 (Direct Cost: ¥30,300,000、Indirect Cost: ¥9,090,000)
Fiscal Year 2020: ¥66,040,000 (Direct Cost: ¥50,800,000、Indirect Cost: ¥15,240,000)
Fiscal Year 2019: ¥80,990,000 (Direct Cost: ¥62,300,000、Indirect Cost: ¥18,690,000)
Keywordsソフトエラー / ミューオン / 集積システム / VLSI / 信頼性
Outline of Research at the Start

地上に降り注ぐ二次宇宙線粒子によって生じる一過性の誤動作 (ソフトエラー)が集積システムの信頼性を決める最大要因となっている。デバイスの微細化により、ミューオンが中性子に変わってソフトエラーの主要因となるパラダイムシフトが起こり、急速にエラー率が増加する可能性がある。本研究では、集積システムの信頼性確保に向けて、ミューオン起因のソフトエラーを正しく理解・評価する技術を世界に先駆けて確立し、将来デバイスの信頼性動向を明らかにする。基礎物理現象の把握と実測結果の再現性検証によりシミュレーション技術の精度を格段に高め、将来の集積システムの信頼性確保に貢献する。

Outline of Final Research Achievements

To ensure the reliability of integrated systems, we worked on establishing technologies for correctly understanding and evaluating soft errors caused by cosmic ray muons and predicting future reliability trends. We developed a simulation infrastructure technology that reproduces the physical phenomena between muons and silicon observed in experiments. Trend predictions based on simulations and actual measurements suggest that while errors caused by muons will not increase explosively in the near future, they are expected to become as prominent as those caused by neutrons.

Academic Significance and Societal Importance of the Research Achievements

ソフトエラーに寄与する低エネルギー環境ミューオン測定、ソフトエラーに寄与する二次粒子に着目した負ミューオンの原子核捕獲反応の実測、最先端FinFETに対する負ミューオン起因エラー測定はすべて世界初の測定結果である。本研究で開発したミューオンソフトエラーを再現するシミュレーション技術は世界中での利用が期待される。ミューオン起因ソフトエラーの評価と低減に必要な基盤技術の開発に成功した。

Assessment Rating
Ex-post Assessment Comments (Rating)

A: In light of the aim of introducing the research area into the research categories, expected outcomes of research have been produced.

Assessment Rating
Interim Assessment Comments (Rating)

A: In light of the aim of introducing the research area into the research categories, the expected progress has been made in research.

Report

(11 results)
  • 2024 Ex-post Assessment (Comments) ( PDF )
  • 2023 Annual Research Report   Final Research Report ( PDF )
  • 2022 Annual Research Report
  • 2021 Abstract (Interim Assessment) ( PDF )   Annual Research Report   Interim Assessment (Comments) ( PDF )
  • 2020 Annual Research Report
  • 2019 Abstract ( PDF )   Comments on the Screening Results ( PDF )   Annual Research Report
  • Research Products

    (63 results)

All 2024 2023 2022 2021 2020 2019

All Journal Article (29 results) (of which Int'l Joint Research: 2 results,  Peer Reviewed: 26 results,  Open Access: 2 results) Presentation (34 results) (of which Int'l Joint Research: 16 results,  Invited: 14 results)

  • [Journal Article] Impact of Irradiation Side on Muon-Induced Single-Event Upsets in 65-nm Bulk SRAMs2024

    • Author(s)
      Deng Yifan、Watanabe Yukinobu、Manabe Seiya、Liao Wang、Hashimoto Masanori、Abe Shin-Ichiro、Tampo Motonobu、Miyake Yasuhiro
    • Journal Title

      IEEE Transactions on Nuclear Science

      Volume: 71 Issue: 4 Pages: 912-920

    • DOI

      10.1109/tns.2024.3378216

    • Related Report
      2023 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Development of a Measuring Method of Cosmic-Ray Muon Momentum Distribution Using Drift Chambers2024

    • Author(s)
      Nakagami Naoto、Kamei Satoko、Kawase Shoichiro、Sato Akira、Watanabe Yukinobu
    • Journal Title

      Journal of Radiation Protection and Research

      Volume: -

    • DOI

      10.14407/jrpr.2023.00423

    • Related Report
      2023 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Effect of large-angle incidence on particle identification performance for light-charged (Z<=2) particles by pulse shape analysis with a pad-type nTD silicon detector2024

    • Author(s)
      Kawase Shoichiro、Murota Takuya、Fukuda Hiroya、Oishi Masaya、Kawata Teppei、Kitafuji Kentaro、Manabe Seiya、Watanabe Yukinobu、Nishibata Hiroki、Go Shintaro、Kai Tamito、Nagata Yuto、Muto Taiga、Ishibashi Yuichi、Niikura Megumi、Suzuki Daisuke、Matsuzaki Teiichiro、Ishida Katsuhiko、Mizuno Rurie、Kitamura Noritaka
    • Journal Title

      Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

      Volume: 1059 Pages: 168984-168984

    • DOI

      10.1016/j.nima.2023.168984

    • Related Report
      2023 Annual Research Report
    • Peer Reviewed
  • [Journal Article] How Accurately Can Soft Error Impact Be Estimated in Black-Box/White-Box Cases? -- a Case Study with an Edge AI SoC --2024

    • Author(s)
      Q. Cheng, Q. Li, L. Lin, W. Liao, L. Dai, H. Yu, and M. Hashimoto
    • Journal Title

      Proc. Design Automation Conference (DAC)

      Volume: -

    • Related Report
      2023 Annual Research Report
    • Peer Reviewed / Int'l Joint Research
  • [Journal Article] Stuck Errors in Bits and Blocks in GDDR6 under High-Energy Neutron Irradiation2024

    • Author(s)
      M. Yoshida, R. Iwamoto, M. Itoh, and M. Hashimoto
    • Journal Title

      Proc. European Conference on Radiation and Its Effects on Components and Systems (RADECS)

      Volume: -

    • Related Report
      2023 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Muon-Induced SEU Cross Sections of 12-nm FinFET and 28-nm Planar SRAMs2024

    • Author(s)
      Y. Gomi, K. Takami, R. Mizuno, M. Niikura, Y. Deng, S. Kawase, Y. Watanabe, S. Abe, W. Liao, M. Tampo, I. Umegaki, S. Takeshita, K. Shimomura, Y. Miyake, and M. Hashimoto
    • Journal Title

      Proc. European Conference on Radiation and Its Effects on Components and Systems (RADECS)

      Volume: -

    • Related Report
      2023 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Vulnerability Estimation of DNN Model Parameters with Few Fault Injections2023

    • Author(s)
      ZHANG Yangchao、ITSUJI Hiroaki、UEZONO Takumi、TOBA Tadanobu、HASHIMOTO Masanori
    • Journal Title

      IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences

      Volume: E106.A Issue: 3 Pages: 523-531

    • DOI

      10.1587/transfun.2022VLP0004

    • ISSN
      0916-8508, 1745-1337
    • Year and Date
      2023-03-01
    • Related Report
      2022 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Reliability Exploration of System-on-Chip With Multi-Bit-Width Accelerator for Multi-Precision Deep Neural Networks2023

    • Author(s)
      Cheng Quan、Huang Mingqiang、Man Changhai、Shen Ao、Dai Liuyao、Yu Hao、Hashimoto Masanori
    • Journal Title

      IEEE Transactions on Circuits and Systems I: Regular Papers

      Volume: 70 Issue: 10 Pages: 3978-3991

    • DOI

      10.1109/tcsi.2023.3300899

    • Related Report
      2023 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Avoiding Soft Error-Induced Illegal Memory Accesses in GPU with Inter-Thread Communication2023

    • Author(s)
      R. Iwamoto and M. Hashimoto
    • Journal Title

      Proc. International Symposium on On-Line Testing and Robust System Design (IOLTS)

      Volume: -

    • Related Report
      2023 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Characterizing SEU Cross Sections of 12- and 28-nm SRAMs for 6.0, 8.0, and 14.8 MeV Neutrons2023

    • Author(s)
      Takami Kazusa、Gomi Yuibi、Abe Shin-Ichiro、Liao Wang、Manabe Seiya、Matsumoto Tetsuro、Hashimoto Masanori
    • Journal Title

      Proceedings of International Symposium on Reliability Physics (IRPS)

      Volume: - Pages: 1-6

    • DOI

      10.1109/irps48203.2023.10118134

    • Related Report
      2022 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Emissions of Hydrogen Isotopes from the Nuclear Muon Capture Reaction in <sup>nat</sup>Si2023

    • Author(s)
      Manabe Seiya、Watanabe Yukinobu、Niikura Megumi、Nakano Keita、Nakano Keita、Saito Takeshi Y.、Suzuki Daisuke、Kawashima Yoshitaka、Tomono Dai、Sato Akira、Harano Hideki
    • Journal Title

      EPJ Web of Conferences

      Volume: 284 Pages: 01029-01029

    • DOI

      10.1051/epjconf/202328401029

    • Related Report
      2022 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Development of a counter telescope for light charged particles emitted from muon capture reaction in Si2022

    • Author(s)
      H. Fukuda, S. Kawase, Y. Watanabe, M. OISHI, T. KAWATA, H. NISHIBATA, S. GO, M. NIIKURA, D. SUZUKI, and S. MANABE
    • Journal Title

      Proceedings of the 2021 Symposium on Nuclear Data

      Volume: -

    • Related Report
      2022 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Constructing Application-level GPU Error Rate Model with Neutron Irradiation Experiment2022

    • Author(s)
      Ito Kojiro、Itsuji Hiroaki、Uezono Takumi、Toba Tadanobu、Itoh Masatoshi、Hashimoto Masanori
    • Journal Title

      Proc. European Conference on Radiation and Its Effects on Components and Systems (RADECS)

      Volume: - Pages: 1-6

    • DOI

      10.1109/radecs55911.2022.10412577

    • Related Report
      2022 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Neutron-Induced Stuck Error Bits and Their Recovery in DRAMs on GPU Cards2022

    • Author(s)
      M. Hashimoto,Y. Zhang,K. Ito
    • Journal Title

      Proceedings of International Conference on Solid State Devices and Materials (SSDM)

      Volume: -

    • Related Report
      2022 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Impact of Neutron-Induced SEU in FPGA CRAM on Image-Based Lane Tracking for Autonomous Driving: From Bit Upset to SEFI and Erroneous Behavior2022

    • Author(s)
      Tanaka Tomonari、Liao Wang、Hashimoto Masanori、Mitsuyama Yukio
    • Journal Title

      IEEE Transactions on Nuclear Science

      Volume: 69 Issue: 1 Pages: 35-42

    • DOI

      10.1109/tns.2021.3131346

    • Related Report
      2021 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Estimating Vulnerability of All Model Parameters in DNN with a Small Number of Fault Injections2022

    • Author(s)
      Y. Zhang, H. Itsuji, T. Uezono, T. Toba, and M. Hashimoto
    • Journal Title

      Proceedings of Design, Automation and Test in Europe Conference (DATE)

      Volume: - Pages: 60-63

    • DOI

      10.23919/date54114.2022.9774569

    • Related Report
      2021 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Analyzing DUE Errors on GPUs With Neutron Irradiation Test and Fault Injection to Control Flow2021

    • Author(s)
      Ito Kojiro、Zhang Yangchao、Itsuji Hiroaki、Uezono Takumi、Toba Tadanobu、Hashimoto Masanori
    • Journal Title

      IEEE Transactions on Nuclear Science

      Volume: 68 Issue: 8 Pages: 1668-1674

    • DOI

      10.1109/tns.2021.3098845

    • Related Report
      2021 Annual Research Report
  • [Journal Article] Muon-Induced Single-Event Upsets in 20-nm SRAMs: Comparative Characterization with Neutrons and Alpha Particles2021

    • Author(s)
      T. Kato, M. Tampo, S. Takeshita, H. Tanaka, H. Matsuyama, M. Hashimoto, and Y. Miyake
    • Journal Title

      IEEE Transactions on Nuclear Science

      Volume: 68 Issue: 7 Pages: 1436-1444

    • DOI

      10.1109/tns.2021.3082559

    • Related Report
      2021 Annual Research Report
    • Peer Reviewed / Open Access
  • [Journal Article] Processor SER Estimation with ACE Bit Analysis2021

    • Author(s)
      T. Hsu, D. Yang, W. Liao, M. Itoh, M. Hashimoto, and J. Liou
    • Journal Title

      Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)

      Volume: - Pages: 1-5

    • DOI

      10.1109/radecs53308.2021.9954474

    • Related Report
      2021 Annual Research Report
    • Peer Reviewed / Int'l Joint Research
  • [Journal Article] Irradiation Test of 65-nm Bulk SRAMs With DC Muon Beam at RCNP-MuSIC Facility2020

    • Author(s)
      Mahara Takumi、Manabe Seiya、Watanabe Yukinobu、Liao Wang、Hashimoto Masanori、Saito Takeshi Y.、Niikura Megumi、Ninomiya Kazuhiko、Tomono Dai、Sato Akira
    • Journal Title

      IEEE Transactions on Nuclear Science

      Volume: 67 Issue: 7 Pages: 1555-1559

    • DOI

      10.1109/tns.2020.2972022

    • Related Report
      2020 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Impact of the Angle of Incidence on Negative Muon-Induced SEU Cross Sections of 65-nm Bulk and FDSOI SRAMs2020

    • Author(s)
      Liao Wang、Hashimoto Masanori、Manabe Seiya、Watanabe Yukinobu、Abe Shin-ichiro、Tampo Motonobu、Takeshita Soshi、Miyake Yasuhiro
    • Journal Title

      IEEE Transactions on Nuclear Science

      Volume: 67 Issue: 7 Pages: 1566-1572

    • DOI

      10.1109/tns.2020.2976125

    • Related Report
      2020 Annual Research Report
    • Peer Reviewed / Open Access
  • [Journal Article] Measurement of Single-Event Upsets in 65-nm SRAMs under Irradiation of Spallation Neutrons at J-PARC MLF2020

    • Author(s)
      J. Kuroda, S. Manabe, Y. Watanabe, K. Ito, W. Liao, M. Hashimoto, S. Abe, M. Harada, K. Oikawa, and Y. Miyake
    • Journal Title

      IEEE Transactions on Nuclear Science

      Volume: 67 Pages: 1599-1605

    • DOI

      10.1109/tns.2020.2978257

    • Related Report
      2020 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Concurrent Detection of Failures in GPU Control Logic for Reliable Parallel Computing2020

    • Author(s)
      H. Itsuji, T. Uezono, T. Toba, K. Ito, and M. Hashimoto
    • Journal Title

      Proceedings of International Test Conference (ITC)

      Volume: - Pages: 1-5

    • DOI

      10.1109/itc44778.2020.9325216

    • Related Report
      2020 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Fault Mode Analysis of Neural Network-Based Object Detection on GPUs with Neutron Irradiation Test2020

    • Author(s)
      Y. Zhang, K. Ito, H. Itsuji, T. Uezono, T. Toba, and M. Hashimoto
    • Journal Title

      Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)

      Volume: - Pages: 1-3

    • DOI

      10.1109/radecs50773.2020.9857684

    • Related Report
      2020 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Development of A Measurement System for Low Energy Cosmic Muon with Charge Identification Feature2020

    • Author(s)
      Satoko Kamei, Akira Sato, Shoichiro Kawase, Tadahiro Kin, Misaki Saitsu, Ryohei Takahashi, and Yukinobu Watanabe
    • Journal Title

      Proceedings of 22nd Cross Straits Symposium on Energy and Environmental Science and Technology

      Volume: -

    • Related Report
      2020 Annual Research Report
  • [Journal Article] Impact of Hydrided and Non-Hydrided Materials Near Transistors on Neutron-Induced Single Event Upsets2020

    • Author(s)
      S. Abe, T. Sato, J. Kuroda, S. Manabe, Y. Watanabe, W. Liao, K. Ito, M. Hashimoto, M. Harada, K. Oikawa, and Y. Miyake
    • Journal Title

      Proceedings of International Symposium on Reliability Physics (IRPS)

      Volume: - Pages: 1-7

    • DOI

      10.1109/irps45951.2020.9128951

    • Related Report
      2020 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Characterizing Energetic Dependence of Low-Energy Neutron-Induced MCUs in 65 nm Bulk SRAMs2020

    • Author(s)
      W. Liao, K. Ito, Y. Mitsuyama, and M. Hashimoto
    • Journal Title

      Proceedings of International Reliability Physics Symposium (IRPS)

      Volume: - Pages: 1-5

    • DOI

      10.1109/irps45951.2020.9129621

    • Related Report
      2020 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Soft Error and Its Countermeasures in Terrestrial Environment2020

    • Author(s)
      Hashimoto Masanori、Liao Wang
    • Journal Title

      Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC)

      Volume: - Pages: 617-622

    • DOI

      10.1109/asp-dac47756.2020.9045161

    • Related Report
      2019 Annual Research Report
  • [Journal Article] When Single Event Upset Meets Deep Neural Networks: Observations, Explorations, and Remedies2020

    • Author(s)
      Yan Zheyu、Shi Yiyu、Liao Wang、Hashimoto Masanori、Zhou Xichuan、Zhuo Cheng
    • Journal Title

      Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC)

      Volume: - Pages: 163-168

    • DOI

      10.1109/asp-dac47756.2020.9045134

    • Related Report
      2019 Annual Research Report
    • Peer Reviewed
  • [Presentation] In-beam activation measurement of muon nuclear capture reaction on Si isotopes2024

    • Author(s)
      R. Mizuno
    • Organizer
      Workshop on frontier nuclear studies with gamma-ray spectrometer arrays (gamma24)
    • Related Report
      2023 Annual Research Report
    • Int'l Joint Research
  • [Presentation] Toward Robust Neural Network Computation on Emerging Crossbar-based Hardware and Digital Systems2024

    • Author(s)
      M. Hashimoto
    • Organizer
      ASP-DAC
    • Related Report
      2023 Annual Research Report
    • Int'l Joint Research / Invited
  • [Presentation] Muon nuclear capture reaction on 28,29,30Si2023

    • Author(s)
      R. Mizuno
    • Organizer
      Fall meeting of APS DNP and JPS
    • Related Report
      2023 Annual Research Report
    • Int'l Joint Research
  • [Presentation] TCAD Simulation Study of Sigle-Event Transient in CFET Latch Circuit2023

    • Author(s)
      T. Matsui
    • Organizer
      International Meeting for Future of Electron Devices, Kansai (IMFEDK)
    • Related Report
      2023 Annual Research Report
    • Int'l Joint Research
  • [Presentation] Nuclear physics for muon-induced soft error2023

    • Author(s)
      M. Niikura
    • Organizer
      Workshop for Computational Technique for Negative Muon Spectroscopy and Elemental Analysis
    • Related Report
      2023 Annual Research Report
    • Int'l Joint Research
  • [Presentation] Development of a measuring method of cosmic-ray muon momentum distribution using drift chambers2023

    • Author(s)
      N. Nakagami
    • Organizer
      International Symposium on Radiation Safety and Detection Technology (ISORD-11)
    • Related Report
      2023 Annual Research Report
    • Int'l Joint Research
  • [Presentation] Study of muon capture reaction on Si via in-beam muon activation2023

    • Author(s)
      R. Mizuno
    • Organizer
      Advances in Radioactive Isotope Science (ARIS)
    • Related Report
      2023 Annual Research Report
    • Int'l Joint Research
  • [Presentation] Measurement of nuclear transmutation via muon capture rection for Si isotopes2023

    • Author(s)
      R. Mizuno
    • Organizer
      Topical Workshops on Modern Aspects of Nuclear Structure
    • Related Report
      2022 Annual Research Report
    • Int'l Joint Research
  • [Presentation] Estimation of SPICE Parameters for MOSFETs with CNN Regression2022

    • Author(s)
      K. Akazawa
    • Organizer
      International Meeting for Future of Electron Devices, Kansai
    • Related Report
      2022 Annual Research Report
    • Int'l Joint Research
  • [Presentation] Measurement of muon-induced nuclear transmutation for Si isotopes2022

    • Author(s)
      R. Mizuno
    • Organizer
      Trans-scale Quantum Science Institute
    • Related Report
      2022 Annual Research Report
    • Int'l Joint Research
  • [Presentation] Terrestrial Cosmic-Ray SEE testing2022

    • Author(s)
      M. Hashimoto
    • Organizer
      RADNEXT facility webinar
    • Related Report
      2022 Annual Research Report
    • Int'l Joint Research / Invited
  • [Presentation] ミュオン起因半導体ソフトエラーの評価と課題2022

    • Author(s)
      橋本昌宜
    • Organizer
      中間子科学の将来討論会
    • Related Report
      2022 Annual Research Report
    • Invited
  • [Presentation] ミュオン起因ソフトエラーの測定と課題2022

    • Author(s)
      橋本昌宜
    • Organizer
      原子力学会
    • Related Report
      2022 Annual Research Report
    • Invited
  • [Presentation] Toward Correct Understanding and Characterization of Cosmic Ray-induced Soft Errors2022

    • Author(s)
      M. Hashimoto
    • Organizer
      International Test Conference in Asia (ITC-Asia)
    • Related Report
      2022 Annual Research Report
    • Int'l Joint Research / Invited
  • [Presentation] ミューオン起因半導体ソフトエラーの測定と課題2022

    • Author(s)
      橋本昌宜
    • Organizer
      RCNP研究会
    • Related Report
      2021 Annual Research Report
    • Invited
  • [Presentation] RISC-Vプロセッサに対するフォールトインジェクション実験の結果分析2021

    • Author(s)
      田上凱斗, 橋本昌宜
    • Organizer
      情報処理学会DAシンポジウム
    • Related Report
      2021 Annual Research Report
  • [Presentation] Applications outside particle physics (soft error)2021

    • Author(s)
      M. Hashimoto
    • Organizer
      ILC Workshop on Potential ILC Experiments (ILCX)
    • Related Report
      2021 Annual Research Report
    • Int'l Joint Research / Invited
  • [Presentation] 負ミューオンを用いた原子核構造研究2021

    • Author(s)
      新倉潤
    • Organizer
      RCNPでの次期計画検討会
    • Related Report
      2021 Annual Research Report
    • Invited
  • [Presentation] 電荷識別型低エネルギー宇宙線ミュオン計測システムの開発2021

    • Author(s)
      亀井 智子,川瀬 頌一郎,佐藤 朗,田中裕貴,中上直人,金 政浩,渡辺 幸信
    • Organizer
      第82回応用物理学会秋季学術講演会
    • Related Report
      2021 Annual Research Report
  • [Presentation] 宇宙線ミュオン起因半導体ソフトエラー率の評価に向けた取り組み2021

    • Author(s)
      渡辺 幸信
    • Organizer
      令和3年度J-PARC MLF産業利用報告会
    • Related Report
      2021 Annual Research Report
    • Invited
  • [Presentation] 半導体デバイスの宇宙線起因ソフトエラー解析2021

    • Author(s)
      渡辺幸信
    • Organizer
      耐放射線デバイス研究会
    • Related Report
      2021 Annual Research Report
    • Invited
  • [Presentation] 半導体デバイスに対する宇宙線起因ソフトエラー研究の現状と展望2021

    • Author(s)
      渡辺 幸信
    • Organizer
      12回半導体材料・デバイスフォーラム
    • Related Report
      2021 Annual Research Report
    • Invited
  • [Presentation] 半導体デバイスにおける宇宙線ミュオン起因ソフトエラー発生率評価に向けたミュオン原子核捕獲反応 測定計画 (1) 概要2021

    • Author(s)
      川瀬頌一郎、福田宏哉、渡辺幸信、新倉潤、橋本昌宜
    • Organizer
      日本原子力学会2021年秋の大会
    • Related Report
      2021 Annual Research Report
  • [Presentation] 半導体デバイスにおける宇宙線ミュオン起因ソフトエラー発生率評価に向けたミュオン原子核捕獲反応 測定計画 (2) 荷電粒子計測システムの開発2021

    • Author(s)
      福田宏哉、川瀬頌一郎、渡辺幸信、大石将也、川田哲平、郷慎太郎、西畑洸希、新倉潤、鈴木大介、真鍋征也
    • Organizer
      日本原子力学会2021年秋の大会
    • Related Report
      2021 Annual Research Report
  • [Presentation] Development of counter telescopes for light charged particles emitted from muon nuclear reaction on Si2021

    • Author(s)
      Hiroya Fukuda, Shoichiro Kawase, Yukinobu Watanabe, Masaya Oishi, Teppei Kawata, Shintaro Go, Hiroki Nisibata, Megumi Niikura, Daisuke Suzuki, Seiya Manabe
    • Organizer
      2021年核データ研究会
    • Related Report
      2021 Annual Research Report
  • [Presentation] Siミューオン原子核反応の測定計画2021

    • Author(s)
      川瀬頌一郎
    • Organizer
      RCNP研究会
    • Related Report
      2021 Annual Research Report
  • [Presentation] 機械学習を用いた極微細MOSFETの電気特性およびパラメータの推定2021

    • Author(s)
      赤澤 光平,仲西唯吾,鈴木悠平,鎌倉良成
    • Organizer
      電子情報通信学会SDM研究会
    • Related Report
      2021 Annual Research Report
  • [Presentation] Analyzing DUE Errors with Neutron Irradiation Test and Fault Injection to Control Flow2020

    • Author(s)
      K. Ito, Y. Zhang, H. Itsuji, T. Uezono, T. Toba, and M. Hashimoto
    • Organizer
      European Conference on Radiation and Its Effects on Components and Systems (RADECS)
    • Related Report
      2020 Annual Research Report
    • Int'l Joint Research
  • [Presentation] Muon-Induced Single-Event Upsets in 20-nm SRAMs: Comparative Characterization with Neutrons and Alpha-Particles2020

    • Author(s)
      T. Kato, M. Tampo, S. Takeshita, Y. Miyake, H Tanaka, and M. Hashimoto
    • Organizer
      Nuclear and Space Radiation Effects Conference (NSREC)
    • Related Report
      2020 Annual Research Report
    • Int'l Joint Research
  • [Presentation] ntD-Si検出器を用いた波形解析による荷電粒子計測システムの開発2020

    • Author(s)
      室田 拓哉,川瀬 頌一郎 、真鍋 征也、渡辺 幸信、福田 宏哉、田村 幸大、 新倉 潤 、郷 慎太郎
    • Organizer
      日本原子力学会2020年秋の大会学生ポスターセッション
    • Related Report
      2020 Annual Research Report
  • [Presentation] nTD-Si検出器を用いた波形解析による粒子弁別可能な荷電粒子計測システムの開発2020

    • Author(s)
      室田 拓哉, 川瀬 頌一郎, 渡辺 幸信, 真鍋 征也, 福田 宏哉, 西津 美咲, 田中 裕貴, 田村 幸大, 郷 慎太郎, 甲斐 民人, 永田 優斗, 新倉 潤, 北村 徳隆, 水野 るり恵
    • Organizer
      日本原子力学会九州支部第40回研究発表講演会
    • Related Report
      2020 Annual Research Report
  • [Presentation] Soft Error and Its Countermeasures in Terrestrial Environment2020

    • Author(s)
      橋本昌宜
    • Organizer
      Asia and South Pacific Design Automation Conference (ASP-DAC)
    • Related Report
      2019 Annual Research Report
    • Int'l Joint Research / Invited
  • [Presentation] ミュオン起因半導体ソフトエラーの測定と分析2019

    • Author(s)
      橋本昌宜
    • Organizer
      J-PARC MLF 産業利用報告会
    • Related Report
      2019 Annual Research Report
    • Invited
  • [Presentation] 宇宙線起因ソフトエラーの測定と解析2019

    • Author(s)
      橋本昌宜
    • Organizer
      応用物理学会シリコンテクノロジー分科会
    • Related Report
      2019 Annual Research Report
    • Invited

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Published: 2019-06-27   Modified: 2025-02-04  

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