Development of X-ray wavefront metrology for single-nanometer focusing of XFEL

• Project/Area Number: 19K23434
• Research Category: Grant-in-Aid for Research Activity Start-up
• Allocation Type: Multi-year Fund
• Review Section: 0202:Condensed matter physics, plasma science, nuclear engineering, earth resources engineering, energy engineering, and related fields
• Research Institution: Institute of Physical and Chemical Research
• Principal Investigator: Jumpei Yamada 国立研究開発法人理化学研究所, 放射光科学研究センター, 基礎科学特別研究員 (10845027)
• Project Period (FY): 2019-08-30 – 2021-03-31
• Project Status: Completed (Fiscal Year 2020)
• Budget Amount: ¥2,860,000 (Direct Cost: ¥2,200,000、Indirect Cost: ¥660,000); Fiscal Year 2020: ¥1,430,000 (Direct Cost: ¥1,100,000、Indirect Cost: ¥330,000); Fiscal Year 2019: ¥1,430,000 (Direct Cost: ¥1,100,000、Indirect Cost: ¥330,000)
• Keywords: X線集光 / X線自由電子レーザー / 波面計測 / X線ミラー / X線 / X線波面計測

Outline of Research at the Start

X線自由電子レーザー(XFEL)Sub-10nm集光の実現と，それに伴う超高密度光子場を利用した新たな学問分野の開拓が望まれている．しかしながら，10nmレベルの集光XFELの直接計測は，光源の振動やアブレーション損傷の観点から難しく，XFELナノビーム評価法の確立が切迫した課題である．これに対し，X線の位相情報の取得が鍵であると考え，日本のXFEL施設であるSACLAにおいて高精度な波面計測手法の開発を行う．波面計測の最重要項目である系統誤差較正(キャリブレーション)を独自の技術により行い，精度λ/20の波面誤差計測の達成を目指す.

Outline of Final Research Achievements

For the realization of the X-ray free-electron laser (XFEL) sub-10nm focusing, the establishment of an XFEL nano-beam characterization method is necesarry. In this study, we developed a single-grating interferometer optimized for the sub-10 nm focusing system at SPring-8 synchrotron radiation facility, and achieved a wavefront measurement accuracy of less than λ/20 rms by systematic error calibrations.

Academic Significance and Societal Importance of the Research Achievements

本研究はXFELのsub-10nm集光と，これによる世界最高強度のX線高密度光子場の生成を実現するための技術開発である．XFEL sub-10nm集光は，X線非線形光学の開拓や蛋白質1分子構造解析を実現しうる技術であり，広範な科学分野からその実現が待たれている．本研究により，ショット毎のビーム特性変化が存在する条件でもsub-10nm集光の評価を実施することは，全ての応用実験の質を保証するために欠かせない．

Research Products

• [Journal Article] Compact full-field hard x-ray microscope based on advanced Kirkpatrick?Baez mirrors (2020)
  • Author(s): Yamada Jumpei、Matsuyama Satoshi、Hirose Raita、Takeda Yoshihiro、Kohmura Yoshiki、Yabashi Makina、Omote Kazuhiko、Ishikawa Tetsuya、Yamauchi Kazuto
  • Journal Title: Optica Volume: 7 Issue: 4 Pages: 367-367
  • DOI: 10.1364/optica.386012
  • Peer Reviewed / Open Access
• [Journal Article] X-Ray Single-Grating Interferometry for Wavefront Measurement and Correction of Hard X-Ray Nanofocusing Mirrors (2020)
  • Author(s): Yamada Jumpei、Inoue Takato、Nakamura Nami、Kameshima Takashi、Yamauchi Kazuto、Matsuyama Satoshi、Yabashi Makina
  • Journal Title: Sensors Volume: 20 Issue: 24 Pages: 7356-7356
  • DOI: 10.3390/s20247356
  • Peer Reviewed / Open Access
• [Journal Article] Full-field X-ray fluorescence microscope based on total-reflection advanced Kirkpatrick-Baez mirror optics (2019)
  • Author(s): S. Matsuyama, J. Yamada, Y. Kohmura, M. Yambashi, T. Ishikawa, and K. Yamauchi
  • Journal Title: Optics Express Volume: 27(13) Issue: 13 Pages: 18318-18328
  • DOI: 10.1364/oe.27.018318
  • Peer Reviewed / Open Access
• [Presentation] Wolter III型advanced KBミラーによるXFEL sub-10 nm集光光学系の開発 (2021)
  • Author(s): 山田純平，松山智至，井上陽登，中村南美，田中優人，大坂泰斗，井上伊知郎，犬伏雄一，湯本博勝，小山貴久，大橋治彦，山内和人，矢橋牧名
  • Organizer: 第34回日本放射光学会年会・放射光科学合同シンポジウム
• [Presentation] X-ray nanofocused beam scan using refractive prism and focusing mirrors (2020)
  • Author(s): J. Yamada, I. Inoue, T. Osaka, S. Matsuyama, K. Yamauchi, and M. Yabashi
  • Organizer: International Conference on X-ray Optics and Applications (XOPT2020)
  • Int'l Joint Research
• [Presentation] Advanced KB mirror optics and its applications (2020)
  • Author(s): J. Yamada
  • Organizer: The 12th 3-Way X-ray Optics Workshop
  • Int'l Joint Research
• [Presentation] プリズム及びミラー光学素子を用いたマイクロ・ナノ集光X線のビームスキャニング (2020)
  • Author(s): 山田純平，井上伊知郎，大坂泰斗，松山智至，山内和人，矢橋牧名
  • Organizer: 33回日本放射光学会年会・放射光科学合同シンポジウム
• [Presentation] XFEL sub-10 nm focusing mirror system based on Wolter III-advanced KB optics (2019)
  • Author(s): J. Yamada
  • Organizer: The 15th Symposium of Japanese Research Community on X-ray Imaging Optics (XIO2019)
  • Int'l Joint Research / Invited
• [Presentation] Development of XFEL sub-10 nm focusing mirrors: wavefront-corrected multilayer KB system and upgrade to advanced KB system (2019)
  • Author(s): J. Yamada, S. Matsuyama, T. Inoue, N. Nakamura, T. Osaka, I. Inoue, Y. Inubushi, K. Tono, H. Yumoto, T. Koyama, H. Ohashi, T. Ishikawa, K. Yamauchi, and M. Yabashi
  • Organizer: RIAO-OPTILAS-MOPM 2019, X-ray optics
  • Int'l Joint Research / Invited
• [Presentation] Development of XFEL sub-10nm focusing system based on Wolter III-adbvanced KB optics (2019)
  • Author(s): J. Yamada, S. Matsuyama, T. Inoue, N. Nakamura, T. Osaka, I. Inoue, Y. Inubushi, K. Tono, H. Yumoto, T. Koyama, H. Ohashi, T. Ishikawa, K. Yamauchi, and M. Yabashi
  • Organizer: International Conference on X-ray Optics and Applications (XOPT2019)
  • Int'l Joint Research