| Project/Area Number |
20401023
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| Research Category |
Grant-in-Aid for Scientific Research (B)
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| Allocation Type | Single-year Grants |
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| Section | 海外学術 |
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| Research Field |
Japanese language education
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| Research Institution | Tokyo Institute of Technology (2010)
Tokyo Gakugei University (2008-2009) |
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Principal Investigator |
MAYEKAWA Shinichi (2010) 東京工業大学, 大学院・社会理工学研究科, 教授 (70190288)
加藤 清方 (2008-2009) Tokyo Gakugei University, 教育学部, 教授 (20185838)
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| Co-Investigator(Kenkyū-buntansha) |
MAEKAWA Shinichi 東京工業大学, 大学院・社会理工学研究科, 教授 (70190288)
KATOH Kiyokata 東京学芸大学, 教育学部, 教授 (20185838)
ECHIZENYA Akiko 東京農工大学, 留学生センター, 名誉教授 (30213549)
UMEKI Yumiko 宇都宮大学, 留学生センター, 教授 (60203577)
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| Co-Investigator(Renkei-kenkyūsha) |
ONOZUKA Wakana 東京富士大学, 経営学部, 非常勤講師 (30574165)
YOSHIZAWA Yukari 東京工業大学, 留学生センター, 非常勤講師
SAITOH Yoshiko 東京大学, 大学院・総合文化研究科, 博士課程在学
KAWABATA Kazuhiro 日本国際教育支援協会
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| Project Period (FY) |
2008 – 2010
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| Project Status |
Completed (Fiscal Year 2010)
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| Budget Amount *help |
¥16,120,000 (Direct Cost: ¥12,400,000、Indirect Cost: ¥3,720,000)
Fiscal Year 2010: ¥4,680,000 (Direct Cost: ¥3,600,000、Indirect Cost: ¥1,080,000)
Fiscal Year 2009: ¥5,980,000 (Direct Cost: ¥4,600,000、Indirect Cost: ¥1,380,000)
Fiscal Year 2008: ¥5,460,000 (Direct Cost: ¥4,200,000、Indirect Cost: ¥1,260,000)
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| Keywords | テスティング / ビジネス日本語 / テストの信頼性 / テストの妥当性 / 項目バンク / 項目プール / 日本語教育 / 評価・測定 / 言語テスト / 大規模日本語試験 / BJTビジネス日本語能力テスト / テスト・ビリーフ / 信頼性 / 妥当性 |
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| Research Abstract |
In this research, we investigated the validity and the reliability of Business Japanese Proficiency Test(BJT), one of the large scale language test program in Japan. In the aim of improving the efficiency of item banking, a set of those items whose test-theoretic characteristics had been found to be unsatisfactory were modified following a newly developed guidelines for modification. As the result of several simulated administration of the modified items, we found that the modified items performed better than the original ones showing the usefulness of our new guidelines. The belief questions administered at the same time showed that the high and the low ability group differ in their beliefs and attitudes toward the test taking.
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