| Budget Amount *help |
¥4,420,000 (Direct Cost: ¥3,400,000、Indirect Cost: ¥1,020,000)
Fiscal Year 2010: ¥780,000 (Direct Cost: ¥600,000、Indirect Cost: ¥180,000)
Fiscal Year 2009: ¥1,430,000 (Direct Cost: ¥1,100,000、Indirect Cost: ¥330,000)
Fiscal Year 2008: ¥2,210,000 (Direct Cost: ¥1,700,000、Indirect Cost: ¥510,000)
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| Research Abstract |
I developed several measuring techniques of noncontact atomic force microscopy for investigating physical properties at the atomic scale such as magnetism, electron charge and elastic distribution on a surface. First, I invented the multifrequency frequency modulation atomic force microscopy (MF-FM-AFM) and performed its observation on semiconductor surfaces at room temperature. The elasticity information of the surfaces was successfully obtained at the atomic scale. Therefore I demonstrated the MF-FM-AFM is expected to be useful for the investigation of the surface elasticity at the atomic scale. In addition, I found and verified the novel method of extracting the magnetic exchange interaction on a surface from the total interaction working between AFM tip and the surface using micro wave.
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