Investigation of physical properties of magnetic thin film with atomic force microscopy in extreme field
| Project/Area Number |
20540314
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| Research Category |
Grant-in-Aid for Scientific Research (C)
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| Allocation Type | Single-year Grants |
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| Section | 一般 |
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| Research Field |
Condensed matter physics I
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| Research Institution | Osaka University |
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Principal Investigator |
NAITOH Yoshitaka Osaka University, 工学研究科, 助教 (90362665)
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| Project Period (FY) |
2008 – 2010
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| Project Status |
Completed (Fiscal Year 2010)
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| Budget Amount *help |
¥4,420,000 (Direct Cost: ¥3,400,000、Indirect Cost: ¥1,020,000)
Fiscal Year 2010: ¥780,000 (Direct Cost: ¥600,000、Indirect Cost: ¥180,000)
Fiscal Year 2009: ¥1,430,000 (Direct Cost: ¥1,100,000、Indirect Cost: ¥330,000)
Fiscal Year 2008: ¥2,210,000 (Direct Cost: ¥1,700,000、Indirect Cost: ¥510,000)
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| Keywords | 原子間力顕微鏡 / 表面弾性 / 磁性 / ゲルマニウム / 磁性薄膜 / 鉄 / 酸化銅 / シリコン / 表面科学 |
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| Research Abstract |
I developed several measuring techniques of noncontact atomic force microscopy for investigating physical properties at the atomic scale such as magnetism, electron charge and elastic distribution on a surface. First, I invented the multifrequency frequency modulation atomic force microscopy (MF-FM-AFM) and performed its observation on semiconductor surfaces at room temperature. The elasticity information of the surfaces was successfully obtained at the atomic scale. Therefore I demonstrated the MF-FM-AFM is expected to be useful for the investigation of the surface elasticity at the atomic scale. In addition, I found and verified the novel method of extracting the magnetic exchange interaction on a surface from the total interaction working between AFM tip and the surface using micro wave.
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Report
(4 results)
Research Products
(26 results)
