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The interface electronic structure between organic semiconductor and ferromagnetic metal surfaces : Towards organic spin-devices

Research Project

Project/Area Number 20550015
Research Category

Grant-in-Aid for Scientific Research (C)

Allocation TypeSingle-year Grants
Section一般
Research Field Physical chemistry
Research InstitutionKyoto University

Principal Investigator

YOHIDA Hiroyuki (YOSHIDA Hiroyuki)  京都大学, 化学研究所, 助教 (00283664)

Project Period (FY) 2008 – 2011
Project Status Completed (Fiscal Year 2011)
Budget Amount *help
¥5,070,000 (Direct Cost: ¥3,900,000、Indirect Cost: ¥1,170,000)
Fiscal Year 2011: ¥910,000 (Direct Cost: ¥700,000、Indirect Cost: ¥210,000)
Fiscal Year 2010: ¥910,000 (Direct Cost: ¥700,000、Indirect Cost: ¥210,000)
Fiscal Year 2009: ¥1,170,000 (Direct Cost: ¥900,000、Indirect Cost: ¥270,000)
Fiscal Year 2008: ¥2,080,000 (Direct Cost: ¥1,600,000、Indirect Cost: ¥480,000)
Keywords有機半導体 / 有機・金属界面 / 電子構造 / 角度分解X線光電子分光法 / 多変量解析 / 表面電気二重層 / 分子性固体 / 分極エネルギー / 角度分析X線光電子分光法 / 埋もれた界面 / 真空準位 / target factor analysis / 変量解析 / スピントロニクス / 薄膜構造
Research Abstract

Interface electronic structures between organic semiconductor and metal surface have been studied using photoemission spectroscopy. In the course of the study, we have developed a novel analytical method that can examine the core energy levels of material as a function of depth. Using this new method, electronic structures of buried metal-organic interfaces are examined. Further, the method allow for the first time to quantitatively determine the energy level difference between the bulk and surface of organic solids to be about 0. 3 eV. The origins of the difference are also discussed.

Report

(6 results)
  • 2011 Annual Research Report   Final Research Report ( PDF )
  • 2010 Annual Research Report   Self-evaluation Report ( PDF )
  • 2009 Annual Research Report
  • 2008 Annual Research Report
  • Research Products

    (58 results)

All 2012 2011 2010 2009 2008 Other

All Journal Article (7 results) (of which Peer Reviewed: 6 results) Presentation (47 results) Remarks (4 results)

  • [Journal Article] Electronic structure of the buried interface between an organic semiconductor, N, N'-Bis(3-methylphenyl)-N, N'-diphenylbenzidine(TPD), and metal surfaces2012

    • Author(s)
      Hiroyuki Yoshida, Eisuke Ito, Masahiko Hara, Naoki Sato
    • Journal Title

      J. Nanosci. Nanotech

      Volume: 12 Issue: 1 Pages: 494-498

    • DOI

      10.1166/jnn.2012.5401

    • Related Report
      2011 Final Research Report
  • [Journal Article] A Precise Analysis of the Core Level Energy Difference between the Surface and Bulk Region of Organic Semiconductor Thin Films2012

    • Author(s)
      Hiroyuki Yoshida, Naoki Sato
    • Journal Title

      J. Phys. Chem. C

      Volume: 116 Issue: 18 Pages: 10033-10038

    • DOI

      10.1021/jp3009404

    • Related Report
      2011 Annual Research Report 2011 Final Research Report
    • Peer Reviewed
  • [Journal Article] Electronic structure of the buried interface between an organic semiconductor, N,N'-Bis(3-methylphenyl)-N,N'-diphenylbenzidine (TPD), and metal surfaces2012

    • Author(s)
      Hiroyuki Yoshida, Eisuke Ito, Masahiko Hara, Naoki Sato
    • Journal Title

      J.Nanosci.Nanotech.

      Volume: 12 Pages: 2549-2553

    • Related Report
      2011 Annual Research Report
    • Peer Reviewed
  • [Journal Article] The depth profile of core energy levels : Electronic structure of buried organic/metal interfaces examined by X-ray photoemission and target factor analysis2011

    • Author(s)
      Hiroyuki Yoshida, Naoki Sato
    • Journal Title

      Chem. Phys. Lett.

      Volume: 511 Pages: 146-150

    • DOI

      10.1016/j.cplett.2012.04.058

    • Related Report
      2011 Annual Research Report 2011 Final Research Report
    • Peer Reviewed
  • [Journal Article] Decay mechanism of spontaneously built-up surface potential in a thin film of a zwitterionic molecule having noncentrosymmetric crystal structure2011

    • Author(s)
      Jun' ya Tsutsumi, Hiroyuki Yoshida, Richard Murdey, Naoki Sato
    • Journal Title

      J. Phys. Chem. C

      Volume: 115 Issue: 5 Pages: 2356-2356

    • DOI

      10.1021/jp107857n

    • Related Report
      2011 Annual Research Report 2011 Final Research Report
    • Peer Reviewed
  • [Journal Article] The depth profile of core energy levels : Electronic structure of buried organic/metal interfaces examined by X-ray photoemission and target factor analysis

    • Author(s)
      吉田弘幸、佐藤直樹
    • Journal Title

      Chem.Phys.Lett. (accepted)

    • Related Report
      2010 Self-evaluation Report
    • Peer Reviewed
  • [Journal Article] Electronic structure of buried interface between organic semiconductor, N, N' -Bis (3-methylphenyl) -N, N' -dipheny lbenzidine (TPD) and metals

    • Author(s)
      吉田弘幸、伊藤英輔、原正彦、佐藤直樹
    • Journal Title

      J.Nanosci.Nanotech. (accepted)

    • Related Report
      2010 Self-evaluation Report
    • Peer Reviewed
  • [Presentation] Core-energy level energy difference between the surface and bulk regions of organic semiconductor films2012

    • Author(s)
      Hiroyuki Yoshida, Eisuke Ito, Masahiko Hara, Naoki Sato, Thomas Ules, Michel G.Ramsey
    • Organizer
      76th Annual Meeting of the Deutche Physicalishe Gesellshaft (DPG) and DPG Spring Meeting(ドイツ物理学会)
    • Place of Presentation
      ベルリン工科大学(ドイツ)
    • Year and Date
      2012-03-26
    • Related Report
      2011 Annual Research Report
  • [Presentation] Core-energy level energy difference between the surface and bulk regions of organic semiconductor films2012

    • Author(s)
      Hiroyuki Yoshida, Eisuke Ito, Masahiko Hara, Naoki Sato, Thomas Ules, Michel G. Ramsey
    • Organizer
      76th Annual Meeting of the Deutche Physicalishe Gesellshaft(DPG) and DPG Spring Meeting(ドイツ物理学会)
    • Place of Presentation
      Berlin, Germany
    • Related Report
      2011 Final Research Report
  • [Presentation] Depth profiling the energy levels near the surface of organic semiconductor films studied by depth resolved X-ray photoemission spectroscopy2011

    • Author(s)
      Hiroyuki Yoshida, Eisuke Ito, Masahiko Hara, Naoki Sato
    • Organizer
      21st international photovoltaic sicence an engineering conference (PVSEC-21)
    • Place of Presentation
      福岡
    • Year and Date
      2011-11-29
    • Related Report
      2011 Annual Research Report
  • [Presentation] Core-energy level difference in the surface and bulk regions of organic semiconductor films studied by X-ray photoemission spectroscopy with depth resolution2011

    • Author(s)
      Hiroyuki Yoshida, Eisuke Ito, Masahiko Hara, Naoki Sato
    • Organizer
      The 6th Japan-Sweden Workshop on Advanced Spectroseopy of Organic Materials for Electronic Applications (ASOMEA6)
    • Place of Presentation
      石川
    • Year and Date
      2011-11-23
    • Related Report
      2011 Annual Research Report
  • [Presentation] 有機薄膜の表面とバルクの内殻準位のエネルギー差の起源2011

    • Author(s)
      吉困弘幸, 伊藤英輔, 厘正彦, 佐藤直樹
    • Organizer
      第72回応用物理学会学術講演会
    • Place of Presentation
      山形大学
    • Year and Date
      2011-09-01
    • Related Report
      2011 Annual Research Report
  • [Presentation] Core-energy level difference in the surface and bulk regions of organic semiconductor films studied by X-ray photoemission spectroscopy with depth resolution2011

    • Author(s)
      吉田弘幸、伊藤英輔、原正彦、佐藤直樹
    • Organizer
      2011 European Materials Research Society (E-MRS) spring meeting
    • Place of Presentation
      ニース、フランス(口頭講演)
    • Year and Date
      2011-05-09
    • Related Report
      2010 Self-evaluation Report
  • [Presentation] 有機固体中の表面とバルクの分子に対する内殻準位のエネルギー差2011

    • Author(s)
      吉田弘幸、伊藤英輔、原正彦、佐藤直樹
    • Organizer
      日本科学会第91春季年会
    • Place of Presentation
      横浜
    • Year and Date
      2011-03-29
    • Related Report
      2010 Annual Research Report
  • [Presentation] 有機固体中の表面とバルクの内殻準位のエネルギー差の起源2011

    • Author(s)
      吉田弘幸、伊藤英輔、原正彦、佐藤直樹
    • Organizer
      第58回応用物理学関係連合講演会
    • Place of Presentation
      横浜
    • Year and Date
      2011-03-27
    • Related Report
      2010 Annual Research Report
  • [Presentation] Core-energy level difference in the surface and bulk regions of organic semiconductor films studied by X-ray photoemission spectroscopy with depth resolution2011

    • Author(s)
      Hiroyuki Yoshida, Eisuke Ito, Masahiko Hara, Naoki Sato
    • Organizer
      第6回有機分子・バイオエレクトロニクス国際会議
    • Place of Presentation
      仙台
    • Year and Date
      2011-03-16
    • Related Report
      2010 Annual Research Report
  • [Presentation] Depth profiling the energy levels near the surface of organic semiconductor films studied by depth resolved X-ray photoemission spectroscopy2011

    • Author(s)
      Hiroyuki Yoshida, Eisuke Ito, Masahiko Hara, Naoki Sato
    • Organizer
      21st international photovoltaic sicence an engineering conference(PVSEC-21)
    • Place of Presentation
      Fukuoka, Japan
    • Related Report
      2011 Final Research Report
  • [Presentation] Core-energy level difference in the surface and bulk regions of organic semiconductor films studied by X-ray photoemission spectroscopy with depth resolution2011

    • Author(s)
      Hiroyuki Hiroyuki Yoshida, Eisuke Ito, Masahiko Hara, Naoki Sato
    • Organizer
      The 6th Japan-Sweden Workshop on Advanced Spectroscopy of Organic Materials for Electronic Applications(ASOMEA6)
    • Place of Presentation
      Ishikawa, Japan
    • Related Report
      2011 Final Research Report
  • [Presentation] X線光電子分光法で調べる有機半導体薄膜の内部の電子構造2011

    • Author(s)
      吉田弘幸、伊藤英輔、原正彦、Whee WonChin、Jin WookHan、永野修作、Michel Ramsey、佐藤直樹
    • Organizer
      第60回高分子討論会(依頼講演)
    • Place of Presentation
      岡山
    • Related Report
      2011 Final Research Report
  • [Presentation] A New Experimental Method for Depth Profiling Core Energy Levels : Application to the Electronic Structure of Buried Organic/Metal Interfaces2011

    • Author(s)
      Hiroyuki Yoshida, Eisuke Ito, Masahiko Hara, Naoki Sato
    • Organizer
      International Conference on Materials for Advanced Technology(ICMAT2011)
    • Place of Presentation
      Singapore
    • Related Report
      2011 Final Research Report
  • [Presentation] Core-energy level difference in the surface and bulk regions of organic semiconductor films studied by X-ray photoemission spectroscopy with depth resolution2011

    • Author(s)
      Hiroyuki Yoshida, Eisuke Ito, Masahiko Hara, Naoki Sato
    • Organizer
      2011 European Material Research Society(E-MRS) Sping Meeting
    • Place of Presentation
      Nice, France
    • Related Report
      2011 Final Research Report
  • [Presentation] A New Experimental Method for Depth Profiling Core Energy Levels : Application to the Electronic Structure of Buried Organic/Metal Interfaces2011

    • Author(s)
      Hiroyuki Yoshida, Eisuke Ito, Masahiko Hara, Naoki Sato
    • Organizer
      International Conference on Materials for Advanced Technology (ICMAT2011)
    • Place of Presentation
      シンガポール
    • Related Report
      2011 Annual Research Report
  • [Presentation] Core-energy level difference in the surface aid bulk resions of organic semiconductor films studied by X-ray pbotoemission spectroscopy with depth resolution2011

    • Author(s)
      Hiroyuki Yoshida, Eisuke Ito, Masahiko Hara, Naoki Sato
    • Organizer
      2011 European Material Research Society (E-MRS) Sping Meeting
    • Place of Presentation
      ニース(フランス)
    • Related Report
      2011 Annual Research Report
  • [Presentation] X線光電子分光法で調べる有機半導体薄膜の内部の電子構造2011

    • Author(s)
      吉田弘幸、伊藤英輔、原正彦, Whee WonChin、Jin WookHan, 永野修作, Michel Ramsey, 佐藤直樹
    • Organizer
      第60回高分子討論会
    • Place of Presentation
      岡山大学(依頼講演)
    • Related Report
      2011 Annual Research Report
  • [Presentation] 有機薄膜の表面とバルクの間で認められる内殻準位エネルギー差の起源2011

    • Author(s)
      吉困弘幸, 伊藤英輔, 原正彦, 佐藤直樹
    • Organizer
      第5回分子科学討論会
    • Place of Presentation
      札幌コンベンションセンター
    • Related Report
      2011 Annual Research Report
  • [Presentation] 有機薄膜の表面とバルク間の内殻準位エネルギー差の起源2011

    • Author(s)
      吉田弘幸、伊藤英輔、原正彦, 佐藤直樹, Whee WonChin、Jin WookHan
    • Organizer
      第20回有機結晶シンポジウム
    • Place of Presentation
      富山大学
    • Related Report
      2011 Annual Research Report
  • [Presentation] 光電子分光法で調べる有機固体内部の電子準位2010

    • Author(s)
      吉田弘幸
    • Organizer
      富山大学特別講演会
    • Place of Presentation
      富山
    • Year and Date
      2010-09-22
    • Related Report
      2010 Annual Research Report
  • [Presentation] 角度分解X線光電子分光法による内殻準位の深さプロファイル:有機半導体と金属の埋もれた界面の電子構造2010

    • Author(s)
      吉田弘幸、伊藤英輔、原正彦、佐藤直樹
    • Organizer
      第4回分子科学討論会
    • Place of Presentation
      大阪(口頭講演)
    • Year and Date
      2010-09-15
    • Related Report
      2010 Self-evaluation Report
  • [Presentation] 角度分解X線光電子分光法による内殻準位の深さプロファイル有機半導体と金属の埋もれた界面の電子構造2010

    • Author(s)
      吉田弘幸、伊藤英輔、原正彦、佐藤直樹
    • Organizer
      第4回分子科学討論会
    • Place of Presentation
      大阪
    • Year and Date
      2010-09-15
    • Related Report
      2010 Annual Research Report
  • [Presentation] 角度分解X線光電子分光法による内殻準位の深さプロファイル:有機半導体と金属の埋もれた界面の電子構造2010

    • Author(s)
      吉田弘幸、伊藤英輔、原正彦、佐藤直樹
    • Organizer
      第71回応用物理学会学術講演会
    • Place of Presentation
      長崎(口頭講演)
    • Year and Date
      2010-09-14
    • Related Report
      2010 Self-evaluation Report
  • [Presentation] 角度分解X線光電子分光法による内殻準位の深さプロファイル:有機半導体と金属の埋もれた界面の電子構造2010

    • Author(s)
      吉田弘幸、伊藤英輔、原正彦、佐藤直樹
    • Organizer
      2010年秋季第71回応用物理学会学術講演会
    • Place of Presentation
      長崎
    • Year and Date
      2010-09-14
    • Related Report
      2010 Annual Research Report
  • [Presentation] A New Experimental Technique to Examine Electronic Structure at Buried Interface in Organic/Metal Contacts2010

    • Author(s)
      吉田弘幸、伊藤英輔、原正彦、佐藤直樹
    • Organizer
      International Conference on Science and Technology of Synthetic Metals 2010
    • Place of Presentation
      京都(口頭講演)
    • Year and Date
      2010-07-06
    • Related Report
      2010 Self-evaluation Report
  • [Presentation] A New Experimental Technique to Examine Electronic Structure at Buried Interface in Organic/Metal Contacts2010

    • Author(s)
      Hiroyuki YOSHIDA, Eisuke ITO, Masahiko HARA, Naoki SATO
    • Organizer
      International Conference on Science and Technology of Synthetic Metals (ICSM) 2010
    • Place of Presentation
      Groningen, Netherlands
    • Year and Date
      2010-07-06
    • Related Report
      2010 Annual Research Report
  • [Presentation] 角度分解X線光電子分光法による有機半導体・金属の埋もれた界面の電子構造観測2010

    • Author(s)
      吉田弘幸、佐藤直樹
    • Organizer
      日本化学会第90春季年会
    • Place of Presentation
      近畿大学
    • Year and Date
      2010-03-28
    • Related Report
      2009 Annual Research Report
  • [Presentation] 角度分解X線光電子分光法による有機半導体・金属の埋もれた界面の電子構造観測2010

    • Author(s)
      吉田弘幸、佐藤直樹
    • Organizer
      第57回応用物理学関係連合講演会
    • Place of Presentation
      東海大学湘南キャンパス
    • Year and Date
      2010-03-18
    • Related Report
      2009 Annual Research Report
  • [Presentation] A New Experimental Techniqueto Examine Electronic Structure at Buried Interface of Organic/Metal Contacts2010

    • Author(s)
      吉田弘幸、佐藤直樹
    • Organizer
      5th WINTERSCHOOL ON ORGANIC ELECTRONICS
    • Place of Presentation
      Planneralm, Austria
    • Year and Date
      2010-03-10
    • Related Report
      2009 Annual Research Report
  • [Presentation] A New Experimental Technique to Examine Electronic Structure at Buried Interface of Organic/Metal Contacts2010

    • Author(s)
      吉田弘幸、佐藤直樹
    • Organizer
      The 5th edition of the international workshop on Electronic Structure and Processes at Molecular-Based Interfaces (ESPMI-〓)
    • Place of Presentation
      千葉大学
    • Year and Date
      2010-01-25
    • Related Report
      2009 Annual Research Report
  • [Presentation] Electronic Structure at Buried Interfaces of Organic/Metal Contacts Observed with Angle Resolved X-Ray Photoemission Spectroscopy2010

    • Author(s)
      吉田弘幸、佐藤直樹
    • Organizer
      第3回物質合成国際会議
    • Place of Presentation
      名古屋大学
    • Year and Date
      2010-01-06
    • Related Report
      2009 Annual Research Report
  • [Presentation] New Experimental Technique to Examine Electronic Structure at Buried Interfaces of Metal/Organic Contacts2010

    • Author(s)
      Hiroyuki Yoshida, Eisuke Ito, Masahiko Hara, Naoki Sato
    • Organizer
      The 27 th European Conference of Surface Science(ECOSS 27)
    • Place of Presentation
      Groningen, Netherland
    • Related Report
      2011 Final Research Report
  • [Presentation] New Experimental Technique to Examine Electronic Structure at Buried Interfaces of Metal/Organic Contacts2010

    • Author(s)
      Hiroyuki Yoshida, Eisuke Ito, Masahiko Hara, Naoki Sato
    • Organizer
      International Conference of Synthetic Metals(ICSM) 7
    • Place of Presentation
      Kyoto, Japan
    • Related Report
      2011 Final Research Report
  • [Presentation] A New Experimental Technique to Examine Electronic Structure at Buried Interface in Organic/Metal Contacts2010

    • Author(s)
      吉田弘幸、伊藤英輔、原正彦、佐藤直樹
    • Organizer
      European Conference on Surface Science (ECOSS) 27
    • Place of Presentation
      ローニンゲン、オランダ(口頭講演)
    • Related Report
      2010 Self-evaluation Report
  • [Presentation] New Experimental Technique to Examine Electronic Structure at Buried Interfaces of Metal/Organic Contacts2010

    • Author(s)
      吉田弘幸
    • Organizer
      有機太陽電池シンポジウム
    • Place of Presentation
      京都
    • Related Report
      2010 Annual Research Report
  • [Presentation] A New Experimental Technique to Examine Electronic Structure at Buried Interface in Organic/Metal Contacts2010

    • Author(s)
      Hiroyuki YOSHIDA, Eisuke ITO, Masahiko HARA, Naoki SATO
    • Organizer
      European Conference on Surface Science(ECOSS)27
    • Place of Presentation
      Groningen, Netherlands
    • Related Report
      2010 Annual Research Report
  • [Presentation] Depth profiling of energy levels of nanometer-thick organic films : electronic structure of buried organic/metal interface2010

    • Author(s)
      Hiroyuki YOSHIDA, Eisuke ITO, Masahiko HARA, Naoki SATO
    • Organizer
      AsiaNano2010
    • Place of Presentation
      東京
    • Related Report
      2010 Annual Research Report
  • [Presentation] Depth profiling of core-energy levels by X-ray photoemission spectroscopy2010

    • Author(s)
      Hiroyuki Yoshida
    • Organizer
      COE Start-up International Workshop
    • Place of Presentation
      千葉
    • Related Report
      2010 Annual Research Report
  • [Presentation] 電子分光法で調べる有機半導体の内部の電子構造2010

    • Author(s)
      吉田弘幸
    • Organizer
      第4回物質科学フロンティアセミナー
    • Place of Presentation
      名古屋
    • Related Report
      2010 Annual Research Report
  • [Presentation] 角度分解X線光電子分光法による有機半導体・金属の埋もれた界面の電子構造観測2009

    • Author(s)
      吉田弘幸、佐藤直樹
    • Organizer
      第5回物質合成シンポジウム
    • Place of Presentation
      京都大学
    • Year and Date
      2009-11-19
    • Related Report
      2009 Annual Research Report
  • [Presentation] 角度分解X線光電子分光法による有機半導体・金属の埋もれた界面の電子構造観測2009

    • Author(s)
      吉田弘幸、佐藤直樹
    • Organizer
      第18回有機結晶シンポジウム
    • Place of Presentation
      東京大学
    • Year and Date
      2009-11-10
    • Related Report
      2009 Annual Research Report
  • [Presentation] Electronic structure of buried interfaces at organic/metal contacts observed with angle resolved X-ray photoemission spectroscopy2009

    • Author(s)
      吉田弘幸、佐藤直樹
    • Organizer
      The Workshop on Advanced Spectroscopy Organic Materials for Electronic Applications (ASOMEA) 5
    • Place of Presentation
      Krusenberg, Sweden
    • Year and Date
      2009-10-01
    • Related Report
      2009 Annual Research Report
  • [Presentation] 角度分解X線光電子分光法による有機半導体・金属の埋もれた界面の電子構造観測2009

    • Author(s)
      吉田弘幸、佐藤直樹
    • Organizer
      第3回分子科学討論会
    • Place of Presentation
      名古屋大学
    • Year and Date
      2009-09-21
    • Related Report
      2009 Annual Research Report
  • [Presentation] 角度分解X線光電子分光法による有機半導体・金属の埋もれた界面の電子構造観測2009

    • Author(s)
      吉田弘幸、佐藤直樹
    • Organizer
      第70回 応用物理学会学術講演会
    • Place of Presentation
      富山大学
    • Year and Date
      2009-09-10
    • Related Report
      2009 Annual Research Report
  • [Presentation] Au表面上のビスベンゾペンタチエノアセン真空蒸着膜の構造2008

    • Author(s)
      吉田弘幸, 渡津裕次, 佐藤直樹, 河邉英司, 山根宏之, 金井要, 関一彦, 岡本敏宏, 山口茂弘
    • Organizer
      有機結晶シンポジウム
    • Place of Presentation
      大阪
    • Year and Date
      2008-11-13
    • Related Report
      2008 Annual Research Report
  • [Presentation] ビスベンゾペンタチエノアセン薄膜の膜厚による構造変化2008

    • Author(s)
      吉田弘幸, 渡津裕次, 佐藤直樹, 河邉英司, 山根宏之, 金井要, 関一彦, 岡本敏宏, 山口茂弘
    • Organizer
      第2回分子科学討論会
    • Place of Presentation
      福岡
    • Year and Date
      2008-09-26
    • Related Report
      2008 Annual Research Report
  • [Presentation] ビスベンゾペンタチエノアセン(B5TB)薄膜の構造2008

    • Author(s)
      吉田弘幸, 渡津裕次, 佐藤直樹, 河邉英司, 山根宏之, 金井要, 関一彦, 岡本敏宏, 山口茂弘
    • Organizer
      第69回応用物理学会学術講演会
    • Place of Presentation
      愛知
    • Year and Date
      2008-09-04
    • Related Report
      2008 Annual Research Report
  • [Remarks]

    • URL

      http://www.scl.kyoto-u.ac.jp/~yoshida/hiroyuki_yoshida/main.html

    • Related Report
      2011 Final Research Report
  • [Remarks]

    • Related Report
      2011 Annual Research Report
  • [Remarks] ホームページ

    • URL

      http://www.scl.kyoto-u.ac.jp/~yoshida/hiroyuki_yoshida/main.html

    • Related Report
      2010 Self-evaluation Report
  • [Remarks]

    • URL

      http://www.scl.kyoto-u.ac.jp/~yoshida/hiroyuki_youshida/main.html

    • Related Report
      2010 Annual Research Report

URL: 

Published: 2008-04-01   Modified: 2016-04-21  

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