Investigation of Mechanical Manipulation of Atoms and Molecules on Insulator Surfaces with Extreme Field Atomic Force Microscopy

• Project/Area Number: 20221004
• Research Category: Grant-in-Aid for Scientific Research (S)
• Allocation Type: Single-year Grants
• Research Field: Nanostructural science
• Research Institution: Osaka University
• Principal Investigator: SUGAWARA Yasuhiro 大阪大学, 工学研究科, 教授 (40206404)
• Project Period (FY): 2008 – 2012
• Project Status: Completed (Fiscal Year 2012)
• Budget Amount: ¥92,170,000 (Direct Cost: ¥70,900,000、Indirect Cost: ¥21,270,000); Fiscal Year 2012: ¥12,350,000 (Direct Cost: ¥9,500,000、Indirect Cost: ¥2,850,000); Fiscal Year 2011: ¥18,720,000 (Direct Cost: ¥14,400,000、Indirect Cost: ¥4,320,000); Fiscal Year 2010: ¥20,930,000 (Direct Cost: ¥16,100,000、Indirect Cost: ¥4,830,000); Fiscal Year 2009: ¥21,970,000 (Direct Cost: ¥16,900,000、Indirect Cost: ¥5,070,000); Fiscal Year 2008: ¥18,200,000 (Direct Cost: ¥14,000,000、Indirect Cost: ¥4,200,000)
• Keywords: 複合極限場 / 原子間力顕微鏡 / 絶縁体表面 / 原子分子操作 / ナノ構造体 / ナノ物質 / ポテンシャル面 / 周波数シフト / 電子間力顕微鏡 / CuO表面 / ポテンシヤル面

Research Abstract

Stable and reproducible mechanical manipulation of atoms and molecules on insulator surfaces has not been realized. In the present study, by using extreme field noncontact atomic force microscopy, we investigated the control conditions and the mechanism for performing the mechanism manipulation ofatoms on insulator surfaces. We also investigated the novel physical properties of nanostructures fabricated by the atom manipulation.

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Research Products

• [Journal Article] The stray capacitance effect in Kelvin probe force microscopy using FM, AM and heterodyne AM modes (2013)
  • Author(s): Z. Ma, L. Kou, Y. Naitoh, Y. J. Li and Y. Sugawara
  • Journal Title: Nanotechnol Volume: 24 Issue: 22 Pages: 225701-225701
  • DOI: 10.1088/0957-4484/24/22/225701
  • Peer Reviewed
• [Journal Article] Complex Design of Dissipation Signals in Non-Contact Atomic Force Microscopy (2012)
  • Author(s): J. Bamidele, Y. J. Li, S. Jarvis, Y. Naitoh, Y. Sugawara, and L. Kantorovich
  • Journal Title: Phys. Chem. Chem. Phys. Volume: 14 Pages: 16250-16257
  • Peer Reviewed
• [Journal Article] Quantification of atomic-scale elasticity on Ge(001)-c(4×2) surfaces via noncontact atomic force microscopy with a tungsten-coated ti (2012)
  • Author(s): Y. Naitoh, T. Kamijo, Y. J. Li and Y. Sugawara
  • Journal Title: Phys. Rev. Lett. Volume: 109 Issue: 21 Pages: 215501-215501
  • DOI: 10.1103/physrevlett.109.215501
  • Peer Reviewed
• [Journal Article] Chemical tip fingerprinting in scanning probe microscopy of an oxidized Cu(110) surface (2012)
  • Author(s): J. Bamidele, Y. Kinoshita, R. Turansky, S. H. Lee, Y. N a ito h , Y. J . L I, Y. S u g a w a r a , I . S tic h , a n d L. Kantorovich
  • Journal Title: Phys. Rev. B Volume: 86 Issue: 15
  • DOI: 10.1103/physrevb.86.155422
  • Peer Reviewed
• [Journal Article] High potential sensitivity in heterodyne amplitude modulation Kelvin probe force microscopy (2012)
  • Author(s): Y. Sugawara, L. Kou, Z. Ma, T. Kamijo, Y. Naitoh, and Y. J. Li
  • Journal Title: Appl. Phys. Lett Volume: 100 Issue: 22
  • DOI: 10.1063/1.4723697
  • Peer Reviewed
• [Journal Article] Force Mapping on NaCl(100)/Cu(111) Surface by Atomic Force Microscopy at 78 K (2012)
  • Author(s): Y. J. Li, K. Tenjin, Y. Kinoshita, Z. Ma, L. Kou, Y. Naitoh, M. Kageshima and Y. Sugawara
  • Journal Title: Jpn. J. Appl. Phys. Volume: 51 Issue: 3R Pages: 035201-035201
  • DOI: 10.1143/jjap.51.035201
  • Peer Reviewed
• [Journal Article] Switching surface polarization of atomic force microscopy probe utilizing photoisomerization of photochromic molecules (2011)
  • Author(s): Y. Aburaya, H. Nomura, M. Kageshima, Y. Naitoh, Y. J. Li and Y. Sugawara
  • Journal Title: J. Appl. Phys Volume: 109 Issue: 6
  • DOI: 10.1063/1.3552926
  • Peer Reviewed
• [Journal Article] Fabrication of sharp tungsten-coated tip for atomic force microscopy by ion-beam sputter deposition (2011)
  • Author(s): Y.Kinoshita, Y.Naitoh, Y.J.Li, Y.Sugawara
  • Journal Title: Rev.Sci.Instrum. Volume: 82 Issue: 11
  • DOI: 10.1063/1.3663069
  • Peer Reviewed
• [Journal Article] Force MapPing on NaCl (100)/Cu (111) Surface by Atomic Force Microscopy at 78 K (2011)
  • Author(s): Y.J.Li, K..Tenjin, Y.Kinoshita, Z.Ma, L..Kou, Y.Naitoh, M.Kageshima, Y.Sugawara
  • Journal Title: Ultramicroscopy In press
• [Journal Article] Force Mapping on NaCl(100)/Cu(111) Surface by Atomic Force Microscopy at 78 K (2011)
  • Author(s): Y.J.Li, K.Tenjin, Y.Kinoshita, Z.Ma, L.Kou, Y Naitoh, M Kageshima, Y Sugawara
  • Journal Title: Ultramicroscopy Volume: (印刷中)
  • Peer Reviewed
• [Journal Article] Simultaneous observation of surface topography and elasticity at atomic scale by multifrequency frequency modulation atomic force microscopy (2010)
  • Author(s): Y. Naitoh, Z. Ma, Y. J. Li, M. Kageshima and Y. Sugawara
  • Journal Title: J. Vac. Sci. Technol. B Volume: 28 Issue: 6 Pages: 1210-1214
  • DOI: 10.1116/1.3503611
  • Peer Reviewed
• [Journal Article] High force sensitivity in Q-controlled phase-modulation atomic force microscopy (2010)
  • Author(s): N. Kobayashi, Y. J. Li, Y. Naitoh, M. Kageshima and Y. Sugawara
  • Journal Title: Appl. Phys. Lett Volume: 97 Issue: 1
  • DOI: 10.1063/1.3457431
  • Peer Reviewed
• [Journal Article] Multifrequency High-Speed Phase- Modulation Atomic Force Microscopy in Liquids (2010)
  • Author(s): Y. J. Li, K. Takahashi, N. Kobayashi, Y. Naitoh, M. Kageshima, and Y. Sugawara
  • Journal Title: Ultramicroscopy Volume: 110 Issue: 6 Pages: 582-585
  • DOI: 10.1016/j.ultramic.2010.02.014
  • Peer Reviewed
• [Journal Article] Step Response Measurement of AFM Cantilever for Analysis of Frequency-Resolved Viscoelasticity (2010)
  • Author(s): T. Ogawa, S. Kurachi, M. Kageshima, Y. Naitoh, Y. J. Li and Y. Sugawara
  • Journal Title: Ultramicroscopy Volume: 110 Issue: 6 Pages: 612-617
  • DOI: 10.1016/j.ultramic.2010.02.020
  • Peer Reviewed
• [Journal Article] Effect of Surface Stress around the SAStep of Si(001) on the Dimer Structure Induced by Noncontact Atomic Force Microscopy at 5 K (2010)
  • Author(s): Y. Naitoh, Y. J. Li, H. Nomura, M. Kageshima and Y. Sugawara
  • Journal Title: J. Phys. Soc. Jpn Volume: 79 Issue: 1 Pages: 013601-013601
  • DOI: 10.1143/jpsj.79.013601
  • Peer Reviewed
• [Journal Article] Simultaneous observation of surface topography and elasticity at atomic scale by multifrequency frequency modulation atomic force microscopy (2010)
  • Author(s): Y.Naitoh, Z.Ma, Y.J.Li, M.Kageshima, Y.Sugawara
  • Journal Title: J.Vac.Sci.Technol.B 28 Pages: 1210-1214
• [Journal Article] Effect of Surface Stress around the S_A Step of Si (001) on the Dimer Structure Induced by Noncontact Atomic Force Microscopy at 5 K (2010)
  • Author(s): Y.Naitoh, Y.J.Li, H.Nomura, M.Kageshima, Y. Sugawara
  • Journal Title: J.Phys.Soc.Jpn. 79
• [Journal Article] Simultaneous observation of surface topography and elasticity at atomic scale by multifrequency frequency modulation atomic force microscopy (2010)
  • Author(s): Y.Naitoh, Z.Ma, Y.J.Li, M.Kageshima, Y.Sugawara
  • Journal Title: J.Vac.Sci.& Technol.B Volume: 28 Pages: 1210-1214
  • Peer Reviewed
• [Journal Article] High force sensitivity in Q-controlled phase-modulation atomic force microscopy (2010)
  • Author(s): N.Kobayashi, Y.J.Li, Y.Naitoh, M.Kageshima, Y.Sugawara
  • Journal Title: Appl.Phys.Lett. Volume: 97
  • Peer Reviewed
• [Journal Article] Multifrequency High-Speed Phase-Modulation Atomic Force Microscopy in liquids (2010)
  • Author(s): Y.J.Li, K.Takahashi, N.Kobayashi, Y.Naitoh, M.Kageshima, Y.Sugawara
  • Journal Title: Ultramicroscopy Volume: 110 Pages: 582-585
  • Peer Reviewed
• [Journal Article] Effect of Surface Stress around the SA Step of Si(001) on the Dimer Structure Determined by Noncontact Atomic Force Microscopy at 5 K (2010)
  • Author(s): Y.Naitoh, Y.J.Li, H.Nomura, M.Kageshima, Y.Sugawara
  • Journal Title: J.Phys.Soc.Jpn. Volume: 79
  • Peer Reviewed
• [Journal Article] Step Response Measurement of AFM Cantilever for Analysis of Frequency-Resolved Viscoelasticity (2010)
  • Author(s): T.Ogawa, S.Kurachi, M.Kageshima, Y.Naitoh, Y.J.Li, Y.Sugawara
  • Journal Title: Ultramicroscopy (In press)
  • Peer Reviewed
• [Journal Article] Multifrequency High-Speed Phase-Modulation Atomic Force Microscopy in liquids (2010)
  • Author(s): Y.J.Li, K.Takahashi, N.Kobayashi, Y.Naitoh, M.Kageshima, Y.Sugawara
  • Journal Title: Ultramicroscopy (In press)
  • Peer Reviewed
• [Journal Article] Effect of Surface Stress around the S_A Step of Si(001) on the Dimer Structure Determined by Noncontact Atomic Force Microscopy at 5 K (2010)
  • Author(s): Y.Naitoh, Y.J.Li, H.Nomura, M.Kageshima, Y.Sugawara
  • Journal Title: J.Phys.Soc.Jpn. Vol. 79
  • Peer Reviewed
• [Journal Article] The influence of Si cantilever tip with/without tungsten coating on NC-AFM imaging of Ge(001) surface (2009)
  • Author(s): Y. Naitoh, Y. Kinoshita, Y. J. Li, M. Kageshima and Y. Sugawara
  • Journal Title: Nanotechnology Volume: 20 Issue: 26 Pages: 264011-264011
  • DOI: 10.1088/0957-4484/20/26/264011
  • Peer Reviewed
• [Journal Article] Development of atomic force microscope with wide-band magnetic excitation for study of soft matter dynamics (2009)
  • Author(s): M. Kageshima, T. Chikamoto, T. Ogawa, Y. Hirata, T. Inoue, Y. Naitoh, Y. J. Li, and Y. Sugawara
  • Journal Title: Rev. Sci. Inst Volume: 80 Issue: 2
  • DOI: 10.1063/1.3080557
  • Peer Reviewed
• [Journal Article] The influence of Si cantilever tip with/without tungsten coating on NC-AFM imaging of Ge (001) surface (2009)
  • Author(s): Y.Naitoh, Y.Kinoshita, Y. J.Li, M.Kageshima, Y.Sugawara
  • Journal Title: Nanotechnology 20
• [Journal Article] Influence of Si Cantilever Tip with/without tungsten coating on NC-AFM Imaging of Ge(001) Surface (2009)
  • Author(s): Y.Naitoh, Y.Kinoshita, Y.J.Li, M.Kageshima, Y.Sugawara
  • Journal Title: Nanotechnol. Vol. 20
  • Peer Reviewed
• [Journal Article] Development of atomic force microscope with wide-band magnetic excitation forstudy of soft matter dynamics (2009)
  • Author(s): M.Kageshima, T.Chikamoto, T.Ogawa, Y.Hirata, T.Inoue, Y.Naitoh, Y.J.Li, Y.Sugawara
  • Journal Title: Rev.Sci.Instrum. Vol. 80
  • Peer Reviewed
• [Journal Article] Influence of Si Cantilever Tip with/without tungsten coating on NC-AFM Imaging of Ge(001) Surface (2009)
  • Author(s): Y. Naitoh, Y. Kinoshita, Y. J. Li, M. Kageshima, Y. Sugawara
  • Journal Title: Nanotechnology (In press)
  • Peer Reviewed
• [Journal Article] Development of atomic force microscope with wide-band magneticexcitation for study of soft matter dynamic (2009)
  • Author(s): M. Kageshima, T. Chikamoto, T. Ogawa, Y. Hirata, T. Inoue, Y. Naitoh, Y. J. Li, Y. Sugawara
  • Journal Title: Review of Scientific Instruments 80(2)
  • Peer Reviewed
• [Journal Article] Atomic-Scale Imaging of B/Si(111) √3 x√3 Surface by Noncontact Atomic Force Microscopy (2008)
  • Author(s): M. Kinoshita, Y. Naitoh, Y. J. Li, M. Kageshima and Y. Sugawara
  • Journal Title: Jpn. J. Appl. Phys Volume: 47 Issue: 10S Pages: 8218-8220
  • DOI: 10.1143/jjap.47.8218
  • Peer Reviewed
• [Journal Article] High-speed Phase-Modulation Atomic Force Microscopy in Constant-Amplitude Mode Capable of Simultaneous Measurement of Topography and Energy Dissipation (2008)
  • Author(s): Y. J. Li, N. Kobayashi, H. Nomura, Y. Naitoh, M. Kageshima and Y. Sugawara
  • Journal Title: Jpn. J. Appl. Phys Volume: 47 Issue: 7S2 Pages: 6121-6124
  • DOI: 10.1143/jjap.47.6121
  • Peer Reviewed
• [Journal Article] Study of Oxidized Cu(110) Surface Using Noncontact Atomic Force Microscopy (2008)
  • Author(s): S. Kishimoto, M. Kageshima Y. J. Li, Y. Naitoh, and Y. Sugawara
  • Journal Title: Surface Science Volume: 602 Issue: 13 Pages: 2175-2182
  • DOI: 10.1016/j.susc.2008.04.030
  • Peer Reviewed
• [Journal Article] Phase modulation atomic force microscopy in constant excitation mode capable of simultaneous imaging of topography and energy dissipation (2008)
  • Author(s): Y. J. Li, N. Kobayashi, Y. Naitoh, M. Kageshima and Y. Sugawara
  • Journal Title: Appl. Phys. Lett. Volume: 92 Issue: 12
  • DOI: 10.1063/1.2901151
  • Peer Reviewed
• [Journal Article] Theoretical investigation on force sensitivity in Q-controlled phase modulation atomic force microscopy in constant-amplitude mode (2008)
  • Author(s): N. Kobayashi, Y. J. Li, Y. Naitoh, M. Kageshima and Y. Sugawara
  • Journal Title: J. Appl. Phys. Volume: 103, 054305 Issue: 5 Pages: 1-4
  • DOI: 10.1063/1.2890380
  • Peer Reviewed
• [Journal Article] Viscoelasticity and Dynamics of Single Biopolymer Chain Measured with Magnetically Modulated Atomic Force Microscopy (2008)
  • Author(s): M. Kageshima, Y. Nishihara, Y. Hirata, T. Inoue, Y. Naitoh and Y. Sugawara
  • Journal Title: AIP Conference Proceedings Volume: 982 Pages: 504-507
  • Peer Reviewed
• [Journal Article] Development of Noncontact Atomic force Microscopy Operating at Low Temperatures (2008)
  • Author(s): Y. Sugawara, Y. Naitoh, M. Kageshima and Y. J. Li
  • Journal Title: J. Vac. Soc. Jpn Volume: 51 Pages: 789-795
  • NAID: 10024858334
  • Peer Reviewed
• [Journal Article] Atomic-Scale Imaging of B/Si (111) √<3>x√<3> Surface by Noncontact Atomic Force Microscopy (2008)
  • Author(s): M.Kinoshita, Y.Naitoh, Y. J.Li, M.Kageshima, Y.Sugawara
  • Journal Title: Jpn.J.Appl.Phys. 47 Pages: 8218-8220
• [Journal Article] Atomic-Scale Imaging of B/Si(111)√<3>×√<3> Surface by Noncontact Atomic Force Microscopy (2008)
  • Author(s): M. Kinoshita, Y. Naitoh, Y. J. Li, M. Kageshima, Y. Sugawara
  • Journal Title: Jpn. J. Appl. Phys. 47(10B) Pages: 8218-8220
  • Peer Reviewed
• [Journal Article] High-speed Phase-Modulation Atomic Force Microscopy in Constant-Amplitude Mode Capable of Simultaneous Measurement of Topography and Energy Dissipation (2008)
  • Author(s): Y. J. Li, N. Kobayashi, H. Nomura, Y. Naitoh, M. Kageshima, Y. Sugawara
  • Journal Title: Jpn. J. Appl. Phys. 47 (7B) Pages: 6121-6124
  • Peer Reviewed
• [Journal Article] study of oxidized Cu(110) surface using noncontact atomic force microscopy (2008)
  • Author(s): S. Kishimoto, M. Kageshima, Y. Naitoh, Y. J. Li, Y. Sugawara
  • Journal Title: Surf. Sci. 602 Pages: 2175-2182
  • Peer Reviewed
• [Journal Article] Phase Modulation Atomic Force Microscopy (PM-AFM) in Constant Excitation Mode Capable of Simultaneous Imaging of Topography and Energy Dissipation (2008)
  • Author(s): Y. J. Li, N. Kobayashi, Y. Naitoh, M. Kageshima, Y. Sugawara
  • Journal Title: Appl. Phys. Lett. 92(12)
  • Peer Reviewed
• [Journal Article] Theoretical Investigation on Force Sensitivity in Q-Controlled Phase-Modulation Atomic Force Microscopy in Constant-Amplitude Mode (2008)
  • Author(s): N. Kobayashi, Y. J. Li, Y. Naitoh, M. Kageshima, Y. Sugawara
  • Journal Title: J. Appl. Phys. 103 (5)
  • Peer Reviewed
• [Presentation] 走査型プローブ顕微鏡(SPM (2012)
  • Author(s): 菅原康弘
  • Organizer: 第54回表面科学基礎講座 表面・界面分析の基礎と応用
  • Place of Presentation: 大阪大学・コンベンションセンター
  • Year and Date: 2012-10-16
• [Presentation] 学・コンベンションセンター 2)"原子間力顕微鏡による原子操作と力学分光 (2012)
  • Author(s): 菅原康
  • Organizer: 日本表面科学会 平成 23年度関西支部セミナー
  • Place of Presentation: 京都大学宇治キャンパス
  • Year and Date: 2012-03-07
• [Presentation] Atom Manipulation and Force Spectroscopy on Cu(110)-O Surface with Low-Temperature AFM (2012)
  • Author(s): Y. Sugawara and Y. J. Li
  • Organizer: Li, Annual Meeting of The Chinese Vacuum Society (CVS-2012)
  • Place of Presentation: Lanzhou, China
• [Presentation] Investigation of TiO2Surface by Using Atomic Force Microscopy/Spectroscopy (2012)
  • Author(s): Y. Sugawara
  • Organizer: The 3rd Annual World Congress of Catalytic Asymmetric Synthesis (WCCAS-2012)
  • Place of Presentation: Beijing, China.
• [Presentation] Investigation of TiO2 Surface by Using Atomic Force Microscopy/Spectroscopy (2012)
  • Author(s): Y. Sugawara
  • Organizer: The 3rd Annual World Congress of Catalytic Asymmetric Synthesis (WCCAS-2012)
  • Place of Presentation: Beijing, China
  • Invited
• [Presentation] Heterodyne Kelvin Probe Force Microscopy with High Potential Sensitivity (2012)
  • Author(s): Y. Sugawara, L. Kou, Z. Ma, Y. Naitoh and Y. J. Li
  • Organizer: 15th International Conference on Noncontact Atomic Force Microscopy (NC-AFM 2012)
  • Place of Presentation: Cesky Krumlov, Czech Republic
• [Presentation] Atomic Manipulation and Three-dimensional Force Spectroscopy on Cu(110)-O Surface with LT NC-AFM (2012)
  • Author(s): Y. Sugawara, Y. Kinoshita, Y. Naitoh, and Y. J. Li
  • Organizer: International Conference on Nanoscience & Technology (ICN+T 2012)
  • Place of Presentation: Paris, France
• [Presentation] Atom Manipulation and Force Spectroscopy on Cu(110)-O Surface with Low-Temperature AFM (2012)
  • Author(s): Y. Sugawara and Y. J. Li
  • Organizer: Annual Meeting of The Chinese Vacuum Society (CVS-2012)
  • Place of Presentation: Lanzhou, China
  • Invited
• [Presentation] フォトンAFMによる近接場光高分解能イメージング (2012)
  • Author(s): 古川真, 山田修平, 内藤賀公, 李艶君, 菅原康弘
  • Organizer: 2012春季第59回応用物理学関係連合講演会
  • Place of Presentation: 早稲田大学
• [Presentation] フォトンAFMによる高分解能近接場光イメージング (2012)
  • Author(s): 山田修平, 古川真, 内藤賀公, 李艶君, 菅原康弘
  • Organizer: 2012春季第59回応用物理学関係連合講演会
  • Place of Presentation: 早稲田大学
• [Presentation] 強磁性共鳴を用いた磁気交換力顕微鏡の開発に関する研究(2) (2012)
  • Author(s): 土師将裕, 高田翔一, 内藤賀公, 李艶君, 菅原康弘
  • Organizer: 2012春季第59回応用物理学関係連合講演会
  • Place of Presentation: 早稲田大学
• [Presentation] ばね定数・共振周波数の大きなSiカンチレバーを用いた小振幅FM-AFM (2012)
  • Author(s): 有馬英司、土師将裕, 高田翔一, 内藤賀公, 李艶君, 菅原康弘
  • Organizer: 2012春季第59回応用物理学関係連合講演会
  • Place of Presentation: 早稲田大学
• [Presentation] 非接触原子間力顕微鏡を用いた酸化銅CU(110)-O表面における力分布測定 (2012)
  • Author(s): 木下幸則、内藤賀公、李艶君、菅原康弘
  • Organizer: 2012物理学会第67回年次大会
  • Place of Presentation: 関西学院大学神戸
• [Presentation] フォース顕微鏡における最先端計測技術 (2011)
  • Author(s): 菅原康弘
  • Organizer: 日本顕微鏡学会走査型プローブ顕微鏡分科会平成 23 年度オープン研究会
  • Place of Presentation: 物質・材料研究機構
  • Year and Date: 2011-12-02
• [Presentation] 走査型プローブ顕微鏡(SPM) (2011)
  • Author(s): 菅原康弘
  • Organizer: 第52回表面科学基礎講座 表面・界面分析の基礎と応用
  • Place of Presentation: 大阪大学・コンベンションセンター
  • Year and Date: 2011-09-14
• [Presentation] Atomic Manipulation and Force Spectroscopy by Atomic Force Microscopy (2011)
  • Author(s): Y. Sugawara
  • Organizer: 1st International Conference on Small Science
  • Place of Presentation: Sydney, Australia
  • Year and Date: 2011-08-15
• [Presentation] 菅原康弘 (2011)
  • Author(s): SPM を用いた元素分析の可能性について
  • Organizer: 第1回「顕微表面分析」セミナー
  • Place of Presentation: 島津製作所関西支社マルチホール
  • Year and Date: 2011-07-29
• [Presentation] 多周波数FM-AFMによる表面形状と弾性の原子レベル同時測定 (2011)
  • Author(s): 内藤賀公、馬宗敏、李艶君、菅原康弘
  • Organizer: 2011春季第58回応用物理学関係連合講演会
  • Place of Presentation: 神奈川工科大学、神奈川
  • Year and Date: 2011-03-27
• [Presentation] Atom Manipulation and Force Spectroscopy on Cu(110)-O Surface with Low Temperature Noncontact AFM (2011)
  • Author(s): Y.J.Li, Y.Sugawara
  • Organizer: International Symposium on Test and Measurement (ISTM)
  • Place of Presentation: Suzhou, China(招待講演)
• [Presentation] Stable Contrast Mode on TiO_2 (110) Surface using AFM with Tungsten-coated Tips (2011)
  • Author(s): Y.J.Li, Y.Tsukuda, Y.Naitoh, Y.Sugawara
  • Organizer: 14th International Conference on Noncontact Atomic Force Microscopy 2011
  • Place of Presentation: Lindau, Germany
• [Presentation] Tip-induced heating of Co atoms on Cu (110)-O surface with low-temperature AFM (2011)
  • Author(s): Y.Sugawara, Y.Kinoshita, Y.Naitoh, Y.J.Li
  • Organizer: 14th International Conference on Noncontact Atomic Force Microscopy 2011
  • Place of Presentation: Lindau, Germany
• [Presentation] Investigation of TiO_2 (110) by AFM/STM with the Metal Coated Tip (2011)
  • Author(s): L.Kou, Y.Naitoh, Y.J.Li, Y.Sugawara
  • Organizer: 14th International Conference on Noncontact Atomic Force Microscopy 2011
  • Place of Presentation: Lindau, Gennany
• [Presentation] Huge & Complex Dissipation signals from small & Simple NC-AFM Scans (2011)
  • Author(s): J.Bamidele, H.Nomura, S.Jarvis, Y.J.Li, Y.Naitoh, M.Kageshima, Y.Sugawara, L.Kantorovich
  • Organizer: 14th International Conference on Noncontact Atomic Force Microscopy 2011
  • Place of Presentation: Lindau, Germany
• [Presentation] Small-amplitude FM-AFM using a Si cantilever with very high stiffness and very high resonance frequency (2011)
  • Author(s): M.Haze, Y.Naitoh, Y.J.Li, Y.Sugawara
  • Organizer: 14th International Conference on Noncontact Atomic Force Microscopy 2011
  • Place of Presentation: Lindau, Germany
• [Presentation] Visualization of atomic scale elasticity on Ge (001) surface with multifrequency FM-AFM (2011)
  • Author(s): Y.Naitoh, Y.J.Li, Y.Sugawara
  • Organizer: 14th International Conference on Noncontact Atomic Force Microscopy 2011
  • Place of Presentation: Lindau, Germany
• [Presentation] AFM/STM simultaneous measurement on Cu (110)-O with metal-coated cantilever (2011)
  • Author(s): Z-M.Ma, Y.Naitoh, Y.J.Li, Y.Sugawara
  • Organizer: 14th International Conference on Noncontact Atomic Force Microscopy 2011
  • Place of Presentation: Lindau, Germany
• [Presentation] Stable Contrast Mode on TiO_2 (110) Surface by AFM with W-coated Tips (2011)
  • Author(s): Y.J.Li, Y.Tsukuda, Y.Naitoh, Y.Sugawara
  • Organizer: 19th International Colloquium on Scanning Probe Microscopy (ICSPM19)
  • Place of Presentation: Touyako, Japan
• [Presentation] Imaging of Al_2O_3 Thin Film (2011)
  • Author(s): R.Doi, S.Ozawa, Y.Naitoh, Y.J.Li, S.Sugawara
  • Organizer: 19th International Colloquium on Scanning Probe Microscopy (ICSPM19)
  • Place of Presentation: Touyako, Japan
• [Presentation] Investigation of Optical Properties in Nano Region Using Photon AFM (2011)
  • Author(s): S.Yamada, Y.Naitoh, Y.J.Li, Y.Sugawara
  • Organizer: 19th International Colloquium on Scanning Probe Microscopy (ICSPM19)
  • Place of Presentation: Touyako, Japan
• [Presentation] Sub-nm Resolution Imaging on Sapphire Surface with Photon AFM (2011)
  • Author(s): M.Furukawa, Y.Naitoh, Y.J.Li, Y.Sugawara
  • Organizer: 19th International Colloquium on Scanning Probe Microscopy (ICSPM19)
  • Place of Presentation: Touyako, Japan
• [Presentation] Wコートカンチレバーを用いたTiO2(110)表面のAFM測定 (2011)
  • Author(s): 佃至弘, 内藤賀公, 李艶君, 菅原康弘
  • Organizer: 2011年秋季第72回応用物理学会学術講演会
  • Place of Presentation: 山形大学
• [Presentation] 強磁性共鳴を用いた磁気交換力顕微鏡の開発に関する研究 (2011)
  • Author(s): 土師将裕、高田翔一、内藤賀公、李艶君、菅原康弘
  • Organizer: 2011年秋季第72回応用物理学会学術講演会
  • Place of Presentation: 山形大学
• [Presentation] 走査型プローブ顕微鏡(SPM) (2010)
  • Author(s): 菅原康弘
  • Organizer: 第50回表面科学基礎講座 表面・界面分析の基礎と応用
  • Place of Presentation: 大阪大学・コンベンションセンター
  • Year and Date: 2010-10-20
• [Presentation] 原子間力顕微鏡の現状と展望 (2010)
  • Author(s): 菅原康弘
  • Organizer: 第2回けいはんな物質科学フォーラム
  • Place of Presentation: 奈良先端科学技術大学院大学
  • Year and Date: 2010-05-15
• [Presentation] 力学的な原子分子操作と分光計測 (2010)
  • Author(s): 菅原康弘
  • Organizer: 第4回ナノ理工学情報交流会
  • Place of Presentation: 大阪大学
  • Year and Date: 2010-01-28
• [Presentation] Atom Manipulation and Force Spectroscopy on Cu(110)-O Surface with Low Temperature AFM (2010)
  • Author(s): Y. Sugawara
  • Organizer: The 15th International Conference on Solid Films and Surfaces (ICSFS-15)
  • Place of Presentation: Beijing, China.
• [Presentation] Atom Manipulation and Force Spectroscopy on Cu(110)-O Surface with Low Temperature Noncontact AFM (2010)
  • Author(s): Y. Sugawara
  • Organizer: The 4th AEARU Advanced Materials Science Workshop on Artificial and Self-Organized Nanostructure Sciences and Nano-Technologies for the Sustainable World
  • Place of Presentation: Tsukuba, Japan.
• [Presentation] Atom manipulation and force spectroscopy on Cu(110)-O surface with low temperature noncontact AFM (2010)
  • Author(s): Y. Sugawara
  • Organizer: The 18th International Vacuum Congress (IVC-18)
  • Place of Presentation: Beijing, China
• [Presentation] Atom manipulation and force spectroscopy on Cu(110)-O surface with low temperature noncontact AFM (2010)
  • Author(s): Y. Sugawara
  • Organizer: The 6th Nanoscience and Nanotechnology Conference (NANOTR-VI)
  • Place of Presentation: Izmir, Turkey.
• [Presentation] Atom manipulation and force spectroscopy on Cu (110)-0 surface with low temperature noncontact AFM (2010)
  • Author(s): Y.Sugawara
  • Organizer: The 18th International Vacuum Congress (IVC-18)
  • Place of Presentation: Beijing, China. (Invited)
• [Presentation] Atom manipulation and force spectroscopy on Cu (110)-0 surface with low temperature noncontact AFM (2010)
  • Author(s): Y.Sugawara
  • Organizer: The 6th Nanoscience and Nanotechnology Conference (NANOTR-VI)
  • Place of Presentation: Izmir, Turkey. (Invited)
• [Presentation] Atom Manipulation and Force Spectroscopy on Cu(110)-O Surface with Low Temperature AFM (2010)
  • Author(s): Y.Sugawara
  • Organizer: 15th International Conference on Solid Films and Surfaces (ICSFS-15)
  • Place of Presentation: Beijing, China(招待講演)
• [Presentation] Atom Manipulation and Force Spectroscopy on Cu(110)-O Surface with Low Temperature Noncontact AFM (2010)
  • Author(s): Y.Sugawara
  • Organizer: 4th AEARU Advanced Materials Science Workshop on Artificial and Self-Organized Nanostructure Sciences and Nano-Technologies for the Sustainable World
  • Place of Presentation: Tsukuba, Japan(招待講演)
• [Presentation] Atom manipulation and force spectroscopy on Cu(110)-O surface with low temperature noncontact AFM (2010)
  • Author(s): Y.Sugawara
  • Organizer: 18th International Vacuum Congress (IVC-18)
  • Place of Presentation: Beijing, China(招待講演)
• [Presentation] Atom Manipulation and Force Spectroscopy on Cu(110)-O Surface with Low Temperature Noncontact AFM (2010)
  • Author(s): Y.Sugawara, Y.Kinoshita, Y.Naitoh, M.Kageshima, Y.J.Li
  • Organizer: International Conference on Noncontact Atomic Force Microscopy
  • Place of Presentation: Kanazawa, Japan
• [Presentation] Atom manipulation and force spectroscopy on Cu(110)-O surface with low temperature noncontact AFM (2010)
  • Author(s): Y.Sugawara
  • Organizer: 6th Nanoscience and Nanotechnology Conference (NANOTR-VI)
  • Place of Presentation: Izmir, Turkey(招待講演)
• [Presentation] Lateral Manipulation of Cu Atoms and 2D Force Spectroscopy on Cu(110)-O Surface with Low Temperature Atomic Force Microscopy (2009)
  • Author(s): Y.Kinoshita
  • Organizer: 17th International Colloquium on Scanning Probe Microsconv(ICSPM17)
  • Place of Presentation: 熱川、静岡
  • Year and Date: 2009-12-11
• [Presentation] 原子間力顕微鏡の高感度化・高速化・多機能化 (2009)
  • Author(s): 菅原康弘
  • Organizer: 2009年秋季第70回応用物理学会学術講演会 シンポジウム「非接触原子間力顕微鏡で拓くナノテク最前線」
  • Place of Presentation: 富山大学
  • Year and Date: 2009-09-08
• [Presentation] 原子間力顕微鏡の高感度化・高速化・多機能化 (2009)
  • Author(s): 菅原康弘
  • Organizer: 2009年秋季第70回応用物理学会学術講演会
  • Place of Presentation: 富山大学、富山
  • Year and Date: 2009-09-08
• [Presentation] 液中AFMの基礎と応用 (2009)
  • Author(s): 菅原康弘
  • Organizer: 有機バイオSPM研究会(応用物理学会・有機分子バイオエレクトロニクス分科会主催)
  • Place of Presentation: 幕張メッセ国際展示場
  • Year and Date: 2009-09-04
• [Presentation] Atom Manipulation on Cu(110)-O Surface with Low Temperature Noncontact AFM (2009)
  • Author(s): Y.Sugawara
  • Organizer: International Conference on Nanoscience and Technology, China 2009(ChinaNANO2009)
  • Place of Presentation: Beijing, China
  • Year and Date: 2009-09-02
• [Presentation] Atom manipulation on Cu(110)-O surface with LT-AFM (2009)
  • Author(s): Y.Sugawara
  • Organizer: 12th International Conference on Noncontact Atomic Force Microscopy
  • Place of Presentation: New Haven, CT, USA
  • Year and Date: 2009-08-13
• [Presentation] Phase Modulation Atomic Force Microscopy in Constant Amplitude Mode (2009)
  • Author(s): Y. Sugawara
  • Organizer: The XI International Scanning Probe Microscopy Conference 2009
  • Place of Presentation: Madrid, Spain.
  • Year and Date: 2009-06-18
• [Presentation] Phase Modulation Atomic Force Microscopy in Constant Amplitude Mode (2009)
  • Author(s): Y.Sugawara
  • Organizer: XI International Scanning Probe Microscopy Conference
  • Place of Presentation: Madrid, Spain
  • Year and Date: 2009-06-18
• [Presentation] "Atom Manipulation on Cu(110)-O Surface with Low Temperature Noncontact AFM (2009)
  • Author(s): Y. Sugawara
  • Organizer: The International Conference on Nanoscience and Technology, China 2009 (ChinaNANO 2009)
  • Place of Presentation: Beijing, China
• [Presentation] Atom Manipulation on Cu (110)-0 Surface with Low Temperature Noncontact AFM (2009)
  • Author(s): Y.Sugawara
  • Organizer: The International Conference on Nanoscience and Technology, China 2009 (ChinaNANO 2009)
  • Place of Presentation: Beijing, China. (Invited)
• [Presentation] Atom Manipulation on Cu(110)-O Surface with Low Temperature Noncontact AFM (2008)
  • Author(s): Y. Sugawara, et al.
  • Organizer: 16th International Conference on Scanning Probe Microscopy
  • Place of Presentation: 熱川ハイツ
  • Year and Date: 2008-12-13
• [Presentation] Atom Manipulation on Cu(110)-O Surface with Low Temperature Noncontact AFM (2008)
  • Author(s): Y. Sugawara, et al.
  • Organizer: 5th International Symposium on Surface Science and Nanotechnology
  • Place of Presentation: 早稲田大学
  • Year and Date: 2008-11-10
• [Presentation] 低温AFMによるCu(110)-0表面での単原子操作 (2008)
  • Author(s): 菅原 康弘
  • Organizer: 日本物理学会2008年秋季大会
  • Place of Presentation: 岩手大学
  • Year and Date: 2008-09-23
• [Presentation] Atom Manipulation on Cu(110)-O surface with Low Temperature Noncontact AFM (2008)
  • Author(s): Y. Sugawara, et al.
  • Organizer: 11^<th> International Conference on Noncontact Atomic Force Microscopy
  • Place of Presentation: Madrid, Spain
  • Year and Date: 2008-09-16
• [Presentation] Force Spectroscopy測定を用いたCu(110)-0基板のCu原子操作機構の解明 (2008)
  • Author(s): 佐藤拓平
  • Organizer: 第69回応用物理学会学術講演会
  • Place of Presentation: 中部大学
  • Year and Date: 2008-09-05
• [Presentation] SPMの現状概観とロードマップ点検(AFM) (2008)
  • Author(s): 菅原康弘
  • Organizer: 日本学術振興会振167委員会 第55回研究会
  • Place of Presentation: 桐生地域地場産業振興センター
  • Year and Date: 2008-07-23
• [Presentation] Attractive and Repulsive Forces in Atom Manipulation Measured with Noncontact AFM (2008)
  • Author(s): Y. Sugawara, et al.
  • Organizer: International Conference on Nanoscience+Technology 2008
  • Place of Presentation: Keystone, USA
  • Year and Date: 2008-07-23
• [Presentation] 非接触原子間力顕微鏡による金属酸化物表面での原子種識別と原子操作 (2008)
  • Author(s): 菅原康弘
  • Organizer: 第27回マイクロ化学談話会ポジウム
  • Place of Presentation: 京都大学
  • Year and Date: 2008-06-20
• [Book] 新アクチュエータ開発の最前線 プローブ顕微鏡用高速アクチュエータの開発 (2011)
  • Author(s): 菅原康弘、李艶君、内藤賀公
  • Publisher: エヌ・ティー・エヌ
• [Book] 新アクチュエータ開発の最前線 (2011)
  • Author(s): 菅原康弘、李艶君、内藤賀公
  • Publisher: エヌ・ティー・エヌ
• [Book] Development of High-Speed Actuator for Scanning Probe Microscopy (2010)
  • Author(s): Y. Sugawara, Y. J. Li, Y. Naitoh and M. Kageshima
  • Publisher: Springer, Next Generation Actuators Leading Breakthroughs
• [Book] 走査プローブ顕微鏡を用いたナノイメージング (2008)
  • Author(s): 菅原康弘
  • Publisher: ナノイメージング(エヌ・ティー・エヌ)
• [Book] ナノイメージング(走査プローブ顕微鏡を用いたナノイメージング) (2008)
  • Author(s): 菅原康弘
  • Publisher: エヌ・ティー・エヌ
• [Remarks]
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  • URL: http://nanophysics.ap.eng.osaka-u.ac.jp/
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• [Remarks] ホームページ
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