• Search Research Projects
  • Search Researchers
  • How to Use
  1. Back to previous page

Silicon Single-Dopant Electronics

Research Project

Project/Area Number 20241036
Research Category

Grant-in-Aid for Scientific Research (A)

Allocation TypeSingle-year Grants
Section一般
Research Field Microdevices/Nanodevices
Research InstitutionNTT Basic Research Laboratories

Principal Investigator

ONO Yukinori  日本電信電話株式会社NTT物性科学基礎研究所, 量子電子物性研究部, 主幹研究員 (80374073)

Co-Investigator(Kenkyū-buntansha) TSUCHIYA Toshiaki  島根大学, 総合理工学部, 教授 (20304248)
HORIGUCHI Seiji  工学資源学研究科, 教授 (60375219)
NISHIGUCHI Katsuhiko  日本電信電話株式会社NTT物性科学基礎研究所, 特別研究員 (00393760)
Co-Investigator(Renkei-kenkyūsha) YAMAGUCHI Toru  日本電信電話株式会社NTT物性科学基礎研究所, 主任研究員 (30393763)
MOHAMMED Khalafalla  日本電信電話株式会社NTT物性科学基礎研究所, 研究員 (70463627)
Project Period (FY) 2008 – 2011
Project Status Completed (Fiscal Year 2011)
Budget Amount *help
¥48,360,000 (Direct Cost: ¥37,200,000、Indirect Cost: ¥11,160,000)
Fiscal Year 2011: ¥7,540,000 (Direct Cost: ¥5,800,000、Indirect Cost: ¥1,740,000)
Fiscal Year 2010: ¥12,090,000 (Direct Cost: ¥9,300,000、Indirect Cost: ¥2,790,000)
Fiscal Year 2009: ¥11,830,000 (Direct Cost: ¥9,100,000、Indirect Cost: ¥2,730,000)
Fiscal Year 2008: ¥16,900,000 (Direct Cost: ¥13,000,000、Indirect Cost: ¥3,900,000)
Keywordsシングルドーパント / 単一電子制御 / ナノ・マイクロ科学 / マイクロ・ナノデバイス / ナノ物性制御
Research Abstract

In this project, we aim at the realization of technologies that enable us to manipulate single charges and spins, by using a true atom, or, dopant in silicon, rather than by using an artificial atoms, or quantum dots. Here, we established the way of identifying the position of individual dopants in a transistor and also clarified how each dopant had an impact on the transistor characteristics. In addition, we realized the "atom device" that controls motion of single charges by using a dopant embedded in silicon.

Report

(6 results)
  • 2011 Annual Research Report   Final Research Report ( PDF )
  • 2010 Annual Research Report   Self-evaluation Report ( PDF )
  • 2009 Annual Research Report
  • 2008 Annual Research Report
  • Research Products

    (123 results)

All 2012 2011 2010 2009 2008 Other

All Journal Article (49 results) (of which Peer Reviewed: 48 results) Presentation (65 results) Book (5 results) Remarks (4 results)

  • [Journal Article] Donor-Based Single Electron Pumps with Tunable Donor Binding Energy2012

    • Author(s)
      G. P. Lansbergen, Y. Ono, A. Fujiwara
    • Journal Title

      Nano Letters

      Volume: Vol.12 Pages: 763-768

    • Related Report
      2011 Annual Research Report 2011 Final Research Report
    • Peer Reviewed
  • [Journal Article] Bound exciton photoluminescence from ion-implanted phosphorus in thin silicon layers2011

    • Author(s)
      H. Sumikura, K. Nishiguchi, Y. Ono, A. Fujiwara, M. Notomi
    • Journal Title

      Optics Express

      Volume: Vol.19, No.25 Pages: 2525-2562

    • Related Report
      2011 Final Research Report
    • Peer Reviewed
  • [Journal Article] Significance of the interface regarding magnetic properties of Mn-nanosilicide in silicon2011

    • Author(s)
      Y. Ono, Y. Miyazaki, S. Yabuuchi, H. Kageshima, M. Nagase, A. Fujiwara, E. Ohta
    • Journal Title

      Thin Solid Films

      Volume: Vol.519, No.24 Pages: 8505-8508

    • Related Report
      2011 Final Research Report
    • Peer Reviewed
  • [Journal Article] Impact of a few dopant positions controlled by deterministic single-ion doping on the transconductance of field-effect transistors2011

    • Author(s)
      M. Hori, T. Shinada, Y. Ono, A. Komatsubara, K. Kumagai, T. Tanii, T. Endoh, I. Ohdomari
    • Journal Title

      Appl. Phys. Lett

      Volume: Vol.99, No.6

    • Related Report
      2011 Final Research Report
    • Peer Reviewed
  • [Journal Article] Electrical measurements of terphenyl-based molecular devices2011

    • Author(s)
      T. Goto, H. Inokawa, Y. Ono, A. Fujiwara, K. Torimitsu
    • Journal Title

      Jpn. J. Appl. Phys

      Volume: Vol.50, No.7

    • Related Report
      2011 Final Research Report
    • Peer Reviewed
  • [Journal Article] Carrier transport in indium-doped p-channel silicon-on-insulator transistors doped with indium between 30 to 285 K2011

    • Author(s)
      M. A. H. Khalafalla, Y. Ono, J. Noborisaka, G. P. Lansbergen, A. Fujiwara
    • Journal Title

      J. Appl. Phys

      Volume: Vol.110, No.19

    • Related Report
      2011 Final Research Report
    • Peer Reviewed
  • [Journal Article] Single-electron counting statistics of shot noise in nanowire Si MOSFETs2011

    • Author(s)
      K. Nishiguchi, Y. Ono, A. Fujiwara
    • Journal Title

      Appl. Phys. Lett

      Volume: Vol.98, No.19

    • Related Report
      2011 Final Research Report
    • Peer Reviewed
  • [Journal Article] Enhancing secondary electron detection efficiency by applying a substrate bias voltage for deterministic single-ion Doping2011

    • Author(s)
      M. Hori, T. Shinada, K. Taira, A. Komatsubara, Y. Ono, T. Tanii, T. Endoh, I. Ohdomari
    • Journal Title

      Appl. Phys. Express

      Volume: Vol.4, No.3

    • Related Report
      2011 Final Research Report
    • Peer Reviewed
  • [Journal Article] Strong Stark effect in electroluminescence from phosphorous-doped silicon-on-insulator metal-oxide-semiconductor field-effect transistors2011

    • Author(s)
      J. Noborisaka, K. Nishiguchi, Y. Ono, H. Kageshima, A. Fujiwara
    • Journal Title

      Appl. Phys. Lett

      Volume: Vol.98, No.3

    • Related Report
      2011 Final Research Report
    • Peer Reviewed
  • [Journal Article] Capture/Emission Processes of Carriers in Heterointerface Traps Observed in the Transient Charge-Pumping Characteristics of SiGe/Si-Hetero-Channel pMOSFETs2011

    • Author(s)
      T. Tsuchiya
    • Journal Title

      Key Engineering Materials

      Volume: Vol.470 Pages: 201-206

    • Related Report
      2011 Final Research Report 2010 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Bound exciton photoluminescence from ion-implanted phosphorus in thin silicon layers2011

    • Author(s)
      H.Sumikura
    • Journal Title

      Optics Express

      Volume: Vol.19 Pages: 25255-25262

    • Related Report
      2011 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Significance of the interface regarding magnetic properties of manganese nanosilicide in silicon2011

    • Author(s)
      Y.Ono
    • Journal Title

      Thin Solid Films

      Volume: Vol.519 Issue: 24 Pages: 8505-8508

    • DOI

      10.1016/j.tsf.2011.05.027

    • Related Report
      2011 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Impact of a few Dopant Positions Controlled by Deterministic Single-Ion Doping on the Transconductance of Field-Effect Transistors2011

    • Author(s)
      M.Hori, T.Shinada, Y.Ono, A.Komatsubara, K.Kumagai, T.Tanii, T.Endoh, I.Ohdomari
    • Journal Title

      Applied Physics Letters

      Volume: 99 Issue: 6 Pages: 62103-62103

    • DOI

      10.1063/1.3622141

    • Related Report
      2011 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Electrical Characterization of Terphenyl-Based Molecular Devices2011

    • Author(s)
      T.Goto
    • Journal Title

      Japanese Journal of Applied Physics

      Volume: Vol.99 Issue: 7R Pages: 071603-071603

    • DOI

      10.1143/jjap.50.071603

    • Related Report
      2011 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Carrier transport in indium-doped p-channel silicon-on-insulator transistors between 30 and 285 K2011

    • Author(s)
      M.A.H.Khalafalla
    • Journal Title

      Journal of Applied Physics

      Volume: Vol.110 Issue: 1

    • DOI

      10.1063/1.3605546

    • Related Report
      2011 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Slngle-electron counting statistics of shot noise in nanowire Simetal-oxide-semiconductor field-effect transistors2011

    • Author(s)
      K.Nishiguchi
    • Journal Title

      Applied Physics Letters

      Volume: Vol.98 Issue: 19

    • DOI

      10.1063/1.3589373

    • Related Report
      2011 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Interactions between Interface Traps in Electron Capture/Emission Processes : Deviation from Charge Pumping Current Based on the Shockley2011

    • Author(s)
      T.Tsuchiya
    • Journal Title

      Applied Physics Express

      Volume: Vol.4 Issue: 9 Pages: 094104-094104

    • DOI

      10.1143/apex.4.094104

    • Related Report
      2011 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Strong Stark effect in electroluminescence from phosphorous-doped silicon-on-insulator metal-oxide-semiconductor-field-effect transistors2011

    • Author(s)
      J.Noborisaka, K.Nishiguchi, Y.Ono, H.Kageshima, A.Fujiwara
    • Journal Title

      Appl.Phys.Lett. Vol.98

    • Related Report
      2010 Self-evaluation Report
    • Peer Reviewed
  • [Journal Article] Enhancing secondary electron detection efficiency by applying a substrate bias voltage for deterministic single-ion Doping2011

    • Author(s)
      M.Hori
    • Journal Title

      Applied Physics Express

      Volume: Vol.4

    • Related Report
      2010 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Strong Stark effect in electroluminescence from phosphorous-doped silicon-on-insulator metal-oxide-semiconductor field-effect transistors2011

    • Author(s)
      J.Noborisaka
    • Journal Title

      Applied Physics Letters

      Volume: Vol.98

    • Related Report
      2010 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Direct Observation of Fluctuations in the Number and Individual Electronic Properties of Interface Traps in Nanoscale Metal-Oxide-Semiconductor Field-Effect Transistors2010

    • Author(s)
      T. Tsuchiya
    • Journal Title

      Jpn. J. Appl. Phys

      Volume: Vol.49

    • NAID

      40017176026

    • Related Report
      2011 Final Research Report
    • Peer Reviewed
  • [Journal Article] Resonant escape over an oscillating barrier in a single-electron ratchet transfer2010

    • Author(s)
      S. Miyamoto, K. Nishiguchi, Y. Ono, K. M. Itoh, A. Fujiwara
    • Journal Title

      Phys. Rev. B

      Volume: Vol.82, No.3

    • Related Report
      2011 Final Research Report
    • Peer Reviewed
  • [Journal Article] Single-electron transport through single dopants in a dopant-rich environment Phys2010

    • Author(s)
      M. Tabe, D. Moraru, M. Ligowski, M. Anwar, R. Jablonski, Y. Ono, T. Mizuno
    • Journal Title

      Rev. Lett

      Volume: Vol.105, No.1

    • Related Report
      2011 Final Research Report
    • Peer Reviewed
  • [Journal Article] Tunneling spectroscopy of electron subbands in thin silicon-on-insulator metal-oxide-semiconductor field-effect transistors2010

    • Author(s)
      J. Noborisaka, K. Nishiguchi, H. Kageshima, Y. Ono, A. Fujiwara
    • Journal Title

      Appl. Phys. Lett

      Volume: Vol.96, No.11

    • Related Report
      2011 Final Research Report
    • Peer Reviewed
  • [Journal Article] Single-electron transport through single dopants in a dopant-rich environment2010

    • Author(s)
      M.Tabe, D.Moraru, M.Ligowski, M.Anwar,R.Jablonski, Y.Ono, T.Mizuno
    • Journal Title

      Phys.Rev.Lett. Vol.105

    • Related Report
      2010 Self-evaluation Report
    • Peer Reviewed
  • [Journal Article] Resonant escape over an oscillating barrier in a single-electron ratchet transfer2010

    • Author(s)
      S.Miyamoto
    • Journal Title

      Physical Review B

      Volume: Vol.82

    • Related Report
      2010 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Single-electron transport through single dopants in a dopant-rich environment2010

    • Author(s)
      M.Tabe
    • Journal Title

      Physical Review Letters

      Volume: Vol.105

    • Related Report
      2010 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Direct Observation of Fluctuations in the Number and Individual Electronic Properties of Interface Traps in Nanoscale Metal-Oxide-Semiconductor Field-Effect Transistors2010

    • Author(s)
      T.Tsuchiya
    • Journal Title

      Jpn.J.Appl.Phys.

      Volume: Vol.49

    • NAID

      40017176026

    • Related Report
      2010 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Horizontal position analysis of single acceptors in Si nanoscale field-effect transistors2009

    • Author(s)
      M. A. H. Khalafalla, Y. Ono, K. Nishiguchi, A. Fujiwara
    • Journal Title

      Appl. Phys. Lett

      Volume: Vol.94, No.22

    • Related Report
      2011 Final Research Report
    • Peer Reviewed
  • [Journal Article] Electrons and holes in a 40nm thick silicon slab at cryogenic temperatures2009

    • Author(s)
      K. Takashina, K. Nishiguchi, Y. Ono, A. Fujiwara, T. Fujisawa, Y. Hirayama, K. Muraki
    • Journal Title

      Appl. Phys. Lett

      Volume: Vol.94, No.14

    • Related Report
      2011 Final Research Report
    • Peer Reviewed
  • [Journal Article] ナノスケールMOSデバイスにおける界面物性の揺らぎ-界面トラップ1個1個を検出して評価する-2009

    • Author(s)
      土屋敏章
    • Journal Title

      応用物理

      Volume: vol.78 Pages: 868-872

    • NAID

      10025088628

    • Related Report
      2011 Final Research Report
    • Peer Reviewed
  • [Journal Article] Horizontal position analysis of single acceptors in Si nanoscale field-effect transistors2009

    • Author(s)
      M.A.H.Khalafalla, Y.Ono, K.Nishiguchi, A.Fujiwara
    • Journal Title

      Appl.Phys.Lett. Vol.94

    • Related Report
      2010 Self-evaluation Report
    • Peer Reviewed
  • [Journal Article] Horizontal position analysis of single acceptors in Si nanoscale field-effect transistors2009

    • Author(s)
      M.A.H.Khalafalla, Y.Ono, K.Nishiguchi, A.Fujiwara
    • Journal Title

      Applied Physics Letters Vol.94

    • Related Report
      2009 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Electrons and holes in a 40nm thick silicon slab at cryogenic temperatures2009

    • Author(s)
      K.Takashina, K.Nishiguchi, Y.Ono, A.Fujiwara, T.Fujisawa, Y.Hirayama, K.Muraki
    • Journal Title

      Applied Physics Letters Vol.94

    • Related Report
      2009 Annual Research Report
    • Peer Reviewed
  • [Journal Article] ナノスケールMOSデバイスにおける界面物性の揺らぎ-界面トラップ1個1個を検出して評価する-2009

    • Author(s)
      土屋敏章
    • Journal Title

      応用物理 78(9)

      Pages: 868-872

    • NAID

      10025088628

    • Related Report
      2009 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Escape dynamics of a few electrons in a single-electron ratchet using silicon nanowire metal-oxide-semiconductor field-effect transistor2008

    • Author(s)
      S. Miyamoto, K. Nishiguchi, Y. Ono, K. M. Itoh, A. Fujiwara
    • Journal Title

      Appl. Phys. Lett.

      Volume: Vol.93, No.22

    • Related Report
      2011 Final Research Report
    • Peer Reviewed
  • [Journal Article] Single-electron-resolution electrometer based on field-effect transistor2008

    • Author(s)
      K. Nishiguchi, C. Koechlin, Y. Ono, A. Fujiwara, H. Inokawa, H. Yamaguchi
    • Journal Title

      Jpn. J. Appl. Phys

      Volume: Vol.47, No.11 Pages: 8305-8310

    • NAID

      40016346937

    • Related Report
      2011 Final Research Report
    • Peer Reviewed
  • [Journal Article] Why the long-term charge offset drift in Si single-electron tunneling transistors is much smaller(better) than in metal-based ones : Two-level fluctuator stability2008

    • Author(s)
      N. M. Zimmerman, W. H. Huber, B. Simonds, E. Hourdakis, A. Fujiwara, Y. Ono, Y. Takahashi, H. Inokawa, M. Furlan, M. W. Keller
    • Journal Title

      J. Appl. Phys

      Volume: Vol.104, No.

    • Related Report
      2011 Final Research Report
    • Peer Reviewed
  • [Journal Article] First-principles study on origin of ferromagnetism of MnSi1. 7 nanoparticles in Si2008

    • Author(s)
      S. Yabuuchi, H. Kageshima, Y. Ono, M. Nagase, A. Fujiwara, E. Ohta
    • Journal Title

      Phys. Rev. B

      Volume: Vol.78, No.4

    • Related Report
      2011 Final Research Report
    • Peer Reviewed
  • [Journal Article] Charge transport in boron-doped nano MOSFETs : Towards single-dopant electronics2008

    • Author(s)
      Y. Ono, M. Khalafalla, K. Nishiguchi, K. Takashina, A. Fujiwara, S. Horiguchi, H. Inokawa, Y. Takahashi
    • Journal Title

      Appl. Sur. Sci

      Volume: Vol.254, No.19 Pages: 6252-6256

    • Related Report
      2011 Final Research Report
    • Peer Reviewed
  • [Journal Article] Ferromagnetism of manganese-silicide nanopariticles in Silicon2008

    • Author(s)
      S. Yabuuchi, Y. Ono, H. Kageshima, M. Nagase, A. Fujiwara, E. Ohta
    • Journal Title

      Jpn. J. Appl. Phys

      Volume: Vol.47, No.6 Pages: 4487-4450

    • NAID

      40016110965

    • Related Report
      2011 Final Research Report
    • Peer Reviewed
  • [Journal Article] A gate-defined silicon quantum dot molecule2008

    • Author(s)
      H. W. Liu, T. Fujisawa, H. Inokawa, Y. Ono, A. Fujiwara, Y. Hirayama
    • Journal Title

      Appl. Phys. Lett

      Volume: Vol.92, No.22

    • Related Report
      2011 Final Research Report
    • Peer Reviewed
  • [Journal Article] First-principles study on origin of ferromagnetism of MnSi1.7 nanoparticles in Si2008

    • Author(s)
      S.Yabuuchi, H.Kageshima, Y.Ono, M.Nagase, A.Fujiwara, E.Ohta
    • Journal Title

      Phys.Rev.B Vol.78

    • Related Report
      2010 Self-evaluation Report
  • [Journal Article] Escape dynamics of a few electrons in a single-electron ratchet using silicon nanowire metaloxide-semiconductor field-effect transistor2008

    • Author(s)
      S. Miyamoto, K. Nishiguchi, Y. Ono, K. M. Itoh, A. Fujiwara
    • Journal Title

      Appl. Phys. Lett. Vol.93

    • Related Report
      2008 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Single-Electron-Resolution Electrometer Based on Field-Effect Transistor2008

    • Author(s)
      2. K. Nishiguchi, C. Koechlin, Y. Ono, A. Fujiwara, H. Inokawa, H. Yamaguchi
    • Journal Title

      Jpn. J. Appl. Phys. Vol.47

      Pages: 8305-8310

    • NAID

      40016346937

    • Related Report
      2008 Annual Research Report
    • Peer Reviewed
  • [Journal Article] First-principles study on origin of ferromagnetism of MnSil. 7 nanoparticles in Si2008

    • Author(s)
      S. Yabuuchi, H. Kageshima, Y. Ono, M. Nagase, A. Fujiwara, E. Ohta
    • Journal Title

      Phys. Rev. Vol.B78

    • Related Report
      2008 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Charge transport in boron-doped nano MOSFETs : Towards single-dopant electronics2008

    • Author(s)
      Y. Ono, M. Khalafalla, K. Nishiguchi, K. Takashina, A. Fujiwara, S. Horiguchi, H. Inokawa, Y. Takahashi
    • Journal Title

      Appl. Sur. Science Vol.254

      Pages: 6252-6256

    • Related Report
      2008 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Ferromagnetism of manganese-silicide nanopariticles in Silicon2008

    • Author(s)
      S. Yabuuchi, Y. Ono, H. Kageshima, M. Nagase, A. Fujiwara, E. Ohta
    • Journal Title

      Jpn. J. Appl. Phys. Vol.47

      Pages: 4487-4450

    • NAID

      40016110965

    • Related Report
      2008 Annual Research Report
    • Peer Reviewed
  • [Journal Article] A gate-defined silicon quantum dot molecule2008

    • Author(s)
      H. W. Liu, T. Fujisawa, H. Inokawa, Y. Ono, A. Fujiwara, Y. Hirayama
    • Journal Title

      Appl. Phys. Lett. Vol.92

    • Related Report
      2008 Annual Research Report
    • Peer Reviewed
  • [Presentation] Donor based SE pumps with tunable donor binding energy2012

    • Author(s)
      G.P.Lansbergen
    • Organizer
      The 2012 International Conference on Nanoscience and Nanotechnology
    • Place of Presentation
      Perth, WA Australia
    • Year and Date
      2012-02-06
    • Related Report
      2011 Annual Research Report
  • [Presentation] Subband energy manipulation by gate voltage in Si (100) hole system2011

    • Author(s)
      Y.Niida
    • Organizer
      The 18th International Conference on Electronic Properties of Two-Dimensional Systems
    • Place of Presentation
      Tallahassee, Florida, USA
    • Year and Date
      2011-07-26
    • Related Report
      2011 Annual Research Report
  • [Presentation] Control of Dopant Distribution by Single-Ion Implantation and its Impacton Transconductance of FETs2011

    • Author(s)
      T.Shinada
    • Organizer
      2011 Asdia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices
    • Place of Presentation
      Daejeon, Korea(Invited)
    • Year and Date
      2011-06-29
    • Related Report
      2011 Annual Research Report
  • [Presentation] Dopants in silicon transistors ; Transport and Photoemission2011

    • Author(s)
      Y.Ono
    • Organizer
      CMOS Emerging Technologies Workshop
    • Place of Presentation
      Whistler, BC, Canada(Invited)
    • Year and Date
      2011-06-16
    • Related Report
      2011 Annual Research Report
  • [Presentation] Impact of a few dopant positions controlled by single-ion implantation on transconductance of FETs2011

    • Author(s)
      M.Hori
    • Organizer
      11th International Workshop on Junction Technology
    • Place of Presentation
      Kyoto
    • Year and Date
      2011-06-09
    • Related Report
      2011 Annual Research Report
  • [Presentation] Quantum transport in deterministically implanted single-donors in Si FETs2011

    • Author(s)
      T. Shinada
    • Organizer
      2011 International Electron Devices Meeting
    • Place of Presentation
      San Fransisco, USA
    • Related Report
      2011 Final Research Report
  • [Presentation] Charge transfer by multiple donors in a Si nanowire2011

    • Author(s)
      G. P. Lansbergen
    • Organizer
      2011 International Conference on Solid State Devices and Materials
    • Place of Presentation
      Nagoya
    • Related Report
      2011 Annual Research Report 2011 Final Research Report
  • [Presentation] Subband energy manipulation by gate voltage in Si(100) hole system2011

    • Author(s)
      Y. Niida
    • Organizer
      The 18th International Conference on Electronic Properties of Two-Dimensional Systems
    • Place of Presentation
      Tallahassee, Florida
    • Related Report
      2011 Final Research Report
  • [Presentation] Observation of new current peaks of Si single-electron transistor with a single-hole trap2011

    • Author(s)
      M. Sinohara
    • Organizer
      2011 Silicon Nanoelectronics Workshop
    • Place of Presentation
      Kyoto
    • Related Report
      2011 Annual Research Report 2011 Final Research Report
  • [Presentation] Capture and emission kinetics of traps in MOSFETs2011

    • Author(s)
      G. P. Lansbergen
    • Organizer
      2011 Silicon Nanoelectronics Workshop
    • Place of Presentation
      Kyoto
    • Related Report
      2011 Annual Research Report 2011 Final Research Report
  • [Presentation] Quantum transport in deterministically implanted single-donors in Si FETs2011

    • Author(s)
      T.Shinada
    • Organizer
      2011 International Electron Devices Meeting
    • Place of Presentation
      San Fransisoo, USA
    • Related Report
      2011 Annual Research Report
  • [Presentation] Performance evaluation of transistors with discrete dopants by single-ion doping method2010

    • Author(s)
      T.Shinada
    • Organizer
      21th International conference on the application of accelerators in research and industry
    • Place of Presentation
      Fort Worth, TX, USA
    • Year and Date
      2010-08-08
    • Related Report
      2010 Annual Research Report
  • [Presentation] Significance of the interface regarding magnetic properties of Mn-nanosilicide in silicon2010

    • Author(s)
      Y.Ono
    • Organizer
      Asia-Pacific Conference on Semiconducting Silicides and Related materials Science and Technology Towards Sustainable Ontoelectronies
    • Place of Presentation
      Tsukuba
    • Year and Date
      2010-07-26
    • Related Report
      2010 Annual Research Report
  • [Presentation] Electroluminescence study of phosphorus ionization in silicon-on-insulator metal-oxide-semiconductor field-effect transistors2010

    • Author(s)
      J.Noborisaka
    • Organizer
      International Symposium on Nanoscale Transport and Technology
    • Place of Presentation
      Atsugi
    • Year and Date
      2010-01-13
    • Related Report
      2010 Annual Research Report
  • [Presentation] Charge switching in wire MOSFETs studied by separation of capture and emission2010

    • Author(s)
      G.P.Lansbergen
    • Organizer
      International Symposium on Nanoscale Transport and Technology
    • Place of Presentation
      Atsugi
    • Year and Date
      2010-01-12
    • Related Report
      2010 Annual Research Report
  • [Presentation] Reliable Single Atom Doping and Discrete Dopant Effects on Transistor Performance2010

    • Author(s)
      T. Shinada
    • Organizer
      2010 International Electron Devices Meeting
    • Place of Presentation
      San Fransisco, USA
    • Related Report
      2011 Final Research Report 2010 Annual Research Report
  • [Presentation] KFM Observation of Single-Electron Filling in Dopant Arrays2010

    • Author(s)
      M. Anwar
    • Organizer
      2010 International Conference on Solid State Devices and Materials
    • Place of Presentation
      Tokyo
    • Related Report
      2011 Final Research Report 2010 Annual Research Report
  • [Presentation] Strong Stark effect of electroluminescence in thin SOI MOSFETs2010

    • Author(s)
      J. Noborisaka
    • Organizer
      2010 International Conference on Solid State Devices and Materials
    • Place of Presentation
      Tokyo
    • Related Report
      2011 Final Research Report 2010 Annual Research Report
  • [Presentation] Effect of Device Structure on Electrical Conduction of Terphenyl-based Molecule2010

    • Author(s)
      T. Goto
    • Organizer
      2010 International Conference on Solid State Devices and Materials
    • Place of Presentation
      Tokyo
    • Related Report
      2011 Final Research Report
  • [Presentation] Electron-mobility suppression under valley-polarized region in Si quantum well2010

    • Author(s)
      Y. Niida
    • Organizer
      30^<th> International Conference on the Pysics of Semiconductors
    • Place of Presentation
      Seoul, Korea
    • Related Report
      2011 Final Research Report
  • [Presentation] Significance of the interface regarding magnetic properties of Mn nanosilicide in silicon2010

    • Author(s)
      Y. Ono
    • Organizer
      Asia-Pacific Conference on Semiconducting Silicides and Related materials Science and Technology Towards Sustainable Optoelectronics
    • Place of Presentation
      Tsukuba
    • Related Report
      2011 Final Research Report
  • [Presentation] Enhancement of electron transport property in FET with asymmetric ordered dopant distribution2010

    • Author(s)
      M. Hori
    • Organizer
      18^<th> International Conference on Ion Implantation Technology
    • Place of Presentation
      Kyoto
    • Related Report
      2011 Final Research Report
  • [Presentation] Performance evaluation of MOSFETs with discrete dopant distribution by one-by-one doping method. SPIE Advanced Lithography-Alternative Lithographic Technologies II2010

    • Author(s)
      T. Shinada
    • Place of Presentation
      San Jose, USA
    • Related Report
      2011 Final Research Report
  • [Presentation] In plane transport in a double layer crystalline silicon stracture with an SiO_2 barrier2010

    • Author(s)
      K. Takashina
    • Organizer
      2010 International Symposium on Atom-scale Silicon Hybrid Nanotechnologies for'More. than-Moore' & 'Beyond CMOS' Era
    • Place of Presentation
      Southampton, UK
    • Related Report
      2011 Final Research Report
  • [Presentation] Fluctuations in Electronic Properties of Individual Interface Traps in Nanoscale MOSFETs2010

    • Author(s)
      T. Tsuchiya
    • Organizer
      International Symposium on Technology Evolution for Silicon Nano-Electronics
    • Place of Presentation
      Tokyo
    • Related Report
      2011 Final Research Report 2010 Annual Research Report
  • [Presentation] Single dopant effects in silicon nano transistors2010

    • Author(s)
      Y.Ono, M.Khalafalla, K.Nishiguchi, A.Fujiwara
    • Organizer
      Single Dopant Control
    • Place of Presentation
      Leiden, Netherlands(招待講演)
    • Related Report
      2010 Self-evaluation Report
  • [Presentation] Single dopant effects in silicon nano transistors2010

    • Author(s)
      Y.Ono, M.Khalafalla, K.Nishiguchi, A.Fujiwara
    • Organizer
      2010 International Symposium on Atom-scale Silicon HybridNanotechnologies for 'More-than-Moore'& 'Beyond CMOS' Era
    • Place of Presentation
      Southampton, UK(招待講演)
    • Related Report
      2010 Self-evaluation Report
  • [Presentation] Single dopant effects in silicon nano transistors2010

    • Author(s)
      Y.Ono, M.Khalafalla, K.Nishiguchi, A.Fujiwara
    • Organizer
      Single Dopant Control
    • Place of Presentation
      Leiden, Netherlands
    • Related Report
      2009 Annual Research Report
  • [Presentation] Single dopant effects in silicon nano transistors2010

    • Author(s)
      Y.Ono, M.Khalafalla, K.Nishiguchi, A.Fujiwara
    • Organizer
      2010 International Symposium on Atom-scale Silicon Hybrid Nanotechnologies for 'More-than-Moore' & 'Beyond CMOS' Era
    • Place of Presentation
      southampton, UK
    • Related Report
      2009 Annual Research Report
  • [Presentation] Si single-dopant FETs and observation of single-dopant potential by LT-KFM2010

    • Author(s)
      M.Tabe, D.Moraru, M.Anwar, Y.Kawai, S.Miki, Y.Ono, T.Mizuno
    • Organizer
      5th International WorkShop on New Group IV Semiconductor Nanoelectronics
    • Place of Presentation
      Sendai, Japan
    • Related Report
      2009 Annual Research Report
  • [Presentation] Single-electron counting statistics of shot noise in nanowire Si MOSFETs2009

    • Author(s)
      K. Nishiguchi
    • Organizer
      2009 International Conference on Solid State Devices and Materials
    • Place of Presentation
      Sendai
    • Related Report
      2011 Final Research Report
  • [Presentation] Tunnel spectroscopy of electron subbands in thin SOI MOSFETs2009

    • Author(s)
      J. Noborisaka
    • Organizer
      2009 International Conference on Solid State Devices and Materials
    • Place of Presentation
      Sendai
    • Related Report
      2011 Final Research Report
  • [Presentation] Direct Observation of Fluctuations in Both the Number and Individual Carrier Capture Rate of Interface Traps in Small Gate-Area MOSFETs2009

    • Author(s)
      T. Tsuchiya
    • Organizer
      39th European Solid-State Device Research Conference
    • Place of Presentation
      Athens, Greece
    • Related Report
      2011 Final Research Report 2009 Annual Research Report
  • [Presentation] Fluctuation in Electronic Properties of Interface Traps in Nano-MOSFETs2009

    • Author(s)
      T. Tsuchiya
    • Organizer
      4th International Workshop on New Group IV Semiconductor Nanoelectronics
    • Place of Presentation
      Sendai, Japan
    • Related Report
      2011 Final Research Report 2009 Annual Research Report
  • [Presentation] Single-electron devices based on silicon nanowire MOSFETs2009

    • Author(s)
      A. Fujiwara
    • Organizer
      Trends in NanoTechnology International Conference
    • Place of Presentation
      Barcelona, Spain
    • Related Report
      2011 Final Research Report
  • [Presentation] Detection and position analysis of sinle and coupled acceptors in silicon nano field-effect transistors2009

    • Author(s)
      M. A. H. Khalafalla
    • Organizer
      2009 Silicon Nanoelectronics Workshop
    • Place of Presentation
      Kyoto
    • Related Report
      2011 Final Research Report
  • [Presentation] Effect ofδ-function-like boron charge sheet on p-channel ultra-thin SOI MOSFETs2009

    • Author(s)
      M. Kawach
    • Organizer
      2009 Silicon Nanoelectronics Workshop
    • Place of Presentation
      Kyoto
    • Related Report
      2011 Final Research Report
  • [Presentation] Asymmetric mobility of electrons and holes with respect to quantum-well potential in a double gate SIMOX MOSFET2009

    • Author(s)
      Y. Niida
    • Organizer
      International Symposium on Nanoscale Transport and Technology
    • Place of Presentation
      Atsugi
    • Related Report
      2011 Final Research Report
  • [Presentation] In-plane transport in a double layer crystalline silicon structure with an SiO2 barrier2009

    • Author(s)
      K. Takashina
    • Organizer
      International Symposium on Nanoscale Transport and Technology
    • Place of Presentation
      Atsugi
    • Related Report
      2011 Final Research Report
  • [Presentation] Detection and position analysis of sinle and coupled acceptors in silicon nano field-effect transistors2009

    • Author(s)
      M. A. H. Khalafalla
    • Organizer
      International Symposium on Nanoscale Transport and Technology
    • Place of Presentation
      Atsugi
    • Related Report
      2011 Final Research Report
  • [Presentation] Identification of single dopants in nanowire MOSFETs2009

    • Author(s)
      Y.Ono, M.Khalafalla, S.Horiguchi, K.Nishiguchi, A.Fujiwara
    • Organizer
      2009 International Conference on Solid State Devices and Materials
    • Place of Presentation
      Sendai(招待講演)
    • Related Report
      2010 Self-evaluation Report
  • [Presentation] Identification of single dopants in nanowire MOSFETs2009

    • Author(s)
      Y.Ono, M.Khalafalla, S.Horiguchi, K.Nishiguchi, A.Fujiwara :
    • Organizer
      2009 International Conference on Solid State Devices and Materials
    • Place of Presentation
      Sendai, Japan
    • Related Report
      2009 Annual Research Report
  • [Presentation] Detection and position analysis of sinle and coupled acceptors in silicon nano field-effect transistors2009

    • Author(s)
      M.A.H.Khalafalla, Y.Ono, K.Nishiguchi, A.Fujiwara
    • Organizer
      2009 Silicon Nanoelectronics Workshop
    • Place of Presentation
      Kyoto, Japan
    • Related Report
      2009 Annual Research Report
  • [Presentation] Effect of δ-function-like boron charge sheet on p-channel ultra-thin SOI MOSFETs2009

    • Author(s)
      M.Kawachi, Y.Ono, A.Fujiwara, S.Horiguchi
    • Organizer
      2009 Silicon Nanoelectronics Workshop
    • Place of Presentation
      Kyoto, Japan
    • Related Report
      2009 Annual Research Report
  • [Presentation] Asymmetric mobility of electrons and holes with respect to quantum-well potential in a double gate SIMOX MOSFET2009

    • Author(s)
      Y. Niida, K. Takashina, Y. Ono, A. Fujiwara, Y. Hirayama, K. Muraki
    • Organizer
      International Symposium on Nanoscale Transport and Technology, (ISNTT-2009)
    • Place of Presentation
      Atsugi, Japan
    • Related Report
      2008 Annual Research Report
  • [Presentation] In-plane transport in a double layer crystalline silicon structure with an SiO2 barrier2009

    • Author(s)
      K. Takashina, M. Nagase, K. Nishiguchi, Y. Ono, A. Fujiwara, T. Fujisawa, K. Muraki
    • Organizer
      International Symposium on Nanoscale Transport and Technology, (ISNTT-2009)
    • Place of Presentation
      Atsugi, Japan
    • Related Report
      2008 Annual Research Report
  • [Presentation] Detection and position analysis of sinle and coupled acceptors in silicon nano field-effect transistors2009

    • Author(s)
      M. A. H. Khalafalla, Y. Ono, K. Nishiguchi, A. Fujiwara
    • Organizer
      International Symposium on Nanoscale Transport and Technology, (ISNTT-2009)
    • Place of Presentation
      Atsugi, Japan
    • Related Report
      2008 Annual Research Report
  • [Presentation] Capture/Emission Process of Carriers in Interface Traps Observed in the Transient Charge Pumping Characteristics of MOSFETs2008

    • Author(s)
      T. Tsuchiya
    • Organizer
      39th IEEE Semiconductor Interface Specialist Conference
    • Place of Presentation
      San Diego, USA
    • Related Report
      2011 Final Research Report
  • [Presentation] Single-electron devices and their circuit applications2008

    • Author(s)
      A. Fujiwara
    • Organizer
      2008 Tera-level nanodevices(TND) Technical Forum
    • Place of Presentation
      Korea
    • Related Report
      2011 Final Research Report
  • [Presentation] Escape dynamics of electron in a single-electron ratchet using silicon nanowire MOSFETs2008

    • Author(s)
      S. Miyamoto
    • Organizer
      EEE Nanotechonology Materials and Devices Conference
    • Place of Presentation
      Kyoto
    • Related Report
      2011 Final Research Report
  • [Presentation] In-plane transport in a double layer crystalline silicon structure with an SiO2 barrier2008

    • Author(s)
      K. Takashina
    • Organizer
      IEEE Nanotechonology Materials and Devices Conference
    • Place of Presentation
      Kyoto
    • Related Report
      2011 Final Research Report
  • [Presentation] Single-dopant effect in Si MOSFETs2008

    • Author(s)
      Y.Ono, M.Khalafalla, A.Fujiwara, K.Nishiguchi, K.Takashina, S.Horiguchi, Y.Takahashi, H.Inokawa
    • Organizer
      IEEE Nanotechonology Materials and Devices Conference 2008
    • Place of Presentation
      Kyoto(招待講演)
    • Related Report
      2010 Self-evaluation Report
  • [Presentation] Single boron detection in nano-scale SOI MOSFETs2008

    • Author(s)
      Y.Ono
    • Organizer
      The 2008 International Meeting for Future of Electron Devices, Kansai
    • Place of Presentation
      Osaka, Japan(招待講演)
    • Related Report
      2010 Self-evaluation Report
  • [Presentation] New functional single-electron devices using nanodot array and multiple input gates2008

    • Author(s)
      Y. Takahashi, T. Kaizawa, M. Arita, A. Fujiwara, Y. Ono, H. Inokawa : (Invited)
    • Organizer
      The IUMRS International Conference in Asia 2008 (IUMRS-ICA 2008)
    • Place of Presentation
      Nagoya, Japan
    • Related Report
      2008 Annual Research Report
  • [Presentation] Single-electron devices and their circuit applications2008

    • Author(s)
      A. Fujiwara, K. Nishiguchi, Y. Ono, H. Inokawa, Y. Takahashi : (invited)
    • Organizer
      2008 Tera-level nanodevices (TND) Technical Forum
    • Place of Presentation
      Korea
    • Related Report
      2008 Annual Research Report
  • [Presentation] Escape dynamics of electron in a single-electron ratchet using silicon nanowire MOSFETs2008

    • Author(s)
      S. Miyamoto, K. Nishiguchi, Y. Ono, K. M. Ito, A. Fujiwara
    • Organizer
      IEEE Nanotechonology Materials and Devices Conference 2008 (NMDC-2008)
    • Place of Presentation
      Kyoto, Japan
    • Related Report
      2008 Annual Research Report
  • [Presentation] In-plane transport in a double layer crystalline silicon structure with an SiO2 barrier2008

    • Author(s)
      K. Takashina, M. Nagase, K. Nishiguchi, Y. Ono, A. Fujiwara, T. Fujisawa
    • Organizer
      IEEE Nanotechonology Materials and Devices Conference 2008 (NMDC-2008)
    • Place of Presentation
      Kyoto, Japan
    • Related Report
      2008 Annual Research Report
  • [Presentation] Single-dopant effect in Si MOSFETs2008

    • Author(s)
      Y. Ono, M. Khalafalla, A. Fujiwara, K. Nishiguchi, K. Takashina, S. Horiguchi, Y. Takahashi, H. Inokawa
    • Organizer
      IEEE Nanotechonology Materials and Devices Conference 2008 (NMDC-2008)
    • Place of Presentation
      Kyoto, Japan
    • Related Report
      2008 Annual Research Report
  • [Presentation] Single boron detection in nano-scale SOI MOSFETs2008

    • Author(s)
      Y. Ono
    • Organizer
      The 2008 International Meeting for Future of Electron Devices, Kansai (IEEE IMFEDK-2008)
    • Place of Presentation
      Osaka, Japan
    • Related Report
      2008 Annual Research Report
  • [Presentation] Capture/Emission Process of Carriers in Interface Traps Observed in the Transient Charge-Pumping Characteristics of MOSFETs2008

    • Author(s)
      T. Tsuchiya, K. Yoshida, M. Sakuraba, J. Murota
    • Organizer
      39th IEEE Semiconductor Interface Specialist Conference (SISC 2008)
    • Place of Presentation
      San Diego, USA
    • Related Report
      2008 Annual Research Report
  • [Presentation] Impact of a few dopant positions controlled by single-ion implantation on transconductance of FETs

    • Author(s)
      M. Hori
    • Organizer
      11th International Workshop on Junction Technology
    • Place of Presentation
      Kyoto
    • Related Report
      2011 Final Research Report
  • [Presentation] Electroluminescence study of phosphorus ionization in silicon-on-insulator metal-oxide-semiconductor field-effect transistors

    • Author(s)
      J. Noborisaka
    • Organizer
      International Symposium on Nanoscale Transport and Technology
    • Place of Presentation
      Atsugi
    • Related Report
      2011 Final Research Report
  • [Presentation] Charge switching in wire MOSFETs studied by separation of capture and emission

    • Author(s)
      G. P. Lansbergen
    • Organizer
      International Symposium on Nanoscale Transport and Technology
    • Place of Presentation
      Atsugi
    • Related Report
      2011 Final Research Report
  • [Presentation] Electron-hole transport in a 40 nm thick silicon slab

    • Author(s)
      K. Takashina
    • Organizer
      The 18th International Conference on Electronic Properties of Two-Dimensional Systems
    • Place of Presentation
      Kobe, Japan
    • Related Report
      2011 Final Research Report
  • [Presentation] Single-electron activation over an oscillating barrier in silicon nanowire MOSFETs

    • Author(s)
      S. Miyamoto
    • Organizer
      The 18th International Conference on Electronic Properties of Two-Dimensional Systems
    • Place of Presentation
      Kobe, Japan
    • Related Report
      2011 Final Research Report
  • [Book] Silicon Single-Electron Devices, in" Device Applications of Silicon Nanocrystals and Nanostructures eds2009

    • Author(s)
      Y. Takahashi, Y. Ono, A. Fujiwara, K. Nishiguchi, and H. Inokaw, N. Koshida
    • Publisher
      Springer
    • Related Report
      2011 Final Research Report
  • [Book] Device Applications of Silicon Nanocrystals and Nanostructures(Silicon Single-Electron Devices)2009

    • Author(s)
      Y.Takahashi, Y.Ono, A.Fujiwara, K.Nishiguchi, H.Inokawa
    • Publisher
      Springer
    • Related Report
      2010 Self-evaluation Report
  • [Book] Single-electron transistor and its logic application, in "Information Technology II(volume 4) of Nanotechnology"2008

    • Author(s)
      Y. Ono, K. Nishiguchi, H. Inokawa, Y. Takahashi and A. Fujiwara
    • Publisher
      Wiley-VCH Verlag
    • Related Report
      2011 Final Research Report
  • [Book] Information Technology II (volume 4) of Nanotechnology(Single-electron transistor and its logic application)2008

    • Author(s)
      Y.Ono, K.Nishiguchi, H.Inokawa, Y.Takahashi, A.Fujiwara
    • Publisher
      Wiley-VCH Verlag
    • Related Report
      2010 Self-evaluation Report
  • [Book] Information Technology II (volume 4) of Nanotechnology2008

    • Author(s)
      Y. Ono, K. Nishiguchi, H. Inokawa, Y. Takahashi, A. Fujiwara
    • Total Pages
      23
    • Publisher
      Wiley-VCH Verlag
    • Related Report
      2008 Annual Research Report
  • [Remarks]

    • URL

      http://www.brl.ntt.co.jp/people/ono/index.html

    • Related Report
      2011 Final Research Report
  • [Remarks]

    • URL

      http://www.brl.ntt.co.jp/people/ono/index.html

    • Related Report
      2011 Annual Research Report
  • [Remarks]

    • URL

      http://www.brl.ntt.co.jp/people/ono/index.html

    • Related Report
      2010 Annual Research Report
  • [Remarks]

    • URL

      http://www.brl.ntt.co.jp/people/ono/index.html

    • Related Report
      2009 Annual Research Report

URL: 

Published: 2008-04-01   Modified: 2016-04-21  

Information User Guide FAQ News Terms of Use Attribution of KAKENHI

Powered by NII kakenhi