Analysis of potential barriers for ion transport in ionic conductors
Project/Area Number |
20560634
|
Research Category |
Grant-in-Aid for Scientific Research (C)
|
Allocation Type | Single-year Grants |
Section | 一般 |
Research Field |
Inorganic materials/Physical properties
|
Research Institution | National Institute for Materials Science |
Principal Investigator |
MICHIUE Yuichi National Institute for Materials Science, 量子ビームセンター, 主幹研究員 (50354402)
|
Project Period (FY) |
2008 – 2010
|
Project Status |
Completed (Fiscal Year 2010)
|
Budget Amount *help |
¥4,030,000 (Direct Cost: ¥3,100,000、Indirect Cost: ¥930,000)
Fiscal Year 2010: ¥650,000 (Direct Cost: ¥500,000、Indirect Cost: ¥150,000)
Fiscal Year 2009: ¥650,000 (Direct Cost: ¥500,000、Indirect Cost: ¥150,000)
Fiscal Year 2008: ¥2,730,000 (Direct Cost: ¥2,100,000、Indirect Cost: ¥630,000)
|
Keywords | 単結晶X線回折 / 結晶構造 / イオン伝導 / イオン導電体 / イオン拡散 |
Research Abstract |
Potential barriers of the hopping process for fast ion transport in solids were estimated from single-crystal X-ray diffraction intensities. A newly-presented method was successfully applied to one-dimensional (1d) ionic conductors containing K and Rb ions as mobile species. The validity of the method was also confirmed for a 1d ionic conductor with a superlattice of 3 times the sublattice along the conduction path. It has consequently become easier to discuss relations between structural parameters and ion conductivities in detail.
|
Report
(4 results)
Research Products
(6 results)