Development of bio-microwave atomic force microscopy and noninvasive measurement of cell activity
Project/Area Number |
20246028
|
Research Category |
Grant-in-Aid for Scientific Research (A)
|
Allocation Type | Single-year Grants |
Section | 一般 |
Research Field |
Materials/Mechanics of materials
|
Research Institution | Nagoya University |
Principal Investigator |
JU Yang 名古屋大学, 工学研究科, 教授 (60312609)
|
Co-Investigator(Kenkyū-buntansha) |
MURAOKA Mikio 秋田大学, 工学資源学研究科, 教授 (50190872)
KIMURA Hidehiko 名古屋大学, 工学研究科, 講師 (60345923)
HOSOI Atsushi 名古屋大学, 工学研究科, 助教 (60424800)
|
Project Period (FY) |
2008 – 2010
|
Project Status |
Completed (Fiscal Year 2010)
|
Budget Amount *help |
¥48,100,000 (Direct Cost: ¥37,000,000、Indirect Cost: ¥11,100,000)
Fiscal Year 2010: ¥12,610,000 (Direct Cost: ¥9,700,000、Indirect Cost: ¥2,910,000)
Fiscal Year 2009: ¥15,470,000 (Direct Cost: ¥11,900,000、Indirect Cost: ¥3,570,000)
Fiscal Year 2008: ¥20,020,000 (Direct Cost: ¥15,400,000、Indirect Cost: ¥4,620,000)
|
Keywords | マイクロ波 / 原子間力顕微鏡 / AFMプローブ / 電気的特性 / 細胞計測 / 骨髄幹細胞 / 非侵襲計測 / 細胞活性 / 微細加工 / 生体計測 / ナノ領域 |
Research Abstract |
A novel microscopy which is capable of investigating surface topography and electrical property of cells simultaneously on a sub-nanometer scale was developed. The microwave atomic force microscopy(M-AFM) is a combination of the principles of the scanning probe microscope and the microwave-measurement technique. The waveguide structure of the M-AFM probe allows microwave signals to propagate through the probe and emit from the tip of it. Based on the theoretical analysis and the measured amplitude and phase information of microwave signals, M-AFM can implement the quantitative characterization of the local conductivity and permittivity of cells on the sub-nanometer scale.
|
Report
(4 results)
Research Products
(79 results)
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
[Journal Article]2009
Author(s)
川嶋紘一郎, 坂上隆英, 巨陽
-
Journal Title
非破壊検査工学最前線(共立出版)
Pages: 149-210
Related Report
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
[Presentation] Optimization of the Tip of Microwave AFM Probe2009
Author(s)
Y. Ju, M. Hamada, A. Hosoi, A. Fujimoto
Organizer
2009 ASME/Pacific Rim Technical Conference and Exhibition on Integration and Packaging of MEMS, NEMS, and Electronic Systems
Place of Presentation
San Francisco, USA
Year and Date
2009-07-19
Related Report
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-