Defect-oriented test generation based on fault excitation functions
| Project/Area Number |
20500051
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| Research Category |
Grant-in-Aid for Scientific Research (C)
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| Allocation Type | Single-year Grants |
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| Section | 一般 |
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| Research Field |
Computer system/Network
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| Research Institution | Ehime University |
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Principal Investigator |
HIROSHI Takahashi Ehime University, 理工学研究科, 教授 (80226878)
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| Project Period (FY) |
2008 – 2010
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| Project Status |
Completed (Fiscal Year 2010)
|
| Budget Amount *help |
¥4,420,000 (Direct Cost: ¥3,400,000、Indirect Cost: ¥1,020,000)
Fiscal Year 2010: ¥1,300,000 (Direct Cost: ¥1,000,000、Indirect Cost: ¥300,000)
Fiscal Year 2009: ¥1,300,000 (Direct Cost: ¥1,000,000、Indirect Cost: ¥300,000)
Fiscal Year 2008: ¥1,820,000 (Direct Cost: ¥1,400,000、Indirect Cost: ¥420,000)
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| Keywords | ディペンダブルコンピューティング / ブリッジ故障 / オープン故障 / 欠陥検出向きテスト / 情報工学 / システムオンチップ |
|---|
| Research Abstract |
Under the high-performance LSI fabricated with deep submicron technology, the development of test-CAD tools is necessary to reduce the test cost and to improve the quality for various defects. In this study, we propose fault excitation functions for stuck-at fault, bridging faults, complete disconnected open faults, transition faults, resistive bridging faults, and resistive open faults. We also propose a defect-oriented test generation method based on the fault excitation functions and a fault diagnosis method by using the fault excitation functions. The experimental results for ISCAS benchmark circuits demonstrated that the proposed methods can achieve the better fault coverage and the smaller diagnostic resolutions compared with the existing methods.
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Report
(4 results)
Research Products
(19 results)
