Development of bio-microwave atomic force microscopy and noninvasive measurement of cell activity

• Project/Area Number: 20246028
• Research Category: Grant-in-Aid for Scientific Research (A)
• Allocation Type: Single-year Grants
• Section: 一般
• Research Field: Materials/Mechanics of materials
• Research Institution: Nagoya University
• Principal Investigator: JU Yang 名古屋大学, 工学研究科, 教授 (60312609)
• Co-Investigator(Kenkyū-buntansha): MURAOKA Mikio 秋田大学, 工学資源学研究科, 教授 (50190872) ; KIMURA Hidehiko 名古屋大学, 工学研究科, 講師 (60345923) ; HOSOI Atsushi 名古屋大学, 工学研究科, 助教 (60424800)
• Project Period (FY): 2008 – 2010
• Project Status: Completed (Fiscal Year 2010)
• Budget Amount: ¥48,100,000 (Direct Cost: ¥37,000,000、Indirect Cost: ¥11,100,000); Fiscal Year 2010: ¥12,610,000 (Direct Cost: ¥9,700,000、Indirect Cost: ¥2,910,000); Fiscal Year 2009: ¥15,470,000 (Direct Cost: ¥11,900,000、Indirect Cost: ¥3,570,000); Fiscal Year 2008: ¥20,020,000 (Direct Cost: ¥15,400,000、Indirect Cost: ¥4,620,000)
• Keywords: マイクロ波 / 原子間力顕微鏡 / AFMプローブ / 電気的特性 / 細胞計測 / 骨髄幹細胞 / 非侵襲計測 / 細胞活性 / 微細加工 / 生体計測 / ナノ領域

Research Abstract

A novel microscopy which is capable of investigating surface topography and electrical property of cells simultaneously on a sub-nanometer scale was developed. The microwave atomic force microscopy(M-AFM) is a combination of the principles of the scanning probe microscope and the microwave-measurement technique. The waveguide structure of the M-AFM probe allows microwave signals to propagate through the probe and emit from the tip of it. Based on the theoretical analysis and the measured amplitude and phase information of microwave signals, M-AFM can implement the quantitative characterization of the local conductivity and permittivity of cells on the sub-nanometer scale.

Research Products

• [Journal Article] Structure Modification of M-AFM Probe for the Measurement of Local Conductivity (2011)
  • Author(s): A. Fujimoto, L. Zhang, A. Hosoi and Y. Ju
  • Journal Title: Microsystem Technologies Volume: 17 Issue: 4 Pages: 715-720
  • DOI: 10.1007/s00542-010-1175-9
  • NAID: 120002816362
  • Peer Reviewed
• [Journal Article] Enhancement of Sensitivity for the Evaluation of Electrical Properties by Modifying the Nano Structure of Microwave AFM Probe (2011)
  • Author(s): L. Zhang, Y. Ju, A. Hosoi and A. Fujimoto
  • Journal Title: Materials Science Forum Volume: 675-677 Pages: 555-558
  • DOI: 10.4028/www.scientific.net/msf.675-677.555
  • Peer Reviewed
• [Journal Article] A High-efficiency Nondestructive Method for Remote Detection and Quantitative Evaluation of Pipe Wall Thinning Using Microwaves (2011)
  • Author(s): L. Liu and Y. Ju
  • Journal Title: NDT & E International Volume: 44 Issue: 1 Pages: 106-110
  • DOI: 10.1016/j.ndteint.2010.10.001
  • Peer Reviewed
• [Journal Article] Nanomachining by Rubbing at Ultrasonic Frequency under Controlled Shear Force (2011)
  • Author(s): M. Muraoka
  • Journal Title: Journal of Nanoscience and Nanotechnology Volume: 11 Issue: 3 Pages: 1986-1990
  • DOI: 10.1166/jnn.2011.3519
  • Peer Reviewed
• [Journal Article] Characterization of Films with Thickness less than 10 nm by Sensitivity-Enhanced Atomic Force Acoustic Microscopy (2011)
  • Author(s): M. Muraoka and S. Komatsu
  • Journal Title: Nanoscale Research Letters Volume: 11 Issue: 1 Pages: 1986-1990
  • DOI: 10.1007/s11671-010-9778-8
  • Peer Reviewed
• [Journal Article] Enhancement of Sensitivity for the Evaluation of Electrical Properties by Modifying the Nano Structure of Microwave AFM Probe (2011)
  • Author(s): L.Zhang, Y.Ju, A.Hosoi, A.Fujimoto
  • Journal Title: Materials Science Forum Volume: 675-677 Pages: 555-558
  • Peer Reviewed
• [Journal Article] A High-efficiency Nondestructive Method for Remote Detection and Quantitative Evaluation of Pipe Wall Thinning Using Microwaves (2011)
  • Author(s): L.Liu, Y.Ju
  • Journal Title: NDT&E International Volume: 44 Pages: 106-110
  • Peer Reviewed
• [Journal Article] Characterization of Films with Thickness less than 10 nm by Sensitivity-Enhanced Atomic Force Acoustic Microscopy (2011)
  • Author(s): M.Muraoka, S.Komatsu
  • Journal Title: Nanoscale Research Letters Volume: 6
  • Peer Reviewed
• [Journal Article] Microwave Atomic Force Microscopy Imaging for Nanometer-Scale Electrical Property Characterization (2010)
  • Author(s): L. Zhang, Y. Ju, A. Hosoi and A. Fujimoto
  • Journal Title: Review of Scientific Instruments Volume: 81 Issue: 12
  • DOI: 10.1063/1.3525058
  • Peer Reviewed
• [Journal Article] Properties of M-AFM Probe Affected by Nanostructural Metal Coatings (2010)
  • Author(s): A. Hosoi, M. Hamada, A. Fujimoto, Y. Ju
  • Journal Title: Microsystem Technologies Volume: 16 Issue: 7 Pages: 1233-1237
  • DOI: 10.1007/s00542-009-0957-4
  • Peer Reviewed
• [Journal Article] Mechanical Stretch-induced Changes in Cell Morphology and mRNA Expression of Tendon/Ligament-associated Genes in Rat Bone-marrow Mesenchymal Stem Cells (2010)
  • Author(s): G. Song, Q. Luo, B. Xu and Y. Ju
  • Journal Title: Molecular & Cellular Biomechanics Volume: 7 Pages: 165-174
  • Peer Reviewed
• [Journal Article] ERK1/2 Mediates Mechanical Stretch-induced Proliferation of Bone Marrow-derived Mesenchymal Stem Cells (2010)
  • Author(s): G. Song, L. Yuan, Q. Luo, Y. Shi, L. Yang and Y. Ju
  • Journal Title: IFMBE Proceedings Volume: 31 Pages: 1125-1128
  • DOI: 10.1007/978-3-642-14515-5_286
  • ISBN: 9783642145148, 9783642145155
  • Peer Reviewed
• [Journal Article] Nondestructive Detection of Defects in GFRP Laminates by Microwaves (2010)
  • Author(s): A. Hosoi and Y. Ju
  • Journal Title: Journal of Solid Mechanics and Materials Engineering Volume: 4 Issue: 11 Pages: 1711-1721
  • DOI: 10.1299/jmmp.4.1711
  • NAID: 130000420999
  • ISSN: 1880-9871
  • Peer Reviewed
• [Journal Article] Nondestructive Measurement and High-precision Evaluation of the Electrical Conductivity of Doped GaAs Wafers Using Microwaves (2010)
  • Author(s): L. Liu and Y. Ju
  • Journal Title: Review of Scientific Instruments Volume: 81 Issue: 12
  • DOI: 10.1063/1.3518038
  • Peer Reviewed
• [Journal Article] Displacement Amplifier for Piezoelectric Actuator Based on Honeycomb Link Mechanism (2010)
  • Author(s): M. Muraoka and S. Sanada
  • Journal Title: Sensors and Actuators A : Physical Volume: 157 Issue: 1 Pages: 84-90
  • DOI: 10.1016/j.sna.2009.10.024
  • Peer Reviewed
• [Journal Article] Helical Formation of Coated Nanowires by Viscous Flow of Core Materials (2010)
  • Author(s): Y. Toku and M. Muraoka
  • Journal Title: Nanoscience and Nanotechnology Letters Volume: 2 Issue: 3 Pages: 197-202
  • DOI: 10.1166/nnl.2010.1058
  • Peer Reviewed
• [Journal Article] 二酸化チタン含有ポリカーボネート基板へのイオンビーム照射によるDNA付着強度向上 (2010)
  • Author(s): 出水康仁, 梅原徳次, 村岡幹夫, 今井潤, 赤上陽一, 神田慎吾
  • Journal Title: 日本機械学会論文集C編 Volume: 76 Pages: 2142-2147
  • URL: http://ci.nii.ac.jp/naid/110007685532
  • Peer Reviewed
• [Journal Article] マイクロ波による物性評価と欠陥検出 (2010)
  • Author(s): 巨陽, 細井厚志
  • Journal Title: 非破壊検査 Volume: 59 Pages: 227-230
  • NAID: 10026320399
  • Peer Reviewed
• [Journal Article] Microwave Atomic Force Microscopy Imaging for Nanometer-Scale Electrical Property Characterization (2010)
  • Author(s): L.Zhang, Y.Ju, A.Hosoi, A.Fujimoto
  • Journal Title: Review of Scientific Instruments Volume: 81
  • Peer Reviewed
• [Journal Article] Nondestructive Measurement and High-precision Evaluation of the Electrical Conductivity of Doped GaAs Wafers Using Microwaves (2010)
  • Author(s): L.Liu, Y.Ju
  • Journal Title: Review of Scientific Instruments Volume: 81
  • Peer Reviewed
• [Journal Article] Properties of M-AFM Probe Affected by Nanostructural Metal Coatings (2010)
  • Author(s): A.Hosoi, M.Hamada, A.Fujimoto, Y.Ju
  • Journal Title: Microsystem Technologies 16(印刷中)
  • Peer Reviewed
• [Journal Article] Nanomachining by Rubbing at Ultrasonic Frequency under Controlled Shear Force (2010)
  • Author(s): M.Muraoka
  • Journal Title: Journal of Nanoscience and Nanotechnology 10(印刷中)
  • Peer Reviewed
• [Journal Article] Structure Modification of M-AFM Probe for the Measurement of Local Conductivity (2010)
  • Author(s): A.Fujimoto, L.Zhang, A.Hosoi, Y.Ju
  • Journal Title: Proc.Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS 2010 (印刷中)
  • NAID: 120002816362
  • Peer Reviewed
• [Journal Article] A microwave Probe Nanostructure for Atomic Force Microscopy (2009)
  • Author(s): Y. Ju, M. Hamada, T. Kobayashi and H. Soyama
  • Journal Title: Microsystem Technologies Volume: 15 Issue: 8 Pages: 1195-1199
  • DOI: 10.1007/s00542-009-0782-9
  • Peer Reviewed
• [Journal Article] Mechanical Characterization of Nanowires Based on Optical Diffraction Images of the Bent Shape (2009)
  • Author(s): M. Muraoka, R. Tobe
  • Journal Title: Journal of Nanoscience and Nanotechnology Volume: 9 Issue: 8 Pages: 4566-4574
  • DOI: 10.1166/jnn.2009.1079
  • Peer Reviewed
• [Journal Article] Optimization of the Tip of Microwave AFM Probe (2009)
  • Author(s): Y.Ju, M.Hamada, A.Hosoi, A.Fujimoto
  • Journal Title: Proc.InterPACK 2009 (CD-ROM) Pages: 6-6
  • Peer Reviewed
• [Journal Article] Inverse Analysis on Bent Shape of Nanowire in Fracture Test to Estimate the Fracture Strain (2009)
  • Author(s): M.Muraoka
  • Journal Title: Proc.ICF12 (CD-ROM) Pages: 6-6
  • Peer Reviewed
• [Journal Article] Formation of Helical Nanostructures by Film Deposition on Straight Nanowire (2009)
  • Author(s): M.Muraoka, T.Adachi
  • Journal Title: Proc.ASMP2009 (CD-ROM) Pages: 7-7
  • Peer Reviewed
• [Journal Article] (2009)
  • Author(s): 川嶋紘一郎, 坂上隆英, 巨陽
  • Journal Title: 非破壊検査工学最前線(共立出版) Pages: 149-210
• [Journal Article] Properties of M-AFM Probe Affected by Nanostructural Metal Coatings (2009)
  • Author(s): A. Hosoi (M. Hamada, A. Fujimoto, Y. Ju)
  • Journal Title: Proc. Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS 2009 Pages: 197-201
  • Peer Reviewed
• [Journal Article] A microwave Probe Nanostruoture for Atomic Force Microscopy (2009)
  • Author(s): Y. Ju(M. Hamada, et al. )
  • Journal Title: Microsystem Technologies 15(印刷中)
  • Peer Reviewed
• [Journal Article] Mechanical characterization of Nanowires Based on Optical Diffraction Images of the Bent Shape (2009)
  • Author(s): M. Muraoka (R. Tobe)
  • Journal Title: Journal of Nanoscience and Nanotechnology 9(印刷中)
  • Peer Reviewed
• [Journal Article] Growth and Proliferation of Bone Marrow Mesenchymal Stem Cells by Type I Collagen, Fibronectin and bFGF (2008)
  • Author(s): G. Song, Y. Ju and H. Soyama
  • Journal Title: Materials Science and Engineering C Volume: 28 Issue: 8 Pages: 1146-1171
  • DOI: 10.1016/j.msec.2008.04.005
  • Peer Reviewed
• [Journal Article] Growth and Proliferation of Bone Marrow Mesenchymal Stem Cells by Type I Collagen, Fibronectin and bFGF (2008)
  • Author(s): G. Song(Y. Ju, H. Soyama)
  • Journal Title: Materials Science and Engineering C 28 Pages: 1146-1171
  • Peer Reviewed
• [Presentation] マイクロ波原子間力顕微鏡の開発,中部地区ナノテク総合支援:ナノ材料創製加工と先端機器分析 (2011)
  • Author(s): 張嵐,藤本紹文,細井厚志,巨陽
  • Organizer: 平成22年度成果報告会
  • Place of Presentation: 豊田工業大学(愛知県)
  • Year and Date: 2011-03-30
• [Presentation] マイクロ波原子間力顕微鏡の開発 (2011)
  • Author(s): 張嵐, 藤本紹文, 細井厚志, 巨陽
  • Organizer: 中部地区ナノテク総合支援:ナノ材料創製加工と先端機器分析平成22年度成果報告会
  • Place of Presentation: 豊田工業大学(愛知県)
  • Year and Date: 2011-03-30
• [Presentation] マイクロ波を伝播するM-AFMプローブの低損失導波路の構築 (2011)
  • Author(s): 牧野孝則,巨陽,細井厚志
  • Organizer: 日本機械学会東海学生会第42回学生員卒業研究発表講演会
  • Place of Presentation: 豊橋技術科学大学(愛知県)
  • Year and Date: 2011-03-13
• [Presentation] 力学的刺激を用いた骨髄幹細胞の分化による腱組織の構築 (2011)
  • Author(s): 鈴木敏,渡邉早智,巨陽,森田康之
  • Organizer: 日本機械学会東海学生会第42回学生員卒業研究発表講演会
  • Place of Presentation: 豊橋技術科学大学(愛知県)
  • Year and Date: 2011-03-13
• [Presentation] 幹細胞の腱細胞分化に対する伸縮刺激の伸展率の違いによる影響 (2011)
  • Author(s): 渡邉早智,徐百耀,巨陽,森田康之
  • Organizer: 日本機械学会第23回バイオエンジニアリング講演会
  • Place of Presentation: 熊本大学(熊本県)
  • Year and Date: 2011-01-09
• [Presentation] Effect of High-Density Electric Current Field on Fatigue Cracks in Stainless Steel (2010)
  • Author(s): A.Hosoi, T.Nagahama, Y.Ju
  • Organizer: ASME 2010 International Mechanical Engineering Congress & Exposition
  • Place of Presentation: Vancouver, Canada
  • Year and Date: 2010-11-18
• [Presentation] Enhanced Bending of Coated Nanowires Using Viscous Flow of Core Material : Production of Nanoinductance (2010)
  • Author(s): Y. Toku, M. Muraoka
  • Organizer: 12th International Conference on Electronics Materials and Packaging
  • Place of Presentation: Orchard Hotel, Singapore
  • Year and Date: 2010-10-26
• [Presentation] Reflow of Lead-Free Solder by Microwave Heating (2010)
  • Author(s): Y.Ju, H.Yamauchi, H.Oshima, K.Tanaka
  • Organizer: 12th International Conference on Electronics Materials and Packaging
  • Place of Presentation: Orchard Hotel, Singapore
  • Year and Date: 2010-10-26
• [Presentation] AFMによる間葉系幹細胞の弾性的特性の定量評価 (2010)
  • Author(s): 向井太一,徐百耀,巨陽
  • Organizer: 日本機械学会M & M2010材料力学カンファレンス
  • Place of Presentation: 長岡技術科学大学(滋賀県)
  • Year and Date: 2010-10-11
• [Presentation] AFMによる間葉系幹細胞の弾性的特性の定量評価 (2010)
  • Author(s): 向井太一, 徐百耀, 巨陽
  • Organizer: 日本機械学会M&M2010材料力学カンファレンス
  • Place of Presentation: 長岡技術科学大学(滋賀県)
  • Year and Date: 2010-10-11
• [Presentation] 製膜ひずみとコア流動を利用した金属被覆ナノワイヤの曲げ加工 (2010)
  • Author(s): 徳悠葵, 村岡幹夫
  • Organizer: 日本機械学会M&M2010材料力学カンファレンス
  • Place of Presentation: 長岡技術科学大学(滋賀県)
  • Year and Date: 2010-10-10
• [Presentation] シアフォース制御下の超音波摺動によるナノリソグラフィー (2010)
  • Author(s): 臼井辰徳, 村岡幹夫
  • Organizer: 日本機械学会東北支部2010年度秋季講演会
  • Place of Presentation: 秋田大学(秋田県)
  • Year and Date: 2010-09-24
• [Presentation] Study on the Mechanostransduction Mechanism of Tenogenic Differentiation of Human Mesenchymal Stem Cells (2010)
  • Author(s): 徐百耀,巨陽,宋關斌,渡邉早智
  • Organizer: 日本機械学会2010年度年次大会
  • Place of Presentation: 名古屋工業大学(愛知県)
  • Year and Date: 2010-09-06
• [Presentation] 伸縮による間葉系幹細胞の腱細胞への分化 (2010)
  • Author(s): 渡邉早智,徐百耀,巨陽
  • Organizer: 日本機械学会2010年度年次大会
  • Place of Presentation: 名古屋工業大学(愛知県)
  • Year and Date: 2010-09-06
• [Presentation] Modifying the Structure of Microwave AFM Probe for Improving the Sensitivity in the Measurement of Electrical Properties (2010)
  • Author(s): 張嵐,巨陽,細井厚志,藤本紹文
  • Organizer: 日本機械学会2010年度年次大会
  • Place of Presentation: 名古屋工業大学(愛知県)
  • Year and Date: 2010-09-06
• [Presentation] 集中質量型カンチレバーのナノ接触共振による水晶ウエハの加工変質層の評価 (2010)
  • Author(s): 勝又悠樹, 村岡幹夫
  • Organizer: 日本機械学会2010年度年次大会
  • Place of Presentation: 名古屋工業大学(愛知県)
  • Year and Date: 2010-09-06
• [Presentation] コア流動法によるナノコイル形成の曲率制御 (2010)
  • Author(s): 徳悠葵, 村上幹夫
  • Organizer: 日本機械学会2010年度年次大会
  • Place of Presentation: 名古屋工業大学(愛知県)
  • Year and Date: 2010-09-06
• [Presentation] Measurement of SCC on the Surface of Ni-Base-Alloy by a Microwave Microscope (2010)
  • Author(s): Y.Ju, T.Amano, A.Hosoi
  • Organizer: The Fourth Japan-US NDT Symposium, Engineering NDE Capabilities for a Safer World
  • Place of Presentation: Hawaii, USA
  • Year and Date: 2010-06-08
• [Presentation] Development of a Nanostructural Microwave Probe for Atomic Force Microscopy(Keynote Lecture) (2009)
  • Author(s): Y. Ju
  • Organizer: International Symposium on Precision Engineering and Micro/Nanotechnology 2009
  • Place of Presentation: Zhejiang University, Hangzhou, China
  • Year and Date: 2009-10-29
• [Presentation] Development of a Nanostructural Microwave Probe for Atomic Force Microscopy (2009)
  • Author(s): 巨陽
  • Organizer: International Symposium on Precision Engineering and Micro/Nanotechnology 2009
  • Place of Presentation: Zhejiang University, Hangzhou, China
  • Year and Date: 2009-10-29
• [Presentation] マイクロ波原子間力顕微鏡プローブの開発および電気的特性の評価 (2009)
  • Author(s): 藤本紹文,細井厚志,巨陽
  • Organizer: 日本機械学会2009年度年次大会
  • Place of Presentation: 岩手大学(岩手県)
  • Year and Date: 2009-09-15
• [Presentation] マイクロ波原子間力顕微鏡プローブの開発および電気的特性の評価 (2009)
  • Author(s): 藤本紹文, 細井厚志, 巨陽
  • Organizer: 日本機械学会2009年度年次大会
  • Place of Presentation: 岩手大学 (盛岡市)
  • Year and Date: 2009-09-15
• [Presentation] 集中質量型カンチレバーの接触共振による金属ナノ材料の弾性計測 (2009)
  • Author(s): 村岡幹夫, 勝又悠樹
  • Organizer: 日本機械学会2009年度年次大会
  • Place of Presentation: 岩手大学 (盛岡市)
  • Year and Date: 2009-09-15
• [Presentation] Development of a Nanostructural AFM Probe for Propagating Microwave Signals (2009)
  • Author(s): A. Hosoi, M. Hamada, A. Fujimoto, Y. Ju
  • Organizer: Nanotoday 2009 conference
  • Place of Presentation: Biopolis, Singapore
  • Year and Date: 2009-08-03
• [Presentation] Optimization of the Tip of Microwave AFM Probe (2009)
  • Author(s): Y. Ju, M. Hamada, A. Hosoi, A. Fujimoto
  • Organizer: 2009 ASME/Pacific Rim Technical Conference and Exhibition on Integration and Packaging of MEMS, NEMS, and Electronic Systems
  • Place of Presentation: San Francisco, USA
  • Year and Date: 2009-07-19
• [Presentation] Inverse Analysis on Bent Shape of Nanowire in Fracture Test to Estimate the Fracture Strain (2009)
  • Author(s): M. Muraoka
  • Organizer: 12th International Conference on Fracture
  • Place of Presentation: Ottawa, Canada
  • Year and Date: 2009-07-12
• [Presentation] Formation of Helical Nanostructures by Film Deposition on Straight Nanowire (2009)
  • Author(s): M. Muraoka, T. Adachi
  • Organizer: 2dn Asian Symposium on Materials & Processing
  • Place of Presentation: Penang, Malaysia
  • Year and Date: 2009-06-01
• [Presentation] マイクロ波原子間力顕微鏡に用いるマイクロ波導波プローブの開発 (2009)
  • Author(s): 藤本紹文,細井厚志,巨陽
  • Organizer: 日本非破壊検査協会平成21年度春季講演大会
  • Place of Presentation: アルカディア市ヶ谷(東京都)
  • Year and Date: 2009-05-20
• [Presentation] マイクロ波原子間力顕微鏡に用いるマイクロ波導波プローブの開発 (2009)
  • Author(s): 藤本紹文, 細井厚志, 巨陽
  • Organizer: 日本非破壊検査協会平成21年度春季講演大会
  • Place of Presentation: アルカディア市ヶ谷 (東京)
  • Year and Date: 2009-05-20
• [Presentation] マイクロ波原子間力顕微鏡に用いるGaAsプローブの開発 (2009)
  • Author(s): 藤本紹文,細井厚志,巨陽
  • Organizer: 日本機械学会東海支部第58期総会・講演会
  • Place of Presentation: 岐阜大学(岐阜県)
  • Year and Date: 2009-03-18
• [Presentation] マイクロ波原子間力顕微鏡に用いるGaAsプローブの開発 (2009)
  • Author(s): 藤本紹文(細井厚志, 巨陽)
  • Organizer: 日本機械学会東海支部第58期総会・講演会
  • Place of Presentation: 岐阜大学
  • Year and Date: 2009-03-18
• [Presentation] GaAsを用いたマイクロ波原子間力顕微鏡プローブの開発 (2008)
  • Author(s): 濱田基弘,細井厚志,巨陽
  • Organizer: 日本材料学会第4回マイクロマテリアルシンポジウム
  • Place of Presentation: 東京大学(東京都)
  • Year and Date: 2008-09-24
• [Presentation] GaAsを用いたマイクロ波原子間力顕微鏡プローブの開発 (2008)
  • Author(s): 濱田基弘(細井厚志, 巨陽)
  • Organizer: 日本材料学会第4回マイクロマテリアルシンポジウム
  • Place of Presentation: 東京大学
  • Year and Date: 2008-09-24
• [Presentation] GaAsを用いたマイクロ波AFMプローブの開発 (2008)
  • Author(s): 濱田基弘,巨陽
  • Organizer: 日本機械学会2008年度年次大会
  • Place of Presentation: 横浜国立大学(神奈川県)
  • Year and Date: 2008-08-06
• [Presentation] GaAsを用いたマイクロ波AFMプローブの開発 (2008)
  • Author(s): 濱田基弘(巨陽)
  • Organizer: 日本機械学会2008年度年次大会
  • Place of Presentation: 横浜国立大学
  • Year and Date: 2008-08-06
• [Presentation] ナノワイヤの付着力 (2008)
  • Author(s): 村岡幹夫
  • Organizer: 日本機械学会2008年度年次大会
  • Place of Presentation: 横浜国立大学
  • Year and Date: 2008-08-06
• [Presentation] EBSD・AFM法による超細粒ECAP銅のナノスケール強度評価 (2008)
  • Author(s): 小島由梨(木村英彦, 秋庭義明, 巨陽)
  • Organizer: 日本機械学会2008年度年次大会
  • Place of Presentation: 横浜国立大学
  • Year and Date: 2008-08-04
• [Book] Metallic Micro and Nano Materials (2011)
  • Author(s): M. Saka, K. Sasagawa, M. Muraoka, H. Tohmyoh and Y. Ju
  • Publisher: Springer Publishing Ltd.
• [Book] Metallic Micro and Nano Materials (2011)
  • Author(s): M.Saka, K.Sasagawa, M.Muraoka, H.Tohmyoh, Y.Ju
  • Publisher: Springer Publishing Ltd.
• [Book] 非破壊検査工学最前線 (2009)
  • Author(s): 川嶋紘一郎,坂上隆英,巨陽
  • Publisher: 共立出版
• [Remarks]
  • URL: http://www.mech.nagoya-u.ac.jp/ju/
• [Remarks]
  • URL: http://www.mech.nagoya-u.ac.jp/ju/index.html
• [Patent(Industrial Property Rights)] 原子間力顕微鏡プローブ (2010)
  • Inventor(s): 巨陽, 坂真澄, 居冰峰
  • Industrial Property Rights Holder: 国立大学法人 名古屋大学
  • Acquisition Date: 2010-03-12
• [Patent(Industrial Property Rights)] 導電率測定方法および導電率測定装 (2009)
  • Inventor(s): 巨陽,羽木良明,橋尾克司,佐藤大介
  • Industrial Property Rights Holder: 住友電気工業(株),東北大学,名古屋大学
  • Industrial Property Number: 2009-000880
  • Filing Date: 2009-01-06
• [Patent(Industrial Property Rights)] 導電率測定方法および導電率測定装 (2009)
  • Inventor(s): 巨陽, 羽木良明, 橋尾克司, 佐藤大介
  • Industrial Property Rights Holder: 住友電気工業(株)東北大学名古屋大学
  • Industrial Property Number: 2009-000880
  • Filing Date: 2009-01-06