| Budget Amount *help |
¥18,720,000 (Direct Cost: ¥14,400,000、Indirect Cost: ¥4,320,000)
Fiscal Year 2011: ¥2,340,000 (Direct Cost: ¥1,800,000、Indirect Cost: ¥540,000)
Fiscal Year 2010: ¥3,250,000 (Direct Cost: ¥2,500,000、Indirect Cost: ¥750,000)
Fiscal Year 2009: ¥5,720,000 (Direct Cost: ¥4,400,000、Indirect Cost: ¥1,320,000)
Fiscal Year 2008: ¥7,410,000 (Direct Cost: ¥5,700,000、Indirect Cost: ¥1,710,000)
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| Research Abstract |
The purpose of this study was to reveal the formation process of bonding state between an atom of a sample surface and an atom at the tip apex of atomic force microscopy(AFM) using our developing bias-voltage non-contact atomic force microscopy/spectroscopy(bias nc-AFM/S). Towards this purpose we developed a force sensor with a high sensitivity, improved our electronic control system for the bias nc-AFM/S, and performed simultaneous measurements with high sensitivities of force, electric current and energy dissipation between the sample and the nc-AFM tip. Through this study we concluded that the covalent bond formation between a Si atom and a Si atom strongly depends on their local electronic density of states(LDOS).
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